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1.
针对新产品开发(new product development,NPD)过程难以获得所需的可靠性数据的问题,利用模糊打分法获取所需的可靠性数据。基于IDEF0(Integrated Definition for Function Modeling)建模的基础上,以模糊评价法为工具,构造了基于专家经验的模糊影响矩阵,以“输出”的质量作为过程的可靠性,在此基础上对新产品开发过程的可靠性作出评价。仿真结果表明本文提出的方法不仅可以有效地对过程可靠性作出评价,可以从定量的角度确定影响新产品开发过程可靠性的关键因素。  相似文献   

2.
程立  夏新涛  马文锁 《计量学报》2021,42(10):1307-1315
为了分析滚动轴承的振动性能退化过程与保持可靠性之间的关系,提出一种基于最大熵法和相似度法的滚动轴承振动性能退化模型,并对滚动轴承的退化过程进行评估;然后基于最大熵法和泊松过程建立滚动轴承振动性能保持可靠性模型;最后基于灰关系理论对滚动轴承的性能退化序列和保持可靠性序列进行分析。实验结果表明,所提出的滚动轴承振动性能退化模型能够有效地识别滚动轴承的退化状态,并且滚动轴承振动性能保持可靠性的演变历程与振动性能退化过程之间有明显的灰关系,可信水平均达到80%以上。  相似文献   

3.
航天电连接器加速性能退化试验可行性研究   总被引:5,自引:0,他引:5  
为解决高可靠长寿命的航天电连接器即使进行加速寿命试验也难以获得失效数据的问题,对电连接器失效模式以及长期贮存下接触性能变化结果进行分析,表明电连接器性能退化存在可能性,并根据长期贮存下试验数据的验证,得出电连接器性能具有退化特性.通过温度加速应力下电连接器接触性能数据的分析,得出其性能退化具有加速性,还具有一定的加速退化规律,这为采用加速性能退化试验对航天电连接器进行可靠性评估提供了依据.  相似文献   

4.
有限时间内很难获得大量电子产品的失效数据,传统可靠性评估方法存在一定局限。在分析传统加速退化试验可靠性评估的基础之上,提出利用时间序列对产品加速退化过程描述的方法,使用自回归滑动平均混合(ARMA)模型对退化数据进行建模,通过参数估计得到其退化规律的表达式,从而外推出其失效寿命,进而利用极大似然估计理论进行可靠性评估。最后以某电源电路板加速退化试验数据为例,分时间序列建模和可靠性评估两大步骤,分别对95℃、105℃、115℃下加速退化试验数据进行分析处理,得出可靠性评估结果,验证该方法的有效性和实用性。  相似文献   

5.
基于电子产品板级加速退化数据的可靠性分析   总被引:2,自引:0,他引:2  
以某24 V-2 A稳压电源板在80 C,100 C,120 C下进行恒加加速退化试验为例,观测到电源板输出电压随温度变化的退化过程,由B-S模型采用回归方法进行了可靠性统计推断,并与其它评估结果比较.结论表明,基于加速性能退化数据进行板级电子产品可靠性评估方法可行、结果可信,且更节约试验成本和时间,无继往数据和无失效数据情况下仍能适用.  相似文献   

6.
结构系统在振动过程中必定会伴随刚度退化,通过将刚度累积损伤理论引入振动微分方程,结合随机有限元法和可靠性基本理论,推导出在考虑刚度退化下具有随机参数的振动传递路径系统的传递可靠度和可靠性灵敏度数学模型。通过对某一动力伺服刀架进行分析,得到了该刀架系统在随机参数均值处的可靠度和其对各随机参数的灵敏度随激振频率和时间的变化规律。结果表明刚度退化会引起频域内的可靠度及其对各随机参数的灵敏度走势随时间发生偏移,可靠度对各随机参数的灵敏度峰值随时间发生波动,且零时刻频域内的灵敏度峰值不一定是时域内极大值。通过采用Monte Carlo法进行验证,进一步证明了该方法的准确性。通过对敏感参数优化,可以增强系统稳定性,也可以有效地预防因共振区域随时间改变而引发的共振失效问题。  相似文献   

