Intermittent Operation Control Scheme for Reducing Power Consumption of UWB-IR Receiver

A low power ultra-wideband impulse radio (UWB-IR) receiver was developed in 0.18-mum CMOS. All circuits of the receiver AFE operate intermittently with a sampling clock of an analog-digital converter (ADC). The sampling rate of the ADC is equal to the pulse repetition frequency of the received signals. Power consumption of the receiver AFE is reduced by 60% using a developed intermittent operation scheme without degrading of receiver sensitivity. As a result, the power consumption of the receiver AFE is 38 mW. The receiver has a data rate of 258 kb/s over a distance of 52 m and of 10.7 Mb/s over a distance of 14 m.     

A Time-Based Bandpass ADC Using Time-Interleaved Voltage-Controlled Oscillators

In this paper, a bandpass analog-to-digital converter (ADC) based on time-interleaved oversampled ADC is introduced. Unlike previous delta–sigma bandpass ADCs that require accurate digital-to-analog converters and high-speed analog circuits, the proposed architecture provides bandpass function by time-interleaving first-order voltage-controlled-oscillator (VCO)-based ADCs. The use of VCO-based ADC has the advantage that its resolution is determined by the time resolution rather than the voltage resolution, thus making it attractive for future low-voltage CMOS processes. The performance of the proposed ADC is theoretically analyzed and simulated in ideal condition, as well as in nonideal condition, in the presence of nonlinearity, sampling clock jitter, and mismatch.      

8位CMOS双通道流水线ADC仿真设计

设计了一种8位1.2V,1GS/s双通道流水线A/D转换器(ADC)。所设计ADC对1.5位增益D/A转换电路(MDAC)中的流水线双通道结构进行改进,其中设置有双通道流水线时分复用运算放大器和双/单通道快闪式ADC,以简化结构并提高速度;在系统前置采样/保持器中加设由单一时间信号驱动的开关线性化控制(SLC)电路,以解决两条通道之间的采样歪扭和时序失调问题。用90nm标准CMOS工艺对所设计的流水线ADC进行仿真试验,结果表明,室温下所设计ADC的信噪比SNR为32.7dB,无杂散动态范围SFDR为42.3dB,它的分辨率、功耗PD和采样速率SR分别为8位、23mW和1GS/s,从而满足了高速、高精度和低功耗的应用需要。     

A reconfigurable two-stage cyclic ADC for low-power applications in 3.3 V 0.35 µm CMOS

This article presents a reconfigurable pipeline analog-to-digital converter (ADC) using a two-stage cyclic configuration. The ADC consists of two stages with 1.5 effective bit resolution, two reference circuits for voltage and current biasing, and a clock generator and timing circuit. Throughout the development of this ADC, several techniques were combined for reducing the power consumption as well as for preserving the converter linearity. To reduce the power consumption, the circuit has a single operational trans-conductance amplifier shared by both pipeline stages. To keep conversion linearity, circuits such as the bootstrapped complementary metal-oxide semiconductor (CMOS) transmission gates and a robust comparator topology were implemented. The circuit can be configured to perform conversion between 7 and 15 bit resolutions, and it works with the master clock frequency in the range of 1 kHz to 40 MHz. The circuit has been prototyped in a 3.3 V 0.35 µm CMOS process and consumes 14.1 mW at 40 MHz and 8 MSample/s sampling rate. With this resolution and sampling rate, it achieves 60.1 dB SNR, 56.57 dB SINAD and 9.1 bit ENOB at 0.666 MHz input frequency and 53.6 dB SNR, 52.4 dB SINAD and 8.6 bit ENOB at 3.85 MHz input frequency. The technological FOM obtained was 13.2 A s/m².     

