Extremely low thermal noise floor, high power oscillators usingsurface transverse wave devices

This paper presents state-of-the-art results on 1-GHz surface transverse wave (STW) oscillators running at extremely high loop power levels. The high-Q single-mode STW resonators used in these designs have an insertion loss of 3.6 dB, an unloaded Q of 8000, a residual PM noise of -142 dBc/Hz at a 1-Hz carrier offset, and operate at an incident power of up to +31 dBm in the loop. Other low-Q STW resonators and coupled resonator filters (CRF), with insertion losses in the 5-9 dB range, can conveniently handle power levels in excess of two Watts. These devices were incorporated into voltage controlled oscillators (VCO's) running from a 9.6-V dc source and provide an RF output power of +23 dBm at an RF/dc efficiency of 28%. Their tuning range was 750 kHz and the PM noise floor was -180 dBc/Hz. The oscillators, stabilized with the high-Q devices and using specially designed AB-class power amplifiers, delivered an output power of +29 dBm and exhibited a PM noise floor of -184 dBc/Hz and a 1-Hz phase noise level of -17 dBc/Hz. The 1-Hz phase noise level was improved to -33 dBc/Hz using a commercially available loop amplifier. In this case, the output power was +22 dBm. In all cases studied, the loop amplifier was found to be the factor limiting the close-to-carrier oscillator phase noise performance     

An X-band, high power dielectric resonator oscillator for future military systems

A 9.0-GHz dielectric resonator oscillator (DRO), generating a CW output power of 2.5 W at room temperature, has been designed and fabricated using a high-power GaAs MESFET and a dielectric resonator (DR) in a parallel feedback configuration. The oscillator exhibited a frequency stability of better than 130 ppm, without any temperature compensation, over the range -50 degrees C to +50 degrees C. The output power varied from +35 dBm (3.2 W) at -50 degrees C to +33 dBm (2 W) at +50 degrees C. The single-sideband phase noise levels were measured and found to be -105 and -135 dBc/Hz, at 10- and 100-kHz carrier offset frequencies, respectively. The oscillator output was then fed into a single-stage high-power MESFET amplifier, resulting in a total RF power output of 6.5 W. The overall DC to RF conversion efficiency of the 6.5-W unit was approximately 15.3%     

Characterization technique of optical whispering gallery mode resonators in the microwave frequency domain for optoelectronic oscillators

Optical Q factor measurements are performed on a whispering gallery mode (WGM) disk resonator using a microwave frequency domain approach instead of using an optical domain approach. An absence of hysteretic behavior and a better linearity are obtained when performing linewidth measurements by using a microwave modulation for scanning the resonances instead of the piezoelectric-based frequency tuning capability of the laser. The WGM resonator is then used to stabilize a microwave optoelectronic oscillator. The microwave output of this system generates a 12.48 GHz signal with -94 dBc/Hz phase noise at 10 kHz offset.     

An ultralow noise microwave oscillator based on a high-Q liquidnitrogen cooled sapphire resonator

Two liquid nitrogen-cooled sapphire loaded cavities (SLC's) operating at about 80 K have been successfully constructed, Both cavities were designed to operate on the whispering gallery (WG) E_{12, 1, δ} mode at a resonant frequency of 8.95 GHz. The first SLC was used as the frequency-determining element in a loop oscillator, while the second was used as a frequency discriminator to measure oscillator phase noise. The single sideband phase noise of a free running loop oscillator incorporating the first SLC was measured as -133 dBc/Hz at an offset frequency of 1 kHz, and was limited by the SLC Q-factor and the amplifier flicker phase noise. By using specially designed feedback electronics the oscillator phase noise was reduced to -156 dBc/Hz and -162 dBc/Hz at 1 and 10 kHz offset, respectively. This measurement was shown to be limited by the electronic flicker noise imposed by the phase detector in the feedback electronics, To our knowledge the phase noise and resonator Q-factor of 6×10⁷ represent the best results ever measured at liquid nitrogen temperatures or above     

Extremely low phase noise UHF oscillators utilizing high-overtone, bulk-acoustic resonators

High-overtone, bulk acoustic resonators (HBAR) have been designed that exhibit 9-dB insertion loss and loaded Q values of 80000 at 640 MHz with out-of-phase resonances occurring every 2.5 MHz. These resonators have been used as ovenized frequency-control elements in very low phase noise oscillators. The oscillator sustaining stage circuitry incorporates low-1/f noise modular RF amplifiers, Schottky-diode ALC, and a miniature 2-pole helical filter for suppression of HBAR adjacent resonant responses. Measurement of oscillator output signal flicker-of-frequency noise confirms that state-of-the-art levels of short-term frequency stability have been obtained. Sustaining stage circuit contribution to resulting oscillator flicker-of-frequency noise is 7-10 dB below that due to the resonators themselves. At 16-dBm resonator drive, an oscillator output signal white phase noise floor level of -175 dBc/Hz is achieved.     

