A 1 V 186-μW 50-MS/s 10-bit subrange SAR ADC in 130-nm CMOS process

This paper presents a 10-bit 50-MS/s subrange successive-approximation register (SAR) analog-to-digital converter (ADC) composed of a 4-bit SAR coarse ADC and a 6-bit SAR fine ADC. In the coarse ADC, multi-comparator SAR architecture is used to reduce the digital logic propagation delay, and a traditional asynchronous SAR ADC with monotonic switching method is used as the fine ADC. With that combination, power dissipation also can be much reduced. Meanwhile, a modified SAR control logic is adopted in the fine ADC to speed up the conversion and other techniques, such as splitting capacitors array, are borrowed to reduce the power consumption. Fabricated with 1P8M 130-nm CMOS technology, the proposed SAR ADC achieves 51.6-dB signal to noise and distortion ratio (SNDR) and consumes 186 μ W at 50 MS/s with a 1-V supply, resulting in a figure of merit (FOM) of 12 fJ/conversion-step. The core area is only 0.045 mm².     

A 10 bit 200 MS/s pipeline ADC using loading-balanced architecture in 0.18 μm CMOS

A new loading-balanced architecture for high speed and low power consumption pipeline analog-to-digital converter (ADC) is presented in this paper. The proposed ADC uses SHA-less, op-amp and capacitor-sharing technique, capacitor-scaling scheme to reduce the die area and power consumption. A new capacitor-sharing scheme was proposed to cancel the extra reset phase of the feedback capacitors. The non-standard inter-stage gain increases the feedback factor of the first stage and makes it equal to the second stage, by which, the load capacitor of op-amp shared by the first and second stages is balanced. As for the fourth stage, the capacitor and op-amp no longer scale down. From the system''s point of view, all load capacitors of the shared OTAs are balanced by employing a loading-balanced architecture. The die area and power consumption are optimized maximally. The ADC is implemented in a 0.18 μm 1P6M CMOS technology, and occupies a die area of 1.2×1.2 mm². The measurement results show a 55.58 dB signal-to-noise-and-distortion ratio (SNDR) and 62.97 dB spurious-free dynamic range (SFDR) with a 25 MHz input operating at a 200 MS/s sampling rate. The proposed ADC consumes 115 mW at 200 MS/s from a 1.8 V supply.     

A 0.6 V 10 bit 1 MS/s monotonic switching SAR ADC with common mode stabilizer in 0.13 μm CMOS

This paper presents a 0.6 V 10 bit successive approximation register （SAR） ADC design dedicated to the wireless sensor network application. It adopts a monotonic switching scheme in the DAC to save chip area and power consumption. The main drawback of the monotonic switching scheme is its large common mode shift and the associated comparator offset variation. Due to the limited headroom at the 0.6 V supply voltage, the conventional constant current biasing technique cannot be applied to the dynamic comparator. In this design, a common mode stabilizer is introduced to address this issue in low-voltage design. The effectiveness of this method is verified through both simulation and measurement results. Fabricated with 1P8M 0.13 μm CMOS technology, the proposed SAR ADC consumes 6.3 μW at 1 MS/s from a 0.6 V supply, and achieves 51.25 dB SNDR at the Nyquist frequency and FOM of 21 fJ/conversion-step. The core area is only 120 × 300 μm^2.     

A fractional-N frequency divider for multi-standard wireless transceiver fabricated in 0.18 μm CMOS process

With the rapid evolution of wireless communication technology,integrating various communication modes in a mobile terminal has become the popular trend.Because of this,multi-standard wireless technology is one of the hot spots in current research.This paper presents a wideband fractional-N frequency divider of the multi-standard wireless transceiver for many applications.High-speed divider-by-2 with traditional sourcecoupled-logic is designed for very wide band usage.Phase switching technique and a chain of divider-by-2/3 are applied to the programmable frequency divider with 0.5 step.The phase noise of the whole frequency synthesizer will be decreased by the narrower step of programmable frequency divider.△-Σ modulator is achieved by an improved MASH 1-1-1 structure.This structure has excellent performance in many ways,such as noise,spur and input dynamic range.Fabricated in TSMC 0.18 μm CMOS process,the fractional-N frequency divider occupies a chip area of 1130 × 510μm2 and it can correctly divide within the frequency range of 0.8-9 GHz.With 1.8 V supply voltage,its division ratio ranges from 62.5 to 254 and the total current consumption is 29 mA.     

