利用MCNP对阵列电离室电极片电子发射产额的影响研究

本文通过对7种材质(C、Al、Fe、Cu、Ag、W、Pb)电极片在1.25 Me V入射光子束作用下的电子发射产额进行模拟计算,研究了厚度和材质对阵列电离室电极片电子发射产额的影响关系。研究结果表明:阵列电离室电极片在辐射光子作用下的电子发射产额在电极片厚度较厚时(特别是大于0.01 mm时),随着电极片厚度或电子密度的增大而明显减小。另外,电极片长度的选取需要结合电极的材质适当考虑。     

测量XAFS谱的全电子产额技术

在北京同步辐射实验室XAFS实验站上建立了利用全电子产额方法探测XAFS的实验方法。通过测量单色X－射线在样品表面激发出的电子产额随X－射线能量的变化,提取在吸收边附近的XAFS震荡。对不同厚度Cu薄膜的测量表明,在Cu的K吸收边附近可观察到信噪比很好的XAFS震荡。该探测器设计简单,可以直接在大气下工作。全电子产额XAFS方法的建立,有助于导电薄膜和材料的近表面结构研究。     

低能γ光子及X射线在透射金属箱方向激发的次级X射线

采用Ｓｉ（Ｌｉ）Ｘ射线探测系统，以透射法测量了２４１Ａｍ和２３８Ｐｕ放射源的低能γ光子和Ｘ射线在透过不同厚度的Ｆｅ和Ｃｕ箔时激发的次级Ｘ射线相对强度的变化。实验结果表明：激发产生的Ｘ射线相对强度在实验样品厚度范围内随箔厚的增加而增加；在高原子序数材料中将产生更多的特征Ｘ射线；各次级Ｘ射线的强度与箔厚形成方式以及激发源的活度、能量有关。最后对实验结果的物理机制进行了初步探讨。     

HL—1聚变装置中子发射实验研究

采用ＺｎＳ（Ａｇ）闪烁计数器，经标准中子源刻度校正后，测量ＨＬ－１（中国环流器一号）聚变装置的中子演化和中子产额；同时用活化箔法（１１５Ｉｎ）和原子核乳胶法测量中子产额。在真空室充氘和电子回旋共振加热（ＥＣＲＨ）时，３种方法同时测量，确证ＨＬ－１每放电１次发射中子数平均为（３．４１±０．５０）×１０１０。得到欧姆加热、ＥＣＲＨ、改进约束放电（ＩＯＣ）和弹丸注入等放电实验中的中子演化。在分子束注入和偏压电极（ＥＰＰ）放电实验中，产生中子较少或很少。观察部分放电方式产生的中子产额Ｎ和硬Ｘ射线产额ＨＸ间有线性关系Ｎ＝ａＨＸ－ｂ，其中，ａ和ｂ是与装置运行方式有关的常数。     

低能γ光子及射线在透射金属箔方向激发的次级X射线

采用Ｓｉ（Ｌｉ）Ｘ射线探测系统，以透射法测量了＾２４１Ａｍ和＾２３８Ｐｕ放射源的低能γ光子和Ｘ射线在透过不同厚度的Ｆｅ和Ｃｕ箔时激发的次级Ｘ射线相对强度的变化，实验结果表明，激发产生的Ｘ射线相对强度在实验样品厚度范围内随箔厚的增加而增加，在高原子序数材料中将产生更多的特征Ｘ射线，各次级Ｘ射线的强度与箔厚形成方式以及激发源的活度，能量有关，最后对实验结果的物理机制进行了初步探讨。     

Ar16+与Zr作用产生的X射线谱

本工作对超导离子源(SECRAL)上的10～20 kV/q Ar16 和Ar17 入射到金属Zr表面进行实验研究.实验结果表明,高电荷态Ar16 在金属表面存在着多电子激发过程.Ar空心原子的K层发射X射线强度随入射离子的动能减少,靶原子Zr的L壳层发射X射线强度随入射离子动能的增加而增强.Ar17 单离子的Kα-X射线产额比Ar16 单离子的Kα-X射线产额大5个数量级.     

