Dielectric property measurement using a resonant nonradiative dielectric waveguide structure

This letter describes a new dielectric characterization technique, based on the resonant nonradiative waveguide structure described by Yoneyama and Nishida , for permittivity measurements at microwave and mm-wave frequencies. The measurement system is modeled as a resonator comprised of two parallel conducting plates with a rectangular dielectric slab sandwiched in-between. Resonant frequencies of the longitudinal section electric (LSE) modes and the unloaded Q of the cavity are used to determine the permittivity of the dielectric and its loss tangent, respectively. The technique is shown to be accurate for measuring the dielectric properties of a wide array of polymer and oxide materials. For materials with small dielectric loss tangents, an accuracy of better than /spl plusmn/0.4% is attained in the measurement of the relative dielectric constant of the material.     

New method for complex permittivity measurement of dielectric materials

A novel technique for the measurement of dielectric properties of a homogeneous isotropic material is described. An accuracy better than 1% can be obtained on the permittivity and loss tangent values. The structure used is a cylindrical metallic cavity, carrying at its centre the circular cylindrical dielectric sample. The complex permittivity is deduced from the comparison between the experimental and the computed electromagnetic characteristics (frequencies, quality factors) of the resonant TE01? mode of the dielectric resonator.     

Analysis and Evaluation of a Method of Measuring the Complex Permittivity and Permeability Microwave Insulators

Theory and experimental results are presented to show the possibility of using a resonant post technique for characterizing dielectric and magnetic materials at microwave frequencies. Results of the temperature dependence of the relative dielectric constant of nonmagnetic materials with /spl epsilon//sub r/, varying from 4 to 60 are presented and also loss tangent measurements at room temperature. The complex permittivity and permeability of a number of garnet materials has also been measured with 4/spl pi//spl gamma/M/sub s/ / /spl omega/ varying from 0.25 to 0.8. The measured real part of the permeability is in good agreement with the theoretical predictions of Schlomann and the imaginary part of the permeability agrees with measurements by Green et al. on similar materials.     

Q-Based Design Equations and Loss Limits for Resonant Metamaterials and Experimental Validation

Practical design parameters of resonant metamaterials, such as loss tangent, are derived in terms of the quality factor Q of the resonant effective medium permeability or permittivity. Through electromagnetic simulations of loop-based resonant particles, it is first shown that the Q of the effective medium response is essentially equal to the Q of an individual resonant particle. This implies that by measuring the Q of a single fabricated metamaterial particle, the effective permeability or permittivity of a meta-material can be estimated simply and accurately without complex simulations, fabrication, or measurements. Experimental validation shows that the frequency-dependent complex permeability analytically estimated from the measured Q of a single fabricated self-resonant loop agrees with the complex permeability extracted from S parameter measurements of a metamaterial slab to better than 20 %. This Q equivalence reduces the design of a metamaterial to meet a given loss constraint to the simpler problem of the design of a resonant particle to meet a specific Q constraint. The Q-based analysis also yields simple analytical expressions for estimating the loss tangent of a planar loop magnetic metamaterial due to ohmic losses. It is shown that tan delta ap 0.001 is a strong lower bound for magnetic loss tangents for frequencies not too far from 1 GHz. The ohmic loss of the metamaterial varies inversely with the electrical size of the metamaterial particle, indicating that there is a loss penalty for reducing the particle size at a fixed frequency.     

Temperature dependence of permittivity and loss tangent of lithium tantalate at microwave frequencies

Lithium tantalate (LiTaO/sub 3/) exhibits excellent electro-optical, piezoelectric, and pyroelectric properties and a very low thermal expansion. In this paper, we report measurements of loss tangent and the real part of the relative permittivity /spl epsiv//sub r/spl perp// measured in c-axis LiTaO/sub 3/ crystals in the temperature range from 14 K to 295 K at a frequency of 11.4 and 10 GHz. Microwave properties of LiTaO/sub 3/ were determined by measurements of the resonance frequency and the unloaded Q/sub o/ factor of a TE/sub 011/ mode cylindrical cavity containing the sample under test and accounting for uncalibrated cables and adaptors inside the cryocooler. The permittivity of LiTaO/sub 3/ was found to increase from 38.9 to 41.1 and the loss tangent to change from 1.1/spl times/10/sup -4/ to 6.5/spl times/10/sup -4/ over the full temperature range. Due to its low loss and relatively high permittivity, LiTaO/sub 3/ is suitable for microwave applications.     

