A 10 bit 50 MS/s SAR ADC with partial split capacitor switching scheme in 0.18 μm CMOS

This paper presents a 10 bit successive approximation register (SAR) analog-to-digital converter (ADC) in 0.18 μ m 1P6M CMOS technology with a 1.8 V supply voltage. To improve the conversion speed, a partial split capacitor switching scheme is proposed. By reducing the time constant of the bit cycles, the proposed technique shortens the settling time of a capacitive digital-to-analog converter (DAC). In addition, a new SAR control logic is proposed to reduce loop delay to further enhance the conversion speed. At 1.8 V supply voltage and 50 MS/s the SAR ADC achieves a signal-to-noise and distortion ratio (SNDR) of 57.5 dB and spurious-free dynamic range (SFDR) of 69.3 dB. The power consumption is 2.26 mW and the core die area is 0.096 mm².     

On the design of high-speed energy-efficient successive-approximation logic for asynchronous SAR ADCs

This paper analyzes the power consumption and delay mechanisms of the successive-approximation (SA) logic of a typical asynchronous SAR ADC, and provides strategies to reduce both of them. Following these strategies, a unique direct-pass SA logic is proposed based on a full-swing once-triggered DFF and a self-locking tri-state gate. The unnecessary internal switching power of a typical TSPC DFF, which is commonly used in the SA logic, is avoided. The delay of the ready detector as well as the sequencer is removed from the critical path. A prototype SAR ADC based on the proposed SA logic is fabricated in 130 nm CMOS. It achieves a peak SNDR of 56.3 dB at 1.2 V supply and 65 MS/s sampling rate, and has a total power consumption of 555 μ W, while the digital part consumes only 203 μ W.     

An 8 bit 1 MS/s SAR ADC with 7.72-ENOB

This paper presents a low power 8-bit 1 MS/s SAR ADC with 7.72-bit ENOB. Without an op-amp, an improved segmented capacitor DAC is proposed to reduce the capacitance and the chip area. A dynamic latch comparator with output offset voltage storage technology is used to improve the precision. Adding an extra positive feedback in the latch is to increase the speed. What is more, two pairs of CMOS switches are utilized to eliminate the kickback noise introduced by the latch. The proposed SAR ADC was fabricated in SMIC 0.18 μm CMOS technology. The measured results show that this design achieves an SFDR of 61.8 dB and an ENOB of 7.72 bits, and it consumes 67.5 μ W with the FOM of 312 fJ/conversion-step at 1 MS/s sample under 1.8 V power supply.     

An ll-bit 22-MS/s 0.6 mW SAR ADC with parasitic capacitance compensation

Abstract： This paper presents an l 1-bit 22-MS/s 0.6-mW successive approximation register （SAR） analog-to- digital converter （ADC） using SMIC 65-nm low leakage （LL） CMOS technology with a 1.2 V supply voltage. To reduce the total capacitance and core area the split capacitor architecture is adopted. But in high resolution ADCs the parasitic capacitance in the LSB-side would decrease the linearity of the ADC and it is hard to calibrate. This paper proposes a parasitic capacitance compensation technique to cancel the effect with no calibration circuits. Moreover, dynamic circuits are used to minimize the switching power of the digital logic and also can reduce the latency time. The prototype chip realized an 11-bit SAR ADC fabricated in SMIC 65-nm CMOS technology with a core area of 300 × 200 μm2. It shows a sampling rate of 22 MS/s and low power dissipation of 0.6 mW at a 1.2 V supply voltage. At low input frequency the signal-to-noise-and-distortion ratio （SNDR） is 59.3 dB and the spurious-free dynamic range is 72.2 dB. The peak figure-of-merit is 36.4 fJ/conversion-step.     

一个单通道10位160兆每秒的逐次逼近式模数转换器

This paper demonstrates a single-channel 10-bit 160 MS/s successive-approximation-register （SAR） analog-to-digital converter （ADC） in 65 nm CMOS process with a 1.2 V supply voltage. To achieve high speed, a new window-opening logic based on the asynchronous SAR algorithm is proposed to minimize the logic delay, and a partial set-and-down DAC with binary redundancy bits is presented to reduce the dynamic comparator offset and accelerate the DAC settling. Besides, a new bootstrapped switch with a pre-charge phase is adopted in the track and hold circuits to increase speed and reduce area. The presented ADC achieves 52.9 dB signal-to-noise distortion ratio and 65 dB spurious-free dynamic range measured with a 30 MHz input signal at 160 MHz clock. The power consumption is 9.5 mW and a core die area of 250 ×200 μm^2 is occupied.     

