In-cycle monitoring of tool nose wear and surface roughness of turned parts using machine vision

Tool wear has been extensively studied in the past due to its effect on the surface quality of the finished product. Vision-based systems using a CCD camera are increasingly being used for measurement of tool wear due to their numerous advantages compared to indirect methods. Most research into tool wear monitoring using vision systems focusses on off-line measurement of wear. The effect of wear on surface roughness of the workpiece is also studied by measuring the roughness off-line using mechanical stylus methods. In this work, a vision system using a CCD camera and backlight was developed to measure the surface roughness of the turned part without removing it from the machine in-between cutting processes, i.e. in-cycle. An algorithm developed in previous work was used to automatically correct tool misalignment using the images and measure the nose wear area. The surface roughness of turned parts measured using the machine vision system was verified using the mechanical stylus method. The nose wear was measured for different feed rates and its effect on the surface roughness of the turned part was studied. The results showed that surface roughness initially decreased as the machining time of the tool increased due to increasing nose wear and then increased when notch wear occurred.     

精密测角法的线阵CCD相机几何 参数实验室标定方法

建立了线阵CCD相机几何参数标定系统,对该标定方案所用的设备、实验条件、基于精密测角法的算法和精度进行研究。根据标定精度要求,确定了实验室主要测试设备和环境条件。利用高精度二维转台和CCD细分技术测得被标定系统的一系列视场角和对应像高。最后,利用建立的数学模型,应用最小二乘回归的方法,求得相机几何参数。误差分析结果表明:该方法对主距主点的标定精度可以达到μm级,相对畸变的标定精度可以优于1×10^-4。该方法可以满足线阵相机的高精度几何标定要求,具有较高的实际应用价值。     

“高分二号”上相机和星敏感器相对安装姿态的测量

为了精确测量"高分二号"(GF-2)卫星上相机和星敏感器的相对安装姿态,建立了一套高精度自动化测量系统。针对该系统研究了基于多传感器数据融合的高精度测量算法、基于理论安装数据驱动的自动测量模型、以及基于图像识别的立方镜法线搜索算法。该测量系统主要由二维龙门导轨、精密转台和CCD成像辅助准直的自准直经纬仪构成,通过融合精密转台的转动角度、自准直经纬仪的俯仰角和偏航角等数据计算被测设备安装姿态角度。测量时需先对系统进行标定,制定自动测量规划,然后通过电机驱动使设备自动到达预定位置和角度进行测量。若星上设备安装偏差较大导致被测对象超出自准直经纬仪测量范围时,可启动CCD相机对被测对象局部区域进行搜索识别,并引导自准直经纬仪实现精确准直测量。对测量系统进行了实验验证,结果显示:该系统姿态测量精度可以达到5″,与标准值比对最大偏差为4.1″;该测量系统已用于GF-2卫星的相机和星敏器相对姿态测量中,重复标准差最大为3.5″,满足GF-2对机上设备安装姿态测量精度的需求。     

基于TMS320F2812的非接触式在线测宽仪设计

介绍了一种利用TCD1708D高分辨率CCD为传感器、TMS320F2812高速DSP为处理器、集CCD时序驱动、数据采集与测量控制为一体的非接触式在线测宽仪的设计.利用DSP的高速处理能力,通过简单有效的宽度算法,实现对高速运动工件的在线尺寸测量及控制.整个系统电路设计简捷,性价比高,较好地满足了测量精度和实时性要求.     

