Influence of copper addition on adhesive strength of Sn–3Ag–1·5Sb solder joints

Abstract

The present work investigates the effects of adding a small amount of Cu to Sn–3Ag–1·5Sb solders. The present results indicate that adding 0·5 and 1·0 wt-%Cu to Sn–3Ag–1·5Sb solders causes the liquidus temperature to decrease from its original value of 233·4°C to 231·6°C and to 231·4°C, respectively. Furthermore, it is noted that the addition of 1·0 wt-%Cu reduces the difference between the liquidus and solidus temperatures. It is shown that the added Cu reacts with the Sn content of the solder to form Cu₆Sn₅ particles in the β-Sn matrix, which are distributed non-uniformly since the Cu content is low. The experimental results also reveal that the growth rate of the solder joint interfacial intermetallic compound layers increases at higher levels of Cu addition. Finally, it is established that adding Cu to the Sn–3Ag–1·5Sb solder not only improves the adhesive strength of the solder joints, but also reduces the rate of degradation of the adhesive strength of the joints during thermal storage.     

Effect of crystallographic anisotropy of β-tin grains on thermal fatigue properties of Sn–1Ag–0˙5Cu and Sn–3Ag–0˙5Cu lead free solder interconnects

Abstract

An effect of the crystallographic anisotropy of β-tin grains on thermal fatigue properties of Sn–1Ag– 0˙5Cu and Sn–3Ag–0˙5Cu lead free solder interconnects were discussed. From an orientation imaging microscopic observation, three types of microstructures (single crystal-like, fine grain type and large grain type) were observed in both solders. The single crystal-like microstructure disappeared and the large grain type occurred by further fatigue due to recrystallisation. Because single crystal-like microstructure had the {100} plane approximately parallel to strain concentrated areas, recrystallisation could be retarded if the slip systems of {100}<011> or {100}<010> operate and an amount of thermal strain decreases because these slip systems have the larger critical resolved shear stress due to an anisotropic nature of β-tin. One of the reasons Sn–3Ag–0˙5Cu had longer thermal fatigue life than Sn–1Ag–0˙5Cu can be the number of the single crystal-like or the fine grain type microstructures in Sn–3Ag–0˙5Cu were larger.     

Improving the shear strength of Sn–Ag–Cu–Ni/Cu–Zn solder joints via modifying the microstructure and phase stability of Cu–Sn intermetallic compounds

This study focuses on the correlation between high-speed impact tests and the interfacial reaction in Sn-3.0Ag-0.5Cu-0.1Ni/Cu (wt%) and Sn-3.0Ag-0.5Cu-0.1Ni/Cu-15Zn solder joints. Adding Ni into the Sn–Ag–Cu solder alters the interfacial morphology from scallop type to layer type and exhibits high shear strength after reflow in both solder joints. However, the shear strength of Sn-3.0Ag-0.5Cu-0.1Ni/Cu solder joints degrades significantly after thermal aging at 150 °C for 500 h. It is notable that Sn-3.0Ag-0.5Cu-0.1Ni/Cu-15Zn solder joints still present higher shear strength after aging at 150 °C. The weakened shear strength in Sn-3.0Ag-0.5Cu-0.1Ni/Cu solder joints is due to stress accumulation in the interfacial (Cu,Ni)₆Sn₅ compound induced by the phase transformation from a high-temperature hexagonal structure (η-Cu₆Sn₅) to a low-temperature monoclinic structure (η'-Cu₆Sn₅). However, doping small amounts of Zn into (Cu,Ni)₆(Sn,Zn)₅ can inhibit the phase transformation during thermal aging and maintain strong shear strength. These experiments demonstrate that Sn-3.0Ag-0.5Cu-0.1Ni/Cu-15Zn solder joints can act as a stable connection in the micro-electronic packaging of most electronic products at their average working temperatures.     

