Highly reliable, fine pitch chip on glass (COG) joints fabricated using Sn/Cu bumps and non-conductive adhesives

We have developed a reliable and ultra-fine pitch chip on glass (COG) bonding technique using Sn/Cu bumps and non-conductive adhesive (NCA). Sn/Cu bumps were formed by electroplating and reflowed, forming dome shaped Sn bumps on Cu columns. COG bonding was performed between the reflowed Sn/Cu bumps on the oxidized Si wafer and ITO/Au/Cu/Ti/glass substrate using a thermo-compression bonder. Three different NCAs were applied during bonding. Bonding temperature was 150 °C for NCA-A and NCA-B, and 110 °C for NCA-C. The electrical properties of COG joints were evaluated by measuring the contact resistance of each joint through the four-point probe method. All joints were successfully bonded and the electrical measurement showed that the average contact resistance of each joint was approximately 30 mΩ, regardless of NCA types. The COG joints were subjected to a series of reliability tests: high temperature storage test (85 °C, 160 h); thermal cycling test (−40 °C/+85 °C, 20 cycle); and a temperature and humidity test (50 °C/90%, 160 h) were sequentially performed to evaluate the reliability of the COG joints. The contact resistance measurement showed that there were no failed bumps in all specimens and all joints passed the criterion after reliability test.     

Anisotropic conductive adhesives with enhanced thermal conductivity for flip chip applications

This paper presents the development of new anisotropic conductive adhesives (ACAs) with enhanced thermal conductivity for improved reliability of adhesive flip chip assembly under high current density condition. As the bump size in the flip chip assembly is reduced, the current density through the bump also increases. This increased current density causes new failure mechanisms, such as interface degradation due to intermetallic compound formation and adhesive swelling resulting from high current stressing. This process is found especially in high current density interconnection in which the high junction temperature enhances such failure mechanisms. Therefore, it is necessary for the ACA to become a thermal transfer medium that allows the board to act as a new heat sink for the flip chip package and improve the lifetime of the ACA flip chip joint. We developed the thermally conductive ACA of 0.63 W/m·K thermal conductivity by using a formulation incorporating the 5-μm Ni-filled and 0.2-μm SiC-filled epoxy-based binder system. The current carrying capability and the electrical reliability under the current stressing condition for the thermally conductive ACA flip chip joints were improved in comparison to conventional ACA. This improvement was attributed to the effective heat dissipation from Au stud bumps/ACA/PCB pad structure by the thermally conductive ACA.     

Dynamic strength of anisotropic conductive joints in flip chip on glass and flip chip on flex packages

The work presented in this paper focuses on the behavior of anisotropically conductive film (ACF) joint under the dynamic loading of flip chip on glass (COG) and flip chip on flexible (COF) substrate packages. Impact tests were performed to investigate the key factors that affect the adhesion strength. Scanning electron microscopy (SEM) was used to evaluate the fractography characteristics of the fracture. Impact strength increased with the bonding temperature, but after a certain temperature, it decreased. Good absorption and higher degree of curing at higher bonding temperature accounts for the increase of the adhesion strength, while too high temperature causes overcuring of ACF and degradation at ACF/substrate interface––thus decreases the adhesion strength. Higher extent of air bubbles was found at the ACF/substrate interface of the sample bonded at the higher temperature. These air bubbles reduce the actual contact area and hence reduce the impact strength. Although bonding pressure was not found to influence the impact strength significantly, it is still important for a reliable electrical interconnect. The behaviors of the conductive particles during impact loading were also studied. From the fracture mode study, it was found that impact load caused fracture to propagate in the ACF/substrate interface (for COG packages), and in the ACF matrix (for COF packages). Because of weak interaction of the ACF with the glass, COG showed poor impact adhesion.     

