共查询到13条相似文献,搜索用时 31 毫秒
1.
The present paper describes an artefact based approach to obtain traceability of freeform measurements on coordinate measuring machines. First, the requirements for the traceability of freeform measurements and a strategy for the development of a feasible solution are presented. A new concept of artefact, called the “Modular Freeform Gauge” (MFG) has been developed. It is based on physical modeling of a given freeform surface by a combination of items with regular geometry, well calibrated on their dimensions and form. The relative position is accounted for during the procedure; this information is used to generate a “calibrated” CAD model as reference for freeform measurements. The architecture of the artefact, its collocation in the traceability chain, and the calibration procedure are described.Finally, a procedure for the uncertainty assessment of actual freeform measurements is presented. The work here described has been focused on implementation of the uncertainty assessment procedure for freeform measurements on turbine blades. A task-specific Modular Freeform Gauge was developed for this application. 相似文献
2.
The distances between the balls of a ball array used in machine geometry calibration have to be very accurate. These distances can be calibrated using a laser measurement system, which requires specially designed optical devices and measuring probes. In this paper, a new and economical alternative method for calibrating the ball array is described. A single gage block is used for measuring the standard distance at the starting position. Then, the exact distances between the balls can be obtained by using the coordinate measuring machine (CMM) probe motion. This method does not depend on the accuracy of the CMM. Also, this method does not require expensive instruments or devices, but a CMM and a gage block. A simple “parallel-plane” bracket, mounted on to the measuring end of a CMM probe, is used to determine the centers of the balls automatically and accurately. 相似文献
3.
基于多体系统运动学理论的坐标测量机误差自动建模 总被引:1,自引:0,他引:1
研究分析了运用多体系统运动学理论对复杂机械如坐标测量机进行误差建模的基本原理,介绍了误差自动建模过程。以FXYZ型立式三坐标测量机为例进行了误差建模,给出了空间误差模型具体数学表达式。理论分析和实际应用显示所述方法很好地解决了误差建模的通用性问题,为精度分析和误差补偿等提供了一个理想的误差建模方式。 相似文献
4.
Dr Yin-Lin Shen Xianping Zhang 《The International Journal of Advanced Manufacturing Technology》1997,13(3):206-213
This paper presents a pretravel model for touch trigger probes mounted on indexable probe heads, which can rotate and tilt the probe into a number of orientations for coordinate measurements on coordinate measuring machines (CMMs). Pretravel accounts for the majority of touch trigger probe errors and is caused by bending deflection of the stylus shaft. A trigger force model is derived and used to model bending deflection of the stylus shaft at the trigger instant. Only one model parameter needs to be calculated using the probe calibration data. Experimental data associated with thirteen probe orientations were used to validate the model. It is shown that the model can effectively predict pretravel distances associated with various probe approach directions. The standard deviations of prediction errors are less than 0.71 µm, indicating that the proposed model can be used to compensate for pretravels occurring in touch trigger probe applications. 相似文献
5.
按齿轮渐开线样板国家标准推荐,1级齿轮渐开线样板的齿廓形状偏差需从展开长度3或5 mm开始计值,齿根部非计值区间对应渐开线弧长仅为0.03~0.18 mm,导致1级齿轮渐开线样板齿根部的渐开线齿廓难以精确测量。为了能更好发挥1级齿轮渐开线样板的量值精准传递作用,分析了1级齿轮渐开线样板结构的特殊性以及测头半径对渐开线齿廓偏差测量结果的影响,结果表明,在齿根展开角误差时,测头半径引入的测量误差会随着测头半径的增大而增大,并随着展开长度的减小而增大,在基圆附近的测量误差可以达到齿廓偏差的50%~200%;当仅渐开线齿面存在加工误差时,测头半径引入的测量误差和展开长度受影响的范围会随着测头半径的增大和被测渐开线基圆半径的增大而增大,在齿根部展开长度10%的范围内测量误差约齿廓形状偏差的10%~60%。通过选取测头半径rp=0.5和2.5 mm的测头对同一齿轮渐开线样板验进行了测量实验验证了上述结论。研究为1级齿轮渐开线样板的精密制造、精密测量及使用展开长度区间选取提供了支持。 相似文献
6.
This paper presents a new optical method of coordinate measuring machine (CMM) verification. The proposed system based on a single-mode fiber optical-comb pulsed interferometer with a ball lens of refractive index 2 employed as the target. The target can be used for absolute-length measurements in all directions. The laser source is an optical frequency comb, whose repetition rate is stabilized by a rubidium frequency standard. The measurement range is confirmed to be up to 10 m. The diagonals of a CMM are easier to verify by the proposed method than by the conventional artifact test method. The measurement uncertainty of the proposed method is also smaller than that of the conventional method because the proposed measurement system is less affected by air temperature; it achieves an uncertainty of approximately 7 μm for measuring lengths of 10 m. The experimental results show that the measurement accuracy depends on noise in the interference fringe, which arises from airflow fluctuations and mechanical vibrations. 相似文献
7.
