Room-temperature 2.81-/spl mu/m continuous-wave operation of GaInAsSb-AlGaAsSb laser

GaInAsSb-AlGaAsSb multiple quantum-well (QW) lasers with an emission wavelength of 2.81 /spl mu/m are reported. The ridge waveguide lasers with highly strained QWs show continuous-wave laser emission up to 25/spl deg/C; in pulsed mode, the lasers operate up to 60/spl deg/C. For pulsed operation, a threshold current density of 360 A/cm/sup 2/ is found for devices with 30-/spl mu/m stripe width and 2-mm cavity length at room temperature. A low threshold current density at infinite length of 248 A/cm/sup 2/ is derived.     

Single-frequency 1310-nm AlGaInAs-InP grating-outcoupled surface-emitting lasers

Single-frequency 1310-nm grating-outcoupled surface-emitting (GSE) semiconductor lasers with output slope efficiencies exceeding 0.1 mW/mA into multimode fibers, threshold currents below 22 mA, and >30-dB sidemode suppression ratios are reported. These GSE lasers consist of 500-/spl mu/m-long active ridges that excite one end of surface-emitting second-order outcoupling gratings with 200-/spl mu/m-long first-order distributed Bragg reflector gratings terminating the laser cavities at both ends. The grating outcouplers range from 10 to 50 /spl mu/m in length. These lasers have an open eye pattern for nonreturn-to-zero signals at 2.5 Gb/s into single-mode fibers. The full-width half-maximum far-field beam divergences range from 1.5/spl deg/ /spl times/ 8/spl deg/ to 5/spl deg/ /spl times/ 8/spl deg/.     

Comprehensive above-threshold analysis of antiresonant reflecting optical waveguide edge-emitting diode laser

A three-dimensional (3-D) above-threshold analysis has been performed for laterally antiguided laser structures of the antiresonant-reflecting-optical-waveguide type, of relatively large core width (/spl sim/ 10 /spl mu/m), for high-power, single-spatial-mode operation. A 3-D numerical code has been developed, which takes into account carrier diffusion in the quantum well as well as edge radiation losses. The laser characteristics are calculated as functions of the above-threshold drive level. Within the simulation, 3-5 higher order optical modes on a "frozen background" are computed by the Arnoldi algorithm. Because of the nonuniform gain saturation of the lasing mode, the modal gains for higher order modes increase with the drive current due to increasing overlap of their fields with the two-dimensional gain distribution. The onset of threshold for higher order modes puts an upper limit on the range for stable single-mode operation. The above-threshold analysis is done for various values of the width of the reflector region, below and above the lateral-antiresonance condition. It is found that the maximum intermodal discrimination, which in turn provides the maximum single-mode power, is obtained when the reflector-region width is /spl sim/25 % larger that its value at antiresonance. Then, for 10-/spl mu/m-core devices, stable, single-mode operation is found to occur to drive levels as high as 41 /spl times/ threshold, with single-mode output powers as high as 1.45 W.     

A new method for pHEMT noise-parameter determination based on 50-/spl Omega/ noise measurement system

A new method for determining the four noise parameters of pseudomorphic high electron-mobility transistors (pHEMTs) based on a 50-/spl Omega/ noise measurement system without a microwave tuner is presented. The noise parameters are determined based on the noise correlation matrix technique by fitting the measured noise figure of the active device. On-wafer experimental verification up to 26 GHz is presented and a comparison with a tuner-based method is given. The scaling rules for noise parameters have also been determined. Good agreement is obtained between simulated and measured results for 2/spl times/20 /spl mu/m, 2/spl times/40 /spl mu/m, and 2/spl times/60 /spl mu/m gatewidth (number of gate fingers /spl times/ unit gatewidth) 0.25-/spl mu/m double-heterojunction /spl delta/-doped pHEMTs.     

InP-based 1.3-1.6-/spl mu/m VCSELs with selectively etched tunnel-junction apertures on a wavelength flexible platform

In this letter, the authors demonstrate a wavelength flexible platform for the production of long-wavelength vertical-cavity surface-emitting lasers which provide full wavelength coverage from 1.3-1.6 /spl mu/m. All-epitaxial InP-based devices with AsSb-based distributed Bragg reflectors were achieved through a common design, process, and growth technology at both the important telecommunications wavelengths of 1.3 and 1.5 /spl mu/m. Thin selectively etched tunnel junctions were implemented as low-loss apertures and offer scalability to small device dimensions. Devices showed low threshold currents (<2 mA), near single-mode (SMSR>20 dB) operation, and high differential efficiency (>40% at 1.3 /spl mu/m and >25% at 1.5 /spl mu/m).     

