Etching processes of transparent carbon nanotube thin films using laser technologies

Carbon nanotubes (CNTs) have potential as a transparent conductive material with good mechanical and electrical properties. However, carbon nanotube thin film deposition and etching processes are very difficult to pattern the electrode. In this study, transparent CNT film with a binder is coated on a PET flexible substrate. The transmittance and sheet resistance of carbon nanotube film are 84% and 1000 Ω/□, respectively. The etching process of carbon nanotube film on flexible substrates was investigated using 355 nm and 1064 nm laser sources. Experimental results show that carbon nanotube film can be ablated using laser technology. With the 355 nm UV laser, the minimum etched line width was 20 μm with a low amount of recast material of the ablated sections. The optimal conditions of laser ablation were determined for carbon nanotube film.     

Characteristics of highly orientated BiFeO3 thin films on a LaNiO3-coated Si substrate by RF sputtering

BiFeO₃ (BFO) films were grown on LaNiO₃-coated Si substrate by a RF magnetron sputtering system at temperatures in the range of 300-700 °C. X-ray reflectivity and high-resolution diffraction measurements were employed to characterize the microstructure of these films. For a substrate temperature below 300 °C and at 700 °C only partially crystalline films and completely randomly polycrystalline films were grown, whereas highly (001)-orientated BFO film was obtained for a substrate temperature in the range of 400-600 °C. The crystalline quality of BFO thin films increase as the deposition temperature increase except for the film deposited at 700 °C. The fitted result from X-ray reflectivity curves show that the densities of the BFO films are slightly less than their bulk values. For the BFO films deposited at 300-600 °C, the higher the deposition temperature, the larger the remnant polarization and surface roughness of the films present.     

Highly conducting and transparent tin-doped CdO thin films for optoelectronic applications

Highly conducting and transparent thin films of tin-doped cadmium oxide were deposited on quartz substrate using pulsed laser deposition technique. The effect of growth temperature on structural, optical and electrical properties was studied. These films are highly transparent (78-89%) in visible region, and transmittance of the films depends on growth temperature. It is observed that resistivity increases with growth temperature after attaining minimum at 150 °C, while carrier concentration continuously decreases with temperature. The lowest resistivity of 1.96 × 10^− 5 Ω cm and carrier concentration of 5.52 × 10²¹ cm³ is observed for the film grown at 150 °C. These highly conducting and transparent tin-doped CdO thin films grown via pulsed laser deposition could be an excellent candidate for future optoelectronic applications.     

Uniformity of gallium doped zinc oxide thin film prepared by pulsed laser deposition

Recently, transparent conducting oxide thin films have attracted attention for the application to transparent conducting electrodes. In this work, we evaluated the uniformity of electrical, optical and structural properties for gallium doped zinc oxide thin films prepared on the 10 × 10 cm² silica glass substrate by pulsed laser deposition. The resistivity, carrier concentration, mobility, bonding state and atomic composition of the film were uniform along in-plane and depth direction over the 10 × 10 cm² area of the substrate. The film showed the average transmittance of 81-87%, resistivity of 1.4 × 10^− 3 Ω cm, carrier concentration of 9.7 × 10²⁰/cm³ and mobility of 5 cm²/Vs in spite of the amorphous X-ray diffraction pattern. The gradual thickness distribution was found, however, the potential for large-area and low temperature deposition of transparent conducting oxide thin film using pulsed laser deposition method was confirmed.     

Transparent indium zinc oxide thin films used in photovoltaic cells based on polymer blends

Indium zinc oxide (IZO) thin films were obtained using pulsed laser deposition. The samples were prepared by ablation of targets with In concentrations, In/(In + Zn), of 80 at.%, at low substrate temperatures under reactive atmosphere. IZO films were used as transparent electrodes in polymer-based - poly(3-hexylthiophene) and 1-(3-methoxycarbonyl)-propyl-1-phenyl-(6,6)C61 1:1 blend - photovoltaic cells. The action spectra measurements revealed that IZO-based photovoltaic structures have performances comparable with those using indium-tin-oxide as transparent electrode.     

Highly oriented metallic SmS films on Si(100) grown by pulsed laser deposition

Stoichiometric and highly oriented in (100) direction SmS films in the metallic phase have been grown on Si(100) substrate at room temperature by pulsed laser deposition (PLD) as revealed from lattice parameter, reflectivity and electrical resistivity measurements. Above-critical compressive stress P = 0.9 GPa in as grown film was determined from sample curvature measurements and attributed to stress building up in PLD process further accompanied by stress due to SmS versus Si lattice parameter mismatch. Stress relaxation and subsequent metal-to-semiconductor phase transition occurred following annealing at T = 900 K as evident from consistent changes of SmS/Si sample curvature, structural, optical and electrical properties.     

