Design of a low-power 3.5-GHz broad-band CMOS transimpedance amplifier for optical transceivers

This paper describes a novel low-power low-noise CMOS voltage-current feedback transimpedance amplifier design using a low-cost Agilent 0.5-/spl mu/m 3M1P CMOS process technology. Theoretical foundations for this transimpedance amplifier by way of gain, bandwidth and noise analysis are developed. The bandwidth of the amplifier was extended using the inductive peaking technique, and, simulation results indicated a -3-dB bandwidth of 3.5 GHz with a transimpedance gain of /spl ap/60 dBohms. The dynamic range of the amplifier was wide enough to enable an output peak-to-peak voltage swing of around 400 mV for a test input current swing of 100 /spl mu/A. The output noise voltage spectral density was 12 nV//spl radic/Hz (with a peak of /spl ap/25 nV//spl radic/Hz), while the input-referred noise current spectral density was below 20 pA//spl radic/Hz within the amplifier frequency band. The amplifier consumes only around 5 mA from a 3.3-V power supply. A test chip implementing the transimpedance amplifier was also fabricated using the low-cost CMOS process.     

A 2-V 23-/spl mu/A 5.3-ppm//spl deg/C curvature-compensated CMOS bandgap voltage reference

A high-order curvature-compensated CMOS bandgap reference, which utilizes a temperature-dependent resistor ratio generated by a high-resistive poly resistor and a diffusion resistor, is presented in this paper. Implemented in a standard 0.6-/spl mu/m CMOS technology with V/sub thn//spl ap/|V/sub thp/|/spl ap/0.9 V at 0/spl deg/C, the proposed voltage reference can operate down to a 2-V supply and consumes a maximum supply current of 23 /spl mu/A. A temperature coefficient of 5.3 ppm//spl deg/C at a 2-V supply and a line regulation of /spl plusmn/1.43 mV/V at 27/spl deg/C are achieved. Experimental results show that the temperature drift is reduced by approximately five times when compared with a conventional bandgap reference in the same technology.     

A quad CMOS single-supply op amp with rail-to-rail output swing

The realization of a commercially viable, general-purpose quad CMOS amplifier is presented, along with discussions of the tradeoffs involved in such a design. The amplifier features an output swing that extends to either supply rail, together with an input common-mode range that includes ground. The device is especially well suited for single-supply operation and is fully specified for operation from 5 to 15 V over a temperature range of -55 to +125/spl deg/C. In the areas of input offset voltage, offset voltage drift, input noise voltage, voltage gain, and load driving capability, this implementation offers performance that equals or exceeds that of popular general-purpose quads or bipolar of Bi-FET construction. On a 5-V supply the typical V/SUB os/ is 1 Mv, V/SUB os/ drift is 1.3 /spl mu/V//spl deg/C, 1-kHz noise is 36 nV//spl radic/Hz, and gain is one million into a 600-/spl Omega/ load. This device achieves its performance through circuit design and layout techniques as opposed to special analog CMOS processing, thus lending itself to use on system chips built with digital CMOS technology.     

A CMOS chopper amplifier

A highly sensitive CMOS chopper amplifier for low-frequency applications is described. It is realized with a second-order low-pass selective amplifier using a continuous-time filtering technique. The circuit has been integrated in a 3-/spl mu/m p-well CMOS technology. The chopper amplifier DC grain is 38 dB with a 200-Hz bandwidth. The equivalent input noise is 63 nV//spl radic/Hz and free from 1/f noise. The input offset is below 5 /spl mu/V for a tuning error less than 1%. The amplifier consumes only 34 /spl mu/W.     