Characteristics of solderable electrically conductive adhesives (ECAs) for electronic packaging

This study investigated the effect of the viscosity of the ECAs using a low-melting-point alloy (LMPA) filler on its bonding characteristics. The curing behaviors of the ECAs were determined using Differential Scanning Calorimetry (DSC), and ECA temperature-dependant viscosity characteristics were observed using a torsional parallel rheometer. The wetting test was conducted to investigate the reduction capability of ECAs and the flow-coalescence-wetting behavior of the LMPAs in ECAs. Electrical and mechanical properties were determined and compared to those with commercial ECAs and eutectic tin/lead (Sn/Pb) solder. In the metallurgically interconnected Quad Flat Package (QFP) joint, a typical scallop-type Cu–Sn intermetallic compound (IMC) layer formed at the upper SnBi/Cu interface after curing process. On the other hand, a (Cu, Ni)₆Sn₅ IMC layer formed on the SnBi/ENIG interface. In addition, the fracture surface exhibited by cleavage fracture mode and the fracture was propagated along the Cu–Sn IMC/SnBi interface. The extremely low-level viscosity of ECAs had a significant influence on the flow-coalescence-wetting behavior of the LMPAs in ECAs and also on the interconnection properties. Stable interconnected assemblies showed good electrical and mechanical properties.     

Bump formation for flip chip and CSP by solder paste printing

Area array packages (flip chip, CSP and BGA) require the formation of bumps for the board assembly. Since the established bumping methods need expensive equipment or are limited by the throughput, minimal pitch and yield the industry is currently searching for new and lower cost bumping approaches. In this paper the experimental work of stencil printing to create solder bumps for flip chip and wafer level CSP (CSP-WL) is described in detail.This paper is divided into two parts. In the first part of the paper a low cost wafer bumping process for flip chip applications will be studied in particular. The process is based on an electroless Nickel under bump metallization and solder bumping by stencil printing. The experimental results for this technology will be presented and the limits concerning pitch, reproducibility and bump height will be discussed in detail. The second part of the paper is focused on solder paste printing for wafer-level CSPs. In order to achieve large bumps an optimized printing method will be presented. Additionally advanced stencil design will be shown and the achieved results will be compared with conventional methods.     

Material properties of anisotropic conductive films (ACFs) and their flip chip assembly reliability in NAND flash memory applications

In this paper, the material properties of anisotropic conductive films (ACFs) and ACF flip chip assembly reliability for a NAND flash memory application were investigated. Measurements were taken on the curing behaviors, the coefficient of thermal expansion (CTE), the modulus, the glass transition temperature (T_g), and the die adhesion strength of six types of ACF. Furthermore, the bonding processes of the ACFs were optimized. After the ACF flip chip assemblies were fabricated with optimized bonding processes, reliability tests were then carried out. In the pressure cooker test, the ACF with the highest adhesion strength showed the best reliability and the ACF flip chip assembly revealed no delamination at the chip-ACF interface, even after 96 h. In the high temperature storage test and the thermal cycling test, the reliability of the ACF flip chip assembly strongly depends on the T_g value of the ACF. In the thermal cycling test, in particular, which gives ACF flip chip assemblies repetitive shear stress, high value of CTE above T_g accelerates the failure rate of the ACF flip chip assembly. From the reliability test results, ACFs with a high T_g and a low CTE are preferable for enhancing the thermal and thermo-mechanical reliability. In addition, a new double-sided chip package with a thickness of 570 μm was demonstrated for NAND flash memory application. In conclusion, this study verifies the ACF feasibility, and recommends the optimum ACF material properties, for NAND flash memory application.     

Processability and reliability of nonconductive adhesives (NCAs) in fine-pitch chip-on-flex applications

The use of NCAs to form direct contact interconnections between chip bumps and substrate pads have become a viable option in interconnection technology for fine-pitch applications. However, the primary concerns with NCAs are their long-term reliability, stability, and consistent electrical performance in particulate interconnections. Results of assembly process studies and environmental testing using NCAs on flexible substrates are analyzed and discussed herein. An extensive design experiment was performed to determine which process parameters were critical in obtaining good electrical connections. A reliability evaluation of NCAs for flexible substrate applications was carried out to gain more insight into the failure mechanisms of this type of interconnect. Pressure cooker test results showed that failures occurring in NCA joints are primarily due to moisture absorption, which could lead to interfacial delamination at the substrate/adhesive interface, accompanied by hygroscopic swelling. NCAs with lower coefficients of thermal expansion also exhibited better contact resistance stability during high-temperature storage tests.     

