Analysis of the optical absorption characteristics of CuInSe2 thin films

Thin films of compound CuInSe₂ have been developed onto glass substrates by in situ thermal annealing of the stack of successively evaporated elemental layers in vacuum. The atomic compositions and the optical properties of the films have been determined by proton-induced X-ray emission (PIXE) method and spectrophotometry in the photon wavelength range of 300–2500 nm, respectively. The typical optical absorption characteristic of the films has been critically analysed. The absorption coefficients vary from 10³ to 10⁵ cm⁻¹ in the measured wavelength range. The films have more than one type of fundamental electronic transitions. Direct allowed and direct forbidden transitions vary between 0.947 to 0.989 eV and 1.099 to 1.204 eV, respectively, depending on the composition of the films. The former transition varies inversely with the Cu/In ratio while the latter shows no such dependence. Valence band splittings due to spin–orbit coupling converge towards the single-crystal value for the near-stoichiometric (NS) and Cu-rich films.     

Evolution of the properties of CuAlSe2 thin films with the oxygen content

CuAlSe₂ thin films have been synthesized by annealing, under argon flow, a multilayer structure of thin Cu, Al and Se layers sequentially deposited by evaporation under vacuum. It is shown that the oxygen content depends not only on the evaporation content but also on the argon flow. The properties of the thin films are modified by this oxygen percentage: when no more than 4–5 at % of oxygen is present in the films, their optical properties are very similar to that of single crystals. The inter-band transitions A, B, C typical of such chalcopyrite structure are clearly visible on the absorption spectra. The variation of the conductivity of these films in the high temperature domain is as that expected in CuAlSe₂, while in the low temperature, grain boundaries are dominant.     

Temperature dependence of the optical transitions in electrodeposited Cu2O thin films

Cu₂O films on flexible copper and molybdenum (Mo) substrates were prepared by electrodeposition form an alkaline bath. The as-deposited films were p-type and the XRD analysis revealed that the film contains only the Cu₂O phase. The thickness of the films was calculated from the interference fringes in the reflection spectra. The Au/Cu₂O Schottky diodes were prepared by sputtering a 15 nm thick layer of very pure gold onto the Cu₂O films on Mo substrate. The probable optical transitions near the band edge were calculated from the spectral response of the device. The band gap calculated at various temperatures show a linear dependence on temperature and the absolute zero value of the band gap is deduced as 2.206 eV. The 2.493 eV direct transition observed in the room temperature shows a temperature dependence. Evidence of phonon assisted indirect transitions were observed at various temperature regions.     

Characterization of Cu(In,Ga)Se2 thin films prepared by thermal crystallization on Mo/glass substrate

Thin films of Cu(In,Ga)Se₂ were prepared by thermal crystallization on the sputtered Mo/substrate and characterized. MoSe₂ layer was formed at the interface between Cu(In,Ga)Se₂ and Mo layers after the thermal crystallization. The graded Ga concentration in crystallized Cu(In,Ga)Se₂ thin films was confirmed. Cu(In,Ga)Se₂ thin films prepared on the Mo/soda-lime glass had large and columnar grains rather than those on the Mo/quartz substrate.     

Preparation and properties of CuInS2 thin film prepared from electroplated precursor

Thin CuInS₂ films were prepared by sulfurization of Cu/In bi-layers. First, the precursor layer was electroplated onto the treated surface of Mo-coated glass. Observation of the cross-section prepared by focused ion beam (FIB) etching revealed that the void-free film was initially formed on the top surface of the precursor layer and continued to grow until the advancing front of the film reached the Mo layer. The nucleation of voids near the bottom of the CuInS₂ film followed. To determine whether the condition of the Cu/In alloy influences the CuInS₂ quality we investigated the Cu/In alloy state using FIB. We found that the annealed precursor of low Cu/In ratio (1.2) has several voids in the mid position in the layer compared with Cu-rich precursor (1.6). The cross-sectional view of the Cu-rich absorber layer is uniform compared with the low copper absorber layer. Thin film solar cells were fabricated using the CuInS₂ film (Cu/In ratio: 1.2) as an optical absorber layer. It was found that the optimization of a sulfurization period is important in order to improve the cell efficiency. We have not yet obtained good results with high Cu-rich absorber because of a blister problem. This blister was found before sulfurization. So, we are going to solve this blister problem before sulfurization.     