A capacitor-free CMOS low-dropout regulator with damping-factor-control frequency compensation

A 1.5-V 100-mA capacitor-free CMOS low-dropout regulator (LDO) for system-on-chip applications to reduce board space and external pins is presented. By utilizing damping-factor-control frequency compensation on the advanced LDO structure, the proposed LDO provides high stability, as well as fast line and load transient responses, even in capacitor-free operation. The proposed LDO has been implemented in a commercial 0.6-/spl mu/m CMOS technology, and the active chip area is 568 /spl mu/m/spl times/541 /spl mu/m. The total error of the output voltage due to line and load variations is less than /spl plusmn/0.25%, and the temperature coefficient is 38 ppm//spl deg/C. Moreover, the output voltage can recover within 2 /spl mu/s for full load-current changes. The power-supply rejection ratio at 1 MHz is -30 dB, and the output noise spectral densities at 100 Hz and 100 kHz are 1.8 and 0.38 /spl mu/V//spl radic/Hz, respectively.     

A 48-16-MHz CMOS SC decimation filter

This paper presents a CMOS switched-capacitor decimation filter for prefiltering operations in video communications systems, reducing the complexity of continuous-time antialiasing filters and alleviating dynamic range requirements of analog-to-digital converters. As a consequence of the structure's low sensitivity to process variations, predicted by theory and verified in the laboratory by measurements on all samples of the same batch, it was possible to apply capacitor arrays having minimum feasible size units of 100 fF to implement the filter coefficients, leading to substantial savings in power consumption. Implemented in a standard 0.8-/spl mu/m CMOS process with poly-poly capacitors, the experimental device samples the incoming continuous-time analog signal at 48 MHz and presents a filtered sampled-data output at 16 MHz, with a measured pass-band deviation smaller than 0.22 dB up to the cutoff frequency of 3.6 MHz, output noise power spectrum of 1.1 nV/sub RMS///spl radic/(Hz) and a signal handling ability of 1.4 V/sub pp/, resulting in a dynamic range of 48 dB, meeting the usual specifications for video-frequency signal processing.     

A very high precision 500-nA CMOS floating-gate analog voltage reference

A floating gate with stored charge technique has been used to implement a precision voltage reference achieving a temperature coefficient (TC) <1 ppm//spl deg/C in CMOS technology. A Fowler-Nordheim tunnel device used as a switch and a poly-poly capacitor form the basis in this reference. Differential dual floating gate architecture helps in achieving extremely low temperature coefficients, and improving power supply rejection. The reference is factory programmed to any value without any trim circuits to within 200 /spl mu/V of its specified value. The floating-gate analog voltage reference (FGAREF) shows a long-term drift of less than 10 ppm//spl radic/1000 h. This circuit is ideal for portable and handheld applications with a total current of only 500 nA. This is done by biasing the buffer amplifier in the subthreshold region of operation. It is fabricated using a 25-V 1.5-/spl mu/m E/sup 2/PROM CMOS technology.     

CMOS voltage references using lateral bipolar transistors

Two bandgap references are presented which make use of CMOS compatible lateral bipolar transistors. The circuits are designed to be insensitive to the low beta and alpha current gains of these devices. Their accuracy is not degraded by any amplifier offset. The first reference has an intrinsic low output impedance. Experimental results yield an output voltage which is constant within 2 mV, over the commercial temperature range (0 to 70/spl deg/C), when all the circuits of the same batch are trimmed at a single temperature. The load regulation is 3.5 /spl mu/V//spl mu/A, and the power supply rejection ratio (PSRR) at 100 Hz is 60 dB. Measurements on a second reference yield a PSRR of minimum 77 dB at 100 Hz. Temperature behaviour is identical to the first circuit presented. This circuit requires a supply voltage of only 1.7 V.     

MOS transistors operated in the lateral bipolar mode and their application in CMOS technology

Operation of an MOS transistor as a lateral bipolar is described and analyzed qualitatively. It yields a good bipolar transistor that is fully compatible with any bulk CMOS technology. Experimental results show that high /spl beta/-gain can be achieved and that matching and 1/f noise properties are much better than in MOS operation. Examples of experimental circuits in CMOS technology illustrate the major advantages that this device offers. A multiple current mirror achieves higher accuracy, especially at low currents. An operational transconductance amplifier has an equivalent input noise density below 0.1 /spl mu/V//spl radic/Hz for frequencies as low as 1 Hz and a total current of 10 /spl mu/A. A bandgap reference yields a voltage stable within 3 mV from -40 to +80/spl deg/C after digital adjustment at ambient temperature. Other possible applications are suggested.     