The effect of reflow process on the contact resistance and reliability of anisotropic conductive film interconnection for flip chip on flex applications

The work presented in this paper focuses on the effect of reflow process on the contact resistance and reliability of anisotropic conductive film (ACF) interconnection. The contact resistance of ACF interconnection increases after reflow process due to the decrease in contact area of the conducting particles between the mating I/O pads. However, the relationship between the contact resistance and bonding parameters of the ACF interconnection with reflow treatment follows the similar trend to that of the as-bonded (i.e. without reflow) ACF interconnection. The contact resistance increases as the peak temperature of reflow profile increases. Nearly 40% of the joints were found to be open after reflow with 260 °C peak temperature. During the reflow process, the entrapped (between the chip and substrate) adhesive matrix tries to expand much more than the tiny conductive particles because of the higher coefficient of thermal expansion, the induced thermal stress will try to lift the bump from the pad and decrease the contact area of the conductive path and eventually, leading to a complete loss of electrical contact. In addition, the environmental effect on contact resistance such as high temperature/humidity aging test was also investigated. Compared with the ACF interconnections with Ni/Au bump, higher thermal stress in the Z-direction is accumulated in the ACF interconnections with Au bump during the reflow process owing to the higher bump height, thus greater loss of contact area between the particles and I/O pads leads to an increase of contact resistance and poorer reliability after reflow.     

The effects of functionalized graphene nanosheets on the thermal and mechanical properties of epoxy composites for anisotropic conductive adhesives (ACAs)

Functionalized graphene/epoxy composites were prepared using the epoxy resin diglycidyl ether of bisphenol A. Graphene oxide (GO) and Al(OH)₃-coated graphene (Al-GO) fillers were fabricated using the Hummers method and a simple sol–gel method, with aluminum isopropoxide as the aluminum precursor. X-ray photoelectron spectroscopy verified the successful formation of functional groups onto the GO and Al-GO. The dispersion of functionalized graphene fillers showed an even distribution within the epoxy resins. A dynamic mechanical analysis was used to investigate the changes in the mechanical properties of the epoxy composites, which included neat epoxy and epoxy with various concentrations of graphene-based fillers. The storage modulus and tan δ graphs illustrate the enhancement achieved by increasing the amount of filler. The composite with 3 wt.% GO had the highest storage modulus and glass transition temperature. The thermal conductivities of the composites with graphene-based fillers were enhanced compared to those without fillers. The 3 wt.% GO/epoxy composite had the highest thermal conductivity, which was nearly twice that of the neat epoxy resin.     

Influence of multi-walled carbon nanotube (MWCNT) concentration on the thermo-mechanical reliability properties of solderable anisotropic conductive adhesives (SACAs)

In the present work, the influence of multi-walled carbon nanotube (MWCNT) concentration on the thermo-mechanical reliability properties of carbon nanotube (CNT)-filled solderable anisotropic conductive adhesives (SACAs) containing low-melting-point-alloy (LMPA) fillers was investigated. To measure the reliability-related properties of SACA assemblies, six types of SACAs with different MWCNT concentrations (from 0 to 2 wt%) were formulated, and two types of reliability tests, thermal shock (TS) and high-temperature and high-humidity (HTHH) tests, were conducted on these samples. All of the CNT-filled SACA assemblies with different MWCNT concentrations showed proper and stable electrical reliability during each aging test, due to the molten LMPA fillers forming a metallurgical interconnection between the corresponding metallization regions. Although the mechanical strength of the CNT-filled SACA joints degraded after aging tests due to excessive intermetallic compound (IMC) layer growth, the CNT-filled SACAs with an MWCNT concentration below 0.1 wt% exhibited better mechanical reliability properties than those of SACAs without MWCNTs due to the initially achieved high bonding strength of the SACA joints, enabled by the reinforcing effects of the MWCNTs within the polymer composites.     

Adherence of self-assembled monolayers on gold and their effects for high-performance anisotropic conductive adhesives

To improve the electrical property of the anisotropic conductive adhesive (ACA) joints, self-assembled monolayer (SAM) compounds are introduced into the interface between the metal filler and the substrate bond pad. The formation of the SAM on gold and the thermal stability were investigated by measuring the contact angles of SAM compounds with a hydrophilic or hydrophobic tail groups such as octadecanethiol (ODT), mercpatoacetic acid (MAA), and 1,4-benzenedithiol (dithiol) on the Au surface. Epoxy resins with two different curing temperatures were used as polymer matrices of the ACA formulations. The SAM-treated ACA joints showed much lower resistance at the same applied current than nontreated joints, and the effect on the low curing temperature epoxy matrices was more significant.     

