纳米氧化硅在玻璃基片表面亚纳米级抛光中的应用

为满足先进电子产品对玻璃基片表面超光滑的要求,制备了一种纳米氧化硅抛光液,并研究了氧化硅粒子大小、抛光时间等参数对玻璃基片抛光后表面粗糙度、材料去除速率的影响。ZYGO形貌仪表明,采用纳米氧化硅抛光液,可以使玻璃表面粗糙度达到0.5 nm左右。AFM表明,抛光后的玻璃基片表面超光滑且无划痕等微观缺陷。     

抛光液pH值对玻璃超光滑表面完整性影响

为研究抛光液的pH值在精密抛光加工过程中对表面完整性的影响,选取K9玻璃为试件材料,用浮法抛光加工成超光滑表面,使用相同浓度的氢氟酸和氢氧化钠溶液对2个试件进行腐蚀,用原子力显微镜、扫描电镜和纳米硬度计测量作用不同时间段的表面质量,通过对比分析各作用时间段2个试件的表面粗糙度、表面形貌和表层硬度的相似和差异,研究了pH值对超光滑表面完整性的影响,得出在玻璃工件抛光加工中,抛光液为微碱环境有利于提高加工效率和得到高质量的超光滑表面.     

在线电解修整磨削与化学机械抛光相结合的蓝宝石基片组合加工技术

通过分析ELID磨削和CMP抛光两种加工技术的原理和特点,充分结合两种技术的优点,对蓝宝石基片进行超光滑纳米级精度的组合加工。从理论上分析和计算了蓝宝石的临界切削深度,以及在不同粒度砂轮下的脆性和延性磨削方式;采用不同粒度的砂轮对蓝宝石基片进行超精密ELID磨削实验,快速地获得高质量的加工表面,同时采用磁流变斑点法对加工面的亚表面损伤进行测量;利用CMP抛光技术对磨削加工后的表面进行光整,以减少磨削时产生的加工缺陷,使工件的表面质量得到进一步改善与提高,最终获得亚纳米级的表面粗糙度。     

添加剂对微晶玻璃化学机械抛光的影响

利用自制抛光液对微晶玻璃进行化学机械抛光,研究络合剂、氧化剂、润滑剂种类及添加量对微晶玻璃化学机械抛光材料去除速率和表面粗糙度的影响。结果表明:抛光液中加入质量分数0.2%的EDTA络合剂后,能大幅降低材料表面粗糙度;加入质量分数2%的过硫酸铵氧化剂后能得到较光滑的材料表面和较高的材料去除速率;加入质量分数为0.2%的丙三醇润滑剂后能降低材料表面粗糙度。将EDTA络合剂、过硫酸铵氧化剂丙、三醇润滑剂加入SiO_2抛光液中对微晶玻璃进行化学机械抛光,利用原子力显微镜观察抛光微晶玻璃抛光前后的表面形貌。结果表明,抛光后微晶玻璃表面极为平整,达到了0.12 nm的纳米级光滑表面,且材料去除速率达到72.8 nm/min。     

纳米SiO2粒子抛光液的制备及其抛光性能

随着计算机磁头与磁盘间间隙的不断减小，硬盘表面要求超光滑，制备了一种纳米SiO2抛光液，并研究了镍磷敷镀的硬盘基片在其中的抛光性能，Chapman MP2000^ 表面形貌仪测得抛光后表面的平均粗糙度（Rα)和波纹度（Wα)分别为0.052nm及0.063nm，为迄今报道的硬盘抛光的的最低值。原子力显微镜（AFM）发现获得的基片表面非常光滑平整，表面无划痕，凹坑，点蚀等表面缺陷。     

计算机硬盘基片的亚纳米级抛光技术研究

随着计算机磁头与磁盘间隙的不断减小,硬盘表面要求超光滑(亚纳米级粗糙度)。化学机械抛光技术是迄今几乎唯一的全局平面化技术。研究了抛光液特性与计算机硬盘基片的化学机械抛光性能间的关系,结果表明,抛光后表面的波纹度(Wa)、粗糙度Ra)以及材料去除量强烈依赖于抛光液中磨粒的粒径、磨粒和氧化剂的浓度等因素。借助对抛光后表面的俄歇能谱(AES)分析,对其化学机械抛光机理进行了探讨。     

超细氧化铝表面改性及其抛光特性

在化学机械抛光（CMP）中,为了提高氧化铝磨料分散稳定性和防止团聚,利用丙烯酰氯对超细氧化铝进行了表面改性,并用XPS、激光粒度仪、SEM对其进行表征,结果表明改性后的超细氧化铝分散性明显提高。研究了改性后超细氧化铝在数字光盘玻璃基片中的化学机械抛光特性,即外加压力、抛光时间和下盘转速对玻璃基片去除量的影响,并对其CMP机制进行了推断。结果表明,材料去除量随下盘转速、压力变化趋势相近,即随着压力的增加或下盘转速的提高,材料去除量先增大后减小;随抛光时间延长,抛光初期材料去除量增加较快,但在后段时间内去除量增加趋势趋于平缓。     