Algorithmic ADC operating with a single reference voltage for PLL-based chemical sensing applications

This paper deals with the design of an algorithmic switched-capacitor analog-to-digital converter (ADC), operating with a single reference voltage, a single-ended amplifier, a single-ended comparator, and presenting a small input capacitance. The ADC requires two clock phases per conversion bit and N clock cycles to resolve the N-bits. The ADC achieves a measured peak signal-to-noise-ratio (SNR) of 49.9 dB and a peak signal-to-noise-and-distortion-ratio (SNDR) of 46.7 dB at P_in = ?6dBFS with a sampling rate of 0.25 MS/s. The measured differential-non-linearity and integral-non-linearity are within +0.6/?0.5 and +0.2/?0.5 LSB, respectively. The ADC power consumption is 300 μW and it is implemented in 90 nm CMOS technology with a single power supply of 1.2 V. The ADC saves power at system-level by requiring only a single reference voltage. At system level, this solution is therefore not only robust but competitive as well.     

A 0.5-V 8-bit 10-Ms/s Pipelined ADC in 90-nm CMOS

This paper presents a pipelined analog-to-digital converter (ADC) operating from a 0.5-V supply voltage. The ADC uses true low-voltage design techniques that do not require any on-chip supply or clock voltage boosting. The switch OFF leakage in the sampling circuit is suppressed using a cascaded sampling technique. A front-end signal-path sample-and-hold amplifier (SHA) is avoided by using a coarse auxiliary sample and hold (S/H) for the sub-ADC and by synchronizing the sub-ADC and pipeline-stage sampling circuit. A 0.5-V operational transconductance amplifier (OTA) is presented that provides inter-stage amplification with an 8-bit performance for the pipelined ADC operating at 10 Ms/s. The chip was fabricated on a standard 90 nm CMOS technology and measures 1.2 mm times 1.2 mm. The prototype chip has eight identical stages and stage scaling was not used. It consumes 2.4 mW for 10-Ms/s operation. Measured peak SNDR is 48.1 dB and peak SFDR is 57.2 dB for a full-scale sinusoidal input. Maximal integral nonlinearity and differential nonlinearity are 1.19 and 0.55 LSB, respectively.     

A high speed GaAs error-detection circuit for fiber-optictransmission systems

A high-speed GaAs IC for detection of line code vibrations is described. This 144-gate error-detection circuit for monitoring a high-bit-rate fiber-optic link has been designed and fabricated using a high-yield titanium tungsten nitride self-aligned gate MESFET process. This process routinely provides a wafer-averaged gate delay (fan-in=fan-out=2) of less than 70 ps with a power dissipation of 0.5 mW/gate. The error-detection circuits were tested on-wafer using high-frequency probe cards at a clock rate of 1.4 GHz, with a yield of 64%. Packaged circuits worked at a clock frequency of over 2.5 GHz and consumed 200-mW power at a fixed power supply voltage of 1.5 V. The circuits operate over a wide variation in power supply voltage and temperature. When operated at a package temperature of 125°C, the circuits show less than a 12% degradation in their maximum clock frequency. The circuit was inserted into a 565-Mb/s system currently using a silicon ECL part, and full functionality was verified with no necessary modifications     

A 100-MS/s 8-b CMOS subranging ADC with sustained parametricperformance from 3.8 V down to 2.2 V

A 100-MS/s 8-b CMOS analog-to-digital converter (ADC) designed for very low supply voltage and power dissipation is presented. This single-ended-input ADC is based on the unified two-step subranging architecture, which processes the coarse and fine decisions in identical signal paths to maximize their matching. However, to minimize power and area, the coarse-to-fine overlap correction has been aggressively reduced to only one LSB. The ADC incorporates five established design techniques to maximize performance: bottom-plate sampling, distributed sampling, autozeroing, interpolation, and interleaving. Very low voltage operation required for a general purpose ADC was obtained with four additional and new circuit techniques. These are a dual-gain first-stage amplifier, differential T-gate boosting, a supply independent delay generator, and a digital delay-locked-loop controlled output driver. For a clock rate of 100 MS/s, 7.0 (7.3) effective bits for a 50 MHz (10 MHz) input are maintained from 3.8 V down to 2.2 V. At 2.2 V, this 100-MS/s converter dissipates 75 mW plus 9 mW for the reference ladder. For a typical supply of 2.7 V, it consumes just 1 mW per MS/s over the 10-160-MS/s clock frequency range. Differential nonlinearity below 0.5 LSB is maintained from 2.7 V down to 2.2 V, and it degrades only slightly to 0.8 LSB at 3.8-V supply. The converter is implemented in a 0.35-μm CMOS process, with double-poly capacitors and no low-threshold devices     

