Dispersion-insensitive measurement of thickness and group refractive index by low-coherence interferometry

We describe a low-coherence interferometric technique for simultaneous measurement of geometric thickness and group refractive index of highly dispersive samples. The technique is immune to the dispersion-induced asymmetry of the interferograms, thus overcoming limitations associated with some other low-coherence approaches to this simultaneous measurement. We use the experimental configuration of a tandem interferometer, with the samples to be characterized placed in an air gap in one arm of the measurement interferometer. Unambiguous, dispersion-insensitive measurements of critical group-delay imbalances in the measurement interferometer are determined from the optical frequency dependence of interferogram phases, by means of dispersive Fourier transform spectrometry. Sample thickness and group refractive index are calculated from these group delays. A thickness measurement precision of 0.2 mum and group index measurement accuracy of 5 parts in 10(5) across a wavelength range of 150 nm have been achieved for BK7 and fused-silica glass samples in the thickness range 2000 to 6000 mum.     

High-speed digital holographic interferometry for vibration measurement

A system based on digital holographic interferometry for the measurement of vibrations is presented. A high-power continuous laser (10 W) and a high-speed CCD camera are used. Hundreds of holograms of an object that has been subjected to dynamic deformation are recorded. The acquisition speed and the time of exposure of the detector are determined by the vibration frequency. Two methods are presented for triggering the camera in order to acquire at a given phase of the vibration. The phase of the wavefront is calculated from the recorded holograms by use of a two-dimensional digital Fourier-transform method. The deformation of the object is obtained from the phase. By combination of the deformations recorded at different times it is possible to reconstruct the vibration of the object.     

Semiconductor line source for low-coherence interferometry

The suitability for low-coherence interferometry of a high-power, semiconductor laser line source operated at a forward bias current below threshold is demonstrated. Measurements of the important characteristics of the source are presented. For example, the source produces an output power of 1.3 mW and a spatially uniform coherence length of 16 mum at a bias current of 86% of threshold (250 mA) at 20 degrees C. The usefulness of the source is verified by measurement of the line profile of a contact lens.     

Three dimensional displacement measurement using Moiré interferometry

Moiré interferometry is used to simultaneously measure the in plane and out of plane displacement components. The high sensitivity of displacement measurement is maintained and high contrast fringes are obtained without recourse to additional filtering.     

Large in-plane displacement measurement in dual-beam speckle interferometry using temporal phase measurement

Abstract

Measurement of in-plane displacements of a diffuse object by observing the temporal fluctuation of the speckle pattern in a dual-beam illumination speckle interferometer is illustrated. To conceive the temporal changes the object is displaced in its plane continuously. A high-speed camera is used to acquire a number of frames of the image of the object motion sequentially. Through Fourier transformation and inverse Fourier transformation of the frames stacked together, the total phase is determined. Finally, the magnitude of the in-plane displacement of the object motion is extracted. The range of displacement that can be measured using this novel method lies between few microns and over 100 μm on the upper end. Theory together with experimental results are presented in this paper.     

Scanning delay line with a rotating-parallelogram prism for low-coherence interferometry

We describe a fast scanning optical delay line for low-coherence interferometry that has good linearity, a high duty cycle, and a continuously adjustable scan range. The delay line consists of a rotating-parallelogram prism with the rotation axis tilted with respect to the incident beam and two motionless mirrors. The delay line is well suited for nearly simultaneous distance measurements at two different depths, which is useful for making absolute and differential distance measurements.     

Depth-resolved whole-field displacement measurement by wavelength-scanning electronic speckle pattern interferometry

We show, for the first time to our knowledge, how wavelength-scanning interferometry can be used to measure depth-resolved displacement fields through semitransparent scattering surfaces. Temporal sequences of speckle interferograms are recorded while the wavelength of the laser is tuned at a constant rate. Fourier transformation of the resultant three-dimensional (3-D) intensity distribution along the time axis reconstructs the scattering potential within the medium, and changes in the 3-D phase distribution measured between two separate scans provide the out-of-plane component of the 3-D displacement field. The principle of the technique is explained in detail and illustrated with a proof-of-principle experiment involving two independently tilted semitransparent scattering surfaces. Results are validated by standard two-beam electronic speckle pattern interferometry.     

Polarization effects on scatterer sizing accuracy analyzed with frequency-domain angle-resolved low-coherence interferometry

Angle-resolved low-coherence interferometry (a/LCI) enables us to make depth-resolved measurements of scattered light that can be used to recover subsurface structural information such as the size of cell nuclei. Endoscopic frequency-domain a/LCI (fa/LCI) acquires data by using a novel fiber probe in a fraction of a second, making it a clinically practical system. However, birefringent effects in fiber-based systems can alter the polarization state of the incident light and potentially skew the collected data. We analyze the effect the polarization state of the incident light has on scattering data collected from polystyrene microsphere tissue phantoms and in vitro cell samples and examine the subsequent accuracy of the determined sizes. It is shown that the endoscopic fa/LCI system accurately determines the size of polystyrene microspheres without the need to control the polarization of the incident beam, but that epithelial cell nuclear sizes are accurately determined only when the polarization state of the incident light is well characterized.     

High-speed 3D imaging using photorefractive holography with novel low-coherence interferometers

The paper reports recent progress in developing high speed 3D imaging systems based on low coherence photorefractive holography with high-speed depth-sectioned imaging at 476 frames per second. It is demonstrated that photorefractive holography can utilize a wide variety of sources of differing spatial and temporal coherence, including a novel all-solid-state broadband laser. Also presented is a novel real-time optical sectioning technique based on structured illumination combined with photorefractive holography that provides real-time optical sectioning when imaging with reflected light or with fluorescence.     

