低银无铅焊料润湿及可靠性能研究

利用润湿测量法研究了低银无铅焊料SAC0307、SAC0507和SAC0807的润湿性能,发现上述低银焊料润湿性能几乎相同.通过波峰焊接实验鉴定了其溶解铜焊盘性能,发现所做短时间溶铜实验中上述低银焊料的低银焊料的溶铜速度几乎相同.温度循环实验后检测了金属间化合物生长及裂纹发生情况,确定低银无铅焊料SAC0807裂纹萌生率最低.所作实验研究中皆采用共晶锡银焊料SAC305作为参照焊料.     

开发高性能的无铅波峰焊料合金

无铅波峰焊已经发展为两个主要的合金体系:SnAgCu锡/银/铜体系通常含银量达3至4%和基于SnCu锡铜共晶体系。如果按照用户的价值方程式来衡量,二者都存在固有的缺陷。含银3%至4%的SnAgCu体系可提供良好的可靠性和工艺良率,但原材料的成本昂贵。作为替代品的SnCu共晶体系及其改性合金SnCuNi的原材料成本较低,但其工艺良率和焊接可靠性存在问题。为了克服现有焊料体系的缺点,确信电子开发出新型焊料合金SACX0307。研究SAC305、Sn99.3Cu0.7、改性Sn99.3Cu0.7SnCuNi和SACX0307四种合金系的测试结果,评估无铅焊接工艺的4个主要特性:工艺良率、铜浸出率、浮渣形成和热机械可靠性。波峰焊实验使用了测试电路板专门设计较复杂,以区分不同加工条件下的差异、三种助焊剂包括水基和醇基配方和两种电路板表面处理铜OSP和浸银处理。测试表明,SACX0307填补了SAC305合金与SnCu共晶合金系列之间的空白,就波峰焊的四个主要特性而言,其性能优于Sn99.3Cu0.7和SnCuNiSn99.3Cu0.7,而原材料成本低于SAC305。     

日本斯倍利亚公司突出展示低银和无银不含铅焊料之间的铜腐蚀差异

全球市场的先进焊料供应商日本斯倍利亚（Nihon Superior）有限公司突出展示其独特SN100C无铅焊料在回流焊接工艺中抑制铜腐蚀的更出色效果。针对目前市场上供应的各种低银和无银不含铅焊料的索赔和反索赔日益增多,     

低银Sn—Ag—Cu无铅钎料的性能研究

使用银含量较低的Sn-Ag-Cu无铅钎料是降低焊料成本最直接有效的手段之一,但银含量降低后对钎料性能的影响尚缺乏系统报导。通过向Sn-Cu二元体系中加入不同比例的纯银,制备了一系列低银合金。研究了银含量对钎料的熔点、可焊性及溶铜性能的影响。通过拉伸试验研究了合金的强度及杨氏模量。综合考虑上述各项性能指标,Sn-0.5Ag-0.7Cu是具有最佳性价比的合金成分。     

无铅焊接的到来与因应（下）

无铅焊料之波焊比起熔焊米还要麻烦，若仍以SnAgCu之锡料而言。其机组中的锡池平均温度，须增高50℃而约在250℃至260℃左右；至于焊接瞬间的波峰温度则更将高达280℃以上（约3-6秒），且预热时间亦需加长，以减少高温的冲击。如此之热量大增     

Sn—Ag—Cu无铅焊料性能研究

环保和微电子器件高度集成化的发展驱动了高性能无铅焊料的研究和开发,Sn—Ag－Cu系无铅焊料由于具有良好的焊接性能和使用性能,已逐渐成为一种通用电子无铅焊料。文章通过实验的方法,研究了8种不同配比的Sn—Ag—Cu焊料中银、铜含量对合金性能（包括熔点、润湿性和剪切强度）的影响,并对焊料的显微组织进行对比与分析,得出低银焊料的可靠性比高银焊料好,同时Sn－2．9Ag—1．2Cu的合金具有较低的熔点且铺展性好,为确定综合性能最佳的该系焊料合金提供了依据。     

