一种全集成型CMOS LDO线性稳压器设计

设计了一种基于0.25μm CMOS工艺的低功耗片内全集成型LDO线性稳压电路。电路采用由电阻电容反馈网络在LDO输出端引入零点,补偿误差放大器输出极点的方法,避免了为补偿LDO输出极点,而需要大电容或复杂补偿电路的要求。该方法电路结构简单,芯片占用面积小,无需片外电容。Spectre仿真结果表明：工作电压为2.5 V,电路在较宽的频率范围内,电源抑制比约为78 dB,负载电流由1 mA到满载100 mA变化时,相位裕度大于40°,LDO和带隙电压源的总静态电流为390μA。     

0.13μm BiCMOS低压差线性稳压器

设计了一种0.13μm BiCMOS低压差线性稳压器(LDO),包括BiCMOS误差放大器、带软启动的BiCMOS带隙基准源、"套筒式"共源-共栅补偿电路等。为了改善线性瞬态响应性能,在BiCMOS误差放大器的前级设置了动态电流偏置电路。由于所设计的BiCMOS带隙基准源对温度的敏感性较小,故能为LDO提供高精度的基准电压。对所设计的LDO进行了工艺流片。流片测试结果表明,该LDO可提供60 mA的输出电流且最小压差只有100 mV。测试同时验证了所设计LDO的负载和瞬态响应都得到改善:负载调整率为0.054 mV/mA,线性调整率为0.014%,而芯片面积约为0.094 mm2,因此特别适用于高精度、便携式片上电源系统。     

A 50‐mA 1‐nF Low‐Voltage Low‐Dropout Voltage Regulator for SoC Applications

In this paper, we present a low‐voltage low‐dropout voltage regulator (LDO) for a system‐on‐chip (SoC) application which, exploiting the multiplication of the Miller effect through the use of a current amplifier, is frequency compensated up to 1‐nF capacitive load. The topology and the strategy adopted to design the LDO and the related compensation frequency network are described in detail. The LDO works with a supply voltage as low as 1.2 V and provides a maximum load current of 50 mA with a drop‐out voltage of 200 mV: the total integrated compensation capacitance is about 40 pF. Measurement results as well as comparison with other SoC LDOs demonstrate the advantage of the proposed topology.     

一种用于LDO稳压器的共享预稳压电路

提出了一种用于LDO稳压器的共享预稳压电路.该共享预稳压电路中包含一个电源抑制减法电路以提高基准源的电源抑制,应用电流负反馈结构以降低基准源的温度系数和电源抑制随工艺阈值电压变化的敏感度,还可以降低LDO稳压器的输出噪声.仿真结果表明在阈值电压发生士20％变化的情况下,基准源的温度系数变化只有0.11×10-6/℃,电...     

FVF‐Based Low‐Dropout Voltage Regulator with Fast Charging/Discharging Paths for Fast Line and Load Regulation

A new internally compensated low drop‐out voltage regulator based on the cascoded flipped voltage follower is presented in this paper. Adaptive biasing current and fast charging/discharging paths have been added to rapidly charge and discharge the parasitic capacitance of the pass transistor gate, thus improving the transient response. The proposed regulator was designed with standard 65‐nm CMOS technology. Measurements show load and line regulations of 433.80 μV/mA and 5.61 mV/V, respectively. Furthermore, the output voltage spikes are kept under 76 mV for 0.1 mA to 100 mA load variations and 0.9 V to 1.2 V line variations with rise and fall times of 1 μs. The total current consumption is 17.88 μA (for a 0.9 V supply voltage).     

A 3 A sink/source current fast transient response low-dropout Gm driven linear regulator

A 3 A sink/source G_m-driven CMOS low-dropout regulator(LDO),specially designed for low input voltage and low cost,is presented by utilizing the structure of a current mirror G_m(transconductance)driving technique,which provides high stability as well as a fast load transient response.The proposed LDO was fabricated by a 0.5μm standard CMOS process,and the die size is as small as 1.0 mm~2.The proposed LDO dissipates 220μA of quiescent current in no-load conditions and is able to deliver up to 3 A of load current.The measured results show that the output voltage can be resumed within 2μs with a less than 1mV overshoot and undershoot in the output current step from-1.8 to 1.8 A with a 0.1μs rising and falling time at three 10μF ceramic capacitors.     