Preparation of CuInS2 films with sufficient sulfur content and excellent morphology by one-step electrodeposition

One-step electrodeposition using sodium thiosulfate (Na₂S₂O₃) as a sulfur source has been studied for the preparation of Cu---In---S thin films. A deposited film is found to have a sufficiently high sulfur content compared with films deposited using thiourea as a sulfur source. The film deposited using Na₂S₂O₃ is also found to have an excellent morphology compared with electrodeposited Cu---In precursors. Predominant factors to govern film composition, In/Cu and S/(Cu + In) ratios, are also investigated in this study. An HC1 content added in order to decompose S₂O₃²⁻ ions in the solution is found to be one of the important factors to control composition of deposited films. A sulfur cocentration in the solution influences not only S/(Cu + In) ratio but also In/Cu ratio in the film. Reproducibility of film composition is deteriorated as the solution temperature increases.     

Comparative study of Cu2ZnSnS4 film growth

We fabricated Cu₂ZnSnS₄ (CZTS) thin films using two different methods, spray pyrolysis and sulfurization of Cu-Zn-Sn metallic films. Spray pyrolysis was carried out under air ambient with modified ultrasonic spray system. Sulfurizations of metallic Cu-Zn-Sn films were done for stacked metallic films, Cu/Sn/Zn/glass, Cu/Sn/Cu/Zn/glass and Sn/Cu/Zn/glass, which were prepared by sputtering method in high vacuum chamber. The sprayed films were not observed to be grown well with good crystallinity, compared with CZTS films made by sulfurization of stacked metallic films. However, it was found that application of additional sulfurization to sprayed CZTS films induced great improvement of crystallinity to the level of the sulfurized metallic films. This implicates that spray pyrolysis with additional sulfurization is a good method for fabrication of CZTS films, especially as a low-cost fabrication technique. All CZTS films were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDS) and Raman spectroscopy measurements.     

CuInSe2 thin film preparation through a new selenisation process using chemical bath deposited selenium

Copper indium selenide thin films were prepared through a novel and an eco-friendly selenisation process. In this method, selenium film required for selenisation was prepared using chemical bath deposition technique, at room temperature. Thus, totally avoided usage of highly toxic H₂Se or selenium vapour. Here, the process involved annealing the Stacked layer, Se/In/Cu in which Cu and In were deposited using vacuum evaporation technique. Investigations on the solid-state reaction between the layers were done by analysing structural and optical properties of films formed at different annealing temperatures. Optimum annealing condition for the formation of copper indium selenide thin film was found to be 673 K for 1 h in high vacuum. Compositional dependence of the growth process was also studied using various Cu/In ratios. Optical band gap was decreased with increase in Cu/In ratio. Carrier concentration and hence conductivity were found to be increased with increase in Cu/In ratio. The films obtained were p-type and highly Cu-rich films were degenerate.     

Characterization of co-sputtered Cu-In alloy precursors for CuInSe2 thin films fabrication by close-spaced selenization

Sputtering technique for Cu–In precursor films fabrication using different Cu and In layer sequences have been widely investigated for CuInSe₂ production. But the CuInSe₂ films fabricated from these precursors using H₂Se or Se vapour selenization mostly exhibited poor microstructural properties. The co-sputtering technique for producing Cu–In alloy films and selenization within a close-spaced graphite box resulting in quality CuInSe₂ films was developed. All films were analysed using SEM, EDX, XRD and four-point probe measurements. Alloy films with a broad range of compositions were fabricated and XRD showed mainly In, CuIn₂ and Cu₁₁In₉ phases which were found to vary in intensities as the composition changes. Different morphological properties were displayed as the alloy composition changes. The selenized CuInSe₂ films exhibited different microstructural properties. Very In-rich films yielded the ODC compound with small crystal sizes whilst slightly In-rich or Cu-rich alloys yielded single phase CuInSe₂ films with dense crystals and sizes of about 5 μm. Film resistivities varied from 10⁻²–10⁸ Ω cm. The films had compositions with Cu/In of 0.40–2.3 and Se/(Cu+In) of 0.74–1.35. All CuInSe₂ films with the exception of very Cu-rich ones contained high amount of Se (>50%).     