Low-threshold continuous-wave 1.5-/spl mu/m GaInNAsSb lasers grown on GaAs

We present the first continuous-wave (CW) edge-emitting lasers at 1.5 /spl mu/m grown on GaAs by molecular beam epitaxy (MBE). These single quantum well (QW) devices show dramatic improvement in all areas of device performance as compared to previous reports. CW output powers as high as 140 mW (both facets) were obtained from 20 /spl mu/m /spl times/ 2450 /spl mu/m ridge-waveguide lasers possessing a threshold current density of 1.06 kA/cm/sup 2/, external quantum efficiency of 31%, and characteristic temperature T/sub 0/ of 139 K from 10/spl deg/C-60/spl deg/C. The lasing wavelength shifted 0.58 nm/K, resulting in CW laser action at 1.52 /spl mu/m at 70/spl deg/C. This is the first report of CW GaAs-based laser operation beyond 1.5 /spl mu/m. Evidence of Auger recombination and intervalence band absorption was found over the range of operation and prevented CW operation above 70/spl deg/C. Maximum CW output power was limited by insufficient thermal heatsinking; however, devices with a highly reflective (HR) coating applied to one facet produced 707 mW of pulsed output power limited by the laser driver. Similar CW output powers are expected with more sophisticated packaging and further optimization of the gain region. It is expected that such lasers will find application in next-generation optical networks as pump lasers for Raman amplifiers or doped fiber amplifiers, and could displace InP-based lasers for applications from 1.2 to 1.6 /spl mu/m.     

Arrays of AC-excited, silicon microdischarge devices as large as 40 000 (200/spl times/200) pixels: electrical and optical characteristics for operation in neon

Electrical characteristics of arrays of (50 /spl mu/m)/sup 2/ Si microplasma devices operating in 500-900 Torr of Ne are presented. Arrays as large as 200/spl times/200 pixels have been AC-excited at frequencies of 5-20 kHz and all exhibit reproducible ignition voltages and lifetimes. At 700 Torr, the power consumed per pixel for a 200/spl times/200 pixel array is 85/spl plusmn/2 /spl mu/W, 190/spl plusmn/2 /spl mu/W, and 290/spl plusmn/2 /spl mu/W for excitation frequencies of 5, 10, and 15 kHz, respectively, and 5.5, 12.0, and 17.8 mA, respectively, of total current (RMS) drawn by the array.     

Damping-limited modulation bandwidths up to 40 GHz in undoped short-cavity In/sub 0.35/Ga/sub 0.65/As-GaAs multiple-quantum-well lasers

We demonstrate record direct modulation bandwidths from MBE-grown In/sub 0.35/Ga/sub 0.65/As-GaAs multiple-quantum-well lasers with undoped active regions and with the upper and lower cladding layers grown at different growth temperatures. Short-cavity ridge waveguide lasers achieve CW direct modulation bandwidths up to 40 GHz for 6/spl times/130 /spl mu/m/sup 2/ devices at a bias current of 155 mA, which is the damping limit for this structure. We further demonstrate large-signal digital modulation up to 20 Gb/s (limited by the measurement setup) and linewidth enhancement factors of 1.4 at the lasing wavelength at threshold of /spl sim/1.1 /spl mu/m for these devices.     

Continuous-wave operation of GaInAsSb-GaSb type-II ridge waveguide lasers emitting at 2.8 /spl mu/m

We have realized compressively strained GaInAsSb-GaSb type-II double quantum-well lasers with an emission wavelength of 2.8 /spl mu/m. Using broad area devices, an internal absorption of 9.8 cm/sup -1/ and an internal quantum efficiency of 0.57 is determined. For the increase of the threshold current with temperature, a T/sub 0/ of 44 K is obtained. Narrow ridge waveguide lasers show continuous-wave laser operation at temperatures up to 45 /spl deg/C, with room-temperature (RT) threshold current of 37 mA. At RT, the maximum optical output power per facet of an uncoated 800/spl times/7 /spl mu/m/sup 2/ ridge waveguide laser exceeds 8 mW.     

Room-temperature continuous-wave operation of GaInNAsSb laser diodes at 1.55 /spl mu/m

The first 1.55 /spl mu/m room-temperature continuous-wave (CW) operation of GaAs-based laser diodes utilising GaInNAsSb/GaNAs double quantum well active regions grown by molecular beam epitaxy is reported. In electrically-pumped CW operation the narrow ridge waveguide devices have a room temperature lasing wavelength of 1550 nm near threshold, increasing to 1553 nm at thermal rollover. The CW threshold current was 132 mA for a 3/spl times/589 /spl mu/m device, with a characteristic temperature of 83 K, measured in pulsed mode between 20 and 70/spl deg/C.     

