A digitally enhanced 1.8-V 15-bit 40-MSample/s CMOS pipelined ADC

A 1.8-V 15-bit 40-MSample/s CMOS pipelined analog-to-digital converter with 90-dB spurious-free dynamic range (SFDR) and 72-dB peak signal-to-noise ratio (SNR) over the full Nyquist band is presented. Its differential and integral nonlinearities are 0.25 LSB and 1.5 LSB, respectively, and its power consumption is 400 mW. This performance is enabled by digital background calibration of internal digital-to-analog converter (DAC) noise and interstage gain errors. The calibration achieves improvements of better than 12 dB in signal-to-noise plus distortion ratio and 20 dB in SFDR relative to the case where calibration is disabled. Other enabling features of the prototype integrated circuit (IC) include a low-latency, segmented, dynamic element-matching DAC, distributed passive input signal sampling, and asymmetric clocking to maximize the time available for the first-stage residue amplifier to settle. The IC is realized in a 0.18-/spl mu/m mixed-signal CMOS process and has a die size of 4mm/spl times/5 mm.     

A noise-shaping coder topology for 15+ bit converters

A topology for high-precision noise-shaping converters that can be integrated on a standard digital IC process is presented. This topology uses a multibit noise-shaping coder and a novel form of dynamic element matching to achieve high accuracy and long-term stability without requiring precision matching of components. A fourth-order noise-shaping D/A (digital-to-analog) conversion system using a 3-b quantizer and a dynamic element-matching internal D/A converter, fabricated in a standard double-metal 3-μm CMOS process, achieved 16-bit dynamic range and a harmonic distortion below -90 dB. This multibit noise-shaping D/A conversion system achieved performance comparable to that of a 1-bit noise-shaping D/A conversion system that operated at nearly four times its clock rate     

Low-Cost 14-Bit Current-Steering DAC With a Randomized Thermometer-Coding Method

A dynamic element-matching (DEM) method, i.e., randomized thermometer coding (RTC), for low-cost current-steering digital-to-analog converter (DAC) design is proposed. The proposed RTC method exhibits randomized starting-element selection, consecutive-element selection, and low-element switching activity. It can be used to significantly suppress the harmonic distortion caused by a large mismatch of small-area transistors, and, thus, very low cost DACs can be realized. With the proposed RTC, a 14-bit current-steering DAC is implemented in a 1P6M 0.18- $muhbox{m}$ 1.8-V CMOS process. The measured spurious-free dynamic range (SFDR) exceeds 80 dB. The measurement results showed that RTC improves the SFDR by more than 16 dB. The DAC has an active area of less than 0.28 $hbox{mm}^{2}$. The proposed DAC achieves a smaller active area than state-of-the-art 12- to 14-bit DACs.      

An untrimmed D/A converter with 14-bit resolution

Describes a monolithic 14-bit DAC which uses a new compensation technique for the DAC linearity, the `self-compensation technique', originated through a new concept. Since this technique automatically compensates for linearity error in the DAC by referring to a ramp function with about 17-bit linearity, a high precision DAC can be produced in monolithic form without the trimming of analog components. An experimental 14-bit DAC chip has been fabricated using analog compatible IIL technology and two-level metalization. A linearity error of less that /spl plusmn/1/2 LSB and a settling time of 1-2 /spl mu/s has been achieved.     

A 14-b, 100-MS/s CMOS DAC designed for spectral performance

A 14-bit, 100-MS/s CMOS digital-to-analog converter (DAC) designed for spectral performance corresponding more closely to the 14-bit specification than current implementations is presented. This DAC utilizes a nonlinearity-reducing output stage to achieve low output harmonic distortion. The output stage implements a return-to-zero (RZ) action, which tracks the DAC once it has settled and then returns to zero. This RZ circuit is designed so that the resulting RZ waveform exhibits high dynamic linearity. It also avoids the use of a hold capacitor and output buffer as in conventional track/hold circuits. At 60 MS/s, DAC spurious-free dynamic range is 80 dB for 5.1-MHz input signals and is down only to 75 dB for 25.5-MHz input signals. The chip is implemented in a 0.8-μm CMOS process, occupies 3.69×3.91 mm ² of die area, and consumes 750 mW at 5-V power supply and 100-MS/s clock speed     