7.
在分析和研究了电主轴性能退化失效机理的前提下,选取合适的性能退化特征量,在此条件下设计电主轴可靠性实验方案,并在该方案的指导下进行电主轴可靠性实验。在研究了基于伪寿命分布的退化数据可靠性评估方法的基本原理基础上,应用该方法结合电主轴实验样本的可靠性实验数据,综合虚拟增广样本法对其可靠性进行评估。最终获得失效分布函数、分布密度函数及其曲线,以及一系列可靠性指标,包括可靠度函数及其曲线、失效率函数及其曲线、平均寿命及部分可靠寿命等。  相似文献   

8.
《中国测试》2016,(9):126-129
针对LED可靠性评估的方法大部分均基于样品伪寿命这一现象,提出基于退化量分布的LED可靠性评估方法。先依据指数模型预测后续时刻的退化量,再通过β分布统示法求出各时刻的累积失效概率,然后根据加速模型确定常应力下LED的可靠度函数。以国内某型LED灯具为实验对象,求出该型灯具寿命估计值为77100h,验证方法的实用性、有效性。  相似文献   

9.
分析了舰船总体性能可靠性问题的产生原因,将其分为2类.对于舰载设备本身存在可靠性问题而造成的,以航速可靠性为例,在舰船总体可靠性的背号下,借助相关数学工具进行了建模方法分析;对于外界随机因素影响而造成的,如横稳性的可靠性问题,则从分析外界随机因素与船体设计参数之间关系入手.初步建立了一套研究舰船总体性能可靠性问题的建模方法.实例计算表明,将所建模型用于分析舰船总体性能比常规方法具有明显的优越性.  相似文献   

10.
为解决多元性能退化特征产品可靠性建模困难,提出了一种通用的可靠性建模方法。首先,基于产品多元退化数据,运用ReliefF算法提取产品关键退化特征;然后,通过满窗宽矩阵的多元核密度方法,估计产品在各检测时刻的可靠度;最后,利用各检测时刻可靠度估计结果,拟合产品寿命分布。案例结果表明,该方法能够克服传统参数方法需对产品退化特征量分布作出具体假设的局限,并且能够获得比文献方法精度更高的产品可靠度估计值。另外,该方法可以为后续产品的可靠性试验减少检测工作量,节约试验成本。  相似文献   

11.
    
Metallized film capacitor is a type of product with a long lifetime and high reliability. It is difficult to assess the lifetime and reliability using the traditional statistical inference method which is based on the large number of testing data. This paper presents a new testing methodology, called T‐performance degradation test, by dividing the test process into several stages. In each stage, the sample size of working capacitors under test decreases stage by stage until the test lasts enough time with few survival capacitors. Leveraging the T‐performance degradation data, this paper further presents a reliability assessment model to predict the lifetime of the high‐performance capacitors. Finally, the reliability assessment model is demonstrated on a type of high‐performance metallized film capacitors used in the energy module of the laser facility. Copyright © 2012 John Wiley & Sons, Ltd.  相似文献   

12.
13.
    
Due to the effects of manufacturing tolerances and environmental conditions, component parameters vary and degrade with time. This may cause performance measures of electronic circuits to deviate from design specifications. Therefore, a tolerance design method based on performance degradation is proposed for electronic circuits, so as to improve the robustness of output characteristics. First, sensitive components causing output fluctuation are determined via orthogonal experiment and PSpice simulation. Then, degradation path models are established to describe the degradation process of sensitive components. The predicted values worked out by the degradation path models are substituted into the simulation model for Monte Carlo analysis. Besides, output characteristics and performance reliability are evaluated according to Monte Carlo simulation. Finally, optimum allocation is carried out for component tolerances as per minimum life cycle cost. The proposed method is illustrated by a case study of light‐emitting diode (LED) driver. Copyright © 2013 John Wiley & Sons, Ltd.  相似文献   

14.
    