Highly conductive, transparent flexible films based on open rings of multi-walled carbon nanotubes

Open rings of multi-walled carbon nanotubes were stacked to form porous networks on a poly(ethylene terephthalate) substrate to form a flexible conducting film (MWCNT-PET) with good electrical conductivity and transparency by a combination of ultrasonic atomization and spin-coating technique. To enhance the electric flexibility, we spin-coated a cast film of poly(vinyl alcohol) onto the MWCNT-PET substrate, which then underwent a thermo-compression process. Field-emission scanning electron microscopy of the cross-sectional morphology illustrates that the film has a robust network with a thickness of ~ 175 nm, and it remarkably exhibits a sheet resistance of approximately 370 Ω/sq with ~ 77% transmittance at 550 nm even after 500 bending cycles. This electrical conductivity is much superior to that of other MWCNT-based transparent flexible films.     

Preparation of fluorine-doped tin oxide (SnO2:F) film on polyethylene terephthalate (PET) substrate

Fluorine-doped tin oxide (FTO), one of the most popular transparent conductive oxide (TCO) materials, coated on glass has been used in various applications including many new-generation solar cells. However, there is a lack of reporting when it comes to FTO coated on flexible transparent substrate. For this paper, spray pyrolysis technique was used to have FTO firstly coated on to a brass substrate, which was then dissolved away after cementing an upper flexible transparent polyethylene terephthalate (PET) substrate, finally leaving high quality FTO film on PET substrate. Their structural, electrical, optical and flexible properties were investigated. The lowest resistivity was 7.6 × 10^− 4 Ω cm, which is as good as conventional FTO deposited on glass. Their fold ability could be significantly improved to transcend commercial ITO/PET only by increasing the pretreating time of the brass substrate.     

High-quality parallel patterning of carbon nanotube thin films by a pulsed laser beam

Single-walled carbon nanotube thin films solution-deposited on the glass substrate were directly patterned by a spatially-modulated pulsed laser beam (wavelength = 355 nm, pulse width = 5 ns) incident from the backside of the substrate. This method utilizes a ultrashort pulse-induced strong thermo-elastic force exerting on the film which plays a role to detach it from the substrate. The threshold energy density required for patterning was as low as 90 mJ/cm², making it possible to pattern over a few square centimeters by a single pulse with maximum energy of 180 mJ. The irradiated regions of the film were clearly photoetched without leaving any residual nanotubes. High-fidelity patterns could be fabricated with a feature size of 35 μm.     

Pulsed laser ablated off-stoichiometric thin films of the Heusler alloy Co2TiSn on Si (100) substrate

We report the growth of thin films of ferromagnetic Heusler alloy Co₂TiSn on Si (100) substrate using KrF excimer pulsed laser ablation. Films of thicknesses ranging from 8 to 220 nm were deposited on Si (100) substrate heated up to 200 ± 10 °C, with an aim to study the structural, morphological and magnetic properties. The grown films are off-stoichiometric, polycrystalline, having single-phase with high degree of (220) texturing. Angle dependent fluorescence measurements suggest no segregation of alloying elements as a function of depth. X-ray reflectivity measurements indicate that all the films are having low density layer at the top as well as at the film-substrate interface. Magneto optical Kerr effect measurements at room temperature reveal clear hysteresis loops suggesting ferromagnetic behavior of the films. Thermal annealing at temperature ≥ 220 °C suggest transformation of Co₂TiSn phase into cobalt silicide phase, which confirms the necessity of low substrate temperature (< 220 °C) to produce such single-phase Co₂TiSn films.     

Effect of inserting a buffer layer on the characteristics of transparent conducting impurity-doped ZnO thin films prepared by dc magnetron sputtering

In transparent conducting impurity-doped ZnO thin films prepared on glass substrates by a dc magnetron sputtering (dc-MS) deposition, the obtainable lowest resistivity and the spatial resistivity distribution on the substrate surface were improved by a newly developed MS deposition method. The decrease of obtainable lowest resistivity as well as the improvement of spatial resistivity distribution on the substrate surface in Al- or Ga-doped ZnO (AZO or GZO) thin films were successfully achieved by inserting a very thin buffer layer, prepared using the same MS apparatus with the same target, between the thin film and the glass substrate. The deposition of the buffer layer required a more strongly oxidized target surface than possible to attain during a conventional dc-MS deposition. The optimal thickness of the buffer layer was found to be about 10 nm for both GZO and AZO thin films. The resistivity decrease is mainly attributed to an increase of Hall mobility rather than carrier concentration, resulting from an improvement of crystallinity coming from insertion of the buffer layer. Resistivities of 3 × 10^− 4 and 4 × 10^− 4Ω cm were obtained in 100 nm-thick-GZO and AZO thin films, respectively, incorporating a 10 nm-thick-buffer layer prepared at a substrate temperature around 200 °C.     