A 1.5 V 10-b 30-MS/s CMOS pipelined analog-to-digital converter

A 1.5 V 10-b 30MS/s CMOS pipelined analog-to-digital converter (ADC) is described. Low-voltage techniques are proposed for pipelined analog-to-digital converter that avoids the use of low-threshold voltage process, on-chip clock voltage doubler, bootstrapped switch, or switched-opamp technique. At the front-end, a low-voltage S/H circuit with cross-coupled input sampling switch is employed to eliminate the input signal feedthrough and enhance the dynamic performance of the pipelined ADC. Multiplying digital-to-analog converter (MDAC) with cross-coupled configuration also provides an effective common-mode feedback to overcome the problem of common-mode accumulation. The prototype chips have been fabricated and experimental results confirm the feasibility of this new technique.     

16位流水线ADC系统级建模及仿真

基于MATLAB/Simulink的平台,设计并实现了16bit 100M流水线模数转换器(ADC)系统仿真的理想模型.在充分掌握流水线ADC整体结构基础上,对其基本模块进行建模,充分考虑并加入电路的非理想特性和噪声,使整个系统模型接近实际电路.在输入信号为40MH2,采样时钟频率为100MHz时,分别对理想模型和加入非理想因素后的模型进行仿真比较,得到各项性能指标.对实际电路的设计具有一定的借鉴作用.     

A 1.4-V 25-Mw 600-MS/s 6-bit folding and interpolating ADC in 0.13-μm CMOS

A 600-MSample/s 6-bit folding and interpolating analog-to-digital converter (ADC) is presented. This ADC with single track-and-hold (T/H) circuits is based on cascaded folding amplifiers and input-connection-improved active interpolating amplifiers. The prototype ADC achieves 5.55 bits of the effective number of bits (ENOB) and 47.84 dB of the spurious free dynamic range (SFDR) at 10-MHz input and 4.3 bit of ENOB and 35.65 dB of SFDR at 200-MHz input with a 500 MS/s sampling rate; it achieves 5.48 bit of ENOB and 43.52 dB of SFDR at 1-MHz input and 4.66 bit of ENOB and 39.56 dB of SFDR at 30. 1-MHz input with a 600-MS/s sampling rate. This ADC has a total power consumption of 25 mW from a 1.4 V supply voltage and occupies 0.17 mm~2 in the 0.13-μm CMOS process.     

一种0.18μm数字工艺的12bit 100MS/s流水线型ADC设计

描述一个基于TSMC 0.18μm数字工艺的12 bit 100 Ms/s流水线模数转换器的设计实例。该模数转换器采用1.5bit每级结构,电源电压为1.8V。包括十级1.5 bit/stage和最后一级2bit Flash模数转换器,共产生22bit数字码,数字码经过数字校正电路产生12 bit的输出。该模数转换器省去了采样保持电路,电路模块包括:各个子流水级、共模电压生成模块、带隙基准电压生成模块、开关电容动态偏置模块、系统时钟生成模块、时间延迟对齐模块和数字校正电路模块。为了实现低功耗设计,在电路设计中综合采用了输入采样保持放大器消去、按比例缩小和动态偏置电路等技术。ADC实测结果,当以100 MHz的采样率对10MHz的正弦输入信号进行采样转换时,在其输出得到了73.23dB的SFDR,62.75dB的SNR,整体功耗仅为113mW。     

4-bit FLASH ADC行为级建模与仿真

基于Matlab/Simulink的平台,设计并实现了一种新型的单通道4-bit FLASH ADC行为级仿真模型,模型充分考虑到时钟抖动、失调电压、迟滞效应、比较器噪声等非理想特性,使整个系统更逼近实际电路。在输入信号为1 GHz,采样时钟频率为500 MHz时,对非理想模型进行时域及频域分析,创建的模型和系统仿真结果可为ADC系统中的误差、静态特性及动态特性研究提供借鉴。     

