Cu基Al掺杂ZnO多层薄膜的生长和性能

本文采用直流磁控溅射技术在玻璃衬底上制备了AZO／Cu、Cu／AZO和AZO／Cu／AZO三种复合结构多层膜,研究了生长温度对多层膜特性的影响,发现AZO／Cu双层薄膜具有最优的光电性能,其最佳生长温度为100～150℃。文中进一步考察了生长温度对AZO／Cu双层薄膜结构性能和表面形貌的影响,结果表明：合适的生长温度有利于改善AZO／Cu双层薄膜的晶体质量,进而提高其光电性能;150℃下沉积的薄膜具有最佳品质因子1．11×10^-2Ω^-1,此时方块电阻为8．99Ω／sq,可见光透过率为80％,近红外反射率约70％。本文在较低温度下制备的AZO／Cu双层膜具有较优的透明导电性和良好的近红外反射性,可以广泛应用于镀膜玻璃、太阳能电池、平板显示器等光电领域。     

Ag层厚度对AZO/Ag/AZO透明导电薄膜性能的影响

在室温条件下,采用磁控溅射技术在玻璃衬底上生长了AZO/Ag/AZO多层透明导电薄膜。主要研究了Ag层厚度对多层透明导电薄膜结构和性能的影响。研究表明,AZO和Ag分别延(002)面和(111)面高度择优生长,随着Ag层厚度的增加,多层透明导电薄膜的电阻率不断降低,透过率呈现先降低再增加最后再降低的变化趋势,其中Ag层厚度为8nm的样品获得最大品质因子33.1×10^-3Ω^-1,综合性能最佳。     

Cu基Al掺杂ZnO多层薄膜的生长及其性能

本文采用直流磁控溅射技术在玻璃衬底上制备了AZO/Cu、Cu/AZO和AZO/Cu/AZO三种复合结构多层膜,研究了生长温度对多层膜特性的影响,发现AZO/Cu双层薄膜具有最优的光电性能,其最佳生长温度为100~150℃。文中进一步考察了生长温度对AZO/Cu双层薄膜结构性能和表面形貌的影响,结果表明：合适的生长温度有...     

溅射功率对AZO／Cu／AZO多层薄膜结构与光电性能的影响

在玻璃衬底上利用磁控溅射法制备AZO／Cu／AZO多层薄膜,研究了溅射功率对AZO薄膜的微观结构和光电性能的影响。采用X射线衍射（XRD）仪、扫描电子显微镜（SEM）、紫外可见光谱仪（UVVis）等方法,对AZO薄膜的形貌结构、光电学性能进行了测试。结果表明：不同溅射功率下沉积的AZO薄膜均呈C轴择优取向,溅射功率对AZO／cu／AZO多层薄膜结构与光电性能有一定的影响。在溅射功率为120W、衬底温度为2500C、溅射气压为0．5Pa时薄膜的光透过率为75％,最低电阻率为2．2×10-4Ω·cm、结晶质量、表面形貌等得到明显改善。     

薄膜厚度对TGZO透明导电薄膜光电性能的影响

利用直流磁控溅射法,在室温水冷玻璃衬底上成功制备出了可见光透过率高、电阻率低的钛镓共掺杂氧化锌(TG-ZO)透明导电薄膜。X射线衍射和扫描电子显微镜研究结果表明,TGZO薄膜为六角纤锌矿结构的多晶薄膜,且具有c轴择优取向。研究了厚度对TGZO透明导电薄膜电学和光学性能的影响,结果表明厚度对薄膜的光电性能有重要影响。当薄膜厚度为628 nm时,薄膜具有最小电阻率2.01×10-4Ω.cm。所制备薄膜在波长为400~760 nm的可见光中平均透过率都超过了91%,TGZO薄膜可以用作薄膜太阳能电池和液晶显示器的透明电极。     

射频磁控溅射法低温制备ZnO：Zr透明导电薄膜及特性研究

利用射频磁控溅射法在室温水冷玻璃衬底上制备出了可见光透过率高、电阻率低的掺锆氧化锌(ZnO:Zr)透明导电薄膜.讨论了薄膜厚度对ZnO:Zr薄膜结构、形貌、光电性能的影响.实验结果表明,厚度对ZnO:Zr薄膜的形貌和电学性能有很大影响.SEM和XRD研究结果表明,ZnO:Zr薄膜为六角纤锌矿结构的多晶薄膜,具有垂直于衬底方向的C轴择优取向.当厚度为300nm时,薄膜的电阻率具有最小值1.77×10-3Ω·cm.所制备薄膜具有良好的附着性能,其可见光区平均透过率超过92%.     