Analysis of thermal effect on transparent conductive oxide thin films ablated by UV laser

Transparent conductive oxide thin films are applied to many computer, communication and consumer electronics products including thin film transistor liquid crystal displays, organic light emitting diodes, solar cells, mobile phones, and digital cameras. The laser direct write patterning of the indium tin oxide (ITO) thin film processing technique produces a heat affected zone that has an enormous effect on the electro-optical efficiency of transparent conductive oxide films. This is because direct laser writing patterning in thermal machining process can create debris and micro-cracks in the substrate. Therefore, this study establishes the ultraviolet (UV) laser ablation of temperature model on the polycarbonate and soda-lime glass substrates using the finite element analysis software ANSYS, and measures the temperature field based on the laser micro-patterning process. The meshing model determines the structure of the pre-processors and parameters were set with ANSYS parameter design language. This study also simulates the Gaussian distribution laser irradiation on the pre-processor structure. A UV laser processing system made micro-patterning on ITO thin films to analyze which conditions damaged the substrates. Comparing the simulation and experiment results reveals the minimum laser ablation threshold of the ITO thin films with the melting and vaporization temperatures. Simulation results show that the temperature distribution on PC and soda-lime glass substrates after laser irradiation of 1.05 μs with a laser output power of 0.07 W produces temperatures of approximately 52 °C, 54 °C and 345°Cand 205 °C at the laser output power of 0.46 W. The experiment results show that the patterning region is similar to the simulation results, and the lower laser power does not damage the substrates.     

Pulsed laser deposited ZnO:In as transparent conducting oxide

Zinc oxide (ZnO) and indium doped ZnO (IZO) thin films with different indium compositions were grown by pulsed laser deposition technique on corning glass substrate. The effect of indium concentration on the structural, morphological, optical and electrical properties of the film was studied. The films were oriented along c-direction with wurtzite structure and highly transparent with an average transmittance of more than 80% in the visible wavelength region. The energy band gap was found to decrease with increasing indium concentration. High transparency makes the films useful as optical windows while the high band gap values support the idea that the film could be a good candidate for optoelectronic devices. The value of resistivity observed to decrease initially with doping concentration and subsequently increases. IZO with 1% of indium showed the lowest resistivity of 2.41 × 10⁻² Ω cm and large transmittance in the visible wavelength region. Especially 1% IZO thin film was observed to be a suitable transparent conducting oxide material to potentially replace indium tin oxide.     

Thermally stable, highly conductive, and transparent Ga-doped ZnO thin films

Highly conductive and transparent films of Ga-doped ZnO (GZO) have been prepared by pulsed laser deposition using a ZnO target with Ga₂O₃ dopant of 3 wt.% in content added. Films with resistivity as low as 3.3 × 10^− 4 Ω cm and transmittance above 80% at the wavelength between 400 and 800 nm can be produced on glass substrate at room temperature. It is shown that a stable resistivity for use in oxidation ambient at high temperature can be attained for the films. The electrical and optical properties, as well as the thermal stability of resistivity, of GZO films were comparable to those of undoped ZnO films.     

ZnO thin films prepared by pulsed laser deposition

Zinc oxide (ZnO) thin films were deposited on soda lime glass substrates by pulsed laser deposition (PLD) in an oxygen-reactive atmosphere. The structural, optical, and electrical properties of the as-prepared thin films were studied in dependence of substrate temperature and oxygen pressure. High quality polycrystalline ZnO films with hexagonal wurtzite structure were deposited at substrate temperatures of 100 and 300 °C. The RMS roughness of the deposited oxide films was found to be in the range 2-9 nm and was only slightly dependent on substrate temperature and oxygen pressure. Electrical measurements indicated a decrease of film resistivity with the increase of substrate temperature and the decrease of oxygen pressure. The ZnO films exhibited high transmittance of 90% and their energy band gap and thickness were in the range 3.26-3.30 eV and 256-627 nm, respectively.     

