Low temperature growth of highly transparent nanocrystalline diamond films on quartz glass by hot filament chemical vapor deposition

Highly transparent and hard nanocrystalline diamond (NCD) films were prepared on quartz glass by hot filament chemical vapor deposition (HFCVD). The effects of total gas pressure, substrate's temperature, and concentration of CH₄ on the grain size, surface's roughness and hardness, growth rate, as well as the optical properties of NCD films were investigated. The results indicated that with a low total gas pressure and high CH₄ concentration, high frequency of secondary nucleation can be obtained. In addition, low substrate temperature can increase the rate of the hydrogen atom etched sp² graphite carbon in the film, yielding a smooth surface of NCD films and very high sp³ content. Under optimized conditions, the hardness can be enhanced up to 65 Gpa, with 80% maximum transmittance in the visible light region. The aforementioned reaction platform outcomes a 1.2 μm thickness of NCD coating with a low root-mean-square (r.m.s.) surface roughness around 12–13 nm and a high growth rate around 1 μm/h. The influences of the total gas pressure, substrate's temperature, and CH₄ concentration for growing NCD films were also discussed in this paper.     

Atomic layer deposition of ZnO thin films on boron-doped nanocrystalline diamond

ZnO thin films were successfully prepared on boron-doped nanocrystalline diamond NCD by means of atomic layer chemical vapour deposition. Their growth and properties are similar to the layers grown by the same technique on glass. The layers thickness can be easily monitored by the number of precursors pulses. The ZnO layers are uniform and have perfect adhesion to NCD. Electrical measurements show that there is no current rectification if highly doped NCD and low resistance ALCVD ZnO are used. On the contrary, a rectifying behaviour can be obtained if lightly boron-doped NCD and resistive hydrothermally prepared ZnO are used.     

Field emission of polycrystalline diamond films grown by microwave-plasma chemical vapor deposition. I. Effects of surface morphology of diamond

The effects of surface morphology on the field emission of non-doped polycrystalline diamond films with thicknesses ranging from 5 to 55 μm were studied. Diamond films grown by a microwave-plasma chemical vapor deposition technique had both the diamond and non-diamond components with pyramidal and angular crystalline structures. Although the average crystallite size increased with increasing the film thickness (d), the volume fraction of the non-diamond components in the films was insensitive to the film thickness. However, the turn-on electric field, F_T, (defined as the low-end electric field to emit electrons) showed a U-shape dependence on the film thickness. This U-shape dependence was explained by a model in which the emission current was controlled by Fowler–Norheim tunneling of electrons at surface of the pyramids when d was thinner than 20 μm and by carrier transport in the polycrystalline diamond film when d was thicker than 20 μm. The lowest field of 4 V/μm was obtained in the film with 20 μm thick.     

Wettability of nanocrystalline diamond films

The wettability of nanocrystalline CVD diamond films grown in a microwave plasma using Ar/CH₄/H₂ mixtures with tin melt (250–850 °C) and water was studied by the sessile-drop method. The films showed the highest contact angles θ of 168 ± 3° for tin among all carbon materials. The surface hydrogenation and oxidation allow tailoring of the θ value for water from 106 ± 3° (comparable to polymers) to 5° in a much wider range compared to microcrystalline diamond films. Doping with nitrogen by adding N₂ in plasma strongly affects the wetting presumably due to an increase of sp²-carbon fraction in the films and formation of C–N radicals.     

Characterization of silicon films grown by atomic layer deposition on nanocrystalline diamond

Ultrathin silicon films were deposited on nanocrystalline diamonds by means of atomic layer deposition (ALD) from gaseous monosilane. The silicon deposition was achieved through the sequential reaction of SiH₄ saturated adsorption and in-site pyrogenation. X-ray diffraction (XRD), transmission electron microscopy (TEM), high-resolution electron microscopy (HREM) and Fourier transform infrared (FTIR) spectra were utilized to investigate the structure and the morphology of Si-coated nanocrystalline diamonds. The results confirmed that continuous silicon films were successfully deposited on both basal planes and edges of nanocrystalline diamond particles by this ALD method and the structure of the film was mainly determined by deposition temperature and deposition cycle.     

