STRUCTURAL PROPERTIES INVESTIGATION ON MICROCRYSTALLINE SILICON FILMS DEPOSITED WITH VHF-PECVD TECHNIQUE

Raman scattering spectroscopy and scanning electron microscopy (SEM) techniques were used to determine the structural properties of two typical series of microcrystalline silicon (μc-Si:H) films deposited at different VHF plasma power and different working gas pressure by very high frequency plasma enhanced chemical vapor deposition (VHF-PECVD) technique. Raman spectra measurements show that both crystalline volume fraction Xc and average grain size d of μc-Si: H films are strongly affected by the two deposition conditions and are more sensitive to working gas pressure than VHF plasma power. SEM characterizations have further confirmed that VHF plasma power and working gas pressure could clearly enhance the surface roughness of/xc-Si : H films ascribing to polymerization reactions, which is also more sensitive to working gas pressure than VHF plasma power.     

EFFECT OF ANNEALING TREATMENT ON THE STRUCTURE OF CdS FILMS

The effect of annealing treatment on the structure of CdS films was investigated. The cadmium sulfide thin films were prepared by chemical bath deposition, and were annealed at nitrogen atmosphere at different temperatures. The films were characterized by SEM and XPS (X-ray photoelectron spectroscopy). X-ray photoelectron spectroscopy was used to examine the chemical states on the CdS films surface. It was found that thermal annealing could produce large grains of CdS thin films, remove the air contamination and reduce the oxygen content on the CdS films surface. Therefore, the CdS films changed more uniform and smoother surface after thermal annealing.     

PREPARATION AND CHARACTERIZATION OF POLY-CRYSTALLINE SILICON THIN FILM

Poly-crystalline silicon thin film has big potential of reducing the cost of solar cells. In this paper the preparation of thin film is introduced, and then the morphology of poly-crystalline thin film, is discussed. On the film we developed poly-crystalline silicon thin film solar cells with efficiency up to 6.05% without anti-reflection coating.     

铝表面化学气相沉积SiOx膜层的显微结构和性能

采用低温常压化学气相沉积(CVD)方法在铝基底上制备了硅氧化物陶瓷膜层.使用SEM、XPS、AFM、XRD、HRTEM和UV-VIS等技术分析了膜层的形貌、成分和组织结构特征,测试了膜层的孔隙率、光学和显微力学性能.结果表明:硅氧化物SiOx陶瓷膜层在铝基表面以气相反应沉积硅氧化物颗粒-颗粒嵌镶堆垛-融合长大的方式生成,大部分膜层为非晶态区域,其中包含少量局部有序区域,SiOx中的硅氧原子比为1:1.60～1:1.75,膜层疏松多孔,具有很高的紫外-可见光吸收率,膜层与基底具有很好的结合性.     

工作压强对PECVD法制备DLC薄膜微观结构与力学性能的影响

采用脉冲等离子体增强化学气相沉积方法(Pulse-PECVD)于316L不锈钢基体上制备类金刚石(DLC)薄膜,研究不同工作气压对DLC薄膜的沉积速率、表面形貌、微观结构、纳米硬度、弹性模量以及结合强度的影响规律。结果表明:随沉积气压增大,薄膜的沉积速率随之增大,压强在3 Pa时沉积速率可高达1. 4μm/h;不同气压下沉积的DLC薄膜均体现出平整光滑的表面形貌和高于不锈钢基体3倍以上的纳米硬度;沉积气压为2 Pa时,DLC薄膜在拉曼光谱中具有最小的ID/IG值,对应最高的纳米硬度16. 1 GPa和弹性模量152. 7 GPa,以及最低的粗糙度和摩擦因数0. 206。      

HFCVD生长金刚石薄膜中气体状态参数空间场模拟计算

本文对ＨＦＣＶＤ过程中的气体状态参数空间场进行了模拟计算，结果表明，气体的温度，体密度，速度和质量流密度场是空间位置的函数，在合适的位置，可获得均匀的温度和质量流密度，这些结果可为制备大面积均匀金刚石薄膜时工艺参数选择提供理论依据。     

Preparation,characterization and electrochemical properties of boron-doped diamond films on Nb substrates

A series of boron-doped polycrystalline diamond films were prepared by hot filament (HF) chemical vapor deposition on Nb substrates. The effects of B/C ratio of reaction gas on film morphology, growth rate, chemical bonding states, phase composition and electrochemical properties of each deposited sample were studied by scanning electron microscopy, Raman spectra, X-ray diffraction, microhardness indentation, and electrochemical analysis. Results show that the average grain size of diamond and the growth rate decrease with increasing the B/C ratio. The diamond films exhibit excellent adhesion under Vickers microhardness testing (9.8 N load). The sample with 2% B/C ratio has a wider potential window and a lower background current as well as a faster redox reaction rate in H₂SO₄solution and KFe(CN)₆ redox system compared with other doping level electrodes.