1.5-GHz voltage controlled oscillator with 3% tuning bandwidth using a two-pole DSBAR filter

First results on a novel voltage controlled oscillator (VCO) in the lower gigahertz range, featuring excellent phase noise and high power efficiency are presented. The heart of the VCO is a recently reported novel miniature two-pole decoupled stacked bulk acoustic resonator (DSBAR) filter. With its single 180° phase transition over the 1 dB bandwidth, linear phase, and maximum 1 dB insertion loss, it provides stable single-mode operation over 45 MHz (≈3%) of tuning bandwidth and has negligible heat dissipation when operated at incident power levels of 100 mW or greater. The 1.55-GHz laboratory VCO prototypes operate at 5 V supply voltage, 50 mA supply current, 15 dBm of output power, and >13% efficiency, demonstrating -84 and < -180 dBc/Hz phase noise suppression at 1 kHz carrier offset and in the thermal noise region, respectively. VCOs with cascaded DSBAR filters for further phase noise reduction are also demonstrated.     

Phase noise measurements of 10-MHz BVA quartz crystal resonators

In this paper, we review a new piece of equipment that allows one to characterize the phase noise of crystal resonators using a phase bridge system with carrier suppression. This equipment allows one to measure the inherent phase stability of quartz crystal resonators in a passive circuit without the noise usually associated with an active oscillator. We achieved a system noise floor of approximately -150 dBc/Hz at 1 Hz and -160 dBc/Hz, at 10 Hz. A SPICE characterization of the carrier suppression system is given. An investigation of the phase modulation (PM) noise in 10 MHz BVA, SC-cut quartz crystal resonator pairs is presented.     

A hybrid superconductor/GaAs-MESFET microwave oscillator at 10.6 GHz

A 10.6 GHz hybrid superconducting film/GaAs-MESFET microwave oscillator has been designed, fabricated and characterized on a 10 mm × 15 mm LaAlO₃ substrate. The oscillator was a reflection mode type using a GaAs MESFET (NE72084) as the active device and a superconducting microstrip resonator as the frequency stabilizing element. By improving the unloaded quality factor of the superconducting microstrip resonator and adjusting coupling coefficient between the resonator and the MESFET, the phase noise of the oscillator was decreased. At 77 K, the phase noise of the oscillator at 10 KHz offset from carrier was −87 dBc/Hz.     

Low phase noise operation of microwave oscillator circuits

In this paper, we describe a theoretical basis, leading to new results, on the general conditions to be fulfilled by oscillator circuits to achieve a very low phase noise. Three main conditions must be fulfilled by a transistor oscillator circuit to reach the minimum phase noise. The energy stored in the resonator must be maximum. Its transfer to the controlling voltage port of the transistor current source must be first maximized. A possible conversion noise at the transistor output port will be also minimized by maximizing the energy transferred to that port. The proposed method has been applied to an experimental oscillator set up with a PHEMT transistor. A state-of-the-art phase noise of -80 dBc/Hz at 100 Hz offset from carrier with a 1/f(3) slope has been measured at room temperature with a 9.2 GHz, oscillator. The application of these new results to free-running oscillator circuits with one-stage then multistage transistor amplifiers demonstrate clearly the validity of the design method. The efficiency of this design method and its ease of use represent a real breakthrough in the field of low noise transistor oscillator circuit design.     

Broad tuning ultra low phase noise dielectric resonator oscillators using SiGe amplifier and ceramic-based resonators

This paper describes the design of very low noise, tunable, X-band dielectric resonator oscillators (DROs) demonstrating phase-noise performance of -135 dBc/Hz at 10 kHz offset. SiGe transistors are used for the oscillator sustaining amplifiers that offer a circulating power of 12 dBm and a gain of 5.4 dB per stage as well as a low flicker noise corner of 40 kHz. A variety of resonator configurations utilising BaTiO₃ resonators are presented demonstrating unloaded Qs from 10 000 to 22 000. These resonators are optimised and coupled to the amplifiers for minimum phase noise where Q_L/Q₀ = 1/2, and hence S₂₁ = -6 dB. To incorporate tuning with low additional phase noise, a phase shifter is also investigated. The theory for the low noise oscillator design is included; experimental results demonstrate close correlation with the theory.     