A comparative study of CuInSe2 and CuIn3Se5 films using transmission electron microscopy, optical absorption and Rutherford backscattering spectrometry

CuInSe₂ and CuIn₃Se₅ films were grown by stepwise flash evaporation onto glass and Si substrates held at different temperatures. Transmission electron microscopy (TEM) studies revealed that the films grown above 370 K were polycrystalline, with CuInSe₂ films exhibiting larger average grain size than CuIn₃Se₅. Optical absorption studies yielded band gaps of 0.97±0.02 and 1.26±0.02 eV for CuInSe₂ and CuIn₃Se₅, respectively. Rutherford backscattering spectrometry (RBS) study of the films on Si showed that CuInSe₂/Si structures included an inhomogeneous interface region consisting of Cu and Si, whereas CuIn₃Se₅/Si structures presented sharp interface.     

Fabrication of Cu2ZnSnS4 films by sulfurization of Cu/ZnSn/Cu precursor layers in sulfur atmosphere for solar cells

Cu₂ZnSnS₄ (CZTS) absorbers were grown by sulfurization of Cu/ZnSn/Cu precursors in sulfur atmosphere. The reaction mechanism of CZTS formation from the precursor was analyzed using XRD and Raman spectroscopy. The films with a single phase CZTS were formed at 560 and 580 °C by sulfurization for 30 min. The film grown at 560 °C showed bi-layer morphology with grooved large grains on the top and dense small grains near the bottom of the film. On the other hand, the film grown at 580 °C showed large grains with grooves that are extended from surface top to bottom of the film. The solar cell fabricated with the CZTS film grown at 560 °C showed the best conversion efficiency of 4.59% for 0.44 cm² with V_oc=0.545 V, J_sc=15.44 mA/cm², and FF=54.6. We found that further improvement of the microstructure of CZTS films can increase the efficiency of CZTS solar cells.     

Improved CIGS thin-film solar cells by surface sulfurization using In2S3 and sulfur vapor

Surface sulfurization of Cu(In,Ga)Se₂ (CIGS) thin films was carried out using two alternative techniques that do not utilize toxic H₂S gas; a sequential evaporation of In₂S₃ after CIGS deposition and the annealing of CIGS thin films in sulfur vapor. A Cu(In,Ga) (S,Se)₂ thin layer was grown on the surface of the CIGS thin film after sulfurization using In₂S₃, whereas this layer was not observed for CIGS thin films after sulfurization using sulfur vapor, although a trace quantity of S was confirmed by AES analysis. In spite of the difference in the surface modification techniques, the cell performance and process yield of the ZnO:Al/CdS/CIGS/Mo/glass thin-film solar cells were remarkably improved by using both surface sulfurization techniques.     

Improved compositional flexibility of Cu(In,Ga)Se2-based thin film solar cells by sodium control technique

The effects of sodium on off-stoichiometric Cu(In,Ga)Se₂ (CIGS)-based thin films and solar cells were investigated. The CIGS-based films were deposited with intentionally incorporated Na₂Se on Mo-coated SiO_x/soda-lime glass substrates by a multi-step process. By sodium control technique high-efficiency ZnO : Al/CdS/CIGS solar cells with efficiencies of 10–13.5% range were obtained over an extremely wide Cu/(In + Ga) ratio range of 0.51–0.96, which has great merit for the large-area manufacturing process. The improved efficiency in the off-stoichiometric regions is mainly attributed to the increased acceptor concentration and the formation of the Cu(In,Ga)₃Se₅ phase films with p-type conductvity. A new type of solar cell with p-type Cu(In,Ga)₃Se₅ phase absorber materials is also suggested.     

