Magnetic and structural properties of Co ion-implanted GaN

A GaN epilayer was grown on Al/sub 2/O/sub 3/ substrate by metal-organic chemical vapor deposition, and Co/sup -/ ions with a dose of 3/spl times/10/sup 16/ cm/sup -2/ were implanted into GaN at 350/spl deg/C. The implanted samples were postannealed at 700/spl deg/C-900/spl deg/C to recrystallize the samples and to remove implantation damage. We have investigated the magnetic and structural properties of Co ion-implanted GaN by using X-ray diffraction (XRD), superconducting quantum interference device (SQUID) magnetometer, and X-ray photoelectron spectroscopy (XPS). XRD results did not show any peaks associated with the second phase formation, and only the diffraction from the GaN layer and substrate structure were observed. The temperature dependence of magnetization taken in zero-field-cooling and field-cooling conditions showed the features of superparamagnetic system in films annealed at 700/spl deg/C-900/spl deg/C. The magnetization curves at 5 K for samples annealed at 700/spl deg/C-900/spl deg/C exhibits ferromagnetic hysteresis loops, and the highest residual magnetization (M/sub R/) and coercivity (H/sub c/) of M/sub R/=1.5/spl times/10/sup -4/ emu/g and H/sub c/=107 Oe were found in the 800/spl deg/C annealed sample. XPS measurement showed the metallic Co 2p core levels and the metallic valence band spectra for as-implanted and 700/spl deg/C-900/spl deg/C annealed samples. From these, it could be explained that the magnetic property of our films originated from Co and CoGa magnetic clusters.     

Ultrahigh-sensitive tin-oxide microsensors for H/sub 2/S detection

Ultrahigh-sensitivity SnO/sub 2/-CuO sensors were fabricated on Si(100) substrates for detection of low concentrations of hydrogen sulfide. The sensing material was spin coated over platinum electrodes with a thickness of 300 nm applying a sol-gel process. The SnO/sub 2/-based sensors doped with copper oxide were prepared by adding various amounts of Cu(NO/sub 3/)/sub 2/.3H/sub 2/O to a sol suspension. Conductivity measurements of the sensors annealed at different temperatures have been carried out in dry air and in the presence of 100 ppb to 10-ppm H/sub 2/S. The nanocrystalline SnO/sub 2/-CuO thin films showed excellent sensing characteristics upon exposure to low concentrations of H/sub 2/S below 1 ppm. The 5% CuO-doped sensor having an average grain size of 20 nm exhibits a high sensitivity of 2.15/spl times/10/sup 6/ (R/sub a//R/sub g/) for 10-ppm H/sub 2/S at a temperature of 85/spl deg/C. By raising the operating temperature to 170/spl deg/C, a high sensitivity of /spl sim/10/sup 5/ is measured and response and recovery times drop to less than 2 min and 15 s, respectively. Selectivity of the sensing material was studied toward various concentrations of CO, CH/sub 4/, H/sub 2/, and ethanol. SEM, XRD, and TEM analyses were used to investigate surface morphology and crystallinity of SnO/sub 2/ films.     

CO-sensing properties of In/sub 2/O/sub 3/-doped SnO/sub 2/ thick-film sensors: effect of doping concentration and grain size

In/sub 2/O/sub 3/-doped SnO/sub 2/ nanoparticles were prepared using sol-gel technique from 0.1-M solutions of both stannic chloride (SnCl/sub 4/ 5H/sub 2/O) and indium nitrate. The doping concentration was varied from 7.718/spl times/10/sup -5/ to 3.859/spl times/10/sup -4/ moles. The average particle size, as measured from XRD, SEM, and TEM analyses, varies from 34-130 nm as a result of powder calcination at different temperatures ranging from 300/spl deg/C-900/spl deg/C. Thick-film samples with a thickness of /spl sim/15 /spl mu/m, were tested for low concentration (15-1000 ppm) of CO in air ambient. The optimal temperature for CO sensing is found to be 220/spl deg/C-240/spl deg/C. A blue shift in the sensing temperature and increase in sensitivity factor (S/sub f/) is observed with increasing doping concentration of indium oxide. Maximum sensitivity factor of /spl sim/5 is found for the highest doping concentration (3.859/spl times/10/sup -4/ moles) at 1000 ppm of CO concentration. The morphological and elemental studies of the film are carried out using SEM, TEM, XRD, and EDAX techniques. The results are discussed based on elemental analyses and available theories.     