HF and VHF Source Stabilization Technique Incorporating Q-Multiplied Quartz Crystal Resonator

A new approach is described for the desiga of HF/VHF crystal-controlled frequency sources exhibiting theoretical short-term stability unattainable through the use of conventional quartz oscillator design. The signal generator design uses the concept of AFC stabilization of a conventional quartz oscillator (VCXO) by means of a crystal-controlled highly selective active frequency reference. The AFC reference is a phase-shift type frequency discriminator that employs a product detector and an active Q-multiplied quartz crystal resonator. The extremely selective transmission response, large group delay, and power gain exhibited by the resonator, together with resonator phase noise levels comparable to that exhibited by the oscillator-maintaining circuit, provide the principal means for prediction of superior output signal spectral purity. Models of the resonators have been designed and constructed at 30 and 80 MHz, exhibiting 3-dB bandwidths of 30 and 160 Hz, respectively. Based on actual measurement of VHF Q-multiplied crystal resonator performance characteristics, approximately 16 dB improvement in VHF crystal-controlled frequency source spectral purity at low and moderate modulation rates is possible, compared to that attainable using the best available VHF quartz oscillator circuit designs.     

1.05-GHz CMOS oscillator based on lateral- field-excited piezoelectric AlN contour- mode MEMS resonators

This paper reports on the first demonstration of a 1.05-GHz microelectromechanical (MEMS) oscillator based on lateral-field-excited (LFE) piezoelectric AlN contourmode resonators. The oscillator shows a phase noise level of -81 dBc/Hz at 1-kHz offset frequency and a phase noise floor of -146 dBc/Hz, which satisfies the global system for mobile communications (GSM) requirements for ultra-high frequency (UHF) local oscillators (LO). The circuit was fabricated in the AMI semiconductor (AMIS) 0.5-?m complementary metaloxide- semiconductor (CMOS) process, with the oscillator core consuming only 3.5 mW DC power. The device overall performance has the best figure-of-merit (FoM) when compared with other gigahertz oscillators that are based on film bulk acoustic resonator (FBAR), surface acoustic wave (SAW), and CMOS on-chip inductor and capacitor (CMOS LC) technologies. A simple 2-mask process was used to fabricate the LFE AlN resonators operating between 843 MHz and 1.64 GHz with simultaneously high Q (up to 2,200) and kt 2 (up to 1.2%). This process further relaxes manufacturing tolerances and improves yield. All these advantages make these devices suitable for post-CMOS integrated on-chip direct gigahertz frequency synthesis in reconfigurable multiband wireless communications.     

HBAR-Based 3.6 GHz oscillator with low power consumption and low phase noise

We have designed and built 2 oscillators at 1.2 and 3.6 GHz based on high-overtone bulk acoustic resonators (HBARs) for application in chip-scale atomic clocks (CSACs). The measured phase noise of the 3.6 GHz oscillator is -67 dBc/Hz at 300 Hz offset and -100 dBc/Hz at 10 kHz offset. The Allan deviation of the free-running oscillator is 1.5 × 10^-9 at one second integration time and the power consumption is 3.2 mW. The low phase noise allows the oscillator to be locked to a CSAC physics package without significantly degrading the clock performance.     

High-Q thermoelectric-stabilized sapphire microwave resonators forlow-noise applications

Two low-noise high-Q sapphire-loaded cavity (SLC) resonators, with unloaded Q values of 2×10⁵ and very low densities of spurious modes, have been constructed. They were designed to operate at 0°C with a center frequency of 10.000000 GHz. The cavity was cooled with a thermoelectric (TE) Peltier element, and in practice achieved the required center frequency near 1°C. The resonator has a measured frequency-temperature coefficient of -0.7 MHz/K, and a Q factor which is measured to be proportional to T^-2.5. An upper limit to the SLC residual phase noise of ℒ (100) Hz=-147 dBc/Hz, ℒ (1 kHz)=-155 dBc/Hz, and ℒ (10) kHz=-160 dBc/Hz has been measured. Also, we have created a free-running loop oscillator based on one of the SLC resonators, and measured a phase noise of ℒ(f)~-10-30log [f] dBc/Hz between f=10 /Hz and 25 kHz, using the other as a discriminator     

Phase noise measurements in dual-mode SC-cut crystal oscillators

This paper describes the phase-noise characteristics and the analysis model of an SC-cut dual-mode oscillator. The C mode phase-noise sideband levels of -124 dBc at 10 Hz and -154 dBc at 10 kHz have been demonstrated using a dual-mode oscillator that simultaneously excited the C and B mode of a 10-MHz, third overtone, SC-cut crystal resonator. Based on Leeson's model, a phase-noise analysis model for dual-mode oscillators has been proposed also. Actual phase-noise levels of the C mode in dual-mode oscillation corresponded well to results calculated from the proposed model.     