Evaluation research of polishing methods for large area diamond films produced by chemical vapor deposition

The current study compared several polishing techniques of chemical vapor deposition (CVD) diamond films. Although research on various diamond polishing techniques has been carried for years, some issues still need to be examined in order to facilitate application on large areas in a cost-efficient manner. In the present work, microwave plasma enhanced chemical vapor deposition (CVD) was used to obtain diamond films with full width half magnitude (FWHM) less than 10 wavenumbers at 1332 cm^− 1 Raman peak. The diamond films were processed through mechanical polishing, chemical-assisted mechanical polishing, thermo-chemical polishing, excimer laser ablation, and catalytic reaction assisted grinding. A profilometer, an atomic force microscope, and a scanning electron microscope have been used to evaluate the surface morphology of diamond films before and after polishing. The results obtained by using the above mentioned techniques were analyzed and compared.     

Large area deposition of boron doped nano-crystalline diamond films at low temperatures using microwave plasma enhanced chemical vapour deposition with linear antenna delivery

We report on the preparation and characterisation of boron (B) doped nano-crystalline diamond (B-NCD) layers grown over large areas (up to 50 cm × 30 cm) and at low substrate temperatures (< 650 °C) using microwave plasma enhanced linear antenna chemical vapour deposition apparatus (MW-LA-PECVD). B-NCD layers were grown in H₂/CH₄/CO₂ and H₂/CH₄ gas mixtures with added trimethylboron (TMB). Layers with thicknesses of 150 nm to 1 μm have been prepared with B/C ratios up to 15000 ppm over a range of CO₂/CH₄ ratios to study the effect of oxygen (O) on the incorporation rate of B into the solid phase and the effect on the quality of the B-NCD with respect to sp³/sp² ratio. Experimental results show the reduction of boron acceptor concentration with increasing CO₂ concentration. Higher sp³/sp² ratios were measured by Raman spectroscopy with increasing TMB concentration in the gas phase without CO₂. Incorporation of high concentrations of B (up to 1.75 × 10²¹ cm³) in the solid is demonstrated as measured by neutron depth profiling, Hall effect and spectroscopic ellipsometry.     

Growth of nanocrystalline diamond films by biased enhanced microwave plasma chemical vapor deposition

Nanocrystalline diamond (NCD) films were grown using biased enhanced growth (BEG) in microwave plasma chemical vapor deposition on mirror polished silicon substrates at temperatures in the range from 400 to 700°C. The films were characterized by Raman spectroscopy, X-ray diffraction (XRD), Auger electron spectroscopy and atomic force microscopy (AFM). Hardness of the films was measured by nano-indentor. Apart from graphitic D and G bands in the films, the Raman spectra exhibit NCD features near 1140 cm⁻¹. The relative intensity of the NCD to graphitic G band in the Raman spectra of the films is negligible in the films grown at 400°C. It increases with temperature and attains a maximum at 600°C following a sharp decrease in the films grown at higher temperatures. XRD results also indicate a maximum concentration of NCD in the film grown at 600°C. Average hardness of the films increases with temperature from ∼5 GPa to ∼40 GPa up to 600°C followed by a decrease (∼24 GPa) in the film grown at 700°C. Substrate temperature seems to play a crucial role in the growth of NCD in BEG processes. An increase in growth temperature may be responsible for evolving bonded hydrogen and increasing mobility of carbon atoms. Both factors help in developing NCD in the films grown at 500 and 600°C with a combination of subplantation mechanism, due to biasing, and a high concentration of H atoms in the gas-phase, typical of CVD diamond process. At 700°C the implanted carbon atoms may be migrating back to the surface resulting in domination of surface processes in the growth, which in turn should result in increase in graphitic content of the films at such a high methane concentration and continuous biasing used in the present study.     

