共查询到17条相似文献,搜索用时 218 毫秒
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SiC器件相比于Si器件,具有更高的功率密度,表现出高的器件结温和热阻。为了提高SiC功率模块的散热能力,提出了一种基于石墨嵌入式叠层DBC的SiC功率模块封装结构,并建立封装体模型。通过ANSYS有限元软件,对石墨层厚度、铜层厚度和导热铜柱直径进行分析,研究各因素对散热性能的影响,并对封装结构进行优化以获得更好的热性能。仿真结果表明,石墨嵌入式封装结构结温为61.675℃,与传统单层DBC封装相比,结温降低19.32%,热阻降低27.05%。各影响因素中石墨层厚度对封装结温和热阻影响最大,其次是铜柱直径和铜层厚度。进一步优化后,结温降低了2.1%,热阻降低了3.4%。此封装结构实现了优异的散热性能,为高导热石墨在功率模块热管理中的应用提供参考。 相似文献
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散热是大功率LED封装的关键技术之一,散热不良将严重影响LED器件的出光效率、亮度和可靠性。影响LED器件散热的因素很多,包括芯片结构、封装材料(热界面材料和散热基板)、封装结构与工艺等。文章具体分析了影响大功率LED热阻的各个因素,指出LED散热是一个系统概念,需要综合考虑各个环节的热阻,单纯降低某一热阻无法有效解决LED的散热难题。文中还对国内外降低LED热阻的最新技术进行了介绍。 相似文献
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首先,将AlN陶瓷表面金属化后分别切割成10 mm×10 mm×1.0mm、12 mm×12 mm×1.0 mm及15 mm×15 mm×1.0mm的方块,嵌入环氧树脂中制备成FR4/AlN复合材料;然后,利用SMT工艺将同款LED灯珠与上述内置三种不同尺寸AlN的复合基板材料组装成LED模组;最后,利用结温测试仪与半导体制冷温控台对三种LED模组分别进行了结温测试.同时,结合热仿真手段对复合材料水平面的温度分布情况进行了模拟研究.结果表明:上述三种尺寸陶瓷片对应LED的结温分别为96.95、92.94与91.81℃.热仿真结果显示,陶瓷片尺寸通过界面热阻对扩散热阻产生影响,增大陶瓷片尺寸有助于降低扩散热阻,进而改善FR4/AlN复合材料的整体散热性能. 相似文献
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大功率白光LED的结温测量 总被引:1,自引:1,他引:0
大功率LED器件的结温是其热性能的重要指标之一,温度对LED的可靠性产生重要的影响。采用板上封装的方法,利用大功率芯片结合金属基板封装出了大功率白光LED样品,利用LED光强分布测试仪测试了器件的I—V曲线,用正向电压法测量了器件的温度敏感系数,进而通过测量与计算得到器件的结温和热阻。最后利用有限元对器件进行实体建模,获得了器件的温度场分布。测量结果表明:正向电压与结温有很好的线性关系,温度敏感系数为2mV·℃^-1,LED的结温为80℃,热阻为13℃·W^-1。有限元模拟的结果与实测值具有良好的一致性。 相似文献
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热学特性是影响功率型LED光学和电学特性的主要因素之一,设计了一套基于脉冲式U-I特性的功率型LED热学特性测试系统,可以测试在不同结温下LED工作电流与正向电压的关系,从而获得LED的热学特性参数。该系统通过产生窄脉冲电流来驱动LED,对其峰值时的电压电流进行采样,同时控制和采集LED的热沉温度,从而获得不同温度下LED的U-I特性曲线。与其他U-I测试系统相比,文中采用了窄脉冲(1 s)工作电流,LED器件PN结区处于发热与散热的交替过程,不会造成大的热积累,大大提高了测量精度。实验中,对某功率型LED进行了测试,获得了该器件的电压、电流和结温特性曲线,并利用B样条建立该器件的U-I-T模型,进而实现了对其结温的实时在线检测。 相似文献
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S. Chittipeddi C. M. Dziuba V. C. Kannan M. J. Kelly W. T. Cochran B. Rambabu 《Journal of Electronic Materials》1993,22(7):785-791
The effect of rapid thermally nitrided titanium films contacting silicided (titanium disilicided) and nonsilicided junctions
has been studied in the temperature range of 800 to 900°C. The rapid thermal nitridation of titanium films used as diffusion
barriers between aluminum and silicon, has a major impact on shallow junction complementary metal oxide semiconductor technologies.
