Nonperturbing gas diagnostics of ion beams

The usability of the gas scintillation method in almost nonperturbing diagnostics of ion beams was investigated. The width of the beam was measured on the ITEP-TWAC setup by its image in argon atmosphere at different gas pressures and beam intensities. The dependences of the luminescence intensity of argon atoms on the number of ions in a pulse and the gas pressure in the diagnostic chamber were obtained.     

Thermal diagnostics of friction in slip bearings

A quasi-three-dimensional thermal mathematical model is proposed for a slip bearing made of polymer composite, in which with the shaft’s cross section varies over its length. The algorithm proposed for solving the inverse boundary problem permits the derivation of the frictional torque from temperature data. Numerical calculations demonstrate the efficiency of the algorithm and its robustness with respect to errors in the temperature measurements. The practical applicability of this method is confirmed experimentally.     

Thermal diagnostics front-end electronics for LISA Pathfinder

Precision temperature measurements are required in the LTP, the LISA technology package, for various diagnostics objectives. In this article, we describe in detail the front-end electronics design and the associated temperature sensors to achieve the LTP requirements: noise equivalent temperature of 10 microK Hz(-12) in the frequency range from 1 to 30 mHz at room temperature. We designed an ac Wheatstone bridge and a subsequent digital demodulation to minimize 1/f noise. We show experimental results where the required sensitivity in the measurement bandwidth is fulfilled.     

A subnanosecond pulsed ion source for micrometer focused ion beams

A new, compact design of an ion source delivers nanosecond pulsed ion beams with low emittance, which can be focused to micrometer size. By using a high-power, 25 fs laser pulse focused into a gas region of 10(-6) mbar, ions at very low temperatures are produced in the small laser focal volume of 5 mum diameter by 20 mum length through multiphoton ionization. These ions are created in a cold environment, not in a hot plasma, and, since the ionization process itself does not significantly heat them, have as a result essentially room temperature. The generated ion pulse, up to several thousand ions per pulse, is extracted from the source volume with ion optical elements that have been carefully designed by simulation calculations. Externally triggered, its subnanosecond duration and even smaller time jitter allow it to be superimposed with other pulsed particle or laser beams. It therefore can be combined with any type of collision experiment where the size and the time structure of the projectile beam crucially affect the achievable experimental resolution.     

Focused ion beams techniques for nanomaterials characterization

Focused ion beam and dual platform systems have, over the last 10 years, become a main stay of sample preparation for material analysis. In this article the merits of using these systems are discussed and the three main techniques used to prepare cross-section specimens for transmission electron microscopy (TEM) are both discussed and compared with emphasis being placed on the tricks that users do to make the lamellae as thin as possible and with a minimum of damage at their sidewalls. Other techniques such as serial slicing for three-dimensional reconstruction and the preparation of plan-view specimens are also summarized.     

New additive technologies based on ion beams

The use of ion beams offers new possibilities in the powder synthesis of multicomponent composites with controllable structure. A system for the synthesis of composites is proposed.     

Thermal imaging of composites

Active thermal imaging techniques and their applications to composite materials are reviewed. The techniques included are transient thermography, scanning thermal microscopy and scanning thermal probe microscopy. The factors that affect the images produced by both pulsed and periodic forms of active heating are considered. For pulsed heating, experimental and numerical modelling results for carbon fibre-reinforced plastic are used to show how the resolution of subsurface features depends on their size and depth and on the anisotropy in thermal materials properties common in such composites. For periodic heating, thermal wave characteristics are introduced to show how the resolution of subsurface features also depends on modulation frequency and focal spot radius. Examples are given of the applications of scanning thermal microscopy and scanning thermal probe microscopy that illustrate the potential of these techniques for the imaging of composite materials.     

New Cs sputter ion source with polyatomic ion beams for secondary ion mass spectrometry applications

A simple design for a cesium sputter ion source compatible with vacuum and ion-optical systems as well as with electronics of the commercially available Cameca IMS-4f instrument is reported. This ion source has been tested with the cluster primary ions of Si(n)(-) and Cu(n)(-). Our experiments with surface characterization and depth profiling conducted to date demonstrate improvements of the analytical capabilities of the secondary ion mass spectrometry instrument due to the nonadditive enhancement of secondary ion emission and shorter ion ranges of polyatomic projectiles compared to atomic ones with the same impact energy.     

