基于TCP／IP协议的桌面视频会议系统的研究

本文的主要目的是研究实现广域上的多媒体通信，为设计开发网环境中的多媒体通信终端做技术准备。我们试图在ＰＣ机Ｗｉｎｄｏｗｓ操作系统的平台上，建立一个基于ＴＣＰ／ＩＰ网络协议的支持视频，音频流的实时，双向传输和通用数据传输的桌面视频会议系统。     

基于DM642的视频音频监控系统设计

为实现视频音频数据的实时采集传输,提出了一种基于DM642的视频音频监控系统的设计方案。硬件上,利用DM642丰富的外设资源,完成了视频输入、输出模块,音频输入输出模块和以太网接口模块的设计。软件上,基于DSP/BIOS实时操作系统,实现对视频音频数据的管理和控制,并构建Web服务器,用户可通过浏览器访问系统,实现远程监控。测试结果表明,该系统性能稳定,符合设计要求。     

新一代多媒体通信协议SIP及其实现

SIP（Session Initiation Protocol）是IETF提出的新一代多媒体通信框架信令协议，业务逻辑实现简单，功能灵活、支持有线、无线网络的无缝接入，已成为NGN的核心协议。目前，SIP已广泛地应用在VoIP系统中，SIP在视频通信系统中的应用更是当前的研究热点课题。论文详细研究了SIP的分层结构、功能实体、消息语法、基本工作流程以及其实现机制，并基于开放源代码的VOCAL系统，分析基于SIP的语音通信实现方法，深入探讨SIP的实现机制。     

基于SIP协议的旅游信息终端的设计与实现

针对当前旅游网站存在的问题,文章设计并实现了基于SIP协议的旅游信息终端。其中,浏览旅游信息的音频和视频模块是基于H.264协议和RTP(实时传输协议)设计的。旅游信息通过区域实现模块分化,用户可以选择景点并播放关于该景点的音频或视频信息,或者阅读图片和文本信息,从而选定最感兴趣的景点游玩。与传统的信息系统相比,文章设计的旅游信息终端具有良好的可扩展性、兼容性、舒适的用户界面、易于搜索和评分的功能。     

基于SIP的无线视频监控系统信令的设计与实现

介绍了初始会话协议(SIP),设计和实现了基于SIP的视频监控系统,包括视频服务器和客户端。着重阐述了SIP模块的开发测试、实现过程,以及信令交互和方法应用。     

EMBLAZE-VCON新品Frontier上市

全球领先的IP视频会议技术供应商——以色列EMBLAZE-VCON有限公司近日宣布推出一款用于防火墙安全穿越和加密通信的产品——Frontier解决方案。Frontier是一款非常有效的应用于IPH．323多媒体通信网络中实现防火墙安全穿越和地址转换的解决疗案,它为视频流、音频流和数据提供穿越多个网络环境或至互联网的安全通信隧道。另外,设置Frontier无     

实时视频中SIP与RTSP的应用

随着网络技术发展,流媒体技术很好地解决了长时间下载后才能播放视频流的问题.首先,通过分析比较SIP与RTSP的异同点,总结SIP与RTSP各自的优势.其次重点分析利用SIP完成实时视频的会话请求建立过程,并通过RTSP协议对实时流进行控制,来完成实时视频请求的过程.最后,论述客户端与服务器端如何协同完成实时视频的播放过程.SIP和RTSP的结合使用在视频监控系统是有效且实用的.     

一种基于嵌入式的视频音频采集系统

给出了一种基于嵌入式硬件平台和Linux操作系统,采用MPEG4视频压缩标准和PCM音频标准的视频和音频采集系统的实现方案。通过对硬件和软件的设计实现了数据的实时压缩和采集。给出了整个系统的逻辑结构,并分别详细论述了硬件和软件的设计流程,着重介绍了如何将MPEG4视频流和PCM音频流保存成AVI格式以及如何实现格式转换的过程。     

利用平台FPGA器件进行多媒体、视频和图像应用设计

当今生活的时代,多媒体通信的出现和流行是大势所趋.随着数字电视(DTV)、IP视频传输、数字相机、无线视频、医疗图像和视频监控等应用的兴起,目前提供音频和数据服务的许多系统都会随实时视频技术的应用而有不同程度的扩展.     

MPEG4—及未来的多媒体通信

讨论了全新的视频编码标准ＭＰＥＧ－４的性能及ＭＰＥＧ－４的视频，音频和系统标准，阐述了其对多媒体通信的影响，并对未来的多媒体通信进行了展望。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.