During the process of rapid thermal nitridation, the dopants in the junctions undergo a redistribution and affect the electrical
properties of shallow junction structures. This work focuses on using novel contact resistance structures to measure the variation
in electrical parameters for rapid thermally nitrided titanium films annealed at different temperatures. The self-aligned
silicide (salicide) junctions in this study were formed using rapid thermally annealed titanium films. Electrical contact
resistance testers were used to measure the interface contact resistance between the salicide and silicon, as well as between
the metal and the salicide. The results show that the interface contact resistance to the p− diffused salicided junctions increases with rapid thermal nitridation of the additional titanium film, whereas the interface
contact resistance to the n− diffused salicided junction shows a decrease. Further, as a function of the rapid thermal annealing temperature (for fixed
titanium thickness), the nonsalicided diffusions show an increase in the interface contact resistance. The boron profiles
at the TiSi2/Si interface obtained using secondary ion mass spectroscopy show an excellent qualitative agreement with the electrical results
for each of the conditions discussed. The films were also characterized using Rutherford back-scattering spectrometry and
transmission electron microscopy and the results show good agreement with the measured variation in electrical parameters.
These results also show that as the anneal temperature is increased, the TiN thickness increases, further the change in the
silicide/silicon interface position with the nitridation of the additional titanium layer was verified.
This work was carried out when the author was working at AT&T Bell Labs 相似文献
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Te-yuan Chung Jian-Hong Jhang Jing-Sian Chen Yi-Chien Lo Gwo-Herng Ho Mount-Learn Wu Ching-Cherng Sun 《Microelectronics Reliability》2012,52(5):872-877
We tested the ability of Au/Sn eutectic, silver paste, and solder paste to bond to a large area as well as the bonding of a high power LED die to a highly conductive submount. The samples ran through several tests including ultrasound image, shear force, and thermal resistance measurement. Finite element analysis (FEA) models were built for comparison and analysis. Au/Sn bonding shows the best thermal and mechanical properties. Silver paste shows lower contact thermal resistance compared with solder paste. Although the thickness of the silver paste bonding layer is greater than the solder paste bonding layer, the average total thermal resistance is noticeably lower than the solder paste bonded samples. 相似文献
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高压(HX)倒装LED是一种新型的光源器件,在小尺寸、高功率密度发光光源领域有广泛的应用前景.设计了4种不同工作电压的高压倒装LED芯片,进行了流片验证,并对其进行了免封装芯片(PFC)结构的封装实验,在其基础上研制出一种基于高压倒装芯片的PFC-LED照明组件.建立了9V高压倒装LED芯片、PFC封装器件及照明组件的模型,利用流体力学分析软件进行了热学模拟和优化设计;利用T3Ster热阻测试分析仪进行了热阻测试,验证了设计的可行性.结果表明,基于9V高压倒装LED芯片的PFC封装器件的热阻约为0.342 K/W,远小于普通正装LED器件的热阻.实验结果为基于高压倒装LED芯片的封装及应用提供了热学设计依据. 相似文献
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倒装芯片衬底粘接材料对大功率LED热特性的影响 总被引:6,自引:0,他引:6
针对倒装芯片(Flipchip)大功率发光二极管器件,描述了大功率LED器件的热阻特性,建立了Flipchip衬底粘接材料的厚度和热导系数与粘接材料热阻的关系曲线,以三类典型粘接材料为例计算了不同厚度下的热阻,得出了Flipchip衬底粘接材料选择的不同对大功率LED的热阻存在较大影响的结论. 相似文献
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The performance of high power LEDs strongly depends on the junction temperature. Operating at high junction temperature causes degradation of light intensity and lifetime. Therefore, proper thermal management is critical for LED packaging. While the design of the heat sink is a major contributor to lowering the overall thermal resistance of the packaged luminaire, another area of concern arises from the need to address the large heat fluxes that exist beneath the die. In this study we conduct a thermal analysis of high power LED packages implementing chip-on-board (COB) architecture combined with power electronic substrate focusing on heat spreading effect. An analytical thermal resistance model is presented for the LED array and validated by comparing it with finite element analysis (FEA) results. By using the analytical expression of thermal resistance, it is possible to understand the impact of design parameters (e.g., material properties, LED spacing, substrate thickness, etc.) on the package thermal resistance, bypassing the need for detailed computational simulations using FEA. 相似文献
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通过对不同驱动电流下各种颜色LED结温和热阻测量,发现各种颜色LED的热阻值均随驱动电流的增加而变大,其中基于InGaN材料的蓝光和白光LED工作在小于额定电流下时,热阻上升迅速;驱动电流大于额定电流时,热阻上升速率变缓。其他颜色LED热阻随驱动电流变化速率基本不变。结温也随驱动电流的增加而变大。相同驱动电流下,基于AlGaInP材料的1W红色、橙色LED的结温要低于基于InGaN材料的蓝色、绿色、白色LED的结温。分别用正向电压法和红外热像仪法测量了实验室自制的1 mm×1 mm蓝光芯片结温,比较了两种方法的优缺点。结果表明,电学法测量简单快捷,测量结果可以满足要求。 相似文献