Properties of pulsed laser deposited fluorinated hydroxyapatite films on titanium

Fluorinated hydroxyapatite coated titanium was investigated for application as implant coating for bone substitute materials in orthopaedics and dentistry. Pulsed laser deposition technique was used for films preparation. Fluorinated hydroxyapatite target composition, Ca₁₀(PO₄)₆F_1.37(OH)_0.63, was maintained at 2 J/cm² of laser fluence and 500-600 °C of the substrate temperature. Prepared films had a compact microstructure, composed of spherical micrometric-size aggregates. The average surface roughness resulted to be of 3 nm for the film grown at 500 °C and of 10 nm for that grown at 600 °C, showing that the temperature increase did not favour the growth of a more fine granulated surface. The films were polycrystalline with no preferential growth orientation. The films grown at 500-600 °C were about 8 μm thick and possessed a hardness of 12-13 GPa. Lower or higher substrate temperature provides the possibility to obtain coatings with different fine texture and roughness, thus tayloring them for various applications.     

Influence of substrate temperature and bias voltage on the optical transmittance of TiN films

Titanium nitride (TiN) thin films were prepared by means of reactive DC sputtering on quartz and sapphire substrates. Structural, electrical and optical effects of deposition parameters such as thickness, substrate temperature, substrate bias voltage were studied. The effect of substrate temperature variations in the 100-300°C range and substrate bias voltage variations in the 0-200 V DC range for 45-180 nm thick TiN films were investigated. Temperature-dependent electrical resistivity in the 100-350 K range and optical transmission in the 300-1500 nm range were measured for the samples. In addition, structural and morphological properties were studied by means of XRD and STM techniques.The smoothest surface and the lowest electrical resistivity was recorded for the optimal samples that were biased at about V_s=−120 V DC. Unbiased films exhibited a narrow optical transmission window between 300 and 600 nm. However, the transmission became much greater with increasing bias voltage for the same substrate temperature. Furthermore, it was found that lower substrate temperatures produced optically more transparent films.Application of single layers of MgF₂ antireflecting coating on optimally prepared TiN films helped increase the optical transmission in the visible region to more than 40% for 45 nm thick samples.     

ZnO nanowire growth by electric current heating method: A study on the effect of substrate temperature

In this study, we report the growth of ZnO nanowire on quartz glass substrates with Au-catalyst assistance by electric current heating of ZnO ceramic bar. The effect of substrate temperature on the properties of ZnO nanostructures has been investigated systematically. Structural analysis indicates that the grown ZnO crystals belong to hexagonal phase with preferential growth along (0 0 2) orientation. Scanning electron microscopic studies reveal the aligned ZnO nanowires were grown at 800 °C. The typical length and diameter of nanowires are in the uniform ranges of 4–20 μm and 20–100 nm, respectively, showing their high aspect ratio of about 1000. We have made an attempt to discuss about the change in ZnO nanostructures with different substrate temperatures and the possible mechanism for the growth of nanowires. Optical reflectance studies show the infrared reflectivity was controlled through the substrate temperature.     

Solid phase epitaxy of silicon thin films by diode laser irradiation for photovoltaic applications

High temperature solid phase epitaxial crystallization of amorphous silicon layers prepared by electron beam evaporation is investigated. By using a continuous wave diode laser for heating the films rapidly (in milliseconds to seconds) this method is suitable on glass substrates with low temperature resistance. Therefore, the method is an economically advantageous technique of producing absorber layers for thin film solar cells. For the experiments 500 nm of amorphous silicon was deposited on two different configurations of substrates. In the first one monocrystalline wafers of three different crystallographic orientations were used. In the second one a polycrystalline seed layer prepared on borosilicate glass served as substrate. The crystallization process was monitored in situ by time resolved reflectivity measurements. Depending on the crystal orientation 2 s to 3 s was needed for complete solid phase epitaxial crystallization of the amorphous films. The evolution of temperature during crystallization was simulated numerically.     

Nanoporous cluster-assembled WOx films prepared by radio-frequency assisted laser ablation

The influence of substrate temperature and ambient gas pressure-composition on the characteristics of WO_x films synthesized by radio-frequency assisted pulsed laser deposition (RF-PLD) are studied with the aim to obtain nanostructured films with large surface area that appear promising for gas sensing applications. A tungsten target was ablated both in chemically reactive molecular oxygen at 5 Pa and in a mixed oxygen-helium atmosphere at 700 Pa. Corning glass was used as the substrate, at 473, 673 and 873 K. Other deposition parameters such as laser fluence (4.5 J/cm²), laser wavelength (355 nm), radio-frequency power (150 W), and target to substrate distance (4 cm) were kept fixed. The sensitivity on the deposition parameters of roughness, morphology, nanostructure and bond coordination of the deposited films were analysed by atomic force microscopy, scanning electron microscopy, transmission electron microscopy and micro-Raman spectroscopy. The role of the investigated process parameters to nanoparticle formation and to the development of an extended nanostructure is discussed.