Production and acceleration of ion beams by laser ablation

In this work, we present a new pulsed laser ablation technique to obtain energetic ion beams. The accelerator we made is a compact device able to extract and accelerate the ionic components of plasma up to 160 keV per charge state. It is composed by a generating chamber containing an expansion chamber used like first electrode. Next, a second electrode connected to ground and a third electrode connected to negative voltage are used. The third electrode is used also as Faraday cup. By the analysis of the ion signals we studied the plume parameters such as TOF accelerated signals, charge state, and divergence.     

A collimator for hot plasma x-ray diagnostics in ion sources

We present a collimator configuration for measuring energy resolved x-ray plasma volume bremsstrahlung emitted, e.g., by an ECRIS. Special attention we paid to shielding the detector against interfering Compton scattered radiation and wall bremsstrahlung stemming from the collimator entrance aperture. We estimate the efficiency for shielding of Compton scattered radiation at least attainable by this arrangement.     

Laser ion sources for radioactive beams (invited)

Resonant ionisation laser ion sources are nowadays extensively used, when available, at many leading on-line facilities. Moreover, new laser ion sources are now under development in most of the recent on-line facility projects under construction worldwide. This success is mainly due to the reliability, the ionization efficiency and the high purity that this type of source can achieve for the production of radioactive species and for a large range of chemical elements. Laser ion sources for radioactive beams gather many different systems such as dye laser or all-solid state titanium:sapphire laser systems, high or low repetition rates, hot cavities or gas cells, additional selectivity by using chemical techniques, or the LIST technique (laser ion source trap). In this paper, the physics of laser ion sources will be described with the current limitations and challenges for the future. An overview of the laser ion source facilities will be given, with an emphasis on the ongoing developments and perspectives on LIS.     

Microwave imaging reflectometry studies for turbulence diagnostics on KSTAR

The first prototype microwave imaging reflectometry (MIR) system [H. Park et al., Rev. Sci. Instrum. 74, 4239 (2004)] clearly demonstrated the shortcomings of conventional reflectometry when the probe beam encountered a large amplitude and/or high fluctuation wavenumber at the reflection layer in laboratory tests, the distinctive advantages shown in these tests were not fully realized in the plasma operation. To understand the discrepancies, the MIR system performance has been thoroughly investigated at POSTECH. In this paper, a possible cause of the MIR performance degradation on TEXTOR will be presented together with a concept of multifrequency MIR system design that will be developed for KSTAR.     

On the production of X-rays by low energy ion beams

Although electron beams with energies of a few keV can excite fluorescent X-ray production from solids, ion beams of comparable energy cannot do so. The reason for this situation is that it is the velocity of the incident particle, rather than its energy, which determines whether an ionization event can be generated.     

Alloy liquid metal ion sources and their application in mass separated focused ion beams

For special purposes like writing ion implantation or ion mixing in the micrometer- or sub-micrometer range different ion species are needed. Therefore alloy liquid metal ion sources (LMISs) are used. The energy distribution of the ions from an alloy LMIS is one of the determining factors for the performance of a FIB column. Different source materials like Au(73)Ge(27), Au(82)Si(18), Au(77)Ge(14)Si(9), Co(36)Nd(64), Er(69)Ni(31), and Er(70)Fe(22)Ni(5)Cr(3) were investigated with respect to the energy spread of the different ion species as a function of emission current, ion mass and emitter temperature. The alloy LMISs discussed above have been used in the Rossendorf FIB system IMSA especially for writing implantation to fabricate sub-micrometer pattern without any lithographic steps. A Co-FIB was applied for the ion beam synthesis of CoSi(2) micro-structures. Additionally, the possibility of varying the current density with the FIB by changing the pixel dwell time was used for radiation damage investigations in Si and SiC at elevated implantation temperatures. Furthermore, a broad spectrum of ions was employed to study the sputtering process depending on temperature, angle of incidence and ion mass on a couple of target materials using the volume-loss method. Especially this technique was used for the fabrication of various kinds of micro-tools.     