应用于碲锌镉探测器逐次逼近模数转换器基准电压的研究

An on-chip reference voltage has been designed in capacitor-resister hybrid SAR ADC for CZT detector with the TSMC 0.35 μ m 2P4M CMOS process. The voltage reference has a dynamic load since using variable capacitors and resistances, which need a large driving ability to deal with the current related to the time and sampling rate. Most of the previous articles about the reference for ADC present only the bandgap part for a low temperature coefficient and high PSRR. However, it is not enough and overall, it needs to consider the output driving ability. The proposed voltage reference is realized by the band-gap reference, voltage generator and output buffer. Apart from a low temperature coefficient and high PSRR, it has the features of a large driving ability and low power consumption. What is more, for CZT detectors application in space, a radiation-hardened design has been considered. The measurement results show that the output reference voltage of the buffer is 4.096 V. When the temperature varied from 0 to 80℃, the temperature coefficient is 12.2 ppm/℃. The PSRR was-70 dB@100 kHz. The drive current of the reference can reach up to 10 mA. The area of the voltage reference in the SAR ADC chip is only 449×614 μm². The total power consumption is only 1.092 mW.     

An area-efficient 55 nm 10-bit 1-MS/s SAR ADC for battery voltage measurement

An area-efficient CMOS 1-MS/s 10-bit charge-redistribution SAR ADC for battery voltage measurement in a SoC chip is proposed. A new DAC architecture presents the benefits of a low power approach without applying the common mode voltage. The threshold inverter quantizer(TIQ)-based CMOS Inverter is used as a comparator in the ADC to avoid static power consumption which is attractive in battery-supply application. Sixteen level-up shifters aim at converting the ultra low core voltage control signals to the higher voltage level analog circuit in a 55 nm CMOS process. The whole ADC power consumption is 2.5 mW with a maximum input capacitance of 12 pF in the sampling mode. The active area of the proposed ADC is 0.0462 mm2 and it achieves the SFDR and ENOB of 65.6917 dB and 9.8726 bits respectively with an input frequency of 200 kHz at 1 MS/s sampling rate.     

A 130 nm CMOS low-power SAR ADC for wide-band communication systems

This paper presents a low power 9-bit 80 MS/s SAR ADC with comparator-sharing technique in 130 nm CMOS process. Compared to the conventional SAR ADC, the sampling phase is removed to reach the full efficiency of the comparator. Thus the conversion rate increases by about 20% and its sampling time is relaxed. The design does not use any static components to achieve a widely scalable conversion rate with a constant FOM. The floorplan of the capacitor network is custom-designed to suppress the gain mismatch between the two DACs. The ＇set-and- down＇ switching procedure and a novel binary-search error compensation scheme are utilized to further speed up the SA bit-cycling operation. A very fast logic controller is proposed with a delay time of only 90 ps. At 1.2 V supply and 80 MS/s the ADC achieves an SNDR of 51.4 dB and consumes 1.86 mW, resulting in an FOM of 76.6 fJ/conversion-step. The ADC core occupies an active area of only 0.089 mm2.     

A monolithic K-band phase-locked loop for microwave radar application

A monolithic K-band phase-locked loop(PLL) for microwave radar application is proposed and implemented in this paper. By eliminating the tail transistor and using optimized high-Q LC-tank, the proposed voltage-controlled oscillator(VCO) achieves a tuning range of 18.4 to 23.3 GHz and reduced phase noise. Two cascaded current-mode logic(CML) divide-by-two frequency prescalers are implemented to bridge the frequency gap, in which inductor peaking technique is used in the first stage to further boost allowable input frequency. Six-stage TSPC divider chain is used to provide programmable division ratio from 64 to 127, and a second-order passive loop filter with 825 kHz bandwidth is also integrated on-chip to minimize required external components. The proposed PLL needs only approximately 18.2 μs settling time, and achieves a wide tuning range from 18.4 to 23.3 GHz, with a typical output power of -0.84 dBm and phase noise of 91:92 dBc/Hz@1 MHz. The chip is implemented in TSMC 65 nm CMOS process, and occupies an area of 0.56 mm² without pads under a 1.2 V single voltage supply.     

一种带有混合平均式分布采样电路的低功耗CMOS全折叠型模数转换器

This paper describes an 8-bit 125 MHz low-power CMOS fully-folding analog-to-digital converter （ADC） A novel mixed-averaging distributed T/H circuit is proposed to improve the accuracy. Folding circuits are not only used in the fine converter but also in the coarse one and in the bit synchronization block to reduce the number of comparators for low power. This ADC is implemented in 0.5μm CMOS technology and occupies a die area of 2 × 1.5 mm^2. The measured differential nonlinearity and integral nonlinearity are 0.6 LSB/-0.8 LSB and 0.9 LSB/-1.2 LSB, respectively. The ADC exhibits 44.3 dB of signal-to-noise plus distortion ratio and 53.5 dB of spurious-free dynamic range for 1 MHz input sine-wave. The power dissipation is 138 mW at a sampling rate of 125 MHz at a 5 V supply.     