A 1.6-GS/s 12-bit return-to-zero GaAs RF DAC for multiple Nyquist operation

A 12-bit 1.6-GS/s digital-to-analog converter (DAC) implemented with 4-/spl mu/m/sup 2/ GaAs HBT process is presented. Return-to-zero (RZ) current switches are added to current steering DAC for high-frequency wideband applications to achieve 800-MHz bandwidth at first and second Nyquist band without the need for a reverse sinc equalization filter in wideband transmitter application. The RZ circuit also improves spectral purity by screening the switching noise from the analog output during data transition. Measured performance shows two-tone third-order harmonic distortion of -70 dB at 1.5-GHz output frequency, clocked at 1.6 GHz. Reliable interface with CMOS logic IC is guaranteed with the inclusion of a four-clock-deep FIFO circuit. The DAC dissipates 1.2 W at -5 V when sampled with 1.6-GHz clock, with typical output voltage swing of 1.2 V/sub PP/.     

A 3-V, 2%-mW multibit current-mode ΣΔ DAC with 100 dBdynamic range

The area ratio of analog to digital for mixed-mode chip has been inversely proportional to the process design rule for a given dynamic range objective, in contradiction to the LSI trend. This paper presents a design approach to realize a high degree of size reduction with process design rules for analog circuitry and a signal processing architecture for digital circuitry. A five-level current-mode ΣΔ digital-to-analog converter (DAC) system reveals full scale total harmonic: distortion plus noise (THD+N) of -90 dB and dynamic-range of 100 dB at 3 V (low power of 22 mW). Analog-area down-scaling can be accomplished by this architecture to be 1.09 mm², using 0.6-μm double-poly double-metal (DPDM) CMOS. For the digital filter, a pipeline instruction sequence with multiplierless architecture also gives small area of 1.98 mm²     

A Continuous-Time ADC/DSP/DAC System With No Clock and With Activity-Dependent Power Dissipation

A continuous-time system that converts its analog input to a continuous-time digital representation without sampling, then processes the information digitally without the aid of a clock, is presented. Without sampling there is no aliasing, which reduces the in-band distortion power by not aliasing into band out-of-band distortion components. The 8-bit system, fabricated in a 90 nm CMOS process, utilizes continuous delay elements as part of a programmable transversal FIR filter. The input is encoded by a delta modulator without a clock into a series of non-uniformly spaced tokens, which are processed by the digital continuous-time filter and converted to an analog output using a custom DAC that guarantees there are no glitches in the output waveform. All activity is signal driven, automatically affording dynamic power scaling that tracks input activity.      

A 14-bit current-mode ΣΔ DAC based upon rotated dataweighted averaging

A new dynamic element matching (DEM) algorithm, referred to as rotated data weighted averaging (RDWA), is implemented in a third-order ΣΔ digital-to-analog converter (DAC) with 64× oversampling and a conversion bandwidth of 25 kHz. The systematic and random errors are considered in the design of the 14-bit converter. The ΣΔ DAC is fabricated in a 2-μm CMOS process and includes the on-chip reconstruction filter. The prototype was designed to test the performance of the DAC without DEM, with data weighted averaging (DWA), and with RDWA. The results show that the new RDWA algorithm is capable of achieving first-order noise shaping while eliminating the signal-dependent harmonic distortion present in DWA     

An ultra-high-speed direct digital synthesizer with nonlinear DAC and wave correction ROM

This paper presents a novel direct digital synthesizer (DDS) architecture combining Nonlinear DAC with a small-sized wave-correction-ROM (WCR), which achieves both high operating speed and accuracy. A 6?GHz 8-bit DDS chip based on the proposed architecture is designed and fabricated in a 60?GHz GaAs HBT technology. The major blocks of the DDS MMIC based on ECL logic includes an 8-bit pipelined accumulator, an 8?×?8?×?3-bit WCR, two combined digital-to-analog converters (DACs) and an analog Gilbert Cell for sine-wave generation, a 3-to-7 thermometer coder, digital logic gates and registers. A method of using a series of RC networks to terminate the clock tree together with a pot-layout simulation scheme is developed to maintain the clock tree signal integrity. The DDS chip is tested using an on-wafer measurement approach. The measured spurious free dynamic range (SFDR) is 33.96 dBc with a 2.367?GHz output using a 6?GHz maximum clock frequency. The measurement also shows an average SFDR of 37.5 dBc and the worst case SFDR of 31.4 dBc (FCW?=?112) within the entire Nyquist band under a 5?GHz clock. The chip occupies 2.4?×?2?mm² of area and consumes a 3.27?W of power from a single ?4.6?V power supply.     