低能高电荷态氮离子与Cu表面相互作用致K-X射线发射的研究

利用中国科学院近代物理研究所的电子回旋共振离子源引出的高电荷态氮离子(N^q+,q=3,5,6),在4.5～120 keV动能范围内系统测量了N^q+(q=3,5,6)与Cu表面碰撞产生的K-X射线能谱;基于原子壳层电离理论计算了K-X射线产额值及其电离截面值。结果表明:N^q+(q=3,5)离子进入靶表面后与Cu原子发生紧密碰撞,在直接库伦电离的作用下发射K-X射线,并且随着入射离子动能的增加,K-X射线产额和K壳层电离截面均单调增大;对于N⁶⁺离子,K-X射线产额与其入射动能没有明显的依赖关系,且在Cu表面形成的"空心原子"级联退激产生的K-X射线产额约占其总K-X射线产额的97%。另外,N⁵⁺离子入射时的K-X射线产额明显高于N³⁺离子入射时的产额。本工作对离子与表面相互作用中形成的"空心原子"的退激过程具有重要的参考价值,并为理解"空心原子"的退激过程和彗星X射线机理的研究提供了基础数据。     

SIP外壳内受X射线激发的电磁干扰环境

本文估算了系统级封装（SIP）外壳内，受脉冲X射线辐照产生的电磁干扰（EMI）环境。首先通过蒙特卡罗数值方法计算了可伐合金及印制电路板（PCB）表面受X射线辐照激发电子的产额和能谱，并基于该计算结果开展了电子自洽运动的数值模拟。利用时域有限差分法（FDTD）和粒子模拟技术（PIC）对电子产生电磁场的过程进行了仿真。计算结果表明，电子的运动使得电子发射面附近的EMI环境最强。此外，从频谱可看出，电磁干扰主要集中在低频部分，且频率取决于X射线的时间参数。通过减小SIP外壳的受辐照面积及高度可降低外壳内的EMI环境强度。     

~(19)F(p,αγ)~(16)O反应产生的6～7MeVγ射线产额及其特性研究

测量了在Ep=34 0～ 34 90keV能区质子束引起19F( p ,αγ) 16O反应发射的 6 12 9、6 917和7 117MeV 3组γ射线的产额 ,并对其特性进行了分析讨论     

低能Xe离子辐照在Al表面上的光辐射研究

本文测量了200~550 keV的Xe10+离子轰击高纯度（9999%）Al表面诱发的溅射Al原子的光发射,研究了Al Ⅰ 30810、30914、39452、39628 nm光谱线强度比值和光子产额随入射离子能量的变化趋势。在本实验能量范围内,辐射光谱线强度比值随入射离子能量增加几乎不变,而发射谱线的光子产额随入射离子能量的增加呈现出不同趋势：入射离子能量为450 keV时,光子产额出现极大值,入射离子能量超过450 keV时,光子产额随能量的增加而减少,其变化趋势与核阻止本领随能量增加的变化没有出现类同的变化特征。结合核阻止和电子阻止效应对实验结果进行了讨论,结果表明：入射离子能量低于450 keV时,核阻止在碰撞中起主导作用,入射离子能量高于450 keV时,电子阻止在碰撞中起主导作用。     

Kinetic electron emission from metals induced by impact of slow atomic particles

Available experimental data on the kinetic electron emission from metals bombarded by low energy atomic particles below the classical threshold were analyzed in terms of one-electron non-adiabatic model and in terms of phenomenological many-electron models. Total electron yields as a function of the particle velocity for several distinctly different substrate-particle systems were successfully interpreted using a phenomenological model. The essential microscopic mechanism of the model is the valence electron Auger interaction which leads to the Boltzmann - like energy distribution of the excited electrons in the impact zone.     