蜂窝夹层结构传输性能随入射角变化规律研究*

使用高Q 谐振腔材料介电性能测试系统,对不同入射角下、不同格孔边长的NOMEX 纸蜂窝材料介电性能进行了测试。结果表明,相同格孔边长的情况下,NOMEX 纸蜂窝材料损耗角正切值随入射角的增大而增大,且小格孔蜂窝受入射角影响较大。为明确蜂窝材料介电性能的这种特性对夹层结构性能影响,设计并加工了一块5 层夹层结构等效平板,通过设计仿真结果和试验结果对比分析,并结合测试误差分析,明确了蜂窝介电性能随入射角变化对夹层结构传输性能的影响及其原因。     

Correction Due to a Finite Permittivity for a Ring Resonator in Free Space

To better determine the resonant fields of a dielectric resonator with high permittivity epsilon/sub r/, the asymptotic theory with1//spl radic/epsilon/sub 3/ as a small parameter is extended by adding higher order terms in 1//spl radic/epsilon /sub r/ in the fields, the resonant wavenumber, and radiation Q. Extensive data are shown for the Phi independent "nonconfined" mode of a ring resonator, which radiates as a magnetic dipole. Some results are added for the "magnetic quadruple" mode.     

Precise Design of a Bandpass Filter Using High-Q Dielectric Ring Resonators

A precise design is presented for a bandpass filter constructed by placing TE/sub 01delta/ dielectric ring resonators coaxially in a TE/sub 01/ cutoff circular waveguide. On the basis of a rigorous analysis by the mode- matching technique, the interresonator coupling coefficients are determined accurately from the calculation of two resonant frequencies f/sub sh/ and f/sub op/ when the structurally symmetric plane is short- and open-circuited. For the TE/sub 01delta/ ring resonator,the resonant frequency f/sub 0/, the temperature coefficient tau/sub f/, the unloaded Q(Q/sub u/), and the other resonances are also calculated accurately in a similar way. From the calculations, the optimum dimensions are determined to obtain the maximum Q/sub u/, as F/sub r/ = f/sub r/ /f/sub 0/ is kept constant, where f/sub r/ is the next higher resonant frequency the ring resonator using low-loss ceramics (epsilon/sub r/ = 24.3, tan delta = 5 x 10/sup -5/) has Q/sub u/ = 16800 at 12 GHz and tau/sub f/ = 0.1+-0.5 ppm/° C, while the rod one has Q/sub u/ = 14700. A four-stage Chebyshev filter having ripple of 0.04 dB and equiripple bandwidth of 27.3 MHz at f/sub 0/ =11.958 GHz is fabricated using these resonator; the measured frequency responses agree well with theory. The insertion loss is 0.9 dB, which corresponds to Q/sub u/ = 9800.     

On the Theory and Application of the Dielectric Post Resonator (Short Papers)

This short paper deals with the modes of the dielectric post resonator when epsilon/sub r/ is large. The normalized frequency F/sub 0/ = (pi D/lambda/sub 0/) /spl radic/ as a function of D/L is discussed. The simple approximate expressions for the resonant frequencies of the lower order modes are given. The properties of the TE/sub 011/, mode are discussed in detail from the point of view of its application to the measurement of the complex permittivity of microwave dielectrics. Curves and expressions for fast and simple determination of the maximum measurement errors are given.     