应用多项式插值函数提高面阵CCD尺寸测量的分辨力

在图像测量系统中，测量的精度主要取决于ＣＣＤ摄像机的分辨率。为提高图像测量系统的测量精度，本文首先提出了一种具有保持边缘特征和滤波功能的十字窗口边缘自动检测算法，并在此基础上，本文又提出了以多项式插值为原理的新的亚像无边缘检测算法，使图像测量系统中的ＣＣＤ摄像机的分辨率提高约６０倍     

利用数字图像处理技术测量直齿圆柱齿轮几何尺寸

研究了采用数字图像处理技术实现对直齿圆柱齿轮几何尺寸的非接触式测量.首先对CCD摄像机拍摄的图像进行畸变校正与滤波去噪,然后对图像进行阈值分割,采用基于数学形态法的四邻域腐蚀来获得单像素宽的图像边缘.针对齿轮的边缘轮廓形状特征,运用重心法、最小二乘拟合、Bresenham画圆法和Hough变换等原理,建立了测量齿轮齿数、模数、中心孔半径、齿顶圆半径、齿根圆半径和变位系数等齿轮几何尺寸参数的测量算法.使用1280×1024的CCD摄像机及黑白采集卡对分度圆直径为50mm的直齿圆柱齿轮进行测量实验,与人工测量值对比,绝对误差小于一个像素,在各测量参数中,最大尺寸的齿顶圆半径绝对误差值为13μm.研究结果表明:因为CCD摄像设备的分辨率越高、被测物体的尺寸越小,则测量精度越高,且为线性关系,所以,使用高分辨率CCD摄像设备并配备光学放大系统,可实现对高精度和微小直齿圆柱齿轮几何尺寸参数的测量.如使用1280×1024像素以上的CCD摄像设备测量分度圆直径5mm以下的直齿圆柱齿轮时,测量精度可在2μm以下.     

TDI CCD全景式航空相机的像移补偿误差分析

基于TDI CCD的航空相机通常工作于推扫方式,介绍了一种新型TDI CCD全景式航空相机.与相同CCD片数的推扫式相机相比,其优点是扩大了摄影视场,但同时带来摆扫方向上的像移.针对这一问题,提出了一种真角度像移补偿方法,并通过实验验证了真角度像移补偿的正确性.以型号为CT-F3的TDI CCD相机为例,对前向像移补偿误差进行了分析,提出系统的性能指标:TDI CCD积分时间精度应大于5‰,扫描反射镜补偿精度应大于1%.     

CCD图像灰度与照度的转换标定方法

本文提出了一种基于CCD摄像机利用图像灰度获得实际照度的新方法,该方法适用于摄像机的任意曝光和增益参数,且考虑了摄像机安装位置和角度对测量的影响。CCD摄像机照度测量法的实际应用主要涉及两个过程:一是标定过程,即应用CCD摄像机进行照度测量前,标定CCD图像灰度与照度之间的转换参数和转换模型;二是照度测量过程,即通过CCD摄像机拍摄图像,将图像灰度代入已定的转换模型,获得测量对象的照度值。其中,灰度与照度转换模型的标定是利用CCD摄像机实现照度测量的基础和关键,文中主要讨论了该模型的推导过程以及标定方法。具体为:首先通过理论推导获得图像灰度与CCD传感器感应的相对辐照度的关系,然后借助以均匀光源搭建的实验系统标定CCD传感器相对辐照度与物面实际照度之间的关系,进而获得图像灰度与物面实际照度的转换关系。在转换过程中讨论了曝光时间、增益以及CCD相机与照度测量点之间的距离和角度对转换模型的影响,为CCD摄像机照度测量法的实际应用奠定了基础。实验结果表明本测量及标定方法适用于摄像机任意曝光和增益条件,经过本方法标定后,应用CCD摄像机进行照度测量,测量结果的相对误差在4.5%以内。     

主轴回转运动精度的计算机视觉测量系统

基于计算机视觉测量技术,建立了机床主轴回转运动精度测量系统。系统主要由CCD 摄像机、计算机和相应的图像处理软件组成。利用图像传感器记录靶标特征点运动轨迹,经过图像处理软件的数据处理,可直接测得主轴的回转运动。由于靶标特征点的提取直接影响系统的测量精度,因此提出了以圆形标记作为靶标图案,采用面积矩方法提取圆心来提高系统测量精度。在MATLAB 环境下编程实现图像处理和数据计算,采用最小区域圆法计算主轴回转误差。最后采用该系统对车床主轴进行了测量,试验证明,系统可以实现主轴回转运动精度的精确、快速测量,且精度达到微米级。     