室温下射频磁控溅射制备ZnO:Al透明导电薄膜及其性能研究

采用射频磁控溅射技术,在室温下,以ZnO:Al2O3(2%Al2O3(质量比))为靶材,在石英玻璃基底上,采用不同工艺条件制备了ZnO:Al(AZO)薄膜。使用扫描电子显微镜观察了薄膜的表面形貌,X射线衍射分析了薄膜的结构,四探针测量仪得到薄膜的表面电阻,轮廓仪测量了薄膜厚度,并计算了电阻率,最后采用分光光度计测量了薄膜的透过率;研究了溅射功率、溅射气压与薄膜厚度对薄膜电阻率及透过率的影响。结果表明:所制备的AZO薄膜具有(002)择优取向,并且发现薄膜厚度对薄膜的光电性能有明显影响,溅射气压和溅射功率对薄膜电学性能有较大影响,但是对薄膜透过率影响不大。当功率为1kW、溅射气压0.052Pa、AZO薄膜厚度为250nm时,其电阻率为8.38×10-4Ω·cm,波长在550nm处透过率为89%,接近基底的本底透过率92%。当薄膜厚度为1125 nm时薄膜的电阻率降至最低(6.16×10-4Ω·cm)。     

直流磁控溅射法制备ZnO∶Zr透明导电薄膜及性能研究

利用直流磁控溅射法在玻璃衬底上制备了ZnO∶Zr(ZZO)透明导电薄膜。研究了厚度对薄膜结构及光电性能的影响。研究结果表明,厚度对薄膜的结构和电学性能有很大的影响。制备的ZZO薄膜为六角纤锌矿结构的多晶薄膜,具有c轴择优取向。在厚度为593nm时,薄膜的电阻率具有最小值1.9×10-3Ω·cm。所制备薄膜样品的可见光平均透过率都超过93%。     

ITO/TiW双层薄膜的制备及其与p-Si接触性能的研究

利用射频磁控溅射两步法分别在玻璃和p型单晶Si衬底上制备ITO/Ti W双层薄膜。采用紫外-可见分光光度计、四探针测试仪和X射线衍射仪表征ITO/Ti W双层薄膜的光学性能、电学性能和结晶性能,用吉时利2400表和线性传输线模型测试ITO/Ti W双层薄膜与p-Si接触的I-V曲线以及比接触电阻。结果表明Ti W薄膜厚度为8 nm时,ITO/Ti W双层薄膜的光电性能最优,还发现Ti W薄膜的引入有利于ITO薄膜的晶粒长大。ITO薄膜与p-Si之间插入Ti W层可以改善接触性能,ITO/Ti W(8 nm)与p-Si接触的比接触电阻最低为4.1×10-4Ω·cm2。     

射频溅射功率对室温沉积AZO薄膜性能的影响

本文采用直流射频耦合磁控溅射技术,在玻璃基底上室温沉积AZO薄膜,将射频电源功率从0W增加到到200W。通过X射线衍射仪(XRD)、扫描电子显微镜(SEM)、紫外分光光度计、霍尔效应测试系统重点研究了AZO薄膜的晶体结构、表面形貌、光学性能和电学性能。研究结果表明,直流射频耦合磁控溅射可以在室温下制备性能优异的AZO薄膜,且射频溅射功率对AZO薄膜光电性能有显著的影响,随着射频功率的提高,AZO薄膜致密性增加,粒子逐渐变大,薄膜表面形貌和生长形态发生一定变化。在射频功率为200W时,室温制备的AZO薄膜电阻率达到最低5.39×10~(-4)Ω·cm,薄膜平均可见光透过率达到82.6%。     

Quality enhancement of AZO thin films at various thicknesses by introducing ITO buffer layer