Effects of bonding temperature on the properties and reliabilities of anisotropic conductive films (ACFs) for flip chip on organic substrate application

The effects of bonding temperatures on the composite properties and reliability performances of anisotropic conductive films (ACFs) for flip chip on organic substrates assemblies were studied. As the bonding temperature decreased, the composite properties of ACF, such as water absorption, glass transition temperature (T_g), elastic modulus (E′) and coefficient of thermal expansion (α), were improved. These results were due to the difference in network structures of cured ACFs which were fully cured at different temperatures. From small angle X-ray scattering (SAXS) test result, ACFs cured at lower temperature, had denser network structures. The reliability performances of flip chip on organic substrate assemblies using ACFs were also investigated as a function of bonding temperatures. The results in thermal cycling test (−55 °C/+150 °C, 1000 cycles) and PCT (121 °C, 100% RH, 96 h) showed that the lower bonding temperature resulted in better reliability of the flip chip interconnects using ACFs. Therefore, the composite properties of cured ACF and reliability of flip chip on organic substrate assemblies using ACFs were strongly affected by the bonding temperature.     

A study on thermal cycling (T/C) reliability of anisotropic conductive film (ACF) flip chip assembly for thin chip-on-board (COB) packages

In this work, thermal cycling (T/C) reliability of anisotropic conductive film (ACF) flip chip assemblies having various chip and substrate thicknesses for thin chip-on-board (COB) packages were investigated. In order to analyze T/C reliability, shear strains of six flip chip assemblies were calculated using Suhir’s model. In addition, correlation of shear strain with die warpage was attempted.The thicknesses of the chips used were 180 μm and 480 μm. The thicknesses of the substrates were 120, 550, and 980 μm. Thus, six combinations of flip chip assemblies were prepared for the T/C reliability test. During the T/C reliability test, the 180 μm thick chip assemblies showed more stable contact resistance changes than the 480 μm thick chip assemblies did for all three substrates. The 550 μm thick substrate assemblies, which had the lowest CTE among three substrates, showed the best T/C reliability performance for a given chip thickness.In order to investigate what the T/C reliability performance results from, die warpages of six assemblies were measured using Twyman–Green interferometry. In addition, shear strains of the flip chip assemblies were calculated using measured material properties of ACF and substrates through Suhir’s 2-D model. T/C reliability of the flip chip assemblies was independent of die warpages; it was, however, in proportion to calculated shear strain. The result was closely related with material properties of the substrates. The T/C reliability of the ACF flip chip assemblies was concluded to be dominatingly dependent on the induced shear strains of ACF layers.     

Interconnection of multichannel polyimide electrodes using anisotropic conductive films (ACFs) for biomedical applications

In this paper, we propose a method for interconnecting soft polyimide (PI) electrodes using anisotropic conductive films (ACFs). Reliable and automated bonding was achieved through development of a desktop thermocompressive bonding device that could simultaneously deliver appropriate temperatures and pressures to the interconnection area. The bonding conditions were optimized by changing the bonding temperature and bonding pressure. The electrical properties were characterized by measuring the contact resistance of the ACF bonding area, yielding a measure that was used to optimize the applied pressure and temperature. The optimal conditions consisted of applying a pressure of 4 kg f/cm(2) and a temperature of 180 °C for 20 s. Although ACF base bonding is widely used in industry (e.g., liquid crystal display manufacturing), this study constitutes the first trial of a biomedical application. We performed a preliminary in vivo biocompatibility investigation of ACF bonded area. Using the optimized temperature and pressure conditions, we interconnected a 40-channel PI multielectrode device for measuring electroencephalography (EEG) signals from the skulls of mice. The electrical properties of electrode were characterized by measuring the impedance. Finally, EEG signals were measured from the mice skulls using the fabricated devices to investigate suitability for application to biomedical devices.     

