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Liu Zhihong CHEN Changchun Lin Huiwang Xiong Xiaoyi Dou Weizhi TSIEN Pei-Hsin 《中国稀土学报(英文版)》2004,22(Z2)
UHVCVD-grown Si/Si1- xGex/Si heterostructure was investigated by Photoreflectance spectroscopy (PR). The principle of PR used in semiconductor film was thoroughly described. According to the E1 transition energy in the Si1- xGex alloy, the Ge content in SiGe film with constant composition can be accurately characterized. In this study, determine the composition uniformity of larger diameter SiGe epiwafer by PR mapping technique was determined. These results show PR is very promising for Si1- xGex epilayer characterization with constant Ge content and can provide film measurements for production-worthy line monitor. 相似文献
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Hui-Yuan Wang Qian Li Bo Liu Nan Zhang Lei Chen Jin-Guo Wang Qi-Chuan Jiang 《Metallurgical and Materials Transactions A》2012,43(13):4926-4932
The refinement in size and modification in morphology for primary Mg2Si depended significantly on Sb contents in Mg-4Si alloys. Adding Sb into melts evidently increased the nucleus numbers of primary Mg2Si crystals. Moreover, the preferential growth along $ \left\langle { 100} \right\rangle $ directions in dendritic crystals was restricted greatly due to the Si sites being substituted by Sb in Mg2Si lattices, resulting in modified primary Mg2Si crystals growing to octahedral morphology surrounded by {111} planes; therefore, the modification process could be called adsorption and poisoning mechanisms. 相似文献
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J. H. Li S. Suetsugu Y. Tsunekawa P. Schumacher 《Metallurgical and Materials Transactions A》2013,44(2):669-681
A series of Al-5 wt pct Si alloys with Yb additions (up to 6100 ppm) have been investigated using thermal analysis and multiscale microstructure characterization techniques. The addition of Yb was found to cause no modification effect to a fibrous morphology involving Si twinning; however, a refined plate-like eutectic structure was observed. The Al2Si2Yb phase was observed with Yb addition level of more than 1000 ppm. Within the eutectic Al and Si phases, the Al2Si2Yb phase was also found as a precipitation from the remained liquid. No Yb was detected in the α-Al matrix or plate-like Si particle, even with Yb addition up to 6100 ppm. The absence of Yb inside the eutectic Si particle may partly explain why no significant Si twinning was observed along {111}Si planes in the eutectic Si particle. In addition, the formation of the thermodynamic stable YbP phases is also proposed to deteriorate the potency of AlP phase in Al alloys. This investigation highlights to distinguish the modification associated with the ever present P in Al alloys. We define modification as a transition from faceted to fibrous morphology, while a reduction of the Si size is termed refinement. 相似文献