Monte Carlo study of ion-induced secondary electron emission from SiO2

Here we describe a recently developed direct Monte Carlo program to study kinetic electron emission from SiO₂ target. The program includes excitation of the target electrons (by projectile ions, recoiling target atoms and fast primary electrons), subsequent transport and escape of these electrons from the target surface. The program can be used to calculate the electron yields, distribution of electron excitation points in the target and other physical parameters of the emitted electrons. In order to demonstrate the capabilities of this program, we report a study on the kinetic electron emission from SiO₂ induced by fast (1-10 keV) rare gas ions. The calculated kinetic electron yield for various ion energies and masses is in good agreement with the predictions of most frequently applied theoretical model. In addition, the effects of projectile energy, mass and impact angle on the depth distribution of electron excitation points and average escape depth of the outgoing electrons were investigated. It is important to mention that the existing experimental techniques are not capable to measure these parameters.     

Optical excitations in electron-induced desorption of sodium from NaCl surface

Optical excitation processes stimulated by electron bombardment of alkali halides have been investigated under various experimental conditions. As an example a 500 eV e⁻ beam was used to bombard a (100) NaCl crystal. The work included measurements of both excited and ground state sodium atom yields as a function of the target temperature and the beam intensity, a cross-beam experiment with two electron beams: parallel and perpendicular to the sample surface, and a modulated beam measurement in search for time correlations between primary electrons and excited state production.The results were compared with the H-centre migration model and the results of recent publications. In particular it was found that a direct excitation of sodium atoms took place above the surface in collisions with the flux of primary and secondary electrons.     

Secondary electron emission from a thin carbon foil induced by equi-velocity protons and electrons of 0.5-3.5 MeV/u

The statistical distributions of the number of simultaneously forward-emitted secondary electrons (SEs) from a thin carbon foil have been measured with H⁰ and H⁺ projectiles of 0.5-3.5 MeV in coincidence with the foil-transmitted protons, irrespective of projectile incident charge state. From these results, the probabilities of the simultaneous emission of n electrons and the SE yields by loss electrons have been evaluated. At energies of 2.5-3.5 MeV, the obtained emission probabilities and the SE yields induced by loss electrons are larger than the corresponding ones by protons of the same velocity. Furthermore, the material parameter is found to be almost constant and is slightly larger than that for the protons. On the other hand, the forward SE yields by loss electrons is decreasing to zero with decreasing the incident energy. This behavior is consistent with the range-energy relation of electrons in carbon.     

Monte Carlo study of ion-induced backward and forward secondary electron emission from thin Al foil

A direct Monte Carlo program has been developed to calculate the backward (γ_b) and forward (γ_f) electron emission yields from 20 nm thick Al foil for impact of C⁺, Al⁺, Ar⁺, Cu⁺ and Kr⁺ ions having energies in the range of 0.1-10 keV/amu. The program incorporates the excitation of target electrons by projectile ions, recoiling target atoms and fast primary electrons. The program can be used to calculate the electron yields, distribution of electron excitation points in the target and other physical parameters of the emitted electrons. The calculated backward electron emission yield and the Meckbach factor R = γ_f/γ_b are compared with the available experimental data, and a good agreement is found. In addition, the effect of projectile energy and mass on the longitudinal and lateral distribution of the excitation points of the electrons emitted from front and back of Al target has been investigated.     

The possible role of anisotropy in kinetic electronic excitation of solids by particle bombardment

The kinetic excitation of a solid surface by impact of energetic particles is investigated by means of internal electron emission across a buried metal-insulator-metal (MIM) tunnel junction. By bombarding the top metal surface of such a device with keV noble gas ions, internal emission yields were determined as a function of projectile impact energy and angle of incidence with respect to the surface normal. In order to understand the observed impact angle dependence, we apply a modified formalism originally published to describe external electron emission. As a result, we find that the measured data can be explained by assuming the spatial distribution of excited electrons propagating towards the buried oxide interface to be strongly influenced by the projectile impact angle. A simple ballistic model assuming excited electrons generated by direct collisions with the projectile to preferably propagate along the direction of the original projectile motion, while electrons excited by scattering from moving recoils propagate isotropically, appears to describe the observed experimental data quite well.     