Dispersion, hybrid interconnection and heat dissipation properties of functionalized carbon nanotubes in epoxy composites for electrically conductive adhesives (ECAs)

Different types of MWNTs/epoxy composites were prepared with diglycidyl ether of bisphenol F (DGEBF) and bisphenol A (DGEBA) used as epoxy resins. MWNTs were functionalized to enhance the properties of epoxy composites by treatment with strong acids (acid-treated MWNTs, a-MWNTs) followed by m-phenylenediamine grafting (amine grafted MWNTs, m-MWNTs). Raw, a-, and m-MWNTs were dispersed in DGEBF or DGEBA to a concentration of 1 wt.%. X-ray photoelectron spectroscopy and thermogravimetric analysis verified the effectiveness of acid treatment and confirmed the amine-functionalization of the MWNTs. Scanning electron microscopy of the fracture surface of the epoxy matrix showed that chemical functionalization improves compatibility between the epoxy and MWNTs. Good dispersion of MWNTs leads to the improvement in coalescence and pull strength in the quad flat package (QFP) test. Further, the thermal conductivity of MWNTs/epoxy composites was higher than that of pure epoxy resins. In particular, the m-MWNT/epoxy composite has the best heat dissipation properties, due to the formation of an effective network for heat flow.     

Chip on chip (COC) and chip on board (COB) assembly on flex rigidprinted circuit assemblies

The move to highly populated printed wire assemblies and smaller sized end user products has led to the more common use of flex rigid substrates or the use of flexible substrates. The material most commonly used for the manufacture of flex-rigid and flexible substrates is a polyimide-based resin. This paper details the issues in the mass manufacture of a chip on chip (COC) and chip on board (COB) hybrid on a flex-rigid and flexible substrate, using polyimide as the base material. The paper lists design, process and manufacturing considerations which effects the long term reliability and the yield of the product during the course of the manufacturing process, as well as its useful life     

Filler size and content effects on the composite properties of anisotropic conductive films (ACFs) and reliability of flip chip assembly using ACFs

Flip chip assembly on organic board using anisotropic conductive films (ACFs) is gained more attention because of its many advantages. But to obtain more reliable flip chip assembly, it is necessary to have low coefficient of thermal expansion (CTE) value of ACFs. To control the CTE of ACF materials, non-conductive silica fillers were incorporated into ACFs. The effect of non-conductive silica filler content and size on cure kinetics and thermo-mechanical properties of ACFs was studied. Furthermore, filler content and size effects on reliability of flip chip assembly using ACFs were also investigated. In accordance with increasing filler content, curing peak temperature and storage modulus (E′) increased. But CTE decreased as the filler content increased. The effect of filler size on composite properties and assembly reliability showed similar tendency with the filler content effect. The smaller filler size was applied, the better composite properties and reliability were obtained. Conclusively, incorporation of non-conductive fillers, particularly in case of smaller size and higher content, in ACFs improves the material properties significantly, and as a result, flip chip assembly using ACFs is resulted in better reliability.     

聚(N-烷基苯胺)膜的制备技术及性能与应用

综述了聚(N-烷基苯胺)及其共聚物和聚(N-烷基磺酸基苯胺)的成膜方法、膜性能及其应用。指出在聚苯胺的N-位上引入烷基、烷基磺酸基等取代基,不仅可以有效地改善聚苯胺的溶解性能,使聚合物成膜简便易行,而且能显示更多的特异性能,如广泛pH范围的性能稳定性,弱酸性介质中的防腐性,臭氧及有机蒸气等气体敏感性等。在金属防腐涂料、场效应管、二次电池、电致变色器件等领域,显示出广阔的应用前景。     

New conductive thick-film paste based on silver nanopowder for high power and high temperature applications

A new thick-film material for screen-printing technology, based on nanoscale silver powders with the particle size distribution 5-55 nm is presented. Silver nanopowder used for paste preparation was elaborated by the authors. The compatibility of investigated paste was proven with alumina, silicon, Kapton foil and glass. The main advantage of this paste is sinterability at much lower temperatures (around 300 °C) compared to pastes obtained from micro-powders (650-850 °C). The thicknesses of obtained layers are 2-3 μm. The elaborated layers are dense and well sintered, exhibit good adhesion to all above mentioned substrates and low resistivity as well as very good resistance to high power and elevated temperatures. The results of loading the layers deposited on alumina substrates with high current and exposed to high temperature are presented as well.