共查询到17条相似文献,搜索用时 62 毫秒
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分析了对铁电薄膜Bi4Ti3O12进行A位、B位掺杂时,Bi4Ti3O12铁电性及疲劳特性的改善及相应的理论解释,并指出Bi4Ti3O12值得进一步深入研究的领域。 相似文献
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钒掺杂对Li4Ti5O12性能的影响 总被引:6,自引:2,他引:6
采用固相反应法合成了锂离子电池负极材料Li4-xVxTi5O12(x=0,0.1,0.2),研究了钒掺杂对其晶格结构、相组成和颗粒形貌以及电化学性能的影响。结果表明:钒的掺杂增大了Li4-xVxTi5O12的晶胞参数,降低了晶格的规整度,增大了合成Li4-xVxTi5O12的颗粒度;同时随着钒掺杂量的增加,Li4-xVxTi5O12在高倍率下的循环稳定性增加,电极极化程度变小。Li4Ti5O12在3.0C下的比容量衰减迅速,但Li4-xVxTi5O12(x=0.1,0.2)在3.0C下仍保持很好的循环稳定性。钒的掺杂降低了Li4Ti5O12的比容量,这与钒在晶格中的存在形式以及掺杂试样较大的颗粒度有直接关系。 相似文献
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分析了对铁电薄膜Bi4Ti3O12进行A位、B位掺杂时,Bi4Ti3O12铁电性及疲劳特性的改善及相应的理论解释,并指出Bi4Ti3O12值得进一步深入研究的领域。 相似文献
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锂离子蓄电池负极材料Li4Ti5O12的研究进展 总被引:6,自引:0,他引:6
对Li4Ti5O12 的结构与电化学性能的关系、制备方法、掺杂改性研究现状等进行了介绍。锂离子蓄电池负极材料锂钛复合氧化物———Li4Ti5O12 相对于锂电极的电位为 1.5 5V ,理论容量为 175mAh/ g ,实验容量为 15 0~ 160mAh/ g。在Li 嵌入和脱出的过程中 ,其晶型不发生改变 ,有很小的收缩和膨胀 ,体积变化小于 1% ,被称为“零应变”材料。以该材料为负极的锂离子蓄电池具有很好的循环性能 ,同时相对于石墨等碳负极 ,安全性和可靠性也得以大大改善 ,具有应用在电动汽车、储能电池等方面的优良前景 ,在全固态锂离子蓄电池的研究中也大多采用该活性材料作为负极 相似文献
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In this work, Bi 3.25 La 0.75 Ti 3 O 12 (BLT) and Bi 3.25 Pr 0.75 Ti 3 O 12 (BPT) thin films were prepared by chemical solution deposition and characterized by X-ray diffraction, scanning electron microscope and electrical measurements. Layered perovskite BLT and BPT films can be achieved by 180 s annealing at a temperature as low as 650 C. Both BPT and BLT films are composed of closely packed spherical grains. BPT shows larger remnant polarization ( Pr ) and smaller coercive field. The Pr values of 700 C annealed BLT and BPT films are 18.3 w C/cm 2 and 20.5 w C/cm 2 , respectively, while BLT films show better-saturated hysteresis loops. The leakage current density of BPT films is significantly (about one order) lower than that of BLT. The dielectric properties of BLT and BPT films were measured and compared. Both films exhibit large dielectric constant and small loss tangent. Under bipolar switching cycles, BLT films showed little polarization reduction but a 30% polarization loss was observed for BPT films after 2 2 10 9 cycles. 相似文献
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Mo-doped Bi3.35La0.75Ti3O12 (BLTM) films were deposited on Pt/Ti bottom electrodes by using a sol-gel method and crystallized at 700°C for 30 min in O2 atmosphere. The ferroelectric properties were greatly improved by substituting B-site ions with Mo ions and the BLTM films showed strong preferred (117) orientation. Typical remanent polarization (2Pr) and coercive field (2Ec) values were 32.0 μC?cm?2 and 158 kV?cm?1, respectively. It was also found that the leakage current densities in the BLTM films were lower than those in Bi3.35La0.75Ti3O12 (BLT) films. 相似文献
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Ferroelectric Bi4 – xNdxTi3O12(BNdT) thin films with the composition (x = 0.75) were prepared on Pt/Ti/SiO2/Si(100) substrate by metal-organic deposition. The films were annealed by various temperatures from 550 to 650C and then the electrical and structural characteristics were investigated for the application of FRAM. Electrical properties such as dielectric constant, 2Pr and capacitance were quite dependent on the thermal heat treatment. The measured 2Pr value on the BNdT capacitor annealed at 650C was 56 C/cm2 at an applied voltage of 5 V. No fatigue was observed up to 8 × 1010 read/write switching cycles at a frequency of 1 MHz regardless of annealing temperatures. 相似文献
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S. S. Kim E. K. Choi H. J. Kim M. H. Park H. S. Lee W. J. Kim J. C. Bae T. K. Song H. S. Lee J. Y. Lee 《Journal of Electroceramics》2004,13(1-3):83-88
Ferroelectric properties of samarium substituted Bi4Ti3O12 films, Bi3.15Sm0.85Ti3O12 (BST), were evaluated for use as lead-free thin film ferroelectrics for FeRAM applications. The BST films were fabricated on the Pt/Ti/SiO2/Si(100) substrates by a metalorganic solution deposition method. The measured XRD patterns revealed that the BST films showed only a Bi4Ti3O12-type phase with a random orientation. The BST film capacitors showed excellent ferroelectric properties. For the film capacitor annealed at 700C, 2Pr of 64.2 C/cm2 and 2Ec of 101.7 kV/cm at applied electric field of 150 kV/cm were observed. The capacitor did not show any significant fatigue up to 1.5 × 108 read/write switching cycles at a frequency of 1 MHz, which suggests that the samarium should be considered for a promising lanthanide elements to make a good thin ferroelectric film for memory applications. 相似文献
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Nam-Yeal Lee Won-Jae Lee Sang-Ouk Ryu In-Kyu You Sung-Min Yoon Seong Mok Cho 《Integrated ferroelectrics》2013,141(1):171-178
The phase formation and electrical properties of (Bi3.15La0.85)Ti3O12 (BLT) thin films prepared by the chemical solution deposition method on Pt/Ti/SiO2/Si substrates have been investigated. It was observed that the microstructure and electrical properties of BLT thin films dramatically varied with the excess Bi content. The crystallographic orientation of BLT films was varied with excess Bi content and the intermediate rapid thermal annealing (RTA) process. While BLT thin films prepared without intermediate RTA process have ?117? orientation irrespective of excess Bi content, BLT thin films with RTA process at 450°C have an orientation change with excess Bi content. The leakage current of BLT thin films slightly increased with increasing excess Bi content up to 6.5% and then considerably decreased in BLT film with 10% Bi, where was revealed to be almost stoichiometric composition. 相似文献
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