SWAN: high-level simulation methodology for digital substrate noise generation

Substrate noise generated by the switching digital circuits degrades the performance of analog circuits embedded on the same substrate. It is therefore important to know the amount of noise at a certain point on the substrate. Existing transistor-level simulation approaches based on a substrate model extracted from layout information are not feasible for digital circuits of practical size. This paper presents a complete high-level methodology, which simulates a large digital standard cell-based design using a network of substrate macromodels, with one macromodel for each standard cell. Such macromodels can be constructed for both EPI-type and bulk-type substrates. Comparison of our substrate waveform analysis (SWAN) to several measurements and to several full SPICE simulations indicates that the substrate noise is simulated with our methodology within 10%-20% error in the time domain and within 2 dB relative error at the major resonance in the frequency domain. However, it is several orders of magnitude faster in CPU time than a full SPICE simulation.     

一种混合信号集成电路衬底耦合噪声分析方法

讨论分析了混合信号集成电路衬底噪声耦合的机理,及对模拟电路性能的影响。提出了一种混合信号集成电路衬底耦合噪声分析方法,基于TSMC 0.35μm 2P4M CMOS工艺,以14位高速电流舵D/A转换器为例,给出了混合信号集成电路衬底耦合噪声分析方法的仿真结果,并与实际测试结果进行比较,证实了分析方法的可信性。     

Analysis and experimental verification of digital substrate noisegeneration for epi-type substrates

Substrate coupling in mixed-signal IC's can cause important performance degradation of the analog circuits. Accurate simulation is therefore needed to investigate the generation, propagation, and impact of substrate noise. Recent studies were limited to the time-domain behavior of generated substrate noise and to noise injection from a single noise source. This paper focuses on substrate noise generation by digital circuits and on the spectral content of this noise. To simulate the noise generation, a SPICE substrate model for heavily doped epi-type substrates has been used. The accuracy of this model has been verified with measurements of substrate noise, using a wide-band, continuous-time substrate noise sensor, which allows accurate measurement of the spectral content of substrate noise. The substrate noise generation of digital circuits is analyzed, both in the time and frequency domain, and the influence of the different substrate noise coupling mechanisms is demonstrated. It is shown that substrate noise voltages up to 20 mV are generated and that, in the frequency band up to 1 GHz, noise peaks are generated at multiples of the clock and repetition frequency. These noise signals will strongly deteriorate the behavior of small signal analog amplifiers, as used in integrated front-ends     

Substrate-aware mixed-signal macrocell placement in WRIGHT

We describe a set of placement algorithms for handling substrate coupled switching noise. A typical mixed-signal IC has both sensitive analog and noisy digital circuits, and the common substrate parasitically couples digital switching transients into the sensitive analog regions of the chip. To preserve the integrity of sensitive analog signals, it is thus necessary to electrically isolate the analog and digital. We argue that optimal area utilization requires such isolation be designed into the system during first-cut chip-level placement. We present algorithms that incorporate commonly used isolation techniques within an automatic placement framework. Our substrate-noise evaluation mechanism uses a simplified substrate model and simple electrical representations for the noisy digital macrocells. The digital/analog interactions determined through these models are incorporated into a simulated annealing macrocell placement framework. Automatic placement results indicate these substrate-aware algorithms allow efficient mixed-signal placement optimization     

Measurements and analysis of PLL jitter caused by digital switchingnoise

When integrating analog and digital circuits onto a mixed-mode chip, power supply noise coupling is a major limitation on the performance of the analog circuitry. Several techniques exist for reducing the noise coupling, of which one of the cheapest is separating the power supply distribution networks for the analog and digital circuits. Noise coupling from a digital noise-generating circuit through the power supply/substrate into an analog phase-locked loop (PLL) is analyzed for three different power supply schemes. The main mechanisms for noise coupling are identified by comparing different PLLs and varying their bandwidths. It is found that the main cause of jitter strongly depends on the power supply configuration of the PLL. Measurements were done on mixed-mode designs in a standard 0.25-μm digital CMOS process with a low-resistivity substrate. The same circuits were also implemented with triple-well processing for comparisons     