Effects of in situ nickel particle addition on the microstructure and microhardness of Sn–Ag solder

Abstract

In this study, various amounts of Ni particles were added in situ to Sn–3·5 wt-%Ag lead free solder to form new composite solders. Copper substrates were then dipped into these solders and aged at 150°C for 0, 25, 225, or 1000 h. The microstructure and microhardness of the as solidified solder and the aged solder/copper couples were investigated. Experimental results revealed that the addition of Ni particles increased the microhardness of the composite solder. Ni additions of less than 3 wt-% yielded a microstructure of β-Sn grains surrounded by a eutectic mixture of Ag₃Sn and a Sn rich matrix. An intermetallic compound of Ni₃Sn₄ particles was dispersed throughout the eutectic. For 5 wt-%Ni addition, the Ni₃Sn₄ phase and the remaining Ni particles were agglomerated. In the case of copper substrate dipped with a thick layer of composite solder, water quenched and then aged at 150°C, the induced (Ni, Cu)₃Sn₄ particles coarsened and agglomerated. Additionally, the intermetallic (Cu, Ni)₆Sn₅ compound layer formed at the solder/Cu interface thickened with increasing Ni content.     

Influence of Cu content on microstructure,grain orientation and mechanical properties of Sn–xCu lead-free solders

The effect of Cu content on the microstructure, grain orientation and mechanical properties of Sn–xCu (x=0–4.0 wt.%) lead-free solder was studied. Results showed that added Cu induced the formation of intermetallic phases. Only the η-Cu₆Sn₅ and ?-Cu₃Sn phases were present in the β-Sn matrix. For all contents, the strongly preferred orientation of the β-Sn phase was formed on the {001} plane. In Sn doped with 1.0 wt.% Cu, the η-Cu₆Sn₅ phase exhibited the preferred orientation of {0001} plane, whereas doping with 3.0 or 4.0 wt.% Cu transformed the preferred orientation to the {010} plane. In addition, only the {0001} and planes were present in the ?-Cu₃Sn phase. The high Cu contents contributed to an increased number of low-angle boundaries, high residual strain, tensile strength and microhardness.     

Ecologically clean solder based on Sn–Ag–Cu

A solder is developed, which does not contain harmful components such as lead and shows super performance properties, at the same time the processing behaviour of the solder remains unchanged.     

Microstructure and mechanical property of Sn–Ag–Cu solder material

Among the lead-free solder materials,Sn-AgCu alloys have many advantages,such as good wetting property,superior interfacial properties and high creep resistance.In this article,the organization and welding performance of Sn-Ag-Cu material were investigated.The surface morphology of the two alloys was observed by stereoscopic microscope and scanning electron microscope(SEM).Chemical constitution was examined by X-ray energy-dispersive spectroscopy(EDS).The mechanical properties of Sn-Ag-Cu solder were evaluated systematically compared with those of Sn-Cu solder.The results show that Sn-Ag-Cu solder based on different solder pads has different welding properties.The thickness of intermetallic compound(IMC) at the interface increases with aging time.For the gold-plated pads,there are a large number of IMC graphic,and in the welding interface,it can reduce the reliability of electrical connection.The Sn-AgCu solder joints show a superior mechanical property over the traditional Sn-Cu solder.The number of dimples decreases and that of cavities increases for Sn-Cu0.7 alloy and the fracture surfaces of Sn-Ag3.0-Cu0.5 alloy have many small size dimples which are homogeneously distributed.     

In-situ alloying of Sn–3.5Ag solder during reflow through Zn nanoparticle addition and its effects on interfacial intermetallic layers

Driven by the necessity to improve the reliability of lead free electronic products and by the trend towards miniaturization, researchers are putting intense efforts to improve the properties of Sn based solders. The present work investigates the effects of Zn nanoparticle addition to Sn-3.5Ag (SA) alloy through paste mixing on the interfacial structure between solder and copper substrate during reflow. Results show that the addition of Zn nanoparticles does not alter the morphology of the interfacial intermetallic compounds although they substantially suppress their growth. Zn nanoparticles are seen to be most efficient compared with Co and Ni nanoparticles in suppressing the growth of Cu₃Sn layers. It is suggested that Zn nanoparticles exert their influence through an in-situ dissolution and alloying effect.     

Interrelation of wettability–microstructure–tensile strength of lead-free Sn–Ag and Sn–Bi solder alloys

A comparative investigation on the wettability and tensile strength of a Sn–2Ag, a Sn–40Bi and the traditional eutectic Sn–Pb solder alloys was carried out. The wettability is represented by thickness of covered layer (TCL) and spread area (SA) while the mechanical behaviour by the ultimate tensile strength (UTS). It is shown that the TCL of studied alloys decreased with the increase in the dipping temperature. It is also shown that TCL and SA have opposite behaviour with respect to the cooling rate. The Sn–Bi solder alloy has lower SA when compared with those of the Sn–Ag solder when similar cooling rates are considered. The Sn–Bi solder exhibits the best UTS/SA combination for dendritic spacings between 25 and 27?µm, associated with cooling rates ～2°C?s^?1, 2× lower than those of the Sn–Ag alloy. Besides, the Sn–Bi alloy has shown SA >70～80% associated with higher UTS (～80?MPa) as compared with the other alloys examined.     