Simultaneous measurement of in-plane and out-of-plane displacement derivatives using dual-wavelength digital holographic interferometry

The paper introduces a method for simultaneously measuring the in-plane and out-of-plane displacement derivatives of a deformed object in digital holographic interferometry. In the proposed method, lasers of different wavelengths are used to simultaneously illuminate the object along various directions such that a unique wavelength is used for a given direction. The holograms formed by multiple reference-object beam pairs of different wavelengths are recorded by a 3-color CCD camera with red, green, and blue channels. Each channel stores the hologram related to the corresponding wavelength and hence for the specific direction. The complex reconstructed interference field is obtained for each wavelength by numerical reconstruction and digital processing of the recorded holograms before and after deformation. Subsequently, the phase derivative is estimated for a given wavelength using two-dimensional pseudo Wigner-Ville distribution and the in-plane and out-of-plane components are obtained from the estimated phase derivatives using the sensitivity vectors of the optical configuration.     

A review of recent work in sub-nanometre displacement measurement using optical and X-ray interferometry

This paper reviews recent work in the field of displacement measurement using optical and X-ray interferometry at the sub-nanometre level of accuracy. The major sources of uncertainty in optical interferometry are discussed and a selection of recent designs of ultra-precise, optical-interferometer-based, displacement measuring transducers presented. The use of X-ray interferometry and its combination with optical interferometry is discussed.     

Optical fiber sensor for electric field and electric charge using low-coherence, Fabry-Perot interferometry

An optical fiber sensor for electric field and electric charge, based on the deflection of a small cantilever, has been developed. When the sensor head is placed in an electric field, induced charging produces deflection of the cantilever, which is measured using low-coherence, Fabry-Perot interferometry. The sensor has been used to measure the electric field in the vicinity of a Van de Graaff generator, in the range 135-650 V/cm. The measured deflections are in good agreement with the predictions of a simple model equating the electrostatic and mechanical forces acting on the cantilever.     

Dual-capillary backscatter interferometry for high-sensitivity nanoliter-volume refractive index detection with density gradient compensation

A simple, stable, ultrasensitive dual-capillary dual-bicell (DCDB) microinterferometic backscattering detection (MIBD) system was developed. In DCDB MIBD, a He-Ne laser beam passes through a half-wave plate onto the cross section of two capillaries, one for reference and another for sensing analyte. The position of the backscattered fringe from each capillary, which are in proximity or essentially identical thermal environments, was detected with matched bicell photodetectors. The configuration was found to effectively compensate for thermal drift, which is normally the major source of noise in refractive index (RI) detection systems. It is shown that passive environmental compensation leads to greatly enhanced signal in nanoscale refractometry preformed by MIBD. An order of magnitude improvement in detection limits over single channel configurations is possible. Performance reaches the 10(-9) RIU level for like solvents in the presence in extremely large thermally induced RI gradients. At this level of detectability, DCDB MIBD could facilitate nanoliter-volume, femtomole-level universal detection in applications ranging from mu-HPLC and on-chip CE to scanning microcalorimetry.     

Surface displacement imaging by interferometry with a light emitting diode

We present an imaging technique to measure static surface displacements of electronic components. A device is supplied by a transient current that creates a variation of temperature, thus a surface displacement. To measure the latter, a setup that is based on a Michelson interferometer is used. To avoid the phenomenon of speckle and the drawbacks inherent to it, we use a light emitting diode as the light source for the interferometer. The detector is a visible CCD camera that analyzes the optical signal containing the information of surface displacement of the device. Combining images, we extract the amplitude of the surface displacement. Out-of-plane surface-displacement images of a thermoelectric device are presented.     

Spectrum-sliced Fourier-domain low-coherence interferometry for measuring the chromatic dispersion of an optical fiber

We present a novel spectrum-slicing method for measuring the chromatic dispersion of an optical fiber in Fourier-domain low-coherence interferometry. Broadband spectral interference data obtained from a low-coherence interferometer is sliced with Gaussian window functions. Each sliced spectral datum is used to calculate a relative group delay with Fourier transformation at the peak wavelength of a narrow window function. We have demonstrated that our proposed method is very powerful and simple for measuring chromatic dispersion and second-order dispersion in optical fibers and optical devices. Comparison of the proposed method with a conventional measurement method agrees within 0.5%.     

Simultaneous measurement of three orthogonal components of displacement by electronic speckle-pattern interferometry and the Fourier transform method

The measurement of three-dimensional displacement by electronic speckle-pattern interferometry with three object beams and one reference beam is presented. Multiple interference fringes corresponding to different sensitivity vectors are recorded in a single interferogram and separated by means of the Fourier transform method to give three components of displacement. The relationship between the ratio of the speckle size to the pixel size of a TV camera and the measurement error is investigated experimentally and compared with the research of others. The optimum condition leading to a minimum measurement error occurs when the speckle size is approximately equal to the pixel size. With this condition satisfied, the measurement error varies from 1.5% to 6.0%.     

Accurate remote distance sensing by use of low-coherence interferometry: an industrial application

An apparatus for accurate remote distance sensing based on fiber-optic low-coherence light interferometry has been designed for molten glass level measurement. We demonstrate operation of the meter in an adverse industrial environment with <20-mum resolution (standard deviation) within a 20-mm range with the sensing head placed in an oven at ~800 degrees C. In laboratory conditions we were able to measure with 3-mum resolution, which could be improved to submicrometer level by optimization of a reference arm of the interferometer and detection electronics.