An ultra-low power output capacitor-less low-dropout regulator with slew-rate-enhanced circuit

An ultra-low power output-capacitorless low-dropout (LDO) regulator with a slew-rate-enhanced (SRE)circuit is introduced.The increased slew rate is achieved by sensing the transient output voltage of the LDO and then charging (or discharging) the gate capacitor quickly.In addition,a buffer with ultra-low output impedance is presented to improve line and load regulations.This design is fabricated by SMIC 0.18 μm CMOS technology.Experimental results show that,the proposed LDO regulator only consumes an ultra-low quiescent current of 1.2 μA.The output current range is from 10 μA to 200 mA and the corresponding variation of output voltage is less than 40 mV.Moreover,the measured line regulation and load regulation are 15.38 mV/V and 0.4 mV/mA respectively.     

Full on-chip and area-efficient CMOS LDO with zero to maximum load stability using adaptive frequency compensation

A full on-chip and area-efficient low-dropout linear regulator (LDO) is presented. By using the proposed adaptive frequency compensation (AFC) technique, full on-chip integration is achieved without compromising the LDO's stability in the full output current range. Meanwhile, the use of a compact pass transistor (the compact pass transistor serves as the gain fast roll-off output stage in the AFC technique) has enabled the LDO to be very area-efficient. The proposed LDO is implemented in standard 0.35 μm CMOS technology and occupies an active area as small as 220×320 μm~2, which is a reduction to 58% compared to state-of-the-art designs using technologies with the same feature size. Measurement results show that the LDO can deliver 0-60 mA output current with 54 μA quiescent current consumption and the regulated output voltage is 1.8 V with an input voltage range from 2 to 3.3 V.     

用于低压差线性稳压器的输出精密微调设计技术

提出了一种用于低压差线性稳压器(LDO:Low-Dropout regulator)的输出精密微调方法,通过在反馈网络中引入可微调电阻梯实现对LDO输出的精密调整,并采取伪电阻保护的版图布局方式提高电阻梯的匹配性能。基于65 nm CMOS工艺对LDO进行了设计,整个LDO线性调整率约为0.05mV/V,输出电压在1.02V~1.36V范围内能够按照0.02V/step的最小步长进行精密微调,能有效减小由电源电压、温度等因素引起的输出误差,适合嵌入式片上系统(So C:System-on-Chip)的应用。     

A fully on-chip fast-transient NMOS low dropout voltage regulator with quasi floating gate pass element

This paper presents a fully on-chip NMOS low-dropout regulator (LDO) for portable applications with quasi floating gate pass element and fast transient response. The quasi floating gate structure makes the gate of the NMOS transistor only periodically charged or refreshed by the charge pump, which allows the charge pump to be a small economical circuit with small silicon area. In addition, a variable reference circuit is introduced enlarging the dynamic range of error amplifier during load transient. The proposed LDO has been implemented in a 0.35 μm BCD process. From experimental results, the regulator can operate with a minimum dropout voltage of 250 mV at a maximum 1 A load and I_Q of 395 μA. Under full-range load current step, the voltage undershoot and overshoot of the proposed LDO are reduced to 50 and 26 mV, respectively.     

一种快速瞬态响应的无片外电容LDO的设计

基于上华0.5μm工艺,设计了输入电压范围为3.5～6.5V,输出电压为3.3V,最大输出电流为100mA的CMOS无片外电容的低压差线性稳压器.提出了一种自动检测网络用来快速感应负载电流的变化,抑制输出电压的跳变,改善了负载瞬态响应.在稳定性方面,采用miller补偿,加之第二级采用了输出电阻很小的buffer结构[1],这样主极点和次极点分离很远使得系统稳定.仿真表明,该LDO在VIN=6.5V和VIN=3.5V下under-shoot分别为156mV和135mV,overshoot分别为145mV和60mV,线性调整率和负载调整率分别为0.023%和0.5%.     