Modeling and experimental verification of substrate noise generation in a 220-Kgates WLAN system-on-chip with multiple supplies

Substrate noise is a major obstacle for mixed-signal integration. While the power consumption scales linearly with the clock frequency, substrate noise does not have this scaling due to the resonances in the transfer function of the supply current to the substrate. This paper addresses a practical technique to estimate the substrate noise frequency spectrum of a large mixed-mode System-on-Chip (SoC) with multiple supplies and embedded memories. The results have been verified with substrate noise measurements on a 60-MHz 220-Kgates telecom SoC implemented in a 0.35 /spl mu/m CMOS process on an EPI-type substrate. We compute a linear chip-level substrate model together with the single-cycle representation of piecewise-linear noise sources of three supply regions used in this ASIC. Based on this model we accurately estimate the four major resonances in the substrate noise spectrum and their relative magnitudes with 2 dB relative error at the major resonance with respect to measurements. We also present substrate noise measurements at different operating modes of the WLAN receiver. These measurements show that output I/O buffers generate significant substrate noise where an increase of 44% is measured for substrate noise peak-to-peak value due to the additional simultaneous switching of six output I/O buffers with already fully switching datapath and two output I/Os.     

Simulation and measurement of supply and substrate noise in mixed-signal ICs

Digital noise in mixed-signal circuits is characterized using a scalable macromodel for substrate noise coupling. The noise coupling obtained through simulations is verified with measured data from a digital noise generator and noise sensitive analog circuits fabricated in the 0.35-/spl mu/m heavily doped CMOS process. The simulations and measurements also demonstrate the effectiveness of including grounded guard rings and separating bulk and supply pins in digital circuits to reduce substrate coupling.     

Modeling of Substrate Noise Generation, Isolation, and Impact for an LC-VCO and a Digital Modem on a Lightly-Doped Substrate

Substrate noise generated by the digital circuits on a mixed-signal IC can severely disturb the analog and RF circuits sharing the same substrate. Simulations at the circuit level of the substrate noise coupling in large systems-on-chip (SoCs) do not provide the necessary understanding in the problem. Analysis at a higher level of abstraction gives much more insight in the coupling mechanisms. This paper presents a physical model to estimate and understand the substrate noise generation by a digital modem, the propagation of this noise and the resulting performance degradation of LC tank VCOs. The proposed linearized model is fast to derive and to evaluate, while remaining accurate. It is validated with measurements on two test structures: a reference design and a design with a$hboxp^+ $/n-well (digital) guard ring. Both structures contain a functional 40k gate digital modem and a 0.18$muhbox m$3.5 GHz CMOS LC-VCO on a lightly-doped substrate. In both cases, the model accurately predicts the level of the spurious components appearing at the VCO output due to the digital switching activity. The error remains smaller than 3 dB. Finally, we demonstrate how the proposed model enables a systematic and controlled isolation strategy to suppress substrate noise coupling problems. As an example, the model is used to determine suitable dimensions for a digital guard ring.     

Voltage-comparator-based measurement of equivalently sampledsubstrate noise waveforms in mixed-signal integrated circuits

This paper describes measurement of substrate noise waveforms in mixed-signal integrated circuits. This method uses wide-band chopper-type single-ended voltage comparators as on-chip noise detectors. By analyzing equivalently sampled comparator outputs in synchronized operation, the noise voltage in the auto-zero and compare modes can be measured separately, and noise waveforms were experimentally reconstructed to within 0.5-ns accuracy. The noise transmission path was analyzed, and this showed that the noise sampled at the auto-zero mode of the comparator can be used to reconstruct substrate noise waveforms with high resolution. The results also explain the influence of noise coupling on analog circuits widely used in on-chip analog-to-digital converters     

Noise Reduction in CMOS Circuits Through Switched Gate and Forward Substrate Bias