Amplifier techniques for combining low noise, precision, and high-speed performance

A monolithic operational amplifier is presented which optimizes voltage noise both in the audio frequency band, and in the low frequency instrumentation range. In addition, the design demonstrates that the requirements for low noise do not necessitate compromising the specifications in other respects. Techniques are set forth for combining low noise with high-speed and precision performance for the first time in a monolithic amplifier. Achieved results are: 3 nV//spl radic/Hz white noise, 80 nV/SUB p-p/ noise from 0.1 to 10 Hz, 17 V//spl mu/s slew rate, 63 MHz gain-bandwidth product, 10 /spl mu/V offset voltage, 0.2 /spl mu/V//spl deg/C drift with temperature, 0.2 /spl mu/V/month drift with time, and a voltage gain of two million.     

A low-noise high-precision operational amplifier

A low-noise high-precision operational amplifier has recently been fabricated in monolithic form with dielectric isolation. The amplifier exhibits a V/SUB OS/ of 10 /spl mu/V, V/SUB OS/T/SUB c/ of 0.3 /spl mu/V//spl deg/C, voltage gain of 140 dB with a 600 /spl Omega/ load, and an input noise voltage of 9 nV//spl radic/Hz. The settling time to within 0.01 percent of final value is 15 /spl mu/s for a 10 V pulse.     

DRAM plate electrode bias optimization for reducing leakage current in UV-O/sub 3/ and O/sub 2/ annealed CVD deposited Ta/sub 2/O/sub 5/ dielectric films

A new plate biasing scheme is described which allowed the use of 65% higher supply voltage without increasing the leakage current for the UV-O/sub 3/ and O/sub 2/ annealed chemical-vapor-deposited tantalum pentaoxide dielectric film capacitors in stacked DRAM cells. Dielectric leakage was reduced by biasing the capacitor plate electrode to a voltage lower than the conventionally used value of V/sub cc//2. Ta/sub 2/O/sub 5/ films with 3.9 nm effective gate oxide, 8.5 fF//spl mu/m/sup 2/ capacitance and <0.3 /spl mu/A/cm/sup 2/ leakage at 100/spl deg/C and 3.3 V supply are demonstrated.<>     

Robust highly linear high-frequency CMOS OTA with IM3 below - 70 dB at 26 MHz

An enhanced configuration for a linearized MOS operational transconductance amplifier (OTA) is proposed. The proposed fully differential OTA circuit is based on resistive source degeneration and an improved adaptive biasing technique. It is robust to process variation, which has not been fully shown in previously reported linearization techniques. Detailed harmonic distortion analysis demonstrating the robustness of the proposed OTA is introduced. The transconductance gain is tunable from 160 to 340 /spl mu/S with a third-order intermodulation (IM3) below -70 dB at 26 MHz. As an application, a 26-MHz second-order low-pass filter fabricated in TSMC 0.35-/spl mu/m CMOS technology with a power supply of 3.3 V is presented. The measured IM3 with an input voltage of 1.4 Vpp is below - 65 dB for the entire filter pass-band, and the input referred noise density is 156nV//spl radic/Hz. The cutoff frequency of the filter is tunable in the range of 13-26 MHz. Theoretical and experimental results are in good agreement.     

An NMOS comparator for a bubble memory

A low-noise low-offset comparator was designed for a bubble memory system. The measured noise performance was 25 /spl mu/V rms or 13 nV//spl radic/Hz and the worst case offset voltage was determined to be 158 /spl mu/V. This results in a 1.30 mV comparator gray region.     

A fourth-order /spl Sigma//spl Delta/ interface for micromachined inertial sensors

This paper presents the design and implementation of a high-order /spl Sigma//spl Delta/ interface for micromachined inertial sensors, which employs an electronic filter in series with the mechanical sensor element to reject the excessive in-band quantization noise inherently present in state-of-the-art second-order solutions. A fourth-order prototype was fabricated in a standard 0.5-/spl mu/m CMOS process. The active circuit area measures 0.9 mm/sup 2/, and the interface consumes 13 mW from a 5-V supply and achieves resolution of 1/spl deg//s//spl radic/Hz with a gyroscope and 150/spl mu/g//spl radic/Hz with an accelerometer. Comparison between the measured and simulated behavior of the system shows that the contribution of the quantization error to the total noise is negligible.     