一种动态补偿、高稳定性的LDO设计

设计并实现了一种动态补偿、高稳定性的LDO.针对LDO控制环路稳定性随负载电流变化的特点,给出一种新颖的动态补偿电路.这种补偿电路能很好地跟踪负载电流的变化,从而使控制环路的稳定性几乎与负载电流无关.设计采用CSMC 0.5μm标准CMOS工艺,利用Cadence的EDA工具完成电路设计、版图绘制和流片测试,最终芯片面...     

用于GaN HEMT栅驱动芯片的快速响应LDO电路

设计了一种用于GaN高电子迁移率晶体管(High-Electron-Mobility Transistor,HEMT)器件栅驱动芯片的快速响应低压差线性稳压器(Low Dropout Regulator,LDO)电路,可为高速变化的数字电路提供快速响应的供电电压。该电路采用动态偏置结构,通过在大负载发生时给误差放大器增加一个额外的动态偏置结构,来加快输出端的瞬态响应速度。基于0.18μm BCD工艺,完成了电路设计验证。仿真结果显示LDO瞬态响应时间小于0.5μs,可满足频率达1 MHz的GaN HEMT器件栅驱动芯片应用要求。     

A robust low quiescent current power receiver for inductive power transmission in bio implants

In this paper, a robust low quiescent current complementary metal-oxide semiconductor (CMOS) power receiver for wireless power transmission is presented. This power receiver consists of three main parts including rectifier, switch capacitor DC–DC converter and low-dropout regulator (LDO) without output capacitor. The switch capacitor DC–DC converter has variable conversion ratios and synchronous controller that lets the DC–DC converter to switch among five different conversion ratios to prevent output voltage drop and LDO regulator efficiency reduction. For all ranges of output current (0–10 mA), the voltage regulator is compensated and is stable. Voltage regulator stabilisation does not need the off-chip capacitor. In addition, a novel adaptive biasing frequency compensation method for low dropout voltage regulator is proposed in this paper. This method provides essential minimum current for compensation and reduces the quiescent current more effectively. The power receiver was designed in a 180-nm industrial CMOS technology, and the voltage range of the input is from 0.8 to 2 V, while the voltage range of the output is from 1.2 to 1.75 V, with a maximum load current of 10 mA, the unregulated efficiency of 79.2%, and the regulated efficiency of 64.4%.     

A fully on-chip area-efficient CMOS low-dropout regulator with fast load regulation

Fully integrated voltage regulators with fast transient response and small area overhead are in high demand for on-chip power management in modern SoCs. A fully on-chip low-dropout regulator (LDO) comprised of multiple feedback loops to tackle fast load transients is proposed, designed and simulated in 90?nm CMOS technology. The LDO also adopts an active frequency compensation scheme that only needs a small amount of compensation capacitors to ensure stability. Simulation results show that, by the synergy of those loops, the LDO improves load regulation accuracy to 3???V/mA with a 1.2?V input and 1?V output. For a 100?mA load current step with the rise/fall time of 100?ps, the LDO achieves maximum output voltage drop and overshoot of less than 95?mV when loaded by a 600?pF decoupling capacitor and consumes an average bias current of 408???A. The LDO also features a magnitude notch in both its PSRR and output impedance that provides better suppression upon the spectral components of the supply ripple and the load variation around the notch frequency. Monte Carlo simulations are performed to show that the LDO is robust to process and temperature variations as well as device mismatches. The total area of the LDO excluding the decoupling capacitor is about 0.005?mm². Performance comparisons with existing solutions indicate significant improvements the proposed LDO achieves.     