Lithium-niobate-based surface acoustic wave oscillator directly integrated with CMOS sustaining amplifier

In this study, a LiNbO(3)-based SAW resonator was directly integrated with a CMOS sustaining amplifier using new wafer-bonding-based integration technology. The developed integration technology has overcome the large thermal expansion mismatch between LiNbO(3) (14 to 15 ppm/K along the a-axis) and Si (2.6 ppm/K) by temporary wafer supporting and low-temperature Au-Au bonding. Two kinds of bonding, UV polymer bonding for temporary wafer supporting and Au-Au bonding following plasma surface activation, are key process technologies. A 500-MHz one-chip SAW oscillator was prototyped and evaluated. A low phase noise of -122 dBc/ Hz at 10 kHz offset and -160 dBc/Hz at 500 kHz offset was achieved.     

Residual phase noise measurements of VHF, UHF, and microwavecomponents

The results of residual phase noise measurements on a number of VHF, UHF, and microwave amplifiers, both silicon (Si) bipolar junction transistor (BJT) and gallium arsenide (GaAs) field effect transistor (FET) based, electronic phase shifters, frequency dividers and multipliers, etc., which are commonly used in a wide variety of frequency source and synthesizer applications are presented. The measurement technique has also been used to evaluate feedback oscillator components, such as the loop and buffer amplifiers, which can play important roles in determining an oscillator's output phase noise spectrum (often in very subtle ways). While some information has previously been published related to component residual phase noise properties, it generally focused on the flicker noise levels of the devices under test, for carrier offset frequencies less than 10 kHz. The work reported herein makes use of an extremely low noise, 500 MHz surface acoustic wave resonator oscillator (SAWRO) test source for residual phase noise measurements, both close-to-and far-from-the-carrier. Using this SAWRO-based test source at 500 MHz, we have been able to achieve a measurement system phase noise floor of -184 dBc/Hz, or better, for carrier offset frequencies greater than 10 kHz, and a system flicker phase noise floor of -150 dBc/Hz, or better, at 1 Hz carrier offset. The paper discusses the results of detailed residual phase noise measurements performed on a number of components using this overall system configuration. Several interesting observations related to the residual phase noise properties of moderate to high power RF amplifiers, i.e., amplifiers with 1 dB gain compression points in the range of +20 to +33 dBm, are highlighted     

Optimization of an ultra low-phase noise sapphire--SiGe HBT oscillator using nonlinear CAD

In this paper, the electrical and noise performances of a 0.8 /spl mu/m silicon germanium (SiGe) transistor optimized for the design of low phase-noise circuits are described. A nonlinear model developed for the transistor and its use for the design of a low-phase noise C band sapphire resonator oscillator are also reported. The best measured phase noise (at ambient temperature) is -138 dBc/Hz at 1 kHz offset from a 4.85 GHz carrier frequency, with a loaded Q/sub L/ factor of 75,000.     

Tunable ferroelectric capacitor-based voltage-controlled oscillator

Ferroelectric capacitors made from Ba(1-0.5)Sr0.5TiO3 (BST) are applied as varactors in tunable, high-frequency circuit applications. In this context, a voltage-controlled oscillator (VCO) has been designed and implemented using discrete RF bipolar junction transistor (BJTs) and tunable ferroelectric capacitor. The designed VCO has a tuning range from 205 MHz to 216.3 MHz with a power dissipation of 5.1 mW. The measured phase noise is -90 dBc/Hz at 100 kHz and -140 dBc/Hz at 1 MHz offset.     

Microwave oscillators incorporating cryogenic sapphire dielectricresonators

Progress is reported on efforts to develop a commercially-viable high purity X-band signal source incorporating a cryogenic sapphire dielectric resonator. The resonator design is of the whispering gallery type to take advantage of the excellent electromagnetic field confinement offered by this geometry. Complications resulting from the high spurious mode density of this type of resonator have been eliminated by developing a very accurate and complete mode analysis program which fully incorporates the dielectric anisotropies of the sapphire ring. This program allows the design of a window in the frequency domain where no unwanted modes exist, with accurate placement of the desired mode at the center of this region. Preliminary evaluation of the phase noise properties of simple oscillators incorporating these resonators have been performed. For example, in a dual-oscillator comparison of two oscillators operating near 13 GHz phase noise values of L(f)=-55 dBc/Hz, -145 dBc/Hz and -161 dBc/Hz were obtained for offset frequencies of 1 Hz, 1 kHz and 10 kHz, respectively