Doping of vanadium to nanocrystalline diamond films by hot filament chemical vapor deposition

Doping an impure element with a larger atomic volume into crystalline structure of buck crystals is normally blocked because the rigid crystalline structure could not tolerate a larger distortion. However, this difficulty may be weakened for nanocrystalline structures. Diamonds, as well as many semiconductors, have a difficulty in effective doping. Theoretical calculations carried out by DFT indicate that vanadium (V) is a dopant element for the n-type diamond semiconductor, and their several donor state levels are distributed between the conduction band and middle bandgap position in the V-doped band structure of diamond. Experimental investigation of doping vanadium into nanocrystalline diamond films (NDFs) was first attempted by hot filament chemical vapor deposition technique. Acetone/H₂ gas mixtures and vanadium oxytripropoxide (VO(OCH₂CH₂CH₃)₃) solutions of acetone with V and C elemental ratios of 1:5,000, 1:2,000, and 1:1,000 were used as carbon and vanadium sources, respectively. The resistivity of the V-doped NDFs decreased two orders with the increasing V/C ratios.     

Biased enhanced growth of nanocrystalline diamond films by microwave plasma chemical vapor deposition

Smooth nanocrystalline diamond thin films with rms surface roughness of ∼17 nm were grown on silicon substrates at 600°C using biased enhanced growth (BEG) in microwave plasma chemical vapor deposition (MPCVD). The evidence of nanocrystallinity, smoothness and purity was obtained by characterizing the samples with a combination of Raman spectroscopy, X-ray diffraction (XRD), atomic force microscopy and Auger electron spectroscopy. The Raman spectra of the films exhibit an intense band near 1150 cm⁻¹ along with graphitic bands. The former Raman band indicates the presence of nanocrystalline diamond. XRD patterns of the films show broad peaks corresponding to inter-planar spacing of (111) and (220) planes of cubic diamond supporting the Raman results. Auger line shapes closely match with the line shape of diamond suggesting high concentration of sp³ carbon on the surfaces of the films. The growth of dominantly sp³ carbon by BEG in the MPCVD system at the conditions used in the present work can be explained by the subsurface implantation mechanism while considering some additional effects from the high concentration of atomic hydrogen in the system.     

Low surface temperature synthesis and characterization of diamond thin films

Polycrystalline diamond films are deposited on p-type Si(100) and n-type SiC(6H) substrates at low surface deposition temperatures of 370–530 °C using a microwave plasma enhanced chemical vapor deposition (MPECVD) system. The surface temperature during deposition is monitored by an IR pyrometer capable of measuring temperature between 250 and 600 °C in a microwave environment. The lower deposition temperature is achieved by using an especially designed cooling stage. The influence of the deposition conditions on the growth rate and structure of the diamond film is investigated. A very high growth rate up to 1.3 μm/h on SiC substrate at 530 °C surface temperature is attributed to an optimized Ar-rich Ar/H₂/CH₄ gas composition, deposition pressure, and microwave power. The structure and microstructure of the films are characterized by X-ray diffraction, scanning electron microscopy, and Raman spectroscopy. A detailed stress analysis of the deposited diamond films of grain sizes between 2 and 7 μm showed a net tensile residual stress and predominantly sp³-bonded carbon in the deposited films.     

纳米晶硅多层薄膜的低温调控及其发光特性

采用单-双靶交替溅射法低温沉积了纳米晶硅多层薄膜（nc-SiO_x/a-SiO_x）,通过改变a-SiO_x势垒层的厚度和化学成分比例,实现了纳米晶硅多层薄膜的低温过程控制。透射电子显微镜（TEM）结果显示,a-SiO_x层太薄,不能有效阻断纳米硅生长,导致多层周期结构在后期沉积过程中受到破坏;增加a-SiO_x层厚度,周期性结构生长得以实现,但仍有部分纳米硅穿透a-SiO_x势垒层;傅里叶变换红外光谱（FTIR）分析表明,薄膜中的氧化反应以及活性氢对物相分离过程的促进作用均对纳米硅生长有影响。进而增加a-SiO_x层氧含量,纳米硅的纵向生长被成功阻断。在此基础上,通过调整nc-SiO_x层厚度实现了薄膜光学带隙调整和纳米硅粒度控制。光吸收谱分析显示,随nc-SiO_x层厚度的增加,薄膜光学带隙逐渐减小;光致发光谱表明,多层周期结构实现了纳米硅尺寸的调控,粒子尺寸为几个纳米的纳米硅表现出了较强的发光,发光机制为量子限制效应-缺陷态复合发光。     