An area-efficient 55 nm 10-bit 1-MS/s SAR ADC for battery voltage measurement

An area-efficient CMOS 1-MS/s 10-bit charge-redistribution SAR ADC for battery voltage measurement in a SoC chip is proposed. A new DAC architecture presents the benefits of a low power approach without applying the common mode voltage. The threshold inverter quantizer(TIQ)-based CMOS Inverter is used as a comparator in the ADC to avoid static power consumption which is attractive in battery-supply application. Sixteen level-up shifters aim at converting the ultra low core voltage control signals to the higher voltage level analog circuit in a 55 nm CMOS process. The whole ADC power consumption is 2.5 mW with a maximum input capacitance of 12 pF in the sampling mode. The active area of the proposed ADC is 0.0462 mm2 and it achieves the SFDR and ENOB of 65.6917 dB and 9.8726 bits respectively with an input frequency of 200 kHz at 1 MS/s sampling rate.     

A current-mode bit-block circuit applicable to low-voltage, low-power pipeline video-speed A/D converters

This paper describes a study to determine if a current-mode circuit is useful as an analog circuit technique for realizing submicron mixed analog-and-digital MOS LSIs. To examine this, we designed and circuit simulated a new current-mode ADC bit-block for a 3 V, 10-bit level, 20 MHz ADC with a pipeline architecture and with full current-mode approach. A new precision current-mode sample-and-hold circuit which enables operation of a bit block at a clock speed of 20 MHz was developed. Current mismatches caused by the poor output impedance of a device were also decreased by adopting a cascode configuration throughout the design. Operation with a 3 V power supply and a 20 MHz clock speed in a 3-bit A/D configuration was verified through circuit simulation using standard CMOS 0.6 m device parameters. Gain error, mismatch of current, and linearity of the bit block with changing threshold voltage of a device were carefully examined. The bit block has a gain error of 0.2% (10-bit level), a linearity error of less than 0.1% (more than 10-bit level), and a current mismatch of DAC current sources in a bit cell of 0.2 to 0.4% (more than 8-bit level) with a 3 V power supply and 20 MHz clock speed. An 8-to 9-bit video-speed pipeline ADC can be realized without calibration. This confirms that the current-mode approach is effective.     

A 13-bit, 8 MSample/s pipeline A/D converter

A 13-bit 8 MSample/s high-accuracy CMOS pipeline ADC is proposed. At the input, the sample-and-hold amplifier (SHA) is removed for low power and low noise; meanwhile, an improved sampling circuit is adopted to alleviate the clock skew effect. On-chip bias current is programmable to achieve low power dissipation at different sampling rates. Particularly, drain-to-source voltages in the operational amplifiers (opamps) are fixed to ensure high DC gain within the variant range of the bias current. Both on-chip and off-chip decoupling capacitors are used in the voltage reference circuit in consideration of low power and stability. The proposed ADC was implemented in 0.18-μm IP6M CMOS technology. With a 2.4-MHz input, the measured peak SNDR and SFDR are 74.4 and 91.6 dB at 2.5 MSample/s, 74.3 and 85.4 dB at 8.0 MSample/s. It consumes 8.1, 21.6, 29.7, and 56.7 mW (including I/O drivers) when operating at 1.5, 2.5, 5.0, and 8.0 MSample/s with 2.7 V power supply, respectively. The chip occupies 3.2 mm2, including I/O pads.     

一个13位8兆采样率流水线模数转换器

A 13-bit 8 MSample/s high-accuracy CMOS pipeline ADC is proposed. At the input, the sample-andhold amplifier （SHA） is removed for low power and low noise; meanwhile, an improved sampling circuit is adopted to alleviate the clock skew effect. On-chip bias current is programmable to achieve low power dissipation at different sampling rates. Particularly, drain-to-source voltages in the operational amplifiers （opamps） are fixed to ensure high DC gain within the variant range of the bias current. Both on-chip and off-chip decoupling capacitors are used in the voltage reference circuit in consideration of low power and stability. The proposed ADC was implemented in 0.18-μm 1P6M CMOS technology. With a 2.4-MHz input, the measured peak SNDR and SFDR are 74.4 and 91.6 dB at 2.5 MSample/s, 74.3 and 85.4 dB at 8.0 MSample/s. It consumes 8.1, 21.6, 29.7, and 56.7 mW （including I/O drivers） when operating at 1.5, 2.5, 5.0, and 8.0 MSample/s with 2.7 V power supply, respectively. The chip occupies 3.2 mm^2, including I/O pads.     