A 16-bit cascaded sigma-delta pipeline A/D converter

A low-noise cascaded multi-bit sigma-delta pipeline analog-to-digital converter （ADC） with a low over-sampling rate is presented. The architecture is composed of a 2-order 5-bit sigma-delta modulator and a cascaded 4-stage 12-bit pipelined ADC, and operates at a low 8X oversampling rate. The static and dynamic performances of the whole ADC can be improved by using dynamic element matching technique. The ADC operates at a 4 MHz clock rate and dissipates 300 mW at a 5 V/3 V analog/digital power supply. It is developed in a 0.35μm CMOS process and achieves an SNR of 82 dB.     

A 12-bit 20-Msample/s pipelined analog-to-digital converter with nested digital background calibration

A 12-bit 20-Msample/s pipelined analog-to-digital converter (ADC) is calibrated in the background using an algorithmic ADC, which is itself calibrated in the foreground. The overall calibration architecture is nested. The calibration overcomes the circuit nonidealities caused by capacitor mismatch and finite operational amplifier (opamp) gain both in the pipelined ADC and the algorithmic ADC. With a 58-kHz sinusoidal input, test results show that the pipelined ADC achieves a peak signal-to-noise-and-distortion ratio (SNDR) of 70.8 dB, a peak spurious-free dynamic range (SFDR) of 93.3 dB, a total harmonic distortion (THD) of -92.9 dB, and a peak integral nonlinearity (INL) of 0.47 least significant bit (LSB). The total power dissipation is 254 mW from 3.3 V. The active area is 7.5 mm/sup 2/ in 0.35-/spl mu/m CMOS.     

A 2-GS/s 3-bit /spl Delta//spl Sigma/-modulated DAC with tunable bandpass mismatch shaping

Direct digital synthesis of signals in the hundreds of megahertz can lead to simpler, smaller transceivers, free of images and LO feedthrough that plague systems requiring analog upconversion. We present a 3-bit, 2 GS/s, /spl Delta//spl Sigma/-modulated DAC in InP HBT technology. The DAC is linearized using bandpass mismatch shaping. The mismatch shaper uses seven tunable 1.5-bit discrete-time bandpass /spl Delta//spl Sigma/ modulators to dynamically route the digital signals to the DACs. These /spl Delta//spl Sigma/ modulators operate in the analog domain to decrease system complexity and power consumption. The mismatch-shaped DAC can generate narrowband signals between 250-750 MHz with >68 dB SNR in a 1-MHz bw, >74-dB SFDR, and <-80-dBc intermodulation distortion with an 8.1-W power consumption.     

An oversampled multibit CMOS D/A converter for digital audio with115-dB dynamic range

The analog part of a current-mode CMOS 5-b bidirectional digital/analog (D/A) converter for digital audio with 115-dB dynamic range and -90-dB distortion at 128-times oversampling is presented. The application of a multibit noise shaping approach combined with a sign-magnitude decoding in an oversampled D/A converter not only increases the dynamic range of the converter but also reduces the intermodulation sensitivity. A dynamic self-calibration technique is used to obtain the required relative accuracy and absolute linearity of the current sources. No laser or external trimming techniques are required     

基于微环谐振器的光学数模转换器

提出并实现了一种基于微环谐振器的2位光学数模转换器,该器件由2个微环谐振器和2个1×2光学分束器构成,该结构可以将一个2位电学数字信号转换成一个光学模拟信号。在SOI晶圆上制备出该光学数模转换器,采用热光效应调制微环谐振器。在输出端口得到光学模拟信号。通过静态光谱测试,确定微环谐振器的驱动电压和工作波长,最终展示了50ksamples/s的动态数模转换结果。     

A 2nd-order sigma-delta mismatch-shaping current-steering DAC for zigbee transmitters

A low-power mismatch-tolerant current-steering digital-to-analog converter (DAC) was presented in this paper for ZigBee transmitter applications. Mismatches among the current units induce harmonic distortions and random analog noise which severely limit the linearity and resolution of the converter. 1^st-order and 2^nd-order sigma-delta dynamic element matching (DEM) schemes and the corresponding elements selection patterns were introduced in this paper, and the later was then applied to the DAC to spectrally shape the mismatches of the DAC without adding complex digital hardware. Measurement results showed that the proposed 2^nd-order DEM improved the resolution of the DAC from 4.5-bit to 11.4-bit, DNL from a maximum of 0.6 to 0.04LSB and INL from 1.1 to 0.07LSB. The SFDR, SNR and ENOB were respectively 70 dB, 58 dB and 7.3-bit for a 50 kHz@-6dBFS input signal.     