Influence of rapid solidification on Sn–8Zn–3Bi alloy characteristics and microstructural evolution of solder/Cu joints during elevated temperature aging

The effects of rapid solidification on the microstructure and melting behavior of the Sn–8Zn–3Bi alloy were studied. The evolution of the microstructural characteristics of the solder/Cu joint after an isothermal aging at 150 °C was also analyzed to evaluate the interconnect reliability. Results showed that the Bi in Sn–8Zn–3Bi solder alloy completely dissolved in the Sn matrix with a dendritic structure after rapid solidification. Compared with as-solidified Sn–8Zn–3Bi solder alloy, the melting temperature of the rapid solidified alloy rose to close to that of the Sn–Zn eutectic alloy due to the extreme dissolution of Bi in Sn matrix. Meanwhile, the adverse effect on melting behavior due to Bi addition was decreased significantly. The interfacial intermetallic compound (IMC) layer of the solder/Cu joint was more compact and uniform. Rapid solidification process obviously depressed the formation and growth of the interfacial IMC during the high-temperature aging and improved the high-temperature stability of the Sn–8Zn–3Bi solder/Cu joint.     

Influence of cold-rolling and annealing treatments on microstructure and mechanical properties of friction stir-welded Al–Cu joints

The influence of post-weld cold-rolling (PWCR) and annealing treatments on microstructure and mechanical properties of the friction stir-welded Al–Cu joints were investigated in detail. The tensile fractures along at the Al–Cu interface in as-welded (AW) joint was effectively inhibited by PWCR. Accordingly, the strength of the dissimilar Al–Cu butt joints significantly increased from 79?MPa to 384?MPa for the AW state and the post-weld cold-rolled treated state, respectively. By the annealing treatment after the PWCR, the elongation of the dissimilar joints was increased from 1.0% to 17.5%, companied with an acceptable decrement of the strength. The optimised distribution of the intermetallic compounds layer at the Al–Cu interface, the reduced property gradients as well as the microstructure refinements, accounts for the improvement of the mechanical performances of the dissimilar Al–Cu joint.     

Modification of Sn–1.0Ag–0.5Cu solder using nickel and boron

Effects of Ni and B additions on the microstructure and growth behavior of the intermetallic compound(IMC) of Sn–1.0Ag–0.5Cu alloys(SAC105) were investigated in this study. Results show that microadditions of Ni and B result in volume fraction of primary Sn increasing and the grain size decreasing observably. It is found that a large number of fine reinforcement particles with network-like shape are found in the solder, and the thickness of interfacial IMC layer in the solder joint is grew less than that of SAC105 with longer aging time. Shear test results reveal that as-soldered solder joints of microalloyed SAC105 have better shear strength than that of SAC105 solder alloy.     

Creep corrosion cracking of Sn–3.0Ag and Sn–0.5Cu solder alloys in NaCl solution

The surface crack nucleation of Sn–3.0Ag and Sn–0.5Cu solder alloys has been examined by performing sustained tensile-loading tests in 0.9 mass% NaCl solution at room temperature. For Sn–3.0Ag alloy, many cracks nucleate and propagate on the side surface of the specimen, similarly to Sn–3.0Ag–0.5Cu alloy reported previously. For Sn–0.5Cu alloy, such cracks are not observed, and ordinary creep deformation occurs in the solution. The effect of sustained applied stress, i.e., creep, on the dissolution of ions is smaller for Sn–0.5Cu alloy than for Sn–3.0Ag alloy. The present results suggest that there are differences in the susceptibility to cracking under applied stress in a solution, i.e., creep corrosion cracking, among lead-free solder alloys.     