一种基于65 nm CMOS工艺的10位10 MS/s SAR ADC

基于SMIC 65 nm CMOS工艺,设计了一种10位10 MS/s逐次逼近型模数转换器(SAR ADC)。采用全差分的R-C组合式DAC网络结构进行设计,提高了共模噪声抑制能力和转换精度。与全电容结构相比,R-C组合式DAC网络结构有效减小了版图面积。DAC中各开关的导通采用对称的开关时序,使比较器差分输入的共模电平保持为固定值,降低了比较器的失调电压,提高了ADC的线性度。在2.5 V模拟电源电压和1.2 V数字电源电压下,使用Spectre进行仿真验证,测得DNL为0.5 LSB,INL为0.8 LSB;在输入信号频率为4.990 2 MHz,采样频率为10 MHz的条件下,测得电路的有效位数为9.63位,FOM为0.04 pJ/conv。     

A 0.18 μm CMOS Gilbert low noise mixer with noise cancellation

This paper presents a broadband Gilbert low noise mixer implemented with noise cancellation technique operating between 10 MHz and 0.9 GHz. The Gilbert mixer is known for its perfect port isolation and bad noise performance. The noise cancellation technique of LNA can be applied here to have a better NF. The chip is implemented in SMIC 0.18 μm CMOS technology. Measurement shows that the proposed low noise mixer has a 13.7-19.5 dB voltage gain from 10 MHz to 0.9 GHz, an average noise figure of 5 dB and a minimum value of 4.3 dB. The core area is 0.6 × 0.45 mm².     

A reconfigurable passive mixer for multimode multistandard receivers in 0.18 μm CMOS

This paper presents a reconfigurable quadrature passive mixer for multimode multistandard receivers. By using controllable transconductor and transimpedance-amplifier stages, the voltage conversion gain of the mixer is reconfigured according to the requirement of the selected communication standard Other characteristics such as noises figure, linearity and power consumption are also reconfigured consequently. The design concept is verified by implementing a quadrature passive mixer in 0.18 μm CMOS technology. On wafer measurement results show that, with the input radio frequency ranges from 700 MHz to 2.3 GHz, the mixer achieves a controllable voltage conversion gain from 4 to 22 dB with a step size of 6 dB. The measured maximum ⅡP3 is 8.5 dBm and the minimum noise figure is 8.0 dB. The consumed current for a single branch (I or Q) ranges from 3.1 to 5.6 mA from a 1.8 V supply voltage. The chip occupies an area of 0.71 mm² including pads.     

A 10-bit 50-MS/s reference-free low power SAR ADC in 0.18-μm SOI CMOS technology

正A 10-bit 50-MS/s reference-free low power successive approximation register(SAR) analog-to-digital converter(ADC) is presented.An energy efficient switching scheme is utilized in this design to obtain low power and high frequency operation performance without an additional analog power supply or on-chip/off-chip reference. An on-chip calibration DAC(CDAC) is implemented to cancel the offset of the latch-type sense amplifier(SA) to ensure precision whilst getting rid of the dependence on the pre-amplifier,so that the power consumption can be reduced further.The design was fabricated in IBM 0.18-μm 1P4M SOI CMOS process technology.At a 1.5-V supply and 50-MS/s with 5-MHz input,the ADC achieves an SNDR of 56.76 dB and consumes 1.72 mW,resulting in a figure of merit(FOM) of 61.1 fJ/conversion-step.     

14位50MS/s100mW0.18μm CMOS流水线ADC

实现了一种14位40MS/s CMOS流水线A/D转换器(ADC)。在1.8V电源电压下,该ADC功耗仅为100mW。基于无采样/保持放大器前端电路和双转换MDAC技术,实现了低功耗设计,其中,无采样/保持放大器前端电路能降低约50%的功耗,双转换MDAC能降低约10%的功耗。该ADC采用0.18μm CMOS工艺制作,芯片尺寸为2.5mm×1.1mm。在40MS/s采样速率、10MHz模拟输入信号下进行测试,电源电压为1.8V,DNL在±0.8LSB以内,INL在±3.5LSB以内,SNR为73.5dB,SINAD为73.3dB,SFDR为89.5dBc,ENOB为11.9位,THD为-90.9dBc。该ADC能够有效降低SOC系统、无线通信系统及数字化雷达的功耗。     