一种快速响应低压差线性稳压器的设计

介绍了一种应用于DRAM芯片内部供电的新型低压差线性稳压器(LDO)。在传统LDO电路PMOS输出驱动管的栅端增加了一个开关电容电路,根据负载电流使能信号控制耦合电容的接入,使驱动管的栅端耦合到一个正向或者负向的电压脉冲,在负载电流急剧变化时能快速调整过驱动电压,以适应负载电流的变化。仿真结果显示,该电路有利于输出电压的快速稳定,恢复时间缩短了38%以上。采用45 nm DRAM 掩埋字线工艺进行流片。实测结果显示,该LDO输出电压恢复时间在10 ns以内。在DDR3-1600的数据传输速度下,DRAM芯片的数据输出眼图为280 ps,符合JEDEC标准。     

一种超低静态电流LDO线性稳压器的设计

为了延长便携式、可穿戴医疗设备的待机时间,设计了一种具有超低静态电流的低压差(LDO)线性稳压器。采用误差放大器与基准电路相结合的结构,在降低静态电流的同时减小芯片面积;其次,利用负载检测模块,降低了空载及轻载时过温保护和过流保护等模块的静态电流。采用自适应偏置电流技术来动态调整稳压环路各支路的工作电流以及零点频率补偿方式,解决了静态功耗与瞬态响应和环路带宽间的矛盾。该LDO线性稳压器采用0.35μm CMOS工艺进行流片加工,测试结果表明,该LDO线性稳压器静态电流为700 nA,最大负载电流为150 mA,轻载与满载跳变时上过冲电压为63 mV,下过冲电压为55 mV。     

低压差双电容补偿高瞬态响应线性稳压器设计

为适应现代电子产品对电源性能的较高要求,基于教学中应用的Spectre平台,采用源随器补偿方法设计了一种无片外电容的LDO稳压器。小补偿电容和大驱动能力的两级运放误差放大器,加快了电路的响应速度,提高了瞬态响应性能,并降低了输出电压波纹,从而增强了系统的稳定性。测试结果表明,电路的静态电流为30μA,工作输出电压为1.2 V,最大输出电流为100 mA,Vdrop为200 mV,相位裕度大于60°,在相应条件下的线性调整率SL、负载调整率So分别为0.05%(V/V),0.23%(V/A)。源随器补偿方法既可保证电路稳定工作,又能有效降低输出波纹和加快瞬态响应速度,已达到系统预期设计指标。     

一种低静态电流、高稳定性的LDO线性稳压器

该文提出了一种低静态电流、高稳定性低压差(LDO)线性稳压器。LDO中的电流偏置电路产生30nA的低温度漂移偏置电流,可使LDO的静态工作电流降低到4A。另外,通过设计一种新型的动态Miller频率补偿结构使得电路的稳定性与输出电流无关,达到了高稳定性的设计要求。芯片设计基于CSMC公司的0.5m CMOS混合信号模型,并通过了流片验证。测试结果表明,该稳压器的线性调整和负载调整的典型值分别为2mV和14mV;输出的最大电流为300mA;其输出压差在150mA输出电流,3.3V输出电压下为170mV;输出噪声在频率从22Hz到80kHz间为150VRMS。     

一种高稳定性高精度低压差线性稳压器的分析与设计

提出了LDO,其基于缓慢滚降式频率补偿方法,通过在电路中引入三个极零对(极零对的产生没有增加静态功耗),不仅克服了常规LDO不能使用低等效串联电阻、低成本陶瓷输出电容的缺点,而且确保了系统在整个负载和输入电压变化范围内稳定工作.由于LDO通常给高性能模拟电路供电,因此其输出电压精度至关重要;而该补偿方法能满足高环路增益、高单位增益带宽的设计要求,从而大幅提高LDO的精度.该LDO基于0.5μm CMOS工艺实现.后仿结果表明,即使在低压满负载条件下,其开环DC增益仍高于70dB,满载时单位增益带宽可达3MHz,线性调整率和负载调整率分别为27μV/V和3.78μV/mA,过冲和欠冲电压均小于30mV,负载电流为150mA时的漏失电压(dropout电压)仅为120mV.