150keV质子辐照对GaAs子电池性能的影响

低能质子辐射会使电池产生较大的非电离能量损失,导致少数载流子寿命降低从而破坏GaInP/GaAs/Ge电池的电性能,其中尤以中间的GaAs子电池的衰减最严重。本文以卫星用主流GaInP/GaAs/Ge三结电池为研究对象,制备与三结电池中GaAs子电池相同尺寸结构和工艺的单结GaAs电池,以150 keV质子辐照后对其性能进行测试。测试结果表明,150 keV质子辐照后电池的量子效率衰减,且基区衰减最严重。光致发光测试结果显示,在3×10~(10)、1×10~(11)、5×10~(11) cm~(-2)辐照注量下,非辐射复合少数载流子寿命分别为2.22、0.67、0.13 ns。基于上述结果,利用多物理场仿真软件COMSOL建立了GaAs的物理模型,对GaAs子电池衰减进行仿真,将实验结果与模拟结果进行对比,两者电学参数的最大相对偏差为7%。仿真结果表明:中国空间站中电池的辐射衰减主要源于内辐射带中的质子,空间站轨道太阳能电池运行5 a,在太阳活动极大时,最大功率衰减约为7.6%,太阳活动极小时,最大功率衰减约为13.7%。     

GaInP/GaAs/Ge三结太阳电池100MeV质子位移辐照损伤效应实验研究

GaInP/GaAs/Ge三结太阳电池是当前航天器空间电源系统的核心元器件,其在空间辐射环境中遭受的辐照损伤会导致太阳电池性能参数衰降,甚至导致航天器供电系统功能失效。为获取GaInP/GaAs/Ge三结太阳电池高能质子辐照损伤退化规律,以国产GaInP/GaAs/Ge三结太阳电池为研究对象,通过开展100 MeV质子不同注量下的辐照实验,分析质子位移损伤诱发GaInP/GaAs/Ge三结太阳电池的开路电压(V_oc)、短路电流(I_sc)、最大输出功率(P_m)、光电转换效率(E_ff)等辐射敏感参数的退化规律和损伤机理。结果表明：注量范围为1×10¹¹～2×10¹² cm^-2时,V_oc、I_sc、P_m、E_ff的退化程度随辐照注量的增加而增大,当注量为2×10¹² cm^-2时,P_m和E     

电子辐照GaInP/GaAs/Ge三结太阳电池少子寿命的变化

为研究电子辐照空间太阳电池的损伤机制,对电子辐照GaInP/GaAs/Ge三结太阳电池进行了光致发光谱测量,分析了GaInP顶电池及GaAs中间电池发光强度随电子注量的变化规律。利用辐射效率关系对归一化发光强度随电子辐照注量的变化进行了拟合,分别得到了GaInP顶电池及GaAs中间电池在不同辐照条件下的少子非辐射复合寿命τ_nr,通过对比辐照前后少子非辐射复合寿命的衰降变化,发现GaInP顶电池的抗辐照性能优于GaAs中间电池。     

0.28-2.80 MeV质子辐射对空间实用GaInP/GaAs/Ge多结太阳电池性能的影响

用0.28、0.62和2.80 MeV质子束模拟空间辐射对国产MOCVD方法制备的GaInP/GaAs/Ge多结电池进行质子辐射效应研究.辐照注量为1×1012 cm-2.对电池的辐射效应用I-V特性和光谱响应测试进行分析.结果表明:随质子辐照能量的增加,太阳电池性能参数Isc,Voc,Pmax和光谱响应的衰降幅度均减小,0.28MeV质子辐照引起电池性能衰降最显著;低能质子辐照引起中间GaAs电池光谱响应衰降更明显.     

一种国产GaInP/GaAs/Ge三结太阳电池的电子辐照特性

对一种国产GaInP/GaAs/Ge三结太阳电池进行了1 MeV电子辐照损伤研究,分析和讨论了不同注量电池电参数和光谱响应的衰降规律.实验结果表明,这种电池不但有很高的初始效率,而且有好的抗辐射性,电子注量达到1×1015 cm-2时,最大输出功率为辐照前的80.4%.辐照后GaInP顶电池几乎不发生退化,而GaAs中间电池短路电流严重退化,致使GaInP顶电池与GaAs中间电池电流失配,是GaInP/GaAs/Ge电池性能退化的主要原因.     