Low threshold high-power room-temperature continuous-wave operation diode laser emitting at 2.26 /spl mu/m

Diode lasers emitting at 2.26 /spl mu/m, based on the InGaAsSb-AlGaAsSb materials system, are reported. These devices exhibit high internal quantum efficiency of 78% and low threshold current density of 184.5 A/cm/sup 2/ for a 2-mm-long cavity. Output power up to 700 mW (/spl ap/550 mW) has been obtained at 280 K (300 K) in continuous-wave operation with 100 /spl mu/m/spl times/1 mm lasers. These devices have been coated with an antireflection on the output facet and are mounted epilayer down on a copper block. The working temperature was maintained by a thermoelectric Peltier cooling element.     

0.85-/spl mu/m vertical-cavity surface-emitting laser diode arrays grown on p-type GaAs substrate

We have fabricated the first room-temperature (RT) continuous-wave (CW) 0.85-/spl mu/m 8/spl times/8 bottom-emitting vertical-cavity surface-emitting AlGaAs-GaAs DBR QW laser diode (VCSEL) arrays on a p-type GaAs substrate, which are applicable to optical interconnection. The laser characteristics are slightly inferior to those of VCSEL arrays made on n-type GaAs substrate with the same reflectivity, but exhibit for better array uniformity of threshold current density than previously reported. Such devices are applicable to N-MOS integration.     

Ridge-width dependence on high-temperature continuous-wave quantum-cascade laser operation

We report continuous-wave (CW) operation of quantum-cascade lasers (/spl lambda/=6 /spl mu/m) up to a temperature of 313 K (40/spl deg/C). The maximum CW optical output powers range from 212 mW at 288 K to 22 mW at 313 K and are achieved with threshold current densities of 2.21 and 3.11 kA/cm/sup 2/, respectively, for a high-reflectivity-coated 12-/spl mu/m-wide and 2-mm-long laser. At room temperature (298 K), the power output is 145 mW at 0.87 A, corresponding to a power conversion efficiency of 1.68%. The maximum CW operating temperature of double-channel ridge waveguide lasers mounted epilayer-up on copper heatsinks is analyzed in terms of the ridge width, which is varied between 12 and 40 /spl mu/m. A clear trend of improved performance is observed as the ridge narrows.     

Low-threshold operation of 1.34-/spl mu/m GaInNAs VCSEL grown by MOVPE

Low-threshold operation was demonstrated for a 1.34-/spl mu/m vertical-cavity surface-emitting laser (VCSEL) with GaInNAs quantum wells (QWs) grown by metal-organic vapor-phase epitaxy. Optimizing the growth conditions and QW structure of the GaInNAs active layers resulted in edge-emitting lasers that oscillated with low threshold current densities of 0.87 kA/cm/sup 2/ at 1.34 /spl mu/m and 1.1 kA/cm/sup 2/ at 1.38 /spl mu/m, respectively. The VCSEL had a low threshold current of 2.8 mA and a lasing wavelength of 1.342 /spl mu/m at room temperature and operated up to 60/spl deg/C.     

Long-wavelength monolithic VCSEL arrays with high optical output power

Two-dimensional vertical-cavity surface-emitting laser (VCSEL) arrays at 1.55 /spl mu/m wavelength with parallel operation of single- or multimode devices are presented. 3/spl times/3 VCSEL arrays show maximum output powers beyond 30 mW and conversion efficiencies as high as 22%.     

Asymmetric broad waveguide diode lasers (/spl lambda/ = 980 nm) of large equivalent transverse spot size and low temperature sensitivity

980-nm InGaAs-InGaAsP diode lasers of asymmetric broad-waveguide (BW) transverse structure are demonstrated. Single-transverse-mode devices have equivalent (transverse) spot sizes of 0.8 /spl mu/m (i.e., significantly larger than for symmetric BW structures), which are obtained at no price in device-parameter temperature sensitivity. Built-in discrimination against the first-order transverse mode allows fundamental-transverse-mode operation in relatively narrow beams (/spl theta//sub /spl perp// = 34/spl deg/). For 2-mm-long 100-/spl mu/m-wide-stripe uncoated devices with double-quantum-well active regions, the threshold-current density is as low as 190 A/cm/sup 2/, while the characteristic temperatures for the threshold-current density T/sub 0/, and the external differential quantum efficiency T/sub 1/ are high: 183 K and 650 K, respectively.     