1-V电源65nm GP CMOS工艺下一款十位80MS/s 1.6mW逐次逼近型模数转换器

This paper presents a 10-bit 80-MS/s successive approximation register(SAR) analog-to-digital converter (ADC) suitable for integration in a system on a chip(SoC).By using the top-plate-sample switching scheme and a split capacitive array structure,the total capacitance is dramatically reduced which leads to low power and high speed.Since the split structure makes the capacitive array highly sensitive to parasitic capacitance,a three-row layout method is applied to the layout design.To overcome the charge leakage in the nanometer process,a special input stage is proposed in the comparator.As 80 MS/s sampling rate for a 10-bit SAR ADC results in around 1 GHz logic control clock,and a tunable clock generator is implemented.The prototype was fabricated in 65 nm 1P9M (one-poly-nine-metal) GP(general purpose) CMOS technology.Measurement results show a peak signal-to-noise and distortion ratio(SINAD) of 48.3 dB and 1.6 mW total power consumption with a figure of merit(FOM) of 94.8 fJ/conversion-step.     

A 10 bit 200 MS/s pipeline ADC using loading-balanced architecture in 0.18 μm CMOS

A new loading-balanced architecture for high speed and low power consumption pipeline analog-to-digital converter (ADC) is presented in this paper. The proposed ADC uses SHA-less, op-amp and capacitor-sharing technique, capacitor-scaling scheme to reduce the die area and power consumption. A new capacitor-sharing scheme was proposed to cancel the extra reset phase of the feedback capacitors. The non-standard inter-stage gain increases the feedback factor of the first stage and makes it equal to the second stage, by which, the load capacitor of op-amp shared by the first and second stages is balanced. As for the fourth stage, the capacitor and op-amp no longer scale down. From the system''s point of view, all load capacitors of the shared OTAs are balanced by employing a loading-balanced architecture. The die area and power consumption are optimized maximally. The ADC is implemented in a 0.18 μm 1P6M CMOS technology, and occupies a die area of 1.2×1.2 mm². The measurement results show a 55.58 dB signal-to-noise-and-distortion ratio (SNDR) and 62.97 dB spurious-free dynamic range (SFDR) with a 25 MHz input operating at a 200 MS/s sampling rate. The proposed ADC consumes 115 mW at 200 MS/s from a 1.8 V supply.     

一种采用差分时域比较器的12位200KS/s低功耗逐次逼近型模数转换器

A low power 12-bit 200-kS/s SAR ADC is proposed.This features a differential time domain comparator whose offset is cancelled by using a charge pump and a phase frequency detector instead of the preamplifiers usually needed in a high resolution comparator.The proposed ADC is manufactured in 0.18-μm CMOS technology and the measured SNR and SNDR are 62.5 dB and 59.3 dB,respectively,with a power consumption of 72μW at a 200-kS/s sampling rate.The device operates with a 1.8-V power supply and achieves a FOM ...     

A 14-bit 40-MHz analog front end for CCD application

A 14-bit, 40-MHz analog front end (AFE) for CCD scanners is analyzed and designed. The proposed system incorporates a digitally controlled wideband variable gain amplifier (VGA) with nearly 42 dB gain range, a correlated double sampler (CDS) with programmable gain functionality, a 14-bit analog-to-digital converter and a programmable timing core. To achieve the maximum dynamic range, the VGA proposed here can linearly amplify the input signal in a gain range from -1.08 to 41.06 dB in 6.02 dB step with a constant bandwidth. A novel CDS takes image information out of noise, and further amplifies the signal accurately in a gain range from 0 to 18 dB in 0.035 dB step. A 14-bit ADC is adopted to quantify the analog signal with optimization in power and linearity. An internal timing core can provide flexible timing for CCD arrays, CDS and ADC. The proposed AFE was fabricated in SMIC 0.18 μm CMOS process. The whole circuit occupied an active area of 2.8×4.8 mm² and consumed 360 mW. When the frequency of input signal is 6.069 MHz, and the sampling frequency is 40 MHz, the signal to noise and distortion (SNDR) is 70.3 dB, the effective number of bits is 11.39 bit.     