柔性倒置赝型三结太阳电池高能质子辐射效应研究

为考察柔性薄膜GaInP/GaAs/InGaAs倒赝型三结（IMM3J）太阳电池的抗辐照性能,本文对其进行了1、3、5 MeV高能质子辐照。SRIM模拟结果表明,1、3、5 MeV质子辐照在IMM3J电池中造成均匀的位移损伤。光特性(LIV)结果表明,开路电压(Voc)、短路电流(Isc)和最大输出功率(Pmax)与质子注量呈对数退化规律。通过非电离能量损失（NIEL）将不同能量质子的注量转化为位移损伤剂量（DDD）,结果显示,Voc和Pmax与DDD呈对数退化规律,而Isc遵循两种不同的退化规律。光谱响应测试证明,GaInP子电池具有优异的抗辐照性能,3个子电池中InGaAs(10 eV)子电池的抗辐照性能最差。     

位移损伤效应对AlGaN/GaN HEMT器件的影响

对AlGaN/GaN高电子迁移率晶体管(HEMT)分别进行3 MeV质子辐照和14 MeV中子辐照实验。3 MeV质子辐照下累积注量达到1×10¹⁵ cm^-2或14 MeV中子辐照下累积注量达到2×10¹³ cm^-2时，AlGaN/GaN HEMTs饱和漏电流下降，阈值电压正向漂移，峰值跨导降低。分别对3 MeV质子辐照和14 MeV中子辐照后的AlGaN/GaN HEMTs进行深能级瞬态谱(DLTS)测试。3 MeV质子辐照后缺陷浓度下降降低了反向栅极漏电流，而14 MeV中子辐照会导致缺陷浓度增加，使得反向栅极漏电流增加。根据质子和中子辐照后的缺陷能级均为(0.850±0.020) eV,推断缺陷类型均为氮间隙缺陷，质子辐照和中子辐照后氮间隙缺陷的位移导致的位移损伤效应是AlGaN/GaN HEMT器件电学性能退化的主要原因。     

温度及功率变化研究电子辐射GaAs电池的热淬灭效应

为进一步探究电子辐射GaInP/GaAs/Ge三结太阳电池GaAs中间电池的热淬灭效应,对该子电池进行了温度及功率变化光致发光谱测量,分析了发光峰强度及其峰位的变化。利用Arrhenius方程对发光强度随温度的变化进行拟合,得到辐射引入GaAs中间电池非辐射复合中心的热激活能（0.96 eV）。通过分析10~300 K温度范围内发光强度的热淬灭效应,发现发光强度与激发功率的关系从线性关系逐渐转变为二次方关系。利用此关系进一步验证了GaAs中间电池的主要缺陷是非辐射复合中心,探究了电子辐射GaAs中间电池热淬灭效应发生的机理。     

低能电子辐照对环氧树脂性能的影响

为了研究低能电子辐照对环氧树脂的体积电阻率、邵氏硬度、拉伸强度和官能团结构的影响,本文在电子辐照能量为30 keV,注量率1×10¹¹ cm^-2•s^-1,总注量为1.6×10¹⁴ cm^-2,真空度10^-6 Pa条件下,结合国家标准对辐照前、后环氧树脂材料的机械性能和结构进行表征。结果表明,辐照后环氧树脂材料的体积电阻率、邵氏硬度、拉伸强度等宏观物理性能均有下降。傅里叶红外光谱图显示环氧树脂主要官能团强度降低,产生的•H、•OH等自由基与聚合物分子上的羟基与氢结合。研究结果对环氧树脂材料在辐射环境中的使用具有重要意义。     

BRISOL钠同位素放射性核束的产生

北京放射性核束装置在线同位素分离器（BRISOL）采用100 MeV、200 μA回旋加速器提供的质子束打靶产生中、短寿命放射性核束,在线分析后供物理用户使用,其质量分辨率好于20 000。为开展²⁰Na核的奇异衰变特性研究,研制了氧化镁靶,并采用100 MeV质子束轰击氧化镁靶在线产生了^20～26Na⁺的钠同位素放射性核束。当质子束流强为8 μA时,²⁰Na⁺离子束的最大产额为2×10⁵ s^-1,²¹Na⁺离子束的最大产额为4×10⁸ s^-1。完成了北京放射性核束装置首个放射性核束物理实验,累计供束近200 h。     

Characteristics of GaAs buffered FET logic (BFL) MESFETs andinverters exposed to high-energy neutrons

A systematic investigation of the effects of high-energy neutrons on GaAs metal-semiconductor field-effect transistors (MESFETs) and buffered FET logic (BFL) gates has been carried out. Discrete transistors, inverters, and ring oscillators were characterized and modeled as a function of neutron fluence. Measurements were made of the threshold voltage shifts, the transconductance degradation, and saturation current degradation of GaAs depletion mode MESFETs, which comprise the BFL logic gates, irradiated with neutron fluences ranging from 5×10¹³ n/cm² to 2×10¹⁵ n/cm² (for particle energies above 10 keV). The threshold voltage was found to shift positively by 0.45 V, the transconductance decreased to 3%, and the saturation current to 1% of their unirradiated values at the highest neutron fluence (2×10¹⁵ n/cm²). The BFL inverter characteristics were measured and successfully simulated with SPICE using device parameters extracted from the neutron-damaged FETs. Ring oscillator measurements were made to determine the effects of high-energy neutrons on the frequency performance of BFL circuits. The ring oscillator frequency decreased to 9% of its unirradiated value at the highest neutron fluence     

A study on the degradation of GaAs/Ge solar cells irradiated by <200 keV protons

Damage effects in GaAs/Ge solar cells irradiated by <200 keV protons were studied by measuring their electrical properties and spectral response together with SRIM simulations. Proton energies of 40, 70 and 170 keV were chosen. Experimental results show that the short circuit current, open circuit voltage and maximum power decrease with increasing proton fluence. The degradation of the open circuit voltage is highest for 70 keV irradiation and lowest for 40 keV irradiation. The degradation of short circuit current decreases with increasing proton energy. According to SRIM simulations and spectral response analysis, the above changes in electrical properties are mainly related to damage in different regions of the solar cells.     