Due to the simultaneously superior optical transmittance and low electrical resistivity, transparent conductive electrodes play a significant role in semiconductor electronics. To enhance the electrical properties of these films, one approach is thickness increment which degrades the optical properties. However, a preferred way to optimize both electrical and optical properties of these layers is to introduce a buffer layer. In this work, the effects of buffer layer and film thickness on the structural, electrical, optical and morphological properties of AZO thin films are investigated. Al-doped zinc oxide (AZO) is prepared at various thicknesses of 100 to 300 nm on the bare and 100 nm-thick indium tin oxide (ITO) coated glass substrates by radio frequency sputtering. Results demonstrate that by introducing ITO as a buffer layer, the average values of sheet resistance and strain within the film are decreased (about 76 and 3.3 times lower than films deposited on bare glasses), respectively. Furthermore, the average transmittance of ITO/AZO bilayer is improved nearly 10% regarding single AZO thin film. This indicates that bilayer thin films show better physical properties rather than conventional monolayer thin films. As the AZO film thickness increases, the interplanar spacing, d₍₀₀₂₎, strain within the film and compressive stress of the film in the hexagonal lattice, decreases indicating the higher yield of AZO crystal. Moreover, with the growth in film thickness, carrier concentration and optical band gap (E_g) of AZO film are increased from 4.62?×?10¹⁹ to 8.21?×?10¹⁹ cm^?3 and from 3.55 to 3.62 eV, respectively due to the Burstein-Moss (BM) effect. The refractive index of AZO thin film is obtained in the range of 2.24–2.26. With the presence of ITO buffer layer, the AZO thin film exhibits a resistivity as low as 6?×?10^?4 Ω cm, a sheet resistance of 15 Ω/sq and a high figure of merit (FOM) of 1.19?×?10⁴ (Ω cm)^?1 at a film thickness of 300 nm. As a result, the quality of AZO thin films deposited on ITO buffer layer is found to be superior regarding those grown on a bare glass substrate. This study has been performed over these two substrates because of their significant usage in the organic light emitting diodes and photovoltaic applications as an enhanced carrier injecting electrodes.     

Structural, optical and electrical properties of AZO/Cu/AZO tri-layer films prepared by radio frequency magnetron sputtering and ion-beam sputtering

Highly conducting tri-layer films consisting of a Cu layer sandwiched between Al-doped ZnO (AZO) layers (AZO/Cu/AZO) were prepared on glass substrates at room temperature by radio frequency (RF) magnetron sputtering of AZO and ion-beam sputtering of Cu. The tri-layer films have superior photoelectric properties compared with the bi-layer films (Cu/AZO, AZO/Cu) and single AZO films. The effect of AZO thickness on the properties of the tri-layer films was discussed. The X-ray diffraction spectra show that all films are polycrystalline consisting of a Cu layer with the cubic structure and two AZO layers with the ZnO hexagonal structure having a preferred orientation of (0 0 2) along the c-axis, and the crystallite size and the surface roughness increase simultaneously with the increase of AZO thickness. When the AZO thickness increases from 20 to 100 nm, the average transmittance increases initially and then decreases. When the fixed Cu thickness is 8 nm and the optimum AZO thickness of 40 nm was found, a resistivity of 7.92 × 10⁻⁵ Ω cm and an average transmittance of 84% in the wavelength range of visible spectrum of tri-layer films have been obtained. The merit figure (F_TC) for revaluing transparent electrodes can reach to 1.94 × 10⁻² Ω⁻¹.     

Transparent conductive and infrared reflective AZO/Cu/AZO multilayer film prepared by RF magnetron sputtering

AZO/Cu/AZO multilayer films were prepared on glass substrate by radio frequency magnetron sputtering technology. The prepared films were investigated by a four-point probe system, X-ray diffraction, optical transmittance spectra, scanning electron microscope, atomic force microscopy and Fourier transform infrared spectroscopy. The results showed that Cu inner layer started forming a continuous film at the thickness around 11 nm. The prepared AZO/Cu/AZO samples exhibited the visible transmittance of 60–80 % and sample with 15 nm Cu inner layer showed the highest infrared reflection rate of 67 % in FIR region and the lowest sheet resistance of 16.6 Ω/sq. The proper visible transmittance and infrared reflection property of the AZO/Cu/AZO multilayer film make it a promising candidate for future energy conservation materials.     

Characterization of aluminum-doped zinc oxide thin films by RF magnetron sputtering at different substrate temperature and sputtering power

In this study, transparent conductive Al doped zinc oxide (ZnO: Al, AZO) thin films with a thickness of 40 nm were prepared on the Corning glass substrate by radio frequency magnetron sputtering. The properties of the AZO thin films are investigated at different substrate temperatures (from 27 to 150 °C) and sputtering power (from 150 to 250 W). The structural, optical and electrical properties of the AZO thin films were investigated. The optical transmittance of about 78 % (at 415 nm)–92.5 % (at 630 nm) in the visible range and the electrical resistivity of 7 × 10^?4 Ω-cm (175.2 Ω/sq) were obtained at sputtering power of 250 W and substrate temperature of 70 °C. The observed property of the AZO thin films is suitable for transparent conductive electrode applications.     