A 16-bit cascaded sigma-delta pipeline A/D converter

A low-noise cascaded multi-bit sigma-delta pipeline analog-to-digital converter (ADC) with a low oversampling rate is presented. The architecture is composed of a 2-order 5-bit sigma-delta modulator and a cascaded 4-stage 12-bit pipelined ADC, and operates at a low 8X oversampling rate, The static and dynamic performances of the whole ADC can be improved by using dynamic element matching technique. The ADC operates at a 4 MHz clock rate and dissipates 300 mW at a 5 V/3 V analog/digital power supply. It is developed in a 0.35 μm CMOS process and achieves an SNR of 82 dB.     

High performance 14-bit pipelined redundant signed digit ADC

A novel architecture of a pipelined redundant-signed-digit analog to digital converter(RSD-ADC) is presented featuring a high signal to noise ratio(SNR), spurious free dynamic range(SFDR) and signal to noise plus distortion(SNDR) with efficient background correction logic. The proposed ADC architecture shows high accuracy with a high speed circuit and efficient utilization of the hardware. This paper demonstrates the functionality of the digital correction logic of 14-bit pipelined ADC at each 1.5 bit/stage. This prototype of ADC architecture accounts for capacitor mismatch, comparator offset and finite Op-Amp gain error in the MDAC(residue amplification circuit) stages. With the proposed architecture of ADC, SNDR obtained is 85.89 dB, SNR is 85.9 dB and SFDR obtained is 102.8 dB at the sample rate of 100 MHz. This novel architecture of digital correction logic is transparent to the overall system, which is demonstrated by using 14-bit pipelined ADC. After a latency of 14 clocks, digital output will be available at every clock pulse. To describe the circuit behavior of the ADC, VHDL and MATLAB programs are used. The proposed architecture is also capable of reducing the digital hardware. Silicon area is also the complexity of the design.     

A 1.2-V 19.2-mW 10-bit 30-MS/s pipelined ADC in 0.13-icm CMOS

A 10-bit 30-MS/s pipelined analog-to-digital converter (ADC) is presented.For the sake of lower power and area,the pipelined stages are scaled in current and area,and op amps are shared between the successive stages.The ADC is realized in the 0.13-tt,m 1-poly 8-copper mixed signal CMOS process operating at 1.2-V supply voltage.Design approaches are discussed to overcome the challenges associated with this choice of process and supply voltage,such as limited dynamic range,poor analog characteristic devices,the limited linearity of analog switches and the embedded sub-1-V bandgap voltage reference.Measured results show that the ADC achieves 55.1-dB signal-to-noise and distortion ratio,67.5-dB spurious free dynamic range and 19.2-mW power under conditions of 30 MSPS and 10.7-MHz input signal.The FoM is 0.33 pJ/step.The peak integral and differential nonlinearities are 1.13 LSB and 0.77 LSB,respectively.The ADC core area is 0.94 mm2.     

A 12-bit 40 MS/s pipelined ADC with over 80 dB SFDR

This paper describes a 12-bit 40 MS/s calibration-free pipelined analog-to-digital converter (ADC), which is optimized for high spurious flee dynamic range (SFDR) performance and low power dissipation. With a 4.9 MHz sine wave input, the prototype ADC implemented in a 0.18-μm 1P6M CMOS process shows measured differential nonlinearity and integral nonlinearity within 0.78 and 1.32 least significant bits at the 12-bit level without any trimming or calibration. The ADC, with a total die area of 3. 1 × 2.1 mm~2, demonstrates a maximum signal-to-noise distortion ratio (SNDR) and SFDR of 66.32 and 83.38 dB, respectively, at a 4.9 MHz analog input and a power consumption of 102 mW from a 1.8 V supply.