一种10位200kS/s65nm CMOS SAR ADC IP核

该文基于65 nm CMOS低漏电工艺,设计了一种用于触摸屏SoC的8通道10位200 kS/s逐次逼近寄存器型(Successive Approximation Register,SAR) A/D转换器(Analog-to-Digital Converter,ADC) IP核。在D/A转换电路的设计上,采用7MSB (Most-Significant-Bit) + 3LSB (Least-Significant-Bit) R-C混合D/A转换方式,有效减小了IP核的面积,并通过采用高位电阻梯复用技术有效减小了系统对电容的匹配性要求。在比较器的设计上,通过采用一种低失调伪差分比较技术,有效降低了输入失调电压。在版图设计上,结合电容阵列对称布局以及电阻梯伪电阻包围的版图设计方法进行设计以提高匹配性能。整个IP核的面积为322m267m。在2.5 V模拟电压以及1.2 V数字电压下,当采样频率为200 kS/s,输入频率为1.03 kHz时,测得的无杂散动态范围(Spurious-Free Dynamic Range,SFDR)和有效位数(Effective Number Of Bits,ENOB)分别为68.2 dB和9.27,功耗仅为440W,测试结果表明本文ADC IP核非常适合嵌入式系统的应用。     

0.18 μm 1.8 V 10 bit 100 MS/s CMOS电流舵D/A IP设计与验证

基于GSMC 0.18μm CMOS工艺,采用曲率补偿带隙参考电压源和中心对称Q2随机游动对策拓扑方式的NMOS电流源阵列版图布局,实现了一种10 bit 100 MS/s分段温度计译码CMOS电流舵D/A转换器.当电源电压为1.8 V时,D/A转换器的功耗为10 mW,微分非线性误差和积分非线性误差分别为1 LSB和0.5 LSB.在取样速率为100 MS/s,输出频率为5 MHz条件下,SFDR为70 dB,10 bit D/A转换器的有效版图面积为0.2 mm2,符合SOC的嵌入式设计要求.     

一种10位50MS/s两级逐次逼近流水线混合型A/D转换器

本文在0.18μm CMOS工艺下,实现了一款10位50MS/s两级逐次逼近流水线混合型模数转换器（pipeline SAR ADC）。其由基于逐次逼近的增益模数单元和逐次逼近ADC组成,并采用1位冗余位放宽了子模数转换器的比较误差。通过采用逐次逼近结构,增益减半MDAC技术,动态比较器及动态逐次逼近控制逻辑,降低了模数转换器的功耗和面积。流片测试结果表明,在1.8V电源电压,50MS/s采样速率下,信噪失真比(SFDR)和功耗分别为56.04dB和5mV。     

A 1.33 μW 10-bit 200KS/s SAR ADC with a tri-level based capacitor switching procedure

A 10-bit successive approximation register (SAR) analog-to-digital converter (ADC) using an energy-efficient tri-level based capacitor switching procedure is presented. The proposed switching procedure achieves 97.66% less switching energy when compared to the conventional method. The number of unit capacitors is reduced by a factor of 4 over that of conventional architecture as well. To make the power consumption of the comparator scale down with respect to the comparison rate, the fully dynamic comparator is used. Moreover, the dynamic logic circuit is implemented to further reduce the power of digital circuits. The ADC is implemented in a 0.18 μm 1P6M CMOS technology. At 1.0-V power supply and 200KS/s, the ADC achieves an SNDR of 60.54 dB and consumes 1.33 μW, resulting in a figure-of-merit (FOM) of 7.7 fJ/conversion-step. The ADC core occupies an active area of only 230×400 µm².     

An 8.12 μ W wavelet denoising chip for PPG detection and portable heart ratemonitoring in 0.18 μm CMOS

A low power wavelet denoising chip for photoplethysmography (PPG) detection and portable heart rate monitoring is presented. To eliminate noise and improve detection accuracy, Harr wavelet (HWT) is chosen as the processing tool. An optimized finite impulse response structure is proposed to lower the computational complexity of proposed algorithm, which is benefit for reducing the power consumption of proposed chip. The modulus maxima pair location module is design to accurately locate the PPG peaks. A clock control unit is designed to further reduce the power consumption of the proposed chip. Fabricated with the 0.18 μm N-well CMOS 1P6M technology, the power consumption of proposed chip is only 8.12 μ W in 1 V voltage supply. Validated with PPG signals in multiparameter intelligent monitoring in intensive care databases and signals acquired by the wrist photoelectric volume detection front end, the proposed chip can accurately detect PPG signals. The average sensitivity and positive prediction are 99.91% and 100%, respectively.     