Fabrication and characterization of nano-sized SrTiO/sub 3/-based oxygen sensor for near room-temperature operation

Nano-sized SrTiO/sub 3/-based oxygen sensors were fabricated from synthesized SrTiO/sub 3/ and commercial SrTiO/sub 3/ using the high-energy ball milling and the thick-film screen-printing techniques. The particle sizes, microstructural properties, oxygen-sensing properties, and humidity effects of the synthesized nano-sized SrTiO/sub 3/-based oxygen sensors were characterized using X-ray diffraction (XRD), transmission electron microscope, scanning electron microscope (SEM), and gas sensing measurements. Experimental results showed that the particle size of the powders was milled down to be around 27 nm. The effect of different annealing temperatures (400/spl deg/C, 500/spl deg/C, 600/spl deg/C, 700/spl deg/C, and 800/spl deg/C) on the gas sensing properties of the synthesized SrTiO/sub 3/ sensor from nitrogen to 20% oxygen was characterized. The commercial SrTiO/sub 3/ devices annealed at 400/spl deg/C, both with 0-h and 120-h milling time, were used for comparison. The optimal relative resistance (R/sub nitrogen//R/sub 20%oxygen/) value of 6.35 is obtained for the synthesized SrTiO/sub 3/ sample annealed at 400/spl deg/C and operating at 40/spl deg/C. This operating temperature is much lower than that of conventional metal oxide semiconducting oxygen gas sensors (300/spl deg/C-500/spl deg/C) and SrTiO/sub 3/ oxygen gas sensors (>700/spl deg/C). The response and recovery times are 1.6 and 5 min, respectively. The detected range is 1-20% oxygen. The impedance of the synthesized SrTiO/sub 3/ sensor with annealing at 400/spl deg/C and operating at 40/spl deg/C (from 1 mHz to 10 MHz) in 20% oxygen ambient was found to be independent of the relative humidity (dry, 20% RH, 80% RH, near 100% RH).     

Structure, properties, and thermal stability of nanocrystallite Fe-Ti-N soft magnetic films

We deposited Fe-Ti-N magnetic films with a high sputtering power of 7 W/cm/sup 2/. When the composition of the films was in the range of Fe-Ti(3.9 at.%)-N(8.8 at.%) to Fe-Ti(3.3 at.%)-N(13.5 at.%), the films were composed of /spl alpha/' and Ti/sub 2/N precipitates. With the addition of nitrogen, 4/spl pi/M/sub s/ became higher than that of pure iron, reaching a maximum of 23.8 kG. At the same time, H/sub c/ was reduced to a minimum of 1.12 Oe. The best films can meet the needs of the recording head in dual-element giant magnetoresistive/inductive heads, yielding high storage density (10 Gb/in/sup 2/). The incorporation of N in /spl alpha/-Fe brought about the /spl alpha/' phase with its higher saturation magnetization. Ti additions inhibited the equilibrium decomposition /spl alpha/'/spl rarr//spl alpha/+/spl gamma/'. Because H/sub C//sup D//spl prop/D/sup 6/, where D is average grain diameter, grain size control is very important. The nitrogen induces severe distortion of the /spl alpha/' lattice, which can cause the grains to break into pieces and reduce the grain size. High sputtering power also led to the formation of fine grains, with diameter in the order of 14 nm. Probably Ti/sub 2/N is preferentially precipitated on the grain boundary, pinning the grain boundary and stabilizing the grain size during high-temperature heat treatment. The temperature limit for stability of the structure and its associated low coercivity was not less than 520/spl deg/C.     

A monolithic CMOS microhotplate-based gas sensor system

A monolithic CMOS microhotplate-based conductance-type gas sensor system is described. A bulk micromachining technique is used to create suspended microhotplate structures that serve as sensing film platforms. The thermal properties of the microhotplates include a 1-ms thermal time constant and a 10/spl deg/C/mW thermal efficiency. The polysilicon used for the microhotplate heater exhibits a temperature coefficient of resistance of 1.067/spl times/10/sup -3///spl deg/C. Tin(IV) oxide and titanium(IV) oxide (SnO/sub 2/,TiO/sub 2/) sensing films are grown over postpatterned gold sensing electrodes on the microhotplate using low-pressure chemical vapor deposition (LPCVD). An array of microhotplate gas sensors with different sensing film properties is fabricated by using a different temperature for each microhotplate during the LPCVD film growth process. Interface circuits are designed and implemented monolithically with the array of microhotplate gas sensors. Bipolar transistors are found to be a good choice for the heater drivers, and MOSFET switches are suitable for addressing the sensing films. An on-chip operational amplifier improves the signal-to-noise ratio and produces a robust output signal. Isothermal responses demonstrate the ability of the sensors to detect different gas molecules over a wide range of concentrations including detection below 100 nanomoles/mole.     