Asynchronous event‐based high speed vision for microparticle tracking

This paper presents a new high speed vision system using an asynchronous address‐event representation camera. Within this framework, an asynchronous event‐based real‐time Hough circle transform is developed to track microspheres. The technology presented in this paper allows for a robust real‐time event‐based multiobject position detection at a frequency of several kHz with a low computational cost. Brownian motion is also detected within this context with both high speed and precision. The carried‐out work is adapted to the automated or remote‐operated microrobotic systems fulfilling their need of an extremely fast vision feedback. It is also a very promising solution to the micro physical phenomena analysis and particularly for the micro/nanoscale force measurement.     

CCD摄像机快速标定技术

在视觉检测系统中,针对视觉传感器数量多,且每个摄像机需标定的内部参数及外部参数较多的特点,提出了一种新的简单的快速摄像机标定方法.分析了摄像机的各个关键参数,采用了全线性标定方法和矢量分析法,逐步求出CCD摄像机的参数.该方法具有标定速度快、精度较高、实用和算法性能分析容易等优点,适用于一般视觉检测系统的摄像机参数的标定,尤其是大型视觉检测系统中多视觉传感器的摄像机参数的标定.实际结果表明,摄像机标定误差优于0.05mm.     

Φ360mm激光平面干涉仪

为了强激光工程的需要 ,研究制造了一台口径 36 0 mm卧式激光平面干涉仪。仪器的测量精度为 λ/2 0 ,仪器配有 CCD相机图像处理系统 ,可目测 ,可拍摄照片 ,也可进行数字化处理。实用结果表明 ,该仪器是一台适合于光学车间生产检验的大口径高精度激光平面干涉仪。     

Restoration of blurred images for surface roughness evaluation using machine vision

An attempt is made to evaluate the surface roughness of uniformly moving machined surface (grinding, milling) using machine vision technique. In the case of moving surfaces the images are likely to blur due to the relative motion between the CCD camera and the object to be captured. Hence the degraded image has to be restored by removing distortion due to motion before subsequent analysis. In this work, image blur due to motion is considered, in particular, blur that occurs when the motion is uniform at constant speed and in a fixed direction. The blurred image is modeled as a convolution between the original image and a known point spread function. The Richardson–Lucy Restoration algorithm, a method of estimation based on Bayes theorem has been used to correct the image. The algorithm is tested in simulations and in practical experiments. A simulation gives complete control over the setup and enables to test the performance of the algorithm. The quantification of roughness for restored images are performed using the statistical parameters such as spatial frequency, arithmetic average of gray level and standard deviation after pre-processing. An Artificial Neural Network (ANN) was used with these three statistical parameters as input to predict the vision roughness. Finally, vision roughness values calculated using the deblurred images are compared with the stylus roughness value. An analysis based on the comparison to understand the validity of the present approach of estimation of surface roughness based on the digitally processed images for implementation in practice, is presented in this paper.     

基于集成成像技术的零件孔径位置检测

针对利用霍夫圆检测方法很难定位大尺寸零件上所有孔径位置的问题,本文提出了一种将集成成像技术与霍夫圆检测算法相结合的非接触式测量方法.首先,根据经典成像理论提出了一套集成成像信息获取算法.其次,利用二维平移台和CCD相机搭建了相机阵列实验装置.系统工作时,相机采集的元素图像阵列,可以通过霍夫圆检测和坐标获取算法来实现零件孔径位置的定位.基于上述理论进行了验证实验,结果显示,零件孔径位置的检测误差在0.3mm以内.该方法为集成成像技术应用于高精密位置检测提供了有效的理论支持.     