High-performance nonhydrogenated nickel-induced laterally crystallized P-channel poly-Si TFTs

High-performance nickel-induced laterally crystallized (NILC) p-channel poly-Si thin-film transistors (TFTs) have been fabricated without hydrogenation. Two different thickness of Ni seed layers are selected to make high-performance p-type TFTs. A very thin seed layer (e.g., 5 /spl Aring/) leads to marginally better performance in terms of transconductance (Gm) and threshold voltage (V/sub th/) than the case of a 60 /spl Aring/ Ni seed layer. However, the p-type poly-Si TFTs crystallized by the very thin Ni seeding result in more variation in both V/sub th/ and G/sub m/ from transistor to transistor. It is believed that differences in the number of laterally grown polycrystalline grains along the channel cause the variation seen between 5 /spl Aring/ NILC TFTs compared to 60-/spl Aring/ NILC TFTs. The 60 /spl Aring/ NILC nonhydrogenated TFTs show consistent high performance, i.e., typical electrical characteristics have a linear field-effect hole mobility of 156 cm/sup 2//V-S, subthreshold swing of 0.16 V/dec, V/sub th/ of -2.2 V, on-off ratio of >10/sup 8/, and off-current of <1/spl times/10/sup -14/ A//spl mu/m when V/sub d/ equals -0.1 V.     

High-speed low-power logic ICs using quasi-normally-off GaAs MESFETs

A digital approach, called `low pinchoff-voltage FET logic' (LPFL), is proposed for high-speed LSI circuit applications. It makes use of `quasi-normally-off' GaAs MESFETs, i.e., Schottky-gate devices operating in enhancement model with a pinchoff-voltage ranging between -0.2 and +0.2 V. Such a V/SUB P/ range is about twice that tolerated by conventional normally-off circuits and thus higher fabrication yields can be routinely achieved. Performances which can be achieved with this approach have been tested by means of a single-clocked frequency divider circuit fabricated with MESFETs of 1 /spl mu/m/spl times/20 /spl mu/m gate geometry.     

Characterization of the temperature sensitivity of gain and recombination mechanisms in 1.3-/spl mu/m AlGaInAs MQW lasers

The potential of 1.3-/spl mu/m AlGaInAs multiple quantum-well (MQW) laser diodes for uncooled operation in high-speed optical communication systems is experimentally evaluated by characterizing the temperature dependence of key parameters such as the threshold current, transparency current density, optical gain and carrier lifetime. Detailed measurements performed in the 20/spl deg/C-100/spl deg/C temperature range indicate a localized T/sub 0/ value of 68 K at 98/spl deg/C for a device with a 2.8 /spl mu/m ridge width and 700-/spl mu/m cavity length. The transparency current density is measured for temperatures from 20/spl deg/C to 60/spl deg/C and found to increase at a rate of 7.7 A/spl middot/cm/sup -2//spl middot/ /spl deg/C/sup -1/. Optical gain characterizations show that the peak modal gain at threshold is independent of temperature, whereas the differential gain decreases linearly with temperature at a rate of 3/spl times/10/sup -4/ A/sup -1//spl middot//spl deg/C/sup -1/. The differential carrier lifetime is determined from electrical impedance measurements and found to decrease with temperature. From the measured carrier lifetime we derive the monomolecular ( A), radiative (B), and nonradiative Auger (C) recombination coefficients and determine their temperature dependence in the 20/spl deg/C-80/spl deg/C range. Our study shows that A is temperature independent, B decreases with temperature, and C exhibits a less pronounced increase with temperature. The experimental observations are discussed and compared with theoretical predictions and measurements performed on other material systems.     

Design for high-power single-mode operation from 2-D surface-emitting ROW-DFB lasers

Stable single-mode single-lobe operation to high powers is predicted for two-dimensional surface-emitting lasers, if second-order distributed feedback/distributed Bragg reflector (DFB/DBR) gratings are preferentially placed in the elements of a resonant-optical-waveguide array. Beside their usual functions (i.e., feedback and outcoupling), the gratings act as an effective array-mode selector due to different interaction with the gratings of different array modes. The in-phase array mode is strongly favored to lase around its (lateral) resonance due to better field overlap with DFB region and lower interelement absorption loss than for nonresonant array modes. For 20-element arrays with 700/600 /spl mu/m DFB/DBR gratings, emitting at /spl lambda/=0.98 /spl mu/m, high (/spl sim/100 A/cm/sup 2/) intermodal discrimination /spl Delta/J/sub th/ is obtained. /spl Delta/J/sub th/ is enhanced to /spl sim/225 A/cm/sup 2/ by introducing free-carrier absorption in the array-interelement regions.