Fracture mechanics of microcrystalline/nanocrystalline composited multilayer chemical vapor deposition self-standing diamond films

Though microwave plasma chemical vapor deposition (MPCVD) diamond films exhibit extraordinary strength, the toughness improvement is still a huge challenge. The catastrophic fracture of the diamond films is undesirable in many applications, especially for the application of fabricating cutting tools. In the present study, adopting the pre-notched and unnotched cantilever bending tests, fracture behaviors of monolayer microcrystalline diamond (m-M), monolayer nanocrystalline diamond (m-N), and microcrystalline/nanocrystalline composited multilayer diamond films were observed and compared. Typical fracture mechanics, including Young's modulus (E), fracture strength (${\sigma }_F$), and fracture toughness (K_IC) of different diamond films were investigated. Effects of diamond crystal structure, intrinsic stress, and tensile-side roughness were systematically analyzed. Grain size and graphite phase content dominated the E of self-standing diamond films. Tensive-side surface roughness and intergranular bonding strength affected the ${\sigma }_F$. When the growth side in tension, E of the multilayer film (modulation period Λ = 3 h) was 16.0% lower than m-M and 26.6% higher than m-N, ${\sigma }_F$ of multilayer film was 16.8% higher than m-M and 8.3% lower than m-N. At fixed Λ, doubling the total deposition period, E, ${\sigma }_F$, and K_IC of the multilayer film increased 72.3%, 22.3%, and 2.7%, respectively. MCD/NCD composited multilayer architecture presented significant strengthening and toughening effects on self-standing diamond films.     

Characterization of nanocrystalline diamond films implanted with nitrogen ions

Nanocrystalline diamond films, prepared by a microwave plasma-enhanced CVD, were implanted using 110-keV nitrogen ions under fluence ranging from 10¹⁶–10¹⁷ ions cm⁻². AFM, XRD, XPS and Raman spectroscopy were used to analyze the changes in surface structure and chemical state of the films before and after implantation. Results show that high-fluence nitrogen ions implanted in the nanocrystalline diamond film cause a decline in diamond crystallinity and a swelling of the crystal lattice; the cubic-shaped diamond grains in the film transform into similar roundish-shaped grains due to the sputtering effect of implanted nitrogen ions. Nitrogen-ion implantation changes the surface chemical state of the nanocrystalline diamond film. After high-fluence implantation, the surface of the film is completely covered by a layer of oxygen-containing groups. This phenomenon plays an importance role in the reduction of the adhesive friction between an Al₂O₃ ball and the nanocrystalline diamond film.     

Synthesis of nanocrystalline diamond films by DC plasma-assisted argon-rich hot filament chemical vapor deposition

Continuous nanocrystalline diamond (NCD) films were grown in an argon-rich gas atmosphere with relatively high growth rates by sustaining a low power (5 W) DC plasma in a hot filament chemical vapor deposition system (HFCVD). The parameter window for the synthesis of NCD films was studied as a function of argon, methane and hydrogen concentrations, as well as substrate temperature and DC bias. The results are consistent with reports indicating that the DC plasma induces re-nucleation by ion bombardment during the initial growth step and helps to maintain the atomic H and hydrocarbon species near the growing surface. It was found that DC plasma-assisted HFCVD enables high NCD growth rates and expands the parameter window, rendering it unnecessary to heat the filament above 2800 K.     