陶瓷-金属封接用钛银铜合金焊料含钛量及其封接工艺的研究

正 (一) 前言 几十年来电真空器件一直采用钼锰金属化或涂钛粉的陶瓷金属封接工艺。该工艺比较复杂,同时封接质量又不易保证。我们研究了用钛银铜(Ti-Ag-Cu)活性合金焊料直接封接的工艺;试验了合金焊料中活性元素钛含量和封接温度等参量对封接质量的影响;给出了合金焊料的合适合钛量和封接的工艺规范。实验表明,钛银铜合金焊料直接封接工艺,方法简单,质量稳定,是值得推广应用的     

低银无铅焊料的研制动态

分析了低银无铅焊料(w(Ag)≤1.0％)在成本、抗跌落性能、Ag3Sn化合物的形成等方面与高银焊料相比的优势,综述了低银焊料在应用过程中面临的问题,如高熔点与氧化、热疲劳性能、返修缺陷等,并列举了实例,提出了一些有针对性的解决方案.最后展望了低银无铅焊料的发展趋势.     

2，9—二甲基—1，10—二氮杂菲分光光度法测定锡铅焊料中微量铜的含量

介绍了2，9－二甲基－1，10－二氮杂菲分光光度法测定锡铅焊料中微量铜的含量的方法，该实验方法简便、快捷、准确，适用于铜含量在0．001％－0．1％范围内的锡铅焊料测定。     

日本斯倍利亚公司突出展示低银和无银不含铅焊料之间的铜腐蚀差异

<正>全球市场的先进焊料供应商日本斯倍利亚(Nihon Superior)有限公司突出展示其独特SN100C?无铅焊料在回流焊接工艺中抑制铜腐蚀的更出色效果。针对目前市场上供应的各种低银     

Sn-Ag-Cu系无铅焊锡成分的优化研究

通过正交实验法对Sn-Ag-Cu系无铅焊锡合金的成分进行了优化研究。用光学显微镜、电导仪、热分析仪等对合金的微观组织、电导率、熔点、铺展性能进行了分析,并与Sn37Pb进行了对比。结果表明,Ag、Cu对Sn-Ag-Cu系焊锡合金的熔点、铺展性和电导率都有影响,当Ag质量分数为3%,Cu为2.8%,焊锡合金具有最佳的综合性能,且与铜基板的扩散层厚度大于Sn37Pb。     

新型Sn-Ag-Cu-Cr无铅焊料合金的研究

对新型Sn-Ag-Cu-Cr无铅焊料进行了熔点、力学性能、润湿性能等的测试,并从微观方面分析了Cr对Sn-Ag-Cu系无铅焊料的作用规律机理。结果表明:Cr的加入对材料力学性能的影响较为显著,当Cr含量(质量分数)在0.1%左右时可提高焊料的各项力学性能指标,而当含量过高后,又将降低材料的强度,提高脆性,Cr含量少于0.5%时,对焊料的熔点影响较小,而Cr的加入对焊料的铺展性能却有降低作用。     

Influence of High-G Mechanical Shock and Thermal Cycling on Localized Recrystallization in Sn-Ag-Cu Solder Interconnects

The impact of isothermal aging and recrystallized grain structure distribution on mechanical shock and thermal cycling performance of solder joints with 1% and 3% silver content Sn-Ag-Cu interconnects were investigated. Localized recrystallized grain structure distributions were analyzed to identify correlations between the microstructure evolution and shock performance. The results reveal that the shock tolerance depends on the amount of shock energy that can be absorbed during each shock cycle, which depends on microstructural features. Based on the recrystallized grain distribution, additional isothermal aging in 1% silver Sn-Ag-Cu interconnects shows improved shock performance, whereas degraded shock performance was observed in 3% Sn-Ag-Cu interconnects. Using the same grain boundary distribution analysis on thermally cycled samples, relationships between the particle size distribution, localized recrystallized grain structure development, shock, and thermomechanical performance were identified: finer particle spacing is beneficial for thermal cycling as it resists grain boundary generation, while conversely, wider particle spacing facilitates recrystallization and grain boundary mobility that allows Sn to absorb shock energy.     