With very few exceptions, most contemporary reliability engineering methods are geared towards estimating a population characteristic(s) of a system, subsystem or component. The information so extracted is extremely valuable for manufacturers and others that deal with product in relatively large volumes. In contrast, end users are typically more interested in the behavior of a ‘particular’ component used in their system to arrive at optimal component replacement or maintenance strategies leading to improved system utilization, while reducing risk and maintenance costs. The traditional approach to addressing this need is to monitor the component through degradation signals and ‘classifying’ the state of a component into discrete classes, say ‘good’, ‘bad’ and ‘in‐between’ categories. In the event, one can develop effective degradation signal forecasting models and precisely define component failure in the degradation signal space, then, one can move beyond the classification approach to a more vigorous reliability estimation and forecasting scheme for the individual unit. This paper demonstrates the feasibility of such an approach using ‘general’ polynomial regression models for degradation signal modeling. The proposed methods allow first‐order autocorrelation in the residuals as well as weighted regression. Parametric bootstrap techniques are used for calculating confidence intervals for the estimated reliability. The proposed method is evaluated on a cutting tool monitoring problem. In particular, the method is used to monitor high‐speed steel drill‐bits used for drilling holes in stainless‐steel metal plates. A second study involves modeling and forecasting fatigue‐crack‐growth data from the literature. The task involved estimating and forecasting the reliability of plates expected to fail due to fatigue‐crack‐growth. Both studies reveal very promising results. Copyright © 2002 John Wiley & Sons, Ltd.  相似文献   

15.
雷管的准爆率如何估计?本文给出矩估计法、贝叶斯估计法、区间估计法,并对各种方法加以分析比较,认为贝叶斯估计法在工程爆破中最为适用。  相似文献   

16.
    
Most systems experience both random shocks (hard failure) and performance degradation (soft failure) during service span, and the dependence of the two competing failure processes has become a key issue. In this study, a novel dependent competing failure processes (DCFPs) model with a varying degradation rate is proposed. The comprehensive impact of random shocks, especially the effect of cumulative shock, is reasonably considered. Specifically, a shock will cause an abrupt degradation damage, and when the cumulative shock reaches a predefined threshold, the degradation rate will change. An analytical reliability solution is derived under the concept of first hitting time (FHT). Besides, a one-step maximum likelihood estimation method is established by constructing a comprehensive likelihood function. Finally, the reasonability of the closed form reliability solution and the feasibility and effectiveness of the proposed DCFPs modeling methodology are demonstrated by a comparative simulation study.  相似文献   

17.
樊正复  孟冲 《工程爆破》1996,2(3):72-74
雷管的准爆率如何估计?本文给出矩估计法、贝叶斯估计法、区间估计法,并对各种方法加以分析比较,认为贝叶斯估计法在工程爆破中最为适用。  相似文献   

18.
    
System reliability optimization problems have been widely discussed to maximize system reliability with resource constraints. Birnbaum importance is a well-known method for evaluating the effect of component reliability on system reliability. Many importance measures (IMs) are extended for binary, multistate, and continuous systems from different aspects based on the Birnbaum importance. Recently, these IMs have been applied in allocating limited resources to the component to maximize system performance. Therefore, the significance of Birnbaum importance is illustrated from the perspective of probability principle and gradient geometrical sense. Furthermore, the equations of various extended IMs are provided subsequently. The rules for simple optimization problems are summarized to enhance system reliability by using ranking or heuristic methods based on IMs. The importance-based optimization algorithms for complex or large-scale systems are generalized to obtain remarkable solutions by using IM-based local search or simplification methods. Furthermore, a general framework driven by IM is developed to solve optimization problems. Finally, some challenges in system reliability optimization that need to be solved in the future are presented.  相似文献   

19.
  总被引:2,自引:0,他引:2  
This paper presents an extension of reliability analysis of electronic devices with multiple competing failure modes involving performance aging degradation. The probability that a product fails on a specific mode is derived. Using this probability, the dominant failure mode on the product can be predicted. A practical example is presented to analyze an electronic device with two kinds of major failure modes–solder/Cu pad interface fracture (a catastrophic failure) and light intensity degradation (a degradation failure). Reliability modeling of an individual failure mode and device reliability analysis is presented and results are discussed. Copyright © 2003 John Wiley & Sons, Ltd.  相似文献   

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