Electron intensities obtained during backscattered-Mössbauer spectroscopy: II. Theoretical and experimental comparisons of emergent angular distributions

When gamma-rays from a ⁵⁷Co source impinge on an absorber containing ⁵⁷Fe, they can be resonantly absorbed, resulting in the generation of conversion electrons and subsequent Auger electrons, or they can be nonresonantly scattered via photoelectric and Compton processes. The ratio of resonant to nonresonant electrons escaping from the absorber represents the absolute peak height/area obtained from a backscattered-conversion electron Mössbauer spectrum and provides important information helpful in the depth-profiling of multilayer specimens.A simple theoretical model which accounts for resonant and nonresonant electrons emerging from the surface at angles from zero to 2π radians with energies above zero eV has been developed previously. The signal-to-background (S/B) ratios from 5 nm iron films and 2.5 × 10⁶ nm iron foils have been calculated using this model, and good agreement between calculated and experimental results has been obtained. The intensity of resonant and nonresonant electrons emerging from the absorber in specific angular intervals has also been calculated using this model for a 1.0 μm thick 92.8% enriched ⁵⁷Fe foil mounted on a stainless steel substrate. The simulated angular distributions for backscattered-resonant electrons and backscattered-nonresonant electrons both provide cosine-type curves and are similar to experimental data, resulting in an isotropic distribution of the S/B ratio. The predicted S/B ratio, however, is about twice the S/B ratio measured experimentally. This discrepancy may result from the neglect of: (i) electrons below 50 eV and (ii) multiple scattering events. Despite these shortcomings, the model proposed in this study is capable of comparing the relative magnitude of the resonant and nonresonant signals, thereby calibrating the resonant signal against the nonresonant background. This procedure appears to provide additional information helpful for nondestructive depth-profiling studies.     

CORRECTION OF INFLUENCE OF SUBSTRATE ON MEASUREMENT OF INNER SHELL IONIZATION CROSS SECTIONS

The energy spectra of reflected electrons from the substrates of targets have been calculated by the bipartion model of electron transport,the contributions of the inner shell ionization events produced by the reflected electrons from the substrates in the targets to the x-ray counting in a Si(Li) detector have been estimated.It has been confirmed that,by such correction to the measured data.the experimental results of inner shell ionization cross sections by electron impact with fine precision may be obtained under the conditio of thick substrate.     

Characteristic X-rays induced by electrons and positrons from β-emitting radioisotopes

We have investigated the use of energetic electrons and positrons from low intensity ⁹⁰Sr and ²²Na radioactive sources respectively to produce characteristic radiation and compare the emission efficiencies of each kind of particle. A new proposed experimental set-up for radioisotope-excited X-ray fluorescence analysis is of the transparent source type and provides at least a ten-time increase in the intensity of characteristic X-rays emitted by the sample as compared to a standard radioactive source arrangement. Theoretically derived expressions for β-particle penetration, transport and emission processes in a sample are presented, and experimental results of absolute characteristic X-ray yields induced by electrons and positrons from 31 pure chemical elements, from titanium to lead, have been included. The advantages of energetic β-particles in comparison with other radiation sources are also discussed, in fact, a remarkable feature observed being that radiation yield changes by less than an order of magnitude across the whole range of the target atomic numbers herein considered.     

带电粒子输运的两群模型:回顾与总结

本工作系统地总结了到目前为止带电粒子输运的两群模型已经取得的进展，包括该模型的基本思想和概念，主要的数学公式和数值方法以及这个模型的各种应用。叙述了这个模型如何从描述中能电子输运中产生，逐步扩展到研究轻离子输运，任意质量的离子输运，原子级联碰撞和包括研究溅射在内的粒子表面发射而成为广泛有效的精确的带电粒子输运理论的发展过程。总计15个图给出了两群模型与已有的实验测量结果和其他理论资料所作的广泛比较，表明带电粒子输运的两群模型是一个功能很强并富有潜力的统一带电粒子输运理论，一些尚未解决的带电粒子输运问题也将在本工作末提到。