The comparative effect of two different annealing temperatures and times on the sensitivity and long-term stability of WO/sub 3/ thin films for detecting NO/sub 2/

We have deposited 150-nm-thick WO/sub 3/ films on Si/sub 3/N/sub 4//Si substrates provided with platinum interdigital electrodes and annealed in static air at 300/spl deg/C and 500/spl deg/C temperatures for 24 h and 200 h. The morphology, crystalline phase, and chemical composition of the films have been characterized using AFM, grazing incidence XRD and high resolution XPS techniques. The sensor resistance response curve has been obtained in the 0.2 -4 ppm NO/sub 2/ gas concentration range in humid air (50% relative humidity), varying the operating temperature between 25 and 250/spl deg/C. By plotting both sensor resistance and gas concentration logarithmically, the response is linear over the investigated dynamic range. Sensor sensitivities, here defined as the ratio of sensor resistance in gas to that in air (i.e., S=R/sub Gas//R/sub Air/), have been compared at a given NO/sub 2/ gas concentration (0.2 ppm). The long-term stability properties have been evaluated by recording film sensitivity for 1 yr under standardized test conditions. Increasing the annealing temperature from 300 to 500/spl deg/C causes the sensitivities to decrease. The 300/24h film is shown to be the most sensitive at S=233, but with poor long-term stability properties. The 300/200h film with S=32 is stable over the examined period. The 500/24 and the 500/200 films are shown to be less sensitive with S=16 and S=14, respectively. The longer the annealing time and the higher the temperature, the poorer the sensitivity, but with positive effects upon the long-term stability of the electrical response. The influence of the annealing conditions on sensitivity and long-term stability has been correlated with the concentration of surface defects, like reduced WO/sub 3/ phase (i.e., W/sup 4+/), which resulted in a strong effect on the sensors' response.     

Thickness-dependent leakage current of (polyvinylidene fluoride/lead titanate) pyroelectric detectors

The novel pyroelectric IR detectors have been fabricated using the Polyvinylidene Fluoride (PVDF)/Lead Titanate (PT) pyroelectric bilayer thin films, which were deposited onto Pt(111)/SiO/sub 2//Si(100) substrates by a sol-gel process. The ceramic/polymer structure was constructed of the randomly oriented polycrystalline PT film (/spl sim/1 /spl mu/m) heated at 700/spl deg/C for 1 h and the /spl beta/-phase PVDF film crystallized at 65/spl deg/C for 2 h. The effects of PVDF thin film thickness (100 /spl sim/ 580 nm) on the pyroelectric response of IR detectors were studied. The results show that the depositions of PVDF thin films onto the PT films will cause the leakage current (J) of the detectors decrease from 6.37/spl times/10/sup -7/ A/cm/sup 2/ to 3.86/spl times/10/sup -7/ A/cm/sup 2/. The specific detectivity (D*) measured at 100 Hz decreased from 2.72/spl times/10/sup 7/ cm/spl middot/Hz/sup 1/2//W for detector without PVDF to 1.71/spl times/10/sup 7/ cm/spl middot/Hz/sup 1/2//W for detector with PVDF thickness of 580 nm. By optimizing the ratio of the specific detectivity (D*) to leakage current, D*/J, the detector with PVDF thickness of 295 nm exhibits the best performance.     

Preparation of ferroelectric Ba(Ti/sub 0.85/Sn/sub 0.15/)O/sub 3/ thin films by metal-organic decomposition

Ferroelectric Ba(Ti/sub 0.85/Sn/sub 0.15/)O/sub 3/ (BTS/sub 15/) thin film is newly prepared on the Pt/Ti/SiO/sub 2//Si substrate by metal-organic decomposition. The firing condition is determined by thermogravimetric and differential thermal analysis. The BTS/sub 15/ thin film with a flat surface and uniform thickness is obtained by spin coating in N/sub 2/ atmosphere that avoids moisture. The BTS/sub 15/ film has a perovskite phase and a preferential [110] texture. It is also found that the crystalline structure is cubic at 24/spl deg/C with a lattice constant of 4.01 /spl Aring/, and a grain size of about 30 nm was estimated by Scherrer equation and SEM image. From P-E hysteresis loop at 20/spl deg/C, the polarization at E=0 and the electric field at P=0 are found to be 1.07 /spl mu/C/cm/sup 2/ and 24.0 kV/cm, respectively. It is observed that the dielectric constant decreases monotonously from about 830 to 630 with increasing temperature ranging from 20/spl deg/C to 50/spl deg/C. Finally, it is found that the BTS/sub 15/ thin film shows a sufficient ferroelectricity and is an attractive material for functional ferroelectric devices, such as thermal-type infrared sensors.     