Interfacial reactions of Sn–Zn–Ag–Cu alloy on soldered Al/Cu and Al/Al joints

This work shows the effect on the soldering process of the addition of Ag and Cu to Sn–Zn alloys. Soldering of Al/Cu and Al/Al joints was performed for a time of 3?min, at a temperature of 250°C, with the use of flux. Aging was carried out at 170°C for Al/Cu and Al/Al joints for 1 and 10 days. During the aging process, intermetallic layers grew at the interface of the Al/Cu joint at the Cu substrate. Intermetallic layers were not observed during wetting of Al/Al joints. On the contrary, dissolution of the Al substrate and migration of Al-rich particles into the bulk of the solder were observed. The experiment was designed to demonstrate the effect of Ag and Cu addition on the dissolution of Al substrate during the soldering and aging processes. In the solder alloys, small precipitates of AgZn₃ and Cu₅Zn₈ were observed.     

Effects of ultrasonic irradiation and cooling rate on the solidification microstructure of Sn–3.0Ag–0.5Cu alloy

A comparative study on the microstructures of Sn–Ag–Cu alloy ingots grown by ultrasound-assisted solidification was carried out with a specific focus on the limits on the ultrasonic processing depth and time imposed by the cooling rate during the melt solidification. During air-cooling, increasing the ultrasonic power reduced the undercooling temperature and increased the solidification time, leading to β-Sn phase fragmentation from a dendritic shape into a circular equiaxed shape. The grain size was decreased from approximately 300 μm to 20 μm. When the cooling rate was increased from 4 °C/s in air to 20 °C/s in water, the macro-undercooling temperature was more greatly reduced by an increase in ultrasonic power, but the solidification time seemed to change only slightly because only a limited period for ultrasonic processing was permitted in the melt. Under both cooling rates, the microstructures were inhomogeneous along the processing depth. The functional depth and period for ultrasonic cavitation and acoustic steaming contributed to the differences in the solidification microstructures.     

Effects of Sn additions on microstructure and corrosion resistance of heat-treated Ti–Cu–Sn titanium alloys

The microstructure and corrosion properties of Ti7CuxSn (x?=?0–5?wt-%) alloys after solution treatment have been investigated. The alloys were solution-treated (ST) at 1000°C for 2?h, followed by quenching in water to room temperature. It was found that the microstructure of the ST Ti7Cu alloy had only a martensite structure, and that addition of Sn could refine the microstructure of Ti7CuxSn alloy. Notably, the pseudo dendritic α-Ti phase was formed in ST Ti7Cu5Sn alloys. Potentiodynamic polarisation curves and electrochemical impedance spectroscopy data demonstrated that adding Sn improved the electrochemical corrosion behaviour of the Ti7CuxSn alloy.     

Influence of stress on the creep behavior of Cu particle enhancement SnPb based composite solder joints

1. Introduction Mechanical fracture of solder joints is a major cause of failure and it decreases the reliability in electronic systems. With the increased functionality, miniaturization of electronic components, broad op-eration temperature ranges, and increased stress re-quirement, good mechanical properties are de-manded on solder joints. The eutectic tin-lead solder, which has a low melting point (183°C), plays an important role in SMT (surface mount technology). The working temperature…     

Comments on “A numerical method to determine interdiffusion coefficients of Cu6Sn5 and Cu3Sn intermetallic compounds”

Li et al. (Intermetallics 2013; 40:50–59) [1] published a paper on “A numerical method to determine interdiffusion coefficients of Cu₆Sn₅ and Cu₃Sn intermetallic compounds”. In section 5.1 of this paper, they stated that the Wagner's method can be used to calculate the integrated interdiffusion coefficients for an incremental diffusion couple only under the assumption of “constant molar volume” for all phases. They gave a detailed derivation. In this comments, we show however that one of the assumptions in their derivation is unphysical, which made them give wrong conclusions. We propose a modified derivation of Wagner's equation without the assumption of “constant molar volume”.     

Anisotropic thermal expansion of Ni3Sn4, Ag3Sn,Cu3Sn,Cu6Sn5 and βSn

The directional coefficient of thermal expansion (CTE) of intermetallics in electronic interconnections is a key thermophysical property that is required for microstructure-level modelling of solder joint reliability. Here, CTE ellipsoids are measured for key solder intermetallics using synchrotron x-ray diffraction (XRD). The role of the crystal structure used for refinement on the CTE shape and temperature dependence is investigated. The results are used to discuss the βSn-IMC orientation relationships (ORs) that minimise the in-plane CTE mismatch on IMC growth facets, which are measured with electron backscatter diffraction (EBSD) in solder joints on Cu and Ni substrates. The CTE mismatch in fully-intermetallic joints is discussed, and the relationship between the directional CTE of monoclinic and hexagonal polymorphs of Cu₆Sn₅ is explored.