An optical-comb pulsed interferometer was developed for the positioning measurements of the industrial coordinate measuring machine (CMM); a rough metal ball was used as the target of the single-mode optical fiber interferometer. The measurement system is connected through a single-mode fiber more than 100 m long. It is used to connect a laser source from the 10th floor of a building to the proposed measuring system inside a CMM room in the basement of the building. The repetition frequency of a general optical comb is transferred to 1 GHz by an optical fiber-type Fabry–Pérot etalon. Then, a compact absolute position-measuring system is realized for practical non-contact use with a high accuracy of measurement. The measurement uncertainty is approximately 0.6 μm with a confidence level of 95%. 相似文献
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9.
This paper presents a refinement and further analysis of an application of the multi-step method for the separation of machine and probe errors on a CMM using multiple redundancy probing of the machine’s own master ball. The objective is to reduce the amount of data required and so minimize the test time in order to reduce the industrial cost of such periodic verifications. 相似文献
10.
Any combination of contact and non contact sensors on a single coordinate measuring machine makes it a multi-sensor or hybrid coordinate measuring machine. The ability to change the probing device without re-establishing the part coordinate system is a significant advantage and consequently the reason for their wide acceptance and usage. In addition to the existing three linear stages in a conventional or hybrid coordinate measuring machine, the number of axes can be augmented with two rotary stages in order to make them more versatile. This not only complicates the metrology loop but also adds more parametric errors to existing list of known 21 errors for a three stage conventional measuring machine. Also different probing sensors in the system have different metrology loops. Literature survey reveals that there is no previous or current work on estimation of task specific uncertainty for machines of this class with a wide potential for measuring complex parts quickly and with great ease. The current work focuses on developing a virtual measuring machine of this class which incorporates a parametric model of a five-axis multi-sensor coordinate measuring machine, techniques to estimate the parametric errors in the model and error correction strategies for the same. The virtual machine is used to mimic real time measurements in order to come up with estimates for task specific measurement uncertainty. 相似文献
11.
Coordinate measuring machines (CMMs) are subject to periodic verification to ensure measurement capability. However, users also need to rapidly diagnose the source of accuracy degradation to guide corrective actions. This paper presents a novel CMM-based implementation of the multi-step method for the separation of machine and reference sphere errors on one side and triggering probe and probe tip errors on the other. The procedure uses multiple redundancy probing of the machine's own reference sphere and result in a mathematical system similar to that of the multi-step method. The procedure's effectiveness is demonstrated for a variety of stylus lengths and shows its ability to detect changes in lobing errors. A metrological validation is conducted by measuring the errors of the probe and errors of the machine using independent methods. 相似文献
12.
This paper describes the surface profile measurement of a XY-grid workpiece with sinusoidal microstructures using an atomic force microscope (AFM) on a diamond turning machine. The sinusoidal micro-structures, which are fabricated on an aluminum plate by fast tool servo-assisted diamond turning, are a superposition of periodic sine-waves along the X- and Y-directions (wavelength (XY): 150 μm, amplitude (Z): 0.25 μm). A linear encoder with a resolution of 0.5 nm is integrated into the AFM-head for accurate measurement of the Z-directional profile height in the presence of noise associated with the diamond turning machine. The spindle and the X-slide of the machine are employed to spirally scan the AFM-head over the sinusoidal grid workpiece. Experiments fabricating and measuring the sinusoidal grid workpiece are carried out after accurate alignment of the AFM cantilever tip with the spindle centerline. 相似文献
13.
K. D. Summerhays R. P. Henke J. M. Baldwin R. M. Cassou C. W. Brown 《Precision Engineering》2002,26(1):262
Selection of an appropriate sampling strategy and of the correct fitting algorithm are two of the key issues in the practice of modern coordinate metrology. A recent report described the development of new techniques for modeling the form errors of machined part features and illustrated their use in identifying and understanding the relation of form errors to machining process variables. In this report, these mathematical tools are further developed and applied for the determination of optimum, reasonably-sized probing patterns for measurement under time and economic constraints. The focus of the work reported here is on full internal cylindrical surfaces. The technique is, however, of general utility and can be employed with any nominal feature geometry. Its application does, in many cases, produce significant improvements in the uncertainty of derived geometric dimensioning and tolerancing parameters with modest or no increase in measurement time. In contrast to most work on these problems, extensive use is made of process-dependent information in selection of sampling protocol and data analysis method. Since the method begins with an understanding of the form errors introduced into the part by the particular manufacturing regime, at least partial benefit can be seen even when the sample pattern optimization is employed in conjunction with commercial, off-the-shelf CMM control and data analysis software. 相似文献