A 1.0-V 6-b 40 MS/s time-domain flash ADC in 0.18 μm CMOS

This paper presents a 6-bit low power low supply voltage time-domain comparator. The conventional voltage comparison is moved to time-domain so as to remove pre-amplifier and latch, which enables its feasibility to low supply voltage. The voltage-to-time converter is realized by the proposed linear pulse-width-modulation. The set-up time of the D flip-flop determines the sampling rate of the converter. The resistive averaging relaxes the matching requirement of the parallel comparison cells. The total input capacitance is decreased to less than 40fF in this architecture. The above digital-intensive setting makes the analog-to-digital converter (ADC) benefit from technology scaling in both power consumption and sampling rate. The prototype ADC is fabricated in SMIC 0.18 μm CMOS process. At 40 MS/s and 1.0-V supply, it consumes 540 μW and achieves an effective-number-of-bit of 5.43, resulting in a figure-of-merit of 0.31 pJ/conversion-step and active area of 0.1 mm².     

A 10 b 120 MS/s 108 mW 0.18 μm CMOS ADC with a PVT-insensitive current reference

This paper proposes a 10 b 120 MS/s CMOS ADC with a PVT-insensitive current reference. The designed current reference shows a mean temperature drift of 35.2 ppm/°C in the temperature range from −25 to 100°C and a supply rejection of 1.1%/V between 1.6 and 2.0 V. The prototype ADC fabricated in a 0.18 μm 1P6M CMOS technology demonstrates a measured DNL and INL of 0.18LSB and 0.53LSB with a maximum SNDR and SFDR of 53 and 68 dB at 120 MS/s. The ADC with an active chip area of 1.8 mm² consumes 108 mW at 120 MS/s and 1.8 V while the proposed on-chip current reference consumes 0.35 mW with a die area of 0.02 mm².     

用于百万像素级CMOS图像传感器的10位50MS/s流水线ADC设计

高速高精度ADC是CMOS图像传感器中的重要部分。随着工艺的进步,低功耗设计已经吸引了很多人的注意。为了在没有降低表现的情况下控制功耗,在本设计采用相同结构放大器共用相同的偏置电路技术,并且采用了共源共栅补偿技术来降低功耗。噪声和不匹配也是流水线ADC中重要的误差源,因此采用了Matlab对这两者进行了仔细的计算和系统仿真。在本文中,提出了一个10位50MS/s的 流水线ADC核心。这个设计可以用于大像素规模的CMOS图像传感器。本设计在表现和功耗上取得了很好的平衡。     

用于百万像素级CMOS图像传感器的10位50MS/s流水线ADC设计

噪声和不匹配是流水线ADC中的重要误差源,采用Matlab软件对它们进行了计算和系统仿真.为了在没有降低表现的情况下控制功耗,采用了相同结构放大器共用相同的偏置电路技术,并且采用了共源共栅补偿技术来降低功耗.还设计并且测试了一个可用于大像素规模CMOS图像传感器系统的10位50MS/s流水线ADC原型.根据测试结果,当采样频率为50MHz时功耗仅为42mW,SINAD为45.69dB.设计在表现和功耗上取得了很好的平衡.     

A 10-bit 2.5-MS/s SAR ADC with 60.46 dB SNDR in 0.13-μm CMOS technology

This paper presents a 10-bit 2.5-MS/s successive-approximation-register (SAR) analog- to-digital-converter (ADC) design for micro controller unit of signal process system. Because of the proposed new segmented architecture of 7 MSBs-plus-3 LSBs capacitor–resistor hybrid digital-to-analog-converter using a thermometer decoder for the most significant 5 MSBs, this design achieves superior static nonlinearity and dynamic performance of SNDR, SFDR. Utilizing the proposed deviation calibration technique, the discharging and charging via substrate resulting from deviation of the comparator’s common-mode voltage is cancelled. The ADC is fabricated in a standard 1P5M 0.13-μm CMOS technology. The peak DNL and INL are +0.18/?0.20-LSB, +0.30/?0.25 LSB respectively while the ENOB is 9.52-bit around all process–voltage–temperature corner analysis. At a 2.3-V supply voltage and a 2.5-MS/s sampling rate, the ADC achieves a SNDR of 60.46 dB, SFDR of 75.32 dB while the power dissipation is 0.191-mW, that resulting in a figure of merit of 98.45 fJ/c-s. The die of ADC measures 0.51 × 0.20 mm² resulting in area efficiency of 122.6 μm²/code and compared with the benchmark SAR ADCs, this work is the most area efficient design.