Focal-plane imaging of crossed beams in nonlinear optics experiments

An application of focal-plane imaging that can be used as a real time diagnostic of beam crossing in various optical techniques is reported. We discuss two specific versions and demonstrate the capability of maximizing system performance with an example in a combined dual-pump coherent anti-Stokes Raman scattering-interferometric Rayleigh scattering experiment (CARS-IRS). We find that this imaging diagnostic significantly reduces beam alignment time and loss of CARS-IRS signals due to inadvertent misalignments.     

Exploration of the ultimate patterning potential achievable with focused ion beams

Decisive advances in the field of nanosciences and nanotechnologies are intimately related to the development of new instruments and of related writing schemes and methodologies. Therefore we have recently proposed the exploitation of the nano-structuring potential of a highly focused ion beam (FIB) as a tool, to overcome intrinsic limitations of current nano-fabrication techniques and to allow innovative patterning schemes that are urgently needed in many nanoscience challenges. In this work, we will first detail a very high-resolution FIB instrument we have developed specifically to meet these nano-fabrication requirements. Then we will introduce and illustrate an advanced FIB processing scheme that is the fabrication of artificial nanopores.     

Characteristics of low-energy ion beams extracted from a wire electrode geometry

Beams of argon ions with energies less than 50 eV were extracted from an ion source through a wire electrode extractor geometry. A retarding potential energy analyzer (RPEA) was constructed in order to characterize the extracted ion beams. The single aperture RPEA was used to determine the ion energy distribution function, the mean ion energy and the ion beam energy spread. The multi-cusp hot cathode ion source was capable of producing a low electron temperature gas discharge to form quiescent plasmas from which ion beam energy as low as 5 eV was realized. At 50 V extraction potential and 0.1 A discharge current, the ion beam current density was around 0.37 mA/cm(2) with an energy spread of 3.6 V or 6.5% of the mean ion energy. The maximum ion beam current density extracted from the source was 0.57 mA/cm(2) for a 50 eV ion beam and 1.78 mA/cm(2) for a 100 eV ion beam.     

Application of a low-energy electron beam as a tool of nondestructive diagnostics of intense charged-particle beams

A new diagnostic instrument intended for measuring the parameters of intense bunches, detecting radiation fields, and performing tomography of intense ion beams is described. The operating principle of the device and the basic scheme of arrangement of its elements are described. The results of simulation of a EBP for several problems are presented. To reconstruct the longitudinal charge-distribution function, the effect detection error of the testing beam on the accuracy of the proposed method is considered. Depending on the problem to be solved, several design versions of the instrument are proposed, which are optimized for diagnosing beams of S-range linear accelerators, detecting radiation fields, studying bunches of superhigh intensity, performing tomography of intense proton beams, and operating in cyclic accelerators.     

Time of flight secondary ion mass spectrometry: a powerful high throughput screening tool

Combinatorial materials libraries are becoming more complicated; successful screening of these libraries requires the development of new high throughput screening methodologies. Time of flight secondary ion mass spectrometry (ToF-SIMS) is a surface analytical technique that is able to detect and image all elements (including hydrogen which is problematic for many other analysis instruments) and molecular fragments, with high mass resolution, during a single measurement. Commercial ToF-SIMS instruments can image 500 microm areas by rastering the primary ion beam over the region of interest. In this work, we will show that large area analysis can be performed, in one single measurement, by rastering the sample under the ion beam. We show that an entire 70 mm diameter wafer can be imaged in less than 90 min using ToF-SIMS stage (macro)rastering techniques. ToF-SIMS data sets contain a wealth of information since an entire high mass resolution mass spectrum is saved at each pixel in an ion image. Multivariate statistical analysis (MVSA) tools are being used in the ToF-SIMS community to assist with data interpretation; we will demonstrate that MVSA tools provide details that were not obtained using manual (univariate) analysis.