A new concept of noise reduction in CMOS circuits is presented taking advantage of a strong reduction of MOSFET low-frequency noise occurring under switched gate bias conditions and forward substrate bias. The effect of forward substrate bias on noise reduction is significantly larger in switched compared to constant gate bias conditions. Experimental results reveal that forward substrate bias is most effective when applied during the off-state of the transistor. A bias scheme adopting forward substrate bias only during the transistor off-state is suggested by the measurement results of transconductance efficiency ${rm gm}/{rm Id}$ and intrinsic voltage gain ${rm gm}/{rm gds}$ showing that these figures of merit are degraded when a forward substrate bias is applied during the on-state. As a first example exploiting the found noise reduction on circuit level, a 14 GHz pMOS VCO is presented. Our results show a significant reduction of close to carrier phase noise when a forward substrate bias is applied to the MOSFETs providing the negative conductance stage for the oscillation of the VCO. The outlined principles can be extended to other circuits and motivate new topologies and biasing schemes for analog and radio frequency CMOS circuits.      

Substrate noise generation in complex digital systems: efficient modeling and simulation methodology and experimental verification

More and more system-on-chip designs require the integration of analog circuits on large digital chips and will therefore suffer from substrate noise coupling. To investigate the impact of substrate noise on analog circuits, information is needed about digital substrate noise generation. In this paper, a recently proposed simulation methodology to estimate the time-domain waveform of the substrate noise is applied to an 86-Kgate CMOS ASIC on a low-ohmic epi-type substrate. These simulation results have been compared with substrate noise measurements on this ASIC and the difference between the simulated and measured substrate noise rms voltage is less than 10%. The simulated time domain waveform and frequency spectrum of the substrate noise correspond well with the measurements, indicating the validity of this simulation methodology. Both measurements and simulations have been used to analyze the substrate noise generation in more detail. It has been found that direct noise coupling from the on-chip power supply to the substrate dominates the substrate noise generation and that more than 80% of the substrate noise is generated by simultaneous switching of the core cells. By varying the parameters of the simulation model, it has been concluded that a flip-chip packaging technique can reduce the substrate noise rms voltage by two orders of magnitude when compared to traditional wirebonding.     

Substrate Noise Simulation Techniques for Analog-Digital Mixed LSI Design

Crosstalk from digital to analog circuits can be causative of operation fails in analog-digital mixed LSIs. This paper describes modeling techniques and simulation strategies of the substrate coupling noise. A macroscopic substrate noise model that expresses the noise as a function of logic state transition frequencies among digital blocks is proposed. A simulation system based on the model is implemented in the mixed signal simulation environment, where performance degradation of the 2nd order ADC coupled to digital noise sources is clearly simulated. These results indicate that the proposed behavioral modeling approach allows practicable full chip substrate noise simulation measures.     

数字信号处理在雷达相噪测量中的应用

随着通信和雷达的发展,脉冲信号的相位噪声成了影响整个系统性能的重要因素之一,采用传统模拟相位检波法测量脉冲信号相位噪声是一个非常大的挑战,因为这样的测试系统非常复杂,并且在测量相位噪声之前需要非常繁琐的校准程序,先进的正交数字相位解调和幅度解调技术能很好地解决这个问题。采用正交数字相位解调和幅度解调技术的系统不需要相位检波器和复杂的校准程序,利用极低噪声的参考源和互相关技术,提高了系统动态范围和测量灵敏度,实现了一键式精密测量脉冲相位噪声和调幅噪声。     

Substrate model extraction using finite differences and parallel multigrid

Substrate noise in integrated circuits is one of the most important problems in high-frequency mixed-signal designs, such as communication, biomedical and analog signal processing circuits and systems. Fast-switching digital blocks inject noise into the common substrate, hindering the performance of high-precision sensible analog circuitry. Miniaturization trends require increasing the accuracy in substrate coupling simulation environments. However, model extraction and evaluation times should not increase, which demands for fast and still accurate substrate model extraction tools.

In this work, a three-dimensional finite difference extraction methodology is presented. The resulting three-dimensional mesh is efficiently reduced to a circuit-level contact-based model by means of a fast multigrid-based algorithm. Moreover, this contact-based model extraction is shown to be efficiently computed in a parallel environment, resulting in extremely useful extraction speedups. Extraction results prove the proposed method to be very efficient, providing linear time and space complexity, and a constant number of iterations, outperforming competing algorithms.     