微量Co对第二代低银SAC焊料合金改性机理研究

目前电子制造业界把低成本的低Ag无铅焊料合金定义为第二代无铅焊料合金。在目前已公开的第二代无铅低Ag焊料合金类型中,又以掺入微量Co改性的应用性能和可靠性表现最优秀而受到了关注。重点对该类型焊料合金掺Co改性的机理展开了研究试验。在研究试验结论的基础上,分析了其推广应用的良好前景。     

Microstructure and Reliability Comparison of Different Pb-Free Alloys Used for Wave Soldering and Rework

This paper describes the results of an intensive microstructural and reliability study of pin-through-hole (PTH) and surface mount technology (SMT) components which were wave solder assembled using three groups of alloys: (1) near-eutectic Sn-Ag-Cu alloys such as SAC405 and SAC305, (2) low-Ag off-eutectic Pb-free alloys with an Ag content of about 1% and lower, and (3) eutectic Sn-Cu alloys with Ni and other additives. Both primary attach and reworked solder connections using solder fountain and hand rework were studied. The PTH connector types and SMT components were wave solder assembled on a test vehicle. Accelerated thermal cycling (ATC) was conducted at 0°C to 100°C for 6000 cycles. The difference in microstructures, intermetallic formation, Cu dissolution, grain coarsening, and crack formation is shown. The influence of the microstructure after assembly and rework on Weibull plot parameters and failure modes is described for 2512 resistors. Interconnect defects such as nonuniform phase distribution and void formation are discussed. The Sn-Cu-Ni- and Sn-Cu-Ag-Bi-based alloys tested in this study are recommended as potential suitable replacements for SAC305/405 in the wave solder process; no failure was detected up to 6000 cycles at 0°C to 100°C. Although SAC405 demonstrated better barrel fill and lower rate of crack propagation during ATC, after PTH rework, both of the alternative Pb-free alloys have a much lower Cu dissolution rate and definitely outperform SAC405 in ATC. SAC405 glue and wave resistors after primary attachment and rework demonstrate higher reliability than alternative alloys. Early failures relate to alternative alloy characteristics and should be considered for some applications.     

Impact of 5% NaCl Salt Spray Pretreatment on the Long-Term Reliability of Wafer-Level Packages with Sn-Pb and Sn-Ag-Cu Solder Interconnects

Understanding the sensitivity of Pb-free solder joint reliability to various environmental conditions, such as corrosive gases, low temperatures, and high-humidity environments, is a critical topic in the deployment of Pb-free products in various markets and applications. The work reported herein concerns the impact of a marine environment on Sn-Pb and Sn-Ag-Cu interconnects. Both Sn-Pb and Sn-Ag-Cu solder alloy wafer-level packages, with and without pretreatment by 5% NaCl salt spray, were thermally cycled to failure. The salt spray test did not reduce the characteristic lifetime of the Sn-Pb solder joints, but it did reduce the lifetime of the Sn-Ag-Cu solder joints by over 43%. Although both materials showed strong resistance to corrosion, the localized nature of the corroded area at critical locations in the solder joint caused significant degradation in the Sn-Ag-Cu solder joints. The mechanisms leading to these results as well as the extent, microstructural evolution, and dependency of the solder alloy degradation are discussed.     

Sn-Ag-Cu焊料中金属间化合物对焊接性能的影响

讨论了Sn-Ag-Cu焊料与Cu焊盘间在回流焊过程中形成的金属间化合物(IMC)的种类、形态,Ag含量和Cu含量对IMC的影响,IMC在老化过程中的生长演变及其对焊接性能的影响。结果表明:Sn-Ag-Cu焊料与Cu焊盘之间的金属间化合物主要是Cu6Sn5和长针状的Ag3Sn,Ag和Cu的添加对组织有明显细化作用,但过量添加会影响IMC的性能。IMC的演变主要是与老化温度、老化时间有关,较厚的IMC不利于焊接性能的提高。     

Study of Solidification Cracks in Sn-Ag-Cu Lead-Free Solder Joints

In the present work, solidification cracks in Sn-Ag-Cu solder joints were investigated. Experimental results indicate that solidification cracks existed in significant numbers in the miniature Sn-Ag-Cu solder joints. In order to create solidification cracks in the miniature solder joints during solidification and evaluate the susceptibility of Sn-Ag-Cu alloys to solidification cracking, a copper self-restraint specimen was designed, which can simulate the process of solidification crack formation. The solidification crack susceptibility of the Sn-Ag-Cu solder alloy was evaluated using the total crack length of the solder joint. In addition, the effect of trace amounts of elemental additions on solidification cracking of Sn-Ag-Cu solder joints was studied. It was found that adding trace amounts of Ni or Ce could depress the solidification cracks in Sn-3.0Ag-0.5Cu solder joints. However, P additions aggravated the formation of solidification cracks.