Design of a low-noise preamplifier for nerve cuff electrode recording

This paper discusses certain important issues involved in the design of a nerve signal preamplifier for implantable neuroprostheses. Since the electroneurogram signal measured from cuff electrodes is typically on the order of 1 /spl mu/V, a very low-noise interface is essential. We present the argument for the use of BiCMOS technology in this application and then describe the design and evaluation of a complete preamplifier fabricated in a 0.8-/spl mu/m double-metal double-poly process. The preamplifier has a nominal voltage gain of 100, a bandwidth of 15 kHz, and a measured equivalent input-referred noise voltage spectral density of 3.3 nV//spl radic/Hz at 1 kHz. The total input-referred rms noise voltage in a bandwidth 1 Hz-10 kHz is 290 nV, the power consumption is 1.3 mW from /spl plusmn/2.5-V power supplies, and the active area is 0.3 mm/sup 2/.     

A 1-V integrated current-mode boost converter in standard 3.3/5-V CMOS technologies

A 1-V integrated CMOS current-mode boost converter implemented in a standard 3.3/5-V 0.6-/spl mu/m CMOS technology (V/sub TH//spl ap/0.85 V), providing power-conversion efficiency of higher than 85% at 100-mA output current, is presented in this paper. The high-performance boost converter is successfully developed due to three proposed low-voltage circuit structures, including an inductor-current sensing circuit for current-mode operation with accuracy of higher than 94%, a precision V-I converter for compensation-ramp generation in current-mode control, and a VCO providing supply-independent clock and ramp signals. Moreover, a proposed startup circuit enables proper converter startup within a sub-1-V supply condition.     

Millimeter-wave voltage-controlled oscillators in 0.13-/spl mu/m CMOS technology

This paper describes the design of CMOS millimeter-wave voltage controlled oscillators. Varactor, transistor, and inductor designs are optimized to reduce the parasitic capacitances. An investigation of tradeoff between quality factor and tuning range for MOS varactors at 24 GHz has shown that the polysilicon gate lengths between 0.18 and 0.24 /spl mu/m result both good quality factor (>12) and C/sub max//C/sub min/ ratio (/spl sim/3) in the 0.13-/spl mu/m CMOS process used for the study. The components were utilized to realize a VCO operating around 60 GHz with a tuning range of 5.8 GHz. A 99-GHz VCO with a tuning range of 2.5 GHz, phase noise of -102.7 dBc/Hz at 10-MHz offset and power consumption of 7-15mW from a 1.5-V supply and a 105-GHz VCO are also demonstrated. This is the CMOS circuit with the highest fundamental operating frequency. The lumped element approach can be used even for VCOs operating near 100-GHz and it results a smaller circuit area.     

192 GHz push-push VCO in 0.13 /spl mu/m CMOS

A 192 GHz cross-coupled push-push voltage controlled oscillator (VCO) is fabricated using the UMC 0.13 /spl mu/m CMOS logic process. The VCO can be tuned from 191.4 to 192.7 GHz. The VCO provides output power of /spl sim/-20 dBm and phase noise of /spl sim/-100 dBc/Hz at 10 MHz offset, while consuming 11 mA from a 1.5 V supply.     

CMOS wideband amplifiers using multiple inductive-series peaking technique

This work presents the technique of multiple inductive-series peaking to mitigate the deteriorated parasitic capacitance in CMOS technology. Employing multiple inductive-series peaking technique, a 10-Gb/s optical transimpedance amplifier (TIA) has been implemented in a 0.18-/spl mu/m CMOS process. The 10-Gb/s optical CMOS TIA, which accommodates a PD capacitor of 250 fF, achieves the gain of 61 dB/spl Omega/ and 3-dB frequency of 7.2 GHz. The noise measurement shows the average noise current of 8.2 pA//spl radic/Hz with power consumption of 70 mW.