Recent developments in high curie temperature perovskite single crystals

The temperature behavior of various relaxor-PT piezoelectric single crystals was investigated. Owing to a strongly-curved morphotropic phase boundary, the usage temperature of these perovskite single crystals is limited by T/sub R-T/- the rhombohedral to tetragonal phase transformation temperature - which occurs at the significantly lower temperatures than the Curie temperature T/sub c/. Attempts to modify the temperature usage range of Pb(Zn/sub 1/3/Nb/sub 2/3/)O/sub 3/-PbTiO/sub 3/ (PZNT) and Pb(Mg/sub 1/3/Nb/sub 2/3/)O/sub 3/-PbTiO/sub 3/ (PMNT) rhombohedral crystals (T/sub c/ /spl sim/ 150-170/spl deg/C, T/sub R-T/ /spl sim/ 60-120/spl deg/C) using minor dopant modifications were limited, with little success. Of significant potential are crystals near the morphotropic phase boundary in the Pb(Yb/sub 1/2/Nb/sub 1/2/)O/sub 3/-PbTiO/sub 3/ (PYNT) system, with a T/sub c/ > 330/spl deg/C, even though T/sub R-T/ was found to be only half the value at /spl sim/160/spl deg/C. Single crystals in the novel BiScO/sub 3/-PbTiO/sub 3/ system offer significantly higher T/sub c/s > 400/spl deg/C, while exhibiting electromechanical coupling coefficients k/sub 33/ > 90% being nearly constant till the T/sub R-T/ temperature around 350/spl deg/C, which greatly increases the temperature range for transducer applications.     

Optical fiber gas sensors based on hydrophobic alumina thin films formed by the electrostatic self-assembly monolayer process

Optical fiber gas sensors have been fabricated by deposition of Al/sub 2/O/sub 3/ and polymer ultra-thin films on the ends of optical fibers using the electrostatic self assembly monolayer process. These sensors are designed to operate at the standard transmission wavelengths with no cross sensitivity to temperature from at least 10 to 70/spl deg/C. Experimental results of the response of these sensors to organic volatile compounds such as acetone, dichloromethane, or ethanol, are presented. In addition, a thermal curing process is proposed for achieving a humidity cross sensitivity of less than 1.4% from 11% to 85% of relative humidity, this cross sensitivity was still negligible after one year of the thermal curing process.     

Shear mode coupling and tilted grain growth of AlN thin films in BAW resonators

Polycrystalline AlN thin films were deposited by RF reactive magnetron sputtering on Pt(111)/Ti electrode films. The substrates were tilted by an angle ranging from 40/spl deg/ to 70/spl deg/ with respect to the target normal. A low deposition temperature and a high sputter gas pressure were found ideal for tilted growth. The resulting grain tilt angle amounts to about half the substrate tilt angle. For coupling evaluation, 5 GHz solidly mounted resonator structures have been realized. The tilted grain AlN films exhibited a permittivity in the 9.5-10.5 range and loss tangent of 0.3%. Two shear modes as well as the longitudinal mode could be clearly identified. The coupling coefficient k/sub eff//sup 2/, of the fundamental thickness shear mode (TSO) was found to be about 0.5%, which is compatible with a c-axis tilt of about 6/spl deg/.     