GaAs基β辐射伏特效应微电池的参量优化设计研究

考虑放射性同位素源自吸收效应,提出基于半导体材料GaAs和同位素源⁶³Ni的微电池最优化设计方案,并通过蒙特卡罗程序MCNP模拟计算β粒子在半导体材料中的输运过程,对同位素源与半导体材料的厚度,换能单元PN结结深、耗尽区宽度、掺杂浓度、少子扩散长度,及电子空穴对的产生及收集情况等进行了研究和分析,给出了不同结深下,各物理参量的最佳设计值。在源活度为3.7×10⁷ Bq,PN结表面积为0.01 cm²时,提出的辐射伏特效应微电池最优化设计方案可实现：短路电流密度为379.68 nA/cm²,开路电压为1.375 V,填充因子为84.39%, 最大输出功率为440.4 nW/cm²,能量转化率为4.34%。     

A study on the electric properties of single-junction GaAs solar cells under the combined radiation of low-energy protons and electrons

Displacement damage induced by charged particle radiation is the main cause of degradation of orbital-service solar cells, while the radiation-induced ionization shows no permanent damage effect on their electrical properties. It is reported that in single crystal silicon solar cells, low-energy electron radiation does not exert permanent degradation of their properties, but the fluence of electron radiation exerts an influence on the damage magnitude under the combined radiation of protons and electrons. The electrical properties of the single-junction GaAs/Ge solar cells were investigated after irradiation by sequential and synchronous electron and proton beams. Low-energy electron radiation showed no effects on the change of the solar cell properties during sequential or synchronous irradiation, implying ionization during particle radiation could not exert influence on the displacement damage process to the solar cells under the experimental conditions.     

Charge collection and noise analysis of heavily irradiated silicondetectors

Measurements performed on high-resistivity silicon detectors irradiated with proton and neutron fluences, up to 3.5×10¹⁴ p/cm², and 4.0×10¹⁵ n/cm² respectively, are presented. The charge collection efficiency (CCE) and the output noise of the devices have been measured to carry out a detector performance study after irradiation. The CCE is found to slowly decrease for fluences increasing up to approximately 1.8×10¹⁴ p/cm². For higher particle fluences, the device inefficiency increases rapidly because full depletion could not be reached (up to 75% for the highest fluence: 4×10¹⁵ n/cm ²). A complete analysis of the noise of the irradiated devices has been carried out assuming a simple model which correlates the main noise sources to the fluence and the leakage current. A linear dependence of the square of the noise amplitude on the fluence has been observed: a value of the leakage current damage constant has been found to be in good agreement with the values reported in literature, obtained with current-voltage (IV) analysis. An extension of the noise analysis is carried out considering the detectors irradiated with very high fluences, up to 4×10¹⁵ n/cm²     

Characteristics of GaAs MESFET inverters exposed to high energyneutrons

GaAs MESFET circuits were exposed to high-energy neutrons with fluences ranging from 1×10¹⁴ n/cm² to 2×10¹⁵ n/cm². The reflections of discrete transistors, inverters, and ring oscillators were characterized at each fluence. While the MESFETs exhibit significant threshold voltage shifts and transconductance and saturation current degradation over this range of neutron fluences, an improvement in the DC characteristics of Schottky diode FET logic (SDFL) inverters was observed. This unusual result has been successfully simulated using device parameters extracted from FETs damaged by exposure to high-energy neutrons. Although the decrease in device transconductance results in an increase in inverter gate delay as reflected in ring oscillator frequency measurements, it is concluded that GaAs ICs fabricated from this logic family will remain functional after exposure to extreme neutron fluences. This is a consequence of the observed improvement in inverter noise margin evident in both measured and simulated circuit performance     

Exposure of Equal-Channel Angular Extruded Tungsten to Deuterium Plasma

Surface morphology and deuterium retention in ultrafine-grained tungsten fabricated by equal-channel angular pressing(ECAP) have been examined after exposure to a low energy,high-flux deuterium(D) plasma at fluences of 3×10~(24) D/m~2 and 1×10~(25) D/m~2 in a temperature range of 100 ℃-150 ℃.The methods used were scanning electron microscopy(SEM) and thermal desorption spectroscopy(TDS).Sparse and small blisters(~0.1 μm) were observed by SEM after D plasma irradiation on every irradiated surface;yet they did not exhibit significant structure or plasma fluence dependence.Larger blisters or protrusions appeared after subsequent TDS heating up to 1000 ℃.The TDS results showed a single D desorption peak at ~220℃ for all samples and the D retention increased with increasing numbers of extrusion passes,i.e.,the decrease of grain sizes.The increased D retention in this low temperature range should be attributed to the faster diffusion of D along the larger volume fraction of grain boundaries introduced by ECAP.