Effect of substrate temperature on the selective deposition of diamond films

Selective diamond films on roughened Si(100) substrates with patternings have been achieved by microwave plasma chemical vapor deposition (MP-CVD). The films have been characterized by scanning electron microscopy (SEM) and Raman spectra. The influence of substrate temperature on the selective deposition of diamond films has been discussed in detail: the diamond nucleation density on the SiO₂ mask increased with substrate temperature while the effect of the selective deposition of diamond films deteriorated; the optimized deposition temperature conditions have been concluded.     

Gas sensing properties of nanocrystalline diamond films

Toxic gas sensing device with metal electrodes built into nanocrystalline diamond (NCD) is investigated. The NCD morphology is controlled via seeding and/or deposition time. The surface properties and morphology of NCD are studied using scanning electron microscopy (SEM) and atomic force microscopy (AFM). AFM measurements reveal increase in NCD surface area by up to 13%. Gas sensing properties of H-terminated NCD device show high sensitivity towards oxidizing species where the surface conductivity is increased by an order of magnitude for humid air and by three orders of magnitude for COCl₂. The surface conductivity exhibits a small decrease to reducing spices (CO₂, NH₃).     

Thermal analysis of submicron nanocrystalline diamond films

The thermal properties of sub-μm nanocrystalline diamond films in the range of 0.37–1.1 μm grown by hot filament CVD, initiated by bias enhanced nucleation on a nm-thin Si-nucleation layer on various substrates, have been characterized by scanning thermal microscopy. After coalescence, the films have been outgrown with a columnar grain structure. The results indicate that even in the sub-μm range, the average thermal conductivity of these NCD films approaches 400 W m^− 1 K^− 1. By patterning the films into membranes and step-like mesas, the lateral component and the vertical component of the thermal conductivity, k_lateral and k_vertical, have been isolated showing an anisotropy between vertical conduction along the columns, with k_vertical ≈ 1000 W m^− 1 K^− 1, and a weaker lateral conduction across the columns, with k_lateral ≈ 300 W m^− 1 K^− 1.     

High compressive stress in nanocrystalline diamond films grown by microwave plasma chemical vapor deposition

Hard and smooth nanocrystalline diamond (NCD) thin films were deposited on mirror polished silicon substrates by biased enhanced growth in a microwave plasma chemical vapor deposition system. The films were characterized by Raman spectroscopy, X-ray diffraction and atomic force microscopy. Stress in the films was calculated by measuring the radius of curvature of the films on substrates and hardness was measured using a Nanoindenter. Stress in the films increases, first, with decreasing methane concentration in the gas phase while keeping biasing voltage constant, and second, with increasing biasing voltage while keeping the methane concentration constant. Observation of enormous stress (∼30 GPa) was possible in the films, which is due to strong adhesion between the films and substrates. To the best of our knowledge, this is the maximum value of stress reported so far in any kind of carbon thin films. It was hypothesized that it is mostly hydrogen content of the films in the methane series and graphitic content of the films in voltage series that are responsible in generating compressive stress in the respective films. The hardness follows almost a reverse trend than stress with the two growth parameters and can be well-defined from the relative concentration of NCD to graphitic content of the films, as estimated from Raman spectroscopy.     

Subgap photoluminescence spectroscopy of nanocrystalline diamond films

We report on the effect of ambient conditions and UV irradiation on the subgap photoluminescence of nanocrystalline diamond prepared by microwave plasma enhanced chemical vapour deposition. We measured the photoluminescence of self-supporting membranes of thickness about 290 nm with the grain size up to 40 nm under variable ambient conditions – pressure, temperature, air, nitrogen and helium atmospheres. We have found that intensity of photoluminescence of samples kept under low pressure increases during the time. The photoluminescence intensity of samples under low pressure depends on sample temperature with maximum at about 260 K. The photoluminescence increase can be enhanced substantially by UV irradiation (325 nm) of the sample under certain conditions: temperature greater than ~ 280 K, low pressure of ambient atmosphere. We interpret the experimental results in terms of desorption of water molecules and their interaction with the of individual diamond nanocrystals in the membrane.