Perturbation of dielectric resonator for material measurement

A novel method for rapid measurement of the permittivity of a small object has been developed. Based on the perturbation of a semi-open resonant structure with a dielectric resonator excited in the TE₀₁₁ mode, the apparatus allows samples to be introduced freely and exhibits substantial mode stability. Results of permittivity measurement on low-loss dielectric samples in the form of thin plates and disks were in good agreement with values given by alternative methods employing much larger samples. The method can be extended to account for dielectric loss and permeability. In addition to being applied to material characterisation in the laboratory, the resonant structure can be developed into a transportable dielectrometer for small objects     

Precise measurement of complex permittivity of low-loss ceramics

A novel TE/sub 01/spl delta// mode cylindrical dielectric resonator is proposed for the precise determination of the complex permittivity of low-loss ceramics. The radial mode matching technique is used to determine the expressions of the relative permittivity and the loss tangent of the sample. Some measurement results are compared with those obtained by other methods and good agreement is reported.     

Cylindrical Dielectric Resonators and Their Applications in TEM Line Microwave Circuits

A cylindrical sample of low-loss high epsilon/sub r/ placed between two parallel conducting plates perpendicular to the sample axis forms a microwave resonator. A simple approximate method for predicting the resonant frequencies of the TE modes of this structure is developed. The method becomes exact for the fitting case of this structure which is known as a dielectric post resonator. In all cases, the accuracy of the method is shown to be better than 3.5 percent. The TE/sub 01delta/ mode chart presented allows the determination of the resonant frequency and the tuning range of any cylindrical dielectric resonator for which epsilon/sub r/ >or= 10. The properties of the dielectric resonator as a TEM line element are demonstrated experimentally.     

Unloaded Q of Single Crystal Yttrium-Iron-Garnet Resonator as a Function of Frequency (Correspondence)

The practical feasibility of constructing magnetically tunable broad-tuning range microwave filters using single crystal yttriumiron-garnet resonators was demonstrated in a recent paper. Experimental results were presented on one- and two- resonator filters which can be tuned by varying a dc magnetic field bias over a full waveguide bandwidth and greater, at the same time maintaining an insertion loss performance which is comparable to mechanically-tuned cavity filters. The crucial parameter of the resonant elements in a band-pass filter is the unloaded Q, Q/sub u/. With a spherical single crystal of yttrium-iron-garnet the Q/sub u/ decreases with frequency below X-band frequencies reaching very low values at frequencies around 2000 Mc.     

闭腔法测量微波介质材料参数的研究

采用TE01δ模闭腔法,推导了介电常数和介质损耗的计算公式.制作了4种介质谐振器,分析了支撑物的材质及高度、耦合的结构及强弱、金属腔材质对所制介质谐振器的谐振频率和品质因数Q值的影响.结果表明:较高的聚四氟乙烯支撑使介质谐振器有较高的有载Q值,弱的耦合使有载Q值非常接近无载Q值,高Q值的金属腔利于介质材料Q值的精确测量...     

A simple method for accurate loss tangent measurement ofdielectrics using a microwave resonant cavity

A simple yet rigorous method has been developed to enable the loss tangent of dielectrics, having a known relative permittivity, to be accurately measured using a waveguide resonant cavity. The novel method eliminates the need for any physical measurement, either on the cavity or dielectric sample under test. The only electrical parameters that need to be measured are resonant frequencies and Q-factors of a reference cavity and those of the same cavity loaded with the dielectric sample. One of the advantages of the new technique is that dielectrics, of arbitrary shape, can be characterized at very high microwave frequencies. The new method has been verified through measurement over X-band     

Automatic Digital Method for Measuring the Permittivity of Thin Dielectric Films

One of the most promising techniques for measuring the electric permittivity at microwave frequencies of thin dielectric materials of the order of 0.1 to 10 /spl mu/m, is the cavity perturbation method. For thin films of this type, it is necessary to determine accurately and display small changes in the resonant frequency and Q factor of the cavity in the presence of the material sample. A circuit for the simultaneous measurement and digital readout of the resonant frequency and Q factor of microwave cavity is described. For the resonant frequency measurement, a very efficient automatic frequency circuit, with a homodyne modulation-detection bridge and frequency stabilization loop, is applied. Theoretical analysis and experiments results with this circuit show that an accuracy of 5x10/sup -7/can be achieved in the resonant frequency measurement. For measuring the Q factor, two similar circuits are described. The technique is based on measuring the phase shift of the envelope of an amplitude modulated microwave signal when this signal is transmitted through a resonant cavity at resonance. Although an accuracy of 0.5 percent in the Q factor can be achieved, it is shown that the main limiting factor in both circuits is the accuracy of phase shift determination at RF frequencies.     