表面接触角测量装置的设计

介绍了一种用于测量表面接触角的简易装置,目的是为材料表面的润湿性实验研究过程提供一种简易专用装置和方法,替代昂贵的专用测量仪器,用于快速评估被测样品表面的接触角。装置由样品台、光学系统、三维平移台、移液器和计算机组成,对被测样品表面具有一定体积的液滴通过光学系统成像,并将CCD相机与计算机相结合,对液滴形态图像进行存储和分析,从而得到被测样品的表面接触角。对装置的结构、功能和使用方法进行了介绍。     

BUNDLE ADJUSTMENTS CCD CAMERA CALIBRATION BASED ON COLLI NEARITY EQUATION

The solid template CCD camera calibration method of bundle adjustments based on collinearity equation is presented considering the characteristics of space large-dimension on-line measurement. In the method, a more comprehensive camera model is adopted which is based on the pinhole model extended with distortions corrections. In the process of calibration, calibration precision is improved by imaging at different locations in the whole measurement space, multi-imaging at the same location and bundle adjustments optimization. The calibration experiment proves that the calibration method is able to fulfill calibration requirement of CCD camera applied to vision measurement.     

基于MC9S128单片机的CCD异步复位触发系统

为保证物体表面图像的采集质量,针对物体在线检测中采集时刻存在误差的问题,设计了CCD异步复位模式的触发时序,并基于飞思卡尔16位单片机MC9S128,提出了一种具有较强通用性的CCD异步复位触发系统。该系统的异步复位信号由接近开关传感器产生,触发摄像机进行异步拍摄,其定位延时精度可达0.1 ms,可以使物体进入设定的位置后进行图像采集,实现运动状态下物体的实时采集。实验及研究结果表明,基于该方法设计的触发系统具有较宽的适应范围,保证了实时图像采集的定位精度,对于一般工业在线检测具有一定的借鉴价值。     

Improved algorithms for automatic bone histomorphometry on a numerized image analysis system

Quantitative histological methods have proved to be the most effective methods in bone disease research. Faster and more accurate techniques are currently needed. We have developed a simple digitized image analysis system which allows accurate measurements of trabecular bone mass. The algorithm is based on the 'four-connected sets' mathematical theory. Given a numerized image displayed by a CCD camera, the algorithm recognizes all possible four-connected sets and provides area measurements. The first procedure automatically eliminates small, irrelevant profiles (wrinkles, cell nuclei, etc.) while larger profiles are erased interactively. The second procedure similarly erases the artefactual defects within the trabecule (artefactual cracks or empty osteocytic lacunae). The method was shown to be very accurate and time-saving.     

光电开关的特殊应用

本文介绍了光电开关在热轧钢坯长度在线检测中的应用,光电开关在此主要起两个作用：１,作为测量钢坯长度时的触发信号,控制计算机通过线同对钢坯尾部进行样。２．用来减小测量视场,提高测量精度。本文较为详细的论述。     

In-line metrology of nanoscale features in semiconductor manufacturing systems

Quality control and defect monitoring are of great importance to the semiconductor industry. This article presents a system to enable inspection of nanoscale features in-line with nanomanufacturing processes. The ultimate goal of this research is to integrate this metrology system into current semiconductor manufacturing processes to enable true in-line wafer inspection and quality control. In the system presented in this paper, AFMs that have been shrunk down on to a single MEMS chip are used to scan the surface of a sample. A flexure-based mechanism allows the MEMS-based AFM to be positioned over a millimeter range of motion, with nanometer level precision when properly actuated. The performance of the system in areas such as positioning repeatability, AFM stability and measurement resolution are evaluated in this study. Owing to the small size of single-chip AFM (1 million times smaller than a conventional AFM instrument), it is a good candidate for multipoint detection. Overall, the system presented in this paper significantly shortens inspection time and dramatically decreases the setup time required for an AFM to load, approach, and measure a sample making in-line inspection of nanoscale features in semiconductor manufacturing systems feasible.