液动压悬浮抛光机床的设计与研究

为了解决纳米薄膜生长所需的原子级超光滑表面制备问题,基于液动压悬浮抛光新方法开展液动压悬浮抛光机床的设计研究。利用铝基盘作上抛光盘,高磷合金铸铁盘作下抛光盘,抛光工件贴于上抛光盘上,上下抛光盘保持一定的间隙并浸没在抛光液中,结合高精度的滚珠花键轴和导轨即可实现新型的非接触式抛光—液动压悬浮抛光。     

纳米CeO2抛光料对硅晶片进行化学机械抛光的研究

通过自制纳米CeO2超细粉体,并配制成抛光液对硅片进行化学机械抛光,研究了纳米CeO2抛光料对硅片的抛光效果,解释了纳米级抛光料的化学机械抛光原理.实验结果表明:由于纳米抛光料粒径小,切削深度小,故材料去除采用塑性流动方式.使用纳米CeO2抛光料最终在1μm的范围内达到了微观表面粗糙度Ra为0.124nm的超光滑表面,满足了产品的要求.     

镁合金AZ91D化学机械抛光工艺研究

将化学机械抛光技术(Chemical Mechanical Polishing,CMP)引入到镁合金片的抛光中,以硅溶胶、表面活性剂、螯合剂及p H调节剂为原料,以涡流搅拌的方法制备镁合金(AZ91D)抛光液。采用单因素法分析抛光过程中压力、转速、抛光液流量及抛光时间等参数对抛光效果的影响。实验结果表明:在压力为0.06MPa,抛光盘上盘转速为10r/min、下盘转速为50r/min,抛光液流量为160m L/min,抛光时间为8min的条件下,镁合金表面形貌良好;在此工艺条件下经过化学机械抛光后,镁合金表面粗糙度Ra能达到10nm。     

TWO STEPS CHEMICAL-MECHANICAL POLISHING OF RIGID DISK SUBSTRATE TO GET ATOM-SCALE PLANARIZATION SURFACE

In order to get atomic smooth rigid disk substrate surface, ultra-fined alumina slurry and nanometer silica slurry are prepared, and two steps chemical-mechanical polishing (CMP) of rigid disk substrate in the two slurries are studied. The results show that, during the first step CMP in the alumina slurry, a high material removal rate is reached, and the average roughness (Ra) and the average waviness (Wa) of the polished surfaces can be decreased from previous 1.4 nm and 1.6 nm to about 0.6 nm and 0.7 nm, respectively. By using the nanometer silica slurry and optimized polishing process parameters in the second step CMP, the Ra and the Wa of the polished surfaces can be further reduced to 0.038 nm and 0.06 nm, respectively. Atom force microscopy (APM) analysis shows that the final polished surfaces are ultra-smooth without micro-defects.     

Ultra-flat and ultra-smooth Cu surfaces produced by abrasive-free chemical–mechanical planarization/polishing using vacuum ultraviolet light

The new bonding technologies utilizing intermolecular bonding forces have been developed and attracting attention recently. Cu is known to be a suitable material for the bonding substrate due to its excellent physical properties. And an ultra flatness and an ultra smoothness over a relatively large area are strongly required for the Cu substrate surface.Chemical–mechanical planarization/polishing (CMP) with abrasives is widely adopted for planarizing and smoothing Cu surfaces. But this method has serious problems resulting from abrasives in CMP slurry. Hence, we have developed an abrasive-free polishing (AFP) method that utilizes vacuum ultraviolet (VUV) light in the previous study and an ultra-smooth Cu surface was achieved. However, the problems about a low removal rate and a small finished area remained.To overcome the problem, a new manufacturing process, namely, the process of combining CMP with abrasives and the AFP method was newly developed. First, an ultra-flat surface is achieved using CMP with abrasives. Next, the AFP method is applied for the final polishing step in order to achieve an ultra-smooth surface. As a result, utilizing VUV in situ irradiation and electrolyzed reduced water in the AFP process, the ultra-flat and the ultra-smooth surface produced has a roughness average of <1 nm with a peak value of <10 nm over a relatively large area of 700 μm × 500 μm.     