Some Effects of Field Perturbation Upon Cavity-Resonance and Dispersion Measurements on MIC Dielectrics

An analysis is presented of field perturbations in MIC resonators in order to examine the errors which occur in permittivity measurements made by cavity-resonance methods: Q factor, coupling effects, fringing fields, crystal misalignment (for anisotropic materials), changes in ambient temperature are all considered. Analysis of a cavity with mixed boundary conditions shows that the resonant-mode frequencies depend to the first order on that part of Q/sub 0/ associated with imperfect electric (metal) walls, but to the second order on that part associated with imperfect magnetic (open-circuit) walls. A new expression is given for the Q of an open-ended microstrip resonator when surface waves are excited in the dielectric, and it is shown that the unloaded Q (Q/sub 0/) can be dominated by this phenomenon. It is further shown that these Q-related effects, together with reactive perturbations arising from fringing, coupling structures, are the principal source of error in measurements for epsilon or epsilon/sub eff/. Such reactive effects may be treated semiquantitatively by applying Slater's perturbation theorem to the affected region. These procedures lead to the following revised values for the crystal permittivity of sapphire (monocrystalline Al/sub 2/0/sub 3/) in the microwave region: epsilon/sub ||/ (parallel to the c axis) = 11.6; epsilon/sub /spl perp// (base-plane) = 9.4.     

Measurement of Low-Loss Dielectric Materials Using Dielectric Rod Resonator

To obtain the complex permittivity of low-loss dielectric materials at 60 GHz, a measurement method is developed. Using a dielectric rod resonator excited by a dielectric waveguide, effective conductivity of conducting plates for short circuiting the resonator is determined. The complex permittivity of the dielectric rod is determined by the resonant frequency and unloaded quality factor of the TE_0m1-mode resonator. Moreover, the complex permittivity of single crystal sapphire, polycrystalline ceramics, and cordierite has been investigated in virtue of numerical simulation. For all the measured specimens in this study, the proposed method is seen to provide much better accuracy for values.     

On RF material characterization in the stripline cavity

We examine the accuracy of the air-filled stripline cavity in measuring the dielectric and magnetic properties of bulk materials in the frequency range of 150-2000 MHz. Measured data on complex permittivity and permeability for several different-sized specimens of dielectric and magnetic materials were compared with reference values obtained using other techniques of known uncertainties. Major differences were noted for both complex permittivity and permeability data, and we largely attribute these to less-than-optimal perturbation of the internal cavity fields by the material specimens under test. The technique is particularly unsuited to measuring the dielectric loss of the higher-permittivity low-loss materials due to energy scatter by the specimen under test. In order to improve measurement accuracy, we suggest guidelines on the range of specimen electric and magnetic volume needed for optimal cavity perturbation     

Millimeter Wave Measurement of the Low-Loss Dielectric in Vacuum Electronic Devices with Reflection-Type Hemispherical Open Resonator

Accurate dielectric properties are of great importance for the design and fabrication of the input and output windows in vacuum electronic devices. A reflection-type hemispherical open resonator (RTHOR) was designed through theoretical analysis and numerical simulation and also was utilized to measure the dielectric properties of the windows material sapphire. Compared with the two ports measurement, a simplified measurement system to obtain the dielectric performance was proposed and the RTHOR with only one coupling aperture was directly connected to a W-band vector network analyzer (VNA). The material properties can be easily calculated through the VNA measured port reflection coefficient (S₁₁) resonant curve. Investigation shows that the permittivity and the loss tangent of the measured sapphire, which is used to construct the input and output window, is respectively about 9.40 and 1.80?×?10^?4 at room temperature in W-band, which agree well with the reported results. Measured results also show that the simplified measurement system can provide a high accuracy for the measurement of low-loss dielectric in a relatively convenient way.