A 14-bit wide temperature range differential SAR ADC with an on-chip multi-segment BGR

A 14-bit low power self-timed differential successive approximation(SAR) ADC with an on-chip multisegment bandgap reference(BGR) is described.An on-chip multi-segment BGR,which has a temperature coefficient of 1.3 ppm/℃and a thermal drift of about 100μV over the temperature range of -40 to 120℃is implemented to provide a high precision reference voltage for the SAR ADC.The Gray code form is utilized instead of binary form mode control to reduce substrate noise and enhance the linearity of the whole system.Self-timed bit-cycling is adopted to enhance the time efficiency.The 14-bit ADC was fabricated in a TSMC 0.13μm CMOS process. With the on-chip BGR,the SAR ADC achieves an SNDR of 81.2 dB(13.2 ENOB) and an SFDR of 85.2 dB with a conversion rate of 2 MS/s at room temperature and can keep an ENOB of more than 12 bits at a conversion rate of 2 MS/s over the temperature range from -40 to 120℃.     

一种应用于RFID的低功耗温度传感器

This paper presents the design and implement of a CMOS smart temperature sensor,which consists of a low power analog front-end and a 12-bit low-power successive approximation register(SAR) analog-to-digital converter(ADC).The analog front-end generates a proportional-to-absolute-temperature(PTAT) voltage with MOSFET circuits operating in the sub-threshold region.A reference voltage is also generated and optimized in order to minimize the temperature error and the 12-bit SAR ADC is used to digitize the PTAT voltage.Using 0.18 m CMOS technology,measurement results show that the temperature error is0.69/C0.85 °C after one-point calibration over a temperature range of40 to 100 °C.Under a conversion speed of 1K samples/s,the power consumption is only 2.02 W while the chip area is 230225 m2,and it is suitable for RFID application.     

应用于生物医疗的0.6-V 8.3-ENOB 异步时序逐次逼近型模数转换器

A microwatt asynchronous successive approximation register （SAR） analog-to-digital converter （ADC） is presented. The supply voltage of the SAR ADC is decreased to 0.6 V to fit the low voltage and low power require- ments of biomedical systems. The tail capacitor of the DAC array is reused for least significant bit conversion to decrease the total DAC capacitance thus reducing the power. Asynchronous control logic avoids the high frequency clock generator and further reduces the power consumption. The prototype ADC is fabricated with a standard 0.18 μm CMOS technology. Experimental results show that it achieves an ENOB of 8.3 bit at a 300-kS/s sampling rate. Very low power consumption of 3.04 μW is achieved, resulting in a figure of merit of 32 fJ/conv.-step.     

Dual-Voltage Single-Rail Dynamic DPA-Resistant Logic Based on Charge Sharing Mechanism

Differential power analysis (DPA) has become a major system security concern.To achieve high levels of security with low power and die area costs,a novel Dual-voltage single-rail dynamic logic (DSDL) design is proposed.The proposed scheme can reduce power dissipation and obtain extremely well-balanced power consumption.The charge sharing mechanism is used for voltage transfer in the internal nodes during the evaluation of the design.Dual power supply voltages are used with positive feedback to speed up the evaluation process.A 4-bit micro Substitution box (SBOX) of the Advanced encryption standard (AES) algorithm has been implemented to verify the security of the proposed logic design.The experimental results proved the security and the efficiency of the proposed DSDL,which can reduce power dissipation by up to 20％ and occupies at most 83％ of the silicon area when compared with previous state-of-the-art countermeasures.     

High-resolution 1 MS/s sub-2 radix split-capacitor SAR ADC

This paper proposes a high-resolution successive-approximation register (SAR) analog-to-digital converter (ADC) with sub-2 radix split-capacitor array architecture. The built-in redundancy of sub-2 radix architecture provides additional information in the digital calibration based on offset double injection. The calibration method is simple in structure and fast in convergence. The correction of errors in each bit is independent of those in the previous bit. A split-capacitor array is used to reduce the total capacitance especially in a high-resolution SAR ADC. An offset signal is injected by the switching scheme of capacitor array to minimize the hardware overhead. The prototype of 0.18 μm CMOS process obtains 14.46 bit ENOB and 95.65 dB SFDR after calibration. With calibration, the INL and DNL are -0.813/0.938 and -0.625/0.688, respectively.     

8位12MS/s带片上参考电压的异步逐次逼近模数转换器

This paper proposes an 8 bit asynchronous successive approximation register ADC for wireless transceivers.A split capacitor DAC is used to reduce power and area consumption and the value of the split capacitor is calculated theoretically to ensure linearity.Asynchronous control logic is proposed to eliminate the high internal clocks and significantly speeds up the successive approximation algorithm.An on-chip reference with a fully integrated buffer and decoupling capacitor is adopted for avoiding an extra pin for the off-chip reference. The prototype,fabricated in UMC 0.18μm CMOS technology,achieves an effective number of bits of 7.64 bits at a sampling frequency of 12 MS/s.The total power consumption is 0.918 mW for a 1.8 V supply,while the onchip reference consumes 53%of the total power.It achieves a figure of merit of 180 fJ/conv-step,excluding the reference’s power consumption.