High-potential magnetic anisotropy of CoPtCr-SiO/sub 2/ perpendicular recording media

The magnetic anisotropy of CoPtCr-SiO/sub 2/ perpendicular recording media, including higher energy terms, was studied as a function of film composition and seed layer materials. All series of CoPtCr films with various Cr content, deposited on Ru seed layers, show maximum values of total anisotropy K/sub u/ at 25-30 at%Pt. The maximum value for CoPt(Cr=0) films reaches /spl sim/15/spl times/10/sup 6/ erg/cm/sup 3/. The addition of SiO/sub 2/ to the CoPtCr films reduces the grain K/sub u/, however the grain K/sub u/ maintains a large value of 8/spl times/10/sup 6/ erg/cm/sup 3/ even when 10at%SiO/sub 2/ is added to (Co/sub 90/Cr/sub 10/)/sub 80/Pt/sub 20/, for instance, which indicates the high-potential thermal stability. Theoretical calculations for media designs of 400 Gbits/in/sup 2/ revealed that the ratio of the high-energy anisotropy term K/sub u2/ to K/sub u1/(K/sub u/=K/sub u1/+K/sub u2/) is required to be 0.2-0.35 to enhance the energy barrier for the remanent state, without a notable change in switching field. The films deposited on Ru seed layers were found to show negligibly small K/sub u2/ values, however, the values of K/sub u1/ and K/sub u2/ vary significantly with the seed layer material used. K/sub u1/ decreases almost linearly as the K/sub u2/ value increases. It is concluded that CoPtCr films have a sufficient potential in the values of K/sub u1/ and K/sub u2/ for high-density perpendicular media.     

Sputtered FeCoN soft magnetic thin films with high resistivity

Fe/sub 70/Co/sub 30/N thin films with thickness from 20 to 1100 /spl Aring/ were prepared by radio- frequency reactive sputtering in an N/sub 2/--Ar mixture. The FeCoN films prepared in a low nitrogen flow rate percentage (<6%) and sputtering pressure (<8 mTorr) have a high B/sub s/ of about 24.0 kG, but a moderate hard-axis coercivity H/sub ch/ of 5-30 Oe. With further increase in N/sub 2/ percentage or sputtering pressure, films become significantly softer, with H/sub ch/ of about 0.1-0.6 Oe, and have a higher resistivity of up to about 160 /spl mu//spl Omega//spl middot/cm. The change in the magnetic properties with nitrogen flow rate percentage and sputtering pressure can be attributed to the formation of an ultrafine grain size nanocrystalline FeCoN thin film as observed by high-resolution transmission electron microscope. The soft properties of FeCoN films with nano-sized crystallites remain stable even after being annealed at 270/spl deg/C.     

Generation-recombination noise in pseudomorphic Modulation-doped Al/sub 0.2/Ga/sub 0.8/As/In/sub 0.1/Ga/sub 0.9/As/GaAs micro-Hall devices

The noise spectrum in micro-Hall devices based on pseudomorphic Al/sub 0.2/Ga/sub 0.8/As/In/sub 0.1/Ga/sub 0.9/As/GaAs modulation-doped heterostructures was measured between 4 Hz and 65 kHz, allowing components due to thermal, 1/f, and generation-recombination to be characterized. Applying deep level noise spectroscopy (DLNS) in the temperature range of 77-300 K to analyze the generation-recombination part of the spectrum, two electron traps contributing to noise density were identified. An emission activation energy of 474 meV was measured for the dominant trap, corresponding to the well-known DX center originating from the AlGaAs barrier. The other deep level, with an emission activation energy of 242 meV, is probably related to defects in the InGaAs layer. The structures under investigation resulted in high-performance micro-Hall devices: a supply-current-related sensitivity up to 725 V/spl middot/A/sup -1//spl middot/T/sup -1/ at 77 K independent of bias current, a signal-to-noise sensitivity of 155 dB/spl middot/T/sup -1/ and a detection limit of 340 pT/spl middot/mm/spl middot/Hz/sup -1/2/ at 77 K were measured.     

Iridium oxide as low temperature NO/sub 2/-sensitive material for work function-based gas sensors

This paper presents the results on work function-based NO/sub 2/-sensing properties of iridium-oxide thin films at 130/spl deg/C. Films of 20-nm and 100-nm thickness were deposited on silicon substrates using dc sputtering followed by annealing in oxygen ambient. Sensitivity of these films to different concentrations of NO/sub 2/, H/sub 2/, CO, Cl/sub 2/, and NH/sub 3/ in synthetic air was measured using a Kelvin probe. It was observed that work function of 20-nm-thick iridium-oxide film changed by /spl sim/100 mV on exposure to 5-ppm NO/sub 2/ (German safety limit). Cross sensitivity to other gases (except NH/sub 3/) and interference of humidity was found to be negligibly small. The film was incorporated as a gate electrode in a hybrid suspended gate field effect transistor (HSGFET) structure to examine its suitability in FET-type sensors. The films were characterized using Rutherford backscattering spectroscopy, X-ray diffraction analysis, and scanning electron microscopy to determine their composition, phase, and surface morphology. The results suggest that iridium-oxide film is a promising material for the realization of a FET-based NO/sub 2/ sensor.     