The effect of test system impedance on measurements of groundbounce in printed circuit boards

Based on the 3D-FDTD approach, an efficient equivalent model employing the embedded resistive voltage source is proposed to simulate the effect of test system impedance on the measurement of the ground bounce noise for the power planes structure in the printed circuit boards (PCB). Compared with the measured results by vector network analyzer, this equivalent model well predicts the impedance behavior of the V_cc/GND power planes. The influences of different probe loading conditions of the test system on the measurement of impedance behavior are studied. It is found that the effects of the probing loads on the measurement of the ground bounce noise is significant at the frequencies near the dc point and resonance, but the influences of the probes are small at the frequencies far from resonance. In addition, the transfer characteristics of the power bus in the realistic digital circuits with decoupling capacitance being considered are simulated in the FDTD model. The difference of the transfer behavior between the realistic case without coaxial feed and the measured results with probing effects is also numerically compared. We find that the ground bounce noise in the real circuit can be accurately measured at most frequencies, where the power planes act in very low impedance, except at the frequencies near dc and resonance frequencies, where the power planes behave in relatively higher impedance characteristics     

Experimental results and modeling techniques for substrate noise inmixed-signal integrated circuits

An experimental technique is described for observing the effects of switching transients in digital MOS circuits that perturb analog circuits integrated on the same die by means of coupling through the substrate. Various approaches to reducing substrate crosstalk (the use of physical separation of analog and digital circuits, guard rings, and a low-inductance substrate bias) are evaluated experimentally for a CMOS technology with a substrate comprising an epitaxial layer grown on a heavily doped bulk wafer. Observations indicate that reducing the inductance in the substrate bias is the most effective. Device simulations are used to show how crosstalk propagates via the heavily doped bulk and to predict the nature of substrate crosstalk in CMOS technologies integrated in uniform, lightly doped bulk substrates, showing that in such cases the substrate noise is highly dependent on layout geometry. A method of including substrate effects in SPICE simulations for circuits fabricated on epitaxial, heavily doped substrates is developed     

Substrate coupling in digital circuits in mixed-signal smart-power systems

This paper describes theoretical and experimental data characterizing the sensitivity of nMOS and CMOS digital circuits to substrate coupling in mixed-signal, smart-power systems. The work presented here focuses on the noise effects created by high-power analog circuits and affecting sensitive digital circuits on the same integrated circuit. The sources and mechanism of the noise behavior of such digital circuits are identified and analyzed. The results are obtained primarily from a set of dedicated test circuits specifically designed, fabricated, and evaluated for this work. The conclusions drawn from the theoretical and experimental analyses are used to develop physical and circuit design techniques to mitigate the substrate noise problems. These results provide insight into the noise immunity of digital circuits with respect to substrate coupling.     

Addressing substrate coupling in mixed-mode ICs: simulation andpower distribution synthesis

This paper describes new techniques for the simulation and power distribution synthesis of mixed analog/digital integrated circuits considering the parasitic coupling of noise through the common substrate. By spatially discretizing a simplified form of Maxwell's equations, a three-dimensional linear mesh model of the substrate is developed. For simulation, a macromodel of the fine substrate mesh is formulated and a modified version of SPICE3 is used to simulate the electrical circuit coupled with the macromodel. For synthesis, a coarse substrate mesh, and interconnect models are used to couple linear macromodels of circuit functional blocks. Asymptotic Waveform Evaluation (AWE) is used to evaluate the electrical behavior of the network at every iteration in the synthesis process. Macromodel simulations are significantly faster than device level simulations and compare accurately to measured results. Synthesis results demonstrate the critical need to constrain substrate noise and simultaneously optimize power bus geometry and pad assignment to meet performance targets     

Scanning electron microscope image enhancement using spread spectrum through dither signal imposition

Noise is a primary issue in obtaining an image in a scanning microscope. This noise needs to be minimized in order to have a clear image of the sample in case of a nanosize level measurement. In this work, we propose a method to improve the image quality by applying dither signal injection to the scanning signal. This method involves minimizing the noise that occurs in scan control circuits, which results in a blurry or distorted image. The collected secondary electrons are first multiplied through a photomultiplier tube and are then converted into digital form using an analog/digital (A/D) converter. We propose a solution for the noise from the scan control circuit that appears on the image by adopting the spread spectrum method.