Highly elastic and transparent multiwalled carbon nanotube/polydimethylsiloxane bilayer films as electric heating materials

Highly elastic and transparent bilayer films composed of MWCNT and polydimethylsiloxane (PDMS) layers were fabricated by spin-coating of MWCNT aqueous solution on glass plates and following curing of PDMS applied on the MWCNT layer. Morphological feature, optical transparency, tensile property, electrical property, and electric heating behavior of the bilayer films with different MWCNT layer thicknesses of 65–185 nm were investigated. SEM images confirmed that pristine MWCNTs were uniformly deposited on glass substrates and the PDMS layer was combined well with the MWCNT layer, resulting in high structural stability of the bilayer films to high elongational or twisting deformations. With the increase of the thickness of the MWCNT layer, the sheet resistance of the bilayer films decreased substantially from ~ 10⁵ Ω/sq to ~ 10³ Ω/sq, in addition to the change of the optical transmittance from ~ 75% to ~ 40% at a 550 nm wavelength. The electric heating behavior of MWCNT/PDMS bilayer films was strongly dependent on the thickness of the MWCNT layer as well as the applied voltage. Even under high twisting by 540° or continuous stepwise voltage changes for long periods of time, the MWCNT/PDMS bilayer films retained stable electrical heating performance in aspects of temperature responsiveness, steady-state maximum temperature, and electric power efficiency.     

Ar流量对磁控溅射制备Al掺杂ZnO薄膜的影响

Al掺杂ZnO(AZO)具有电导率高、光学透射率高的优点,且原料来源丰富、制备成本低廉,被认为是最有应用潜力的透明导电薄膜.本文利用射频磁控溅射制备30 cm×30 cm尺寸大面积AZO薄膜,研究了气压恒定时,Ar流量对薄膜晶粒生长机制、电学和光学性能的影响.结果表明,AZO薄膜晶粒均表现出垂直基片方向的c轴择优取向生...     

Effects of sputtering pressure and Al buffer layer thickness on properties of AZO films grown by rf magnetron sputtering

Transparent and conductive Al-doped (2 wt.%) zinc oxide (AZO) films were deposited on inexpensive soda-lime glass substrates by using rf magnetron sputtering at room temperature. This study analyzed the effects of argon sputtering pressure, which varied in the range from 0.46 to 2.0 Pa, on the morphological, electrical and optical properties of AZO films. The only (0 0 2) diffraction peak of the film were observed at 2θ～34.45°, exhibiting that the AZO films had hexagonal ZnO wurtzite structure, and a preferred orientation with the c-axis perpendicular to the substrate. By applying a very thin aluminum buffer layer with the thickness of 2 nm, findings show that the electrical resistivity was 9.46 × 10⁻⁴ Ω-cm, and the average optical transmittance in the visible part of the spectra was approximately 81%. Furthermore, as for 10 nm thick buffer layer, the electrical resistivity was lower, but the transmittance was decreased.     

The characteristics of transparent conducting Al-doped zinc oxide thin films deposited on polymer substrates

Al-doped zinc oxide (AZO) transparent, conductive thin films were deposited on inexpensive polyethylene terephthalate substrates, using radio frequency (rf) magnetron sputtering, with an AZO ceramic target (the Al₂O₃ content is approximately 2 wt%). This paper presents an effective method for the optimization of the parameters for the deposition process for AZO thin films with multiple performance characteristics, using the Taguchi method, combined with grey relational analysis. Using the Taguchi quality design concept, an L₉ orthogonal array was chosen for the experiments. The effects of various process parameters (rf power, substrate-to-target distance, substrate temperature and deposition time) on the electrical, structural, morphological and optical properties of AZO films were investigated. In the confirmation runs, using grey relational analysis, the electrical resistivity of the AZO films was found to have decreased from 5.0?×?10^?3 to 1.6?×?10^?3?Ω-cm and the optical transmittance was found to have increased from 74.39 to 79.40%. The results demonstrate that the Taguchi method combined with grey relational analysis is an economical way to obtain the multiple performance characteristics of AZO films with the fewest experimental data. Additionally, by applying an Al buffer layer, of thickness 10?nm, the results show that the electrical resistivity was 3.1?×?10^?4?Ω-cm and the average optical transmittance, in the visible part of the spectrum, was approximately 79.12%.