Influence of silicon dioxide-silicon interface trap charges on the performance of monolithic metal-zinc oxide-silicon nitride-silicon dioxide-silicon convolver

An enhancement in the convolution efficiency is obtained by annihilating the SiO/sub 2/-Si interface trap charges in the metal-ZnO-Si/sub 3/N/sub 4/-SiO/sub 2/-Si convolver structure. The annealing process uses a source of hydrogen created underneath the SiO/sub 2/-Si interface by implanting H/sub 3//sup +/ ion followed by rapid thermal anneal of 5s at 900/spl deg/C. The silicon nitride layer is inducted to protect ZnO films from hydrogen influx during low temperature oxygen anneal.     

Gas-sensing properties of sprayed films of (CdO)/sub x/(ZnO)/sub 1-x/ mixed oxide

A novel NO/sub 2/ sensor based on (CdO)/sub x/(ZnO)/sub 1-x/ mixed-oxide thin films deposited by the spray pyrolysis technique is developed. The sensor response to 3-ppm NO/sub 2/ is studied in the range 50/spl deg/C-350/spl deg/C for three different film compositions. The device is also tested for other harmful gases, such as CO (300 ppm) and CH/sub 4/ (3000 ppm). The sensor response to these reducing gases is different at different temperatures varying from the response typical for the p-type semiconductor to that typical for the n-type semiconductor. Satisfactory response to NO/sub 2/ and dynamic behavior at 230/spl deg/C, as well as low resistivity, are observed for the mixed-oxide film with 30% Cd. The response to interfering gas is poor at working temperature (230/spl deg/C). On the basis of this study, a possible sensing mechanism is proposed.     

Design and fabrication of a novel crystal SiGeC far infrared sensor with wavelength 8-14 micrometer

In this paper, we report the design, fabrication, and performance of a novel crystal SiGeC infrared sensor with wavelength 8-14 /spl mu/m by bulk micromachining technology for portable far infrared ray (FIR) in rehabilitation system application. The working principle of the sensor is based on the change of thermistor's resistance under the irradiation FIR light. The thermistor in the IR detector is made of Si/sub 0.68/Ge/sub 0.31/C/sub 0.01/ thin films for its large activation energy of 0.21 ev and the temperature coefficient (TCR) of -2.74%, respectively. Finite element method package ANSYS has been employed for analyze of the thermal isolation and stress distribution in the IR detector. The dimension of the microbridge fabricated by anisotropic wet etching is 2000 /spl times/ 2000 /spl times/ 25 /spl mu/m/sup 3/. The developed FIR sensor exhibits the thermal conductance of 1.85 /spl times/ 10/sup -1/ WK/sup -1/ and the heat capacity as 7.4 /spl times/ 10/sup -7/ JK/sup -1/ under air ambient at room temperature. The responsivity is 523 VW/sup -1/ in the waveband 8-14 /spl mu/m with nickel absorber under a bias voltage 1.5 V.     

Disposable biosensor based on a hemoglobin colloidal gold-modified screen-printed electrode for determination of hydrogen peroxide

A disposable reagentless hydrogen peroxide biosensor based on the direct electrochemistry of hemoglobin immobilized on a colloidal gold-modified screen-printed carbon electrode (Hb-Au-SPCE) was proposed. The electrochemical behavior of immobilized Hb at a SPCE was studied for the first time. The electrode reaction of immobilized Hb showed a surface-controlled process with an electron transfer rate constant of (0.40 /spl plusmn/ 0.02) s/sup -1/ determined in the scan rate range from 25 to 200 mV s/sup -1/. The Hb-Au-SPCE exhibited an electrocatalytic activity toward the reduction of hydrogen peroxide with a K/sub M//sup app/ value of 1.8 mM, which was allowed to be used as a disposable sensor for determination of hydrogen peroxide with a linear range from 1.0 /spl times/ 10/sup -5/ M to 3.2 /spl times/ 10/sup -4/ M, a detection limit of 5.5 /spl times/ 10/sup -6/ M at 3/spl sigma/, a high sensitivity, fast response, and good selectivity, accuracy, and reproducibility. The disposable reagentless sensor was stable, low cost, and simple to use for detection of hydrogen peroxide in real samples.