Investigation of Chemical/Mechanical Polishing of Niobium

A chemical/mechanical method for polishing flat niobium sheets to a mirror finish was developed. Various polishing slurries with different open circuit potentials and pH values were considered. All slurries fell within the niobate region of the Pourbaix diagrams, indicating that slurries are in a thermodynamically stable region. Oxidation characteristics of the niobium in the various slurries were determined by XPS and confirmed previously published work that niobium forms various layers of stable niobium oxides roughly 4.5–4.7 nm in thickness on the surface. A multi-step polishing method that relies on mechanical abrasion of the surface proved to be effective, and particles of different hardness and size were explored. Niobium wafers with initial peak-to-valley (PV) surface roughness of 3 to 7 μm were polished. The multi-step process utilized a slurry containing 1 μm diameter alumina particles to polish this initial roughness down to a submicrometer level. The final polish was provided by a slurry containing smaller particles. The oxide slurry with 70 to 100 nm silica particles gave the best mirror finished surface, with PV = 235 nm, Ra = 32 nm, and RMS = 39 nm. While polishing caused some disorder in the niobium metal, using the oxide slurry gave results closer to those obtained by buffered chemical polish (BCP), which exhibits the highest degree of atomic order based on XPS studies. A polishing process starting with mechanical abrasion, followed by a two-step mechanical polish, is successful for obtaining smooth niobium surfaces on flat wafers.     

单晶SiC的电助光催化抛光及去除机理

为满足电子半导体等领域对SiC超光滑、无损伤和材料高效去除的要求,提出了电助光催化抛光SiC的新方法。研究了光催化剂种类及其pH值对抛光液氧化性和抛光效果的影响,讨论了材料的去除机理。结果表明:以p25型TiO₂为光催化剂配制抛光液所获得的最大氧化还原电位为633.11 mV,材料去除率为1.18μm/h,表面粗糙度Ra=0.218 nm;抛光后SiC表面氧化产物中,Si-C-O、Si-O和Si₄C₄O₄的含量明显增加,SiC表面被氧化并被机械去除是主要的材料去除方式。     

不同氧化剂对6H-SiC化学机械抛光的影响

选用胶体SiO₂纳米颗粒为磨粒,研究不同pH值条件下高锰酸钾和双氧水两种氧化剂对6H-SiC晶片化学机械抛光的影响,并使用原子力显微镜观察抛光后表面质量。采用Zeta电位分析仪分析溶液中胶体SiO₂颗粒的Zeta电位,采用X射线光电子能谱分析SiC抛光表面元素及其化学状态。结果表明：SiC晶片的材料去除率随pH值变化而变化,采用高猛酸钾抛光液抛光时,材料去除率在pH 6时达到峰值185 nm/h,R_a为0.25 nm;采用双氧水抛光液抛光时,材料去除率在pH 8时达到峰值110 nm/h,R_a为0.32 nm。pH值低于5时,电负性的SiO₂颗粒会通过静电作用吸附在带正电的SiC表面,抑制SiC晶片表面原子的氧化及去除,降低材料去除率;pH值高于5时,SiO₂颗粒在双氧水抛光液中的静电排斥力弱于高锰酸钾抛光液中静电排斥力,从而影响了SiO₂颗粒的分散性能,降低了抛光效果。采用高锰酸钾抛光液抛光后,SiC晶片表面的Si-C氧化产物含量（Si-C-O、Si₄C_4-xO₂和Si₄C₄O₄）较高,高锰酸钾抛光液的氧化能力较强。     

LED蓝宝石衬底抛光表面原子台阶形貌及其周期性研究

LED蓝宝石衬底的表面质量会极大影响到后续外延质量,进而影响到LED器件性能。蓝宝石研磨片经Al2O3磨粒粗抛液、SiO2磨粒精抛液下进行化学机械抛光(CMP),最终表面经原子力显微镜(AFM)所测表面粗糙度达到0.101nm,获得亚纳米级粗糙度超光滑表面,并呈现出原子台阶形貌。同时,通过使用Zygo表面形貌仪、AFM观察蓝宝石从研磨片经Al2O3粗抛液、SiO2精抛液抛光后的表面变化,阐述蓝宝石表面原子台阶形貌的形成原因,提出蓝宝石原子级超光滑表面形成的CMP去除机理。通过控制蓝宝石抛光中的工艺条件,获得a-a型、a-b型两种不同周期规律性的台阶形貌表面,并探讨不同周期规律性台阶形貌的形成机理。     

新型环保抛光液的制备及其对软脆碲锌镉晶片的化学机械抛光

针对软脆碲锌镉晶片的传统加工工艺“游离磨料-抛光-化学机械抛光”存在的缺点,提出“固结磨料研磨-新型绿色环保抛光液化学机械抛光”新方法。固结磨料研磨工艺为：采用3000号刚玉防水砂纸,压力为17kPa,抛光盘与抛光垫转速均为80r/min,研磨时间为5min。新型绿色环保抛光液含有双氧水和硅溶胶,采用天然桔子汁作为pH值调节剂。化学机械抛光工艺为:采用自行研制的化学机械抛光液,绒毛抛光垫,抛光压力为28kPa,抛光盘与抛光垫转速均为60r/min,抛光时间为30min。试验结果表明,经过上述加工可获得超光滑的表面,表面粗糙度算术平均值、均方根值、峰谷值分别可以达到0.568nm、0.724nm、6.061nm。