A 75-mW, 10-b, 20-MSPS CMOS subranging ADC with 9.5 effective bitsat Nyquist

A CMOS subranging analog-to-digital converter (ADC) incorporates several features to enhance performance and reduce power dissipation. The combination of an extended settling period for the fine references, absolute-value signal processing, and interpolation in the comparator banks alleviates the principal speed-limiting operation. A front-end sample-and-hold amplifier (SHA) provides sustained dynamic performance at high input frequencies and performs single-ended to differential conversion with a signal gain of two and with low distortion. The SHA holds its differential output for a full clock cycle while it simultaneously samples the next single-ended input, thereby allowing it to drive two comparator banks on consecutive clock phases. The remaining analog circuits are implemented in a fully differential manner. The use of pipelining allows every input sample to be processed by the same channel, thereby avoiding the use of ping-pong techniques, while providing a conversion latency of only two clock cycles. The dynamic performance with a single-ended input approaches that of an ideal ill-bit ADC, typically providing 9.7 effective bits for low input frequencies and 9.5 bits at Nyquist. This performance level is comparable to the best reported for 10-bit CMOS ADC's with differential inputs and significantly better than those with single-ended inputs. The typical maximum differential nonlinearity is ±0.4 LSB, and the maximum integral nonlinearity is ±0.55 LSB without trimming or calibration. With an ADC power of 55 mW plus an SHA power of 20 mW from a 5-V supply, the active area is 1.6 mm² in a 0.5-μm double-poly, double-metal CMOS technology     

A 14-bit digitally self-calibrated pipelined ADC with adaptive bias optimization for arbitrary speeds up to 40 MS/s

This paper presents a 14-bit digitally self-calibrated pipelined analog-to-digital converter (ADC) featuring adaptive bias optimization. Adaptive bias optimization controls the bias currents of the amplifiers in the ADC to the minimum amount required, depending on the sampling speed, environment temperature, and power-supply voltage, as well as the variations in chip fabrication. It utilizes information from the digital calibration process and does not require additional analog circuits. The prototype ADC occupies an area of 0.5/spl times/2.3 mm/sup 2/ in a 0.18-/spl mu/m dual-gate CMOS technology; with a power supply of 2.8 V, it consumes 19.2, 33.7, 50.5, and 72.8 mW when operating at 10, 20, 30, and 40 MS/s, respectively. The peak differential nonlinearity (DNL) is less than 0.5 least significant bit (LSB) for all the sampling speeds with temperature variation up to 80/spl deg/C. When operated at 20 MS/s with 1-MHz input, the ADC achieves 72.1-dB SNR and 71.1-dB SNDR.     

A 10-b 20-Msample/s low-power CMOS ADC

A single-ended input but internally differential 10 b, 20 Msample/s pipelined analog-to-digital converter (ADC) is demonstrated with 4 mW per stage using a single 5 V supply. The prototype ADC made of an input sample and hold (S/H) plus 8 identical unscaled pipelined stages consumes 50 mW including power consumed by a bias generator and two internal buffer amplifiers driving common-mode bias lines. Key circuits developed for this low-power ADC are a dynamic comparator with a capacitive reference voltage divider that consumes no static power, a source-follower buffered op amp that achieves wide bandwidth using large input devices, and a self-biased cascode biasing circuit that tracks power supply variation. The ADC implemented using a double-poly 1.2 μm CMOS technology exhibits a DNL of ±0.65 LSB and a SNDR of 54 dB while sampling at 20 MHz. The chip die area is 13 mm²