X-ray fluorescence investigation of the Ga distribution in Cu(In,Ga)Se2 thin films

The efficiencies of Cu(In,Ga)Se₂/CdS/ZnO solar cell devices in which the absorbers are produced by classical two-step processes are significantly lower that those in which co-evaporated absorbers are used. A significant problem related to two-step growth processes is the reported segregation of Ga towards the Mo back contact, resulting in separate CuInSe₂ and CuGaSe₂ phases. Furthermore, it is often reported that material losses (especially In and Ga) occur during high-temperature selenization of metallic precursors. In this study, X-ray fluorescence (XRF) analysis was used to study the diffusion behaviour of the chalcopyrite elements in single-stage and two-stage processed Cu(In,Ga)Se₂ thin films. This relatively simple characterization technique proved to be very reliable in determining the degree of selenium incorporation, possible material losses and the in-depth compositional uniformity of samples at different stages of processing. This information is especially important in the case of two-stage growth processes, involving high-temperature selenization steps of metallic precursors. Device quality Cu(In,Ga)Se₂ thin films were prepared by a relatively simple and reproducible two-step growth process in which all the metals were evaporated from one single crucible in a selenium-containing environment. The precursors were finally treated in an H₂Se/Ar atmosphere to produce fully reacted films. XRF measurement indicated no loss of In or Ga during this final selenization step, but a significant degree of element diffusion which depended on the reaction temperature. It was also possible to produce Cu(In,Ga)Se₂ thin films with an appreciable amount of Ga in the near-surface region without separated CuInSe₂ and CuGaSe₂ phases.     

Absorption coefficient of bulk and thin film Cu2O

The optical absorption coefficient of thin film and bulk Cu₂O at room temperature is obtained from an accurate analysis of their transmittance and reflectance spectra. These absorption spectra are modeled, together with the low temperature data reported in the literature, using an analytical expression to assess and quantify the role of the different absorption mechanisms. The results suggest that direct forbidden transitions and indirect transitions play an almost equally relevant role. A table of the optical constants of Cu₂O single crystal is given for reference.     

Cu2O/Cu/TiO2 nanotube Ohmic heterojunction arrays with enhanced photocatalytic hydrogen production activity

Cu₂O/Cu/TiO₂ nanotube heterojunction arrays were prepared by assembling Cu@Cu₂O core-shell nanoparticles on TiO₂ nanotube arrays (NTAs) using a facile impregnation-reduction method. SEM and TEM results show that Cu@Cu₂O plate-like nanoparticles with tens of nanometers in size are confined inside TiO₂ NTAs. Only the outmost several nanometers of the nanoparticles are Cu₂O and the predominant inner of the nanoparticles are Cu metals. Cu L₃VV Auger spectra of Cu₂O/Cu/TiO₂ NTAs suggest that Cu metals are enveloped by at least several nanometers Cu₂O on the surface, which further confirms the Cu@Cu₂O core shell structure of Cu nanoparticles. The ability of light absorption of Cu₂O/Cu/TiO₂ NTAs is enhanced. The range of absorption wavelengths changes from 400 to 700 nm due to the surface plasmon response of Cu metals core and Cu₂O nanoparticles shell. The photocatalytic hydrogen production rate of Cu₂O/Cu/TiO₂ heterojunction arrays is enhanced when compared with those of Cu₂O/TiO₂ NTAs and TiO₂ NTAs under UV light. Moreover, a stable H₂ generation property was obtained under visible light (λ gt; 400 nm). The Cu metal core is believed to play a key role in the enhancement of photocatalytic properties of Cu₂O/Cu/TiO₂ nanotube heterojunction arrays.     

Preparation and characterization of CuInS2 thin films solar cells with large grain

The CuInS₂ films with a maximum thickness of about 9 μm and a maximum atomic Cu/In ratio (as-deposited precursor) of 3.0 were prepared, and, to prevent peeling from substrate, were heat treated during Cu/In evaporation and/or intercalated with very thin Pt or Pd (between Mo and CuInS₂ layers). Thus, we could prepare the films with very large grain. It is also worth noting that the large grain films were easily optimized by chemical etching of the films using a thick film and Cu-rich composition. Therefore, the absorber for high-efficiency solar cells can be prepared by varying over a wide range of composition and thickness of precursor. The characterization of CuInS₂ absorbers with various film thickness and compositions were investigated and related with the performance of the photovoltaic device.     

Residual charges and infrared absorption in electrochromic WO3 films prepared by hydrogen-introduced sputtering

Electrochromic WO₃ films were prepared by rf−sputtering in atmosphere consisting of Ar/H₂/O₂ mixed gas. The as-sputtered films require several times of injection/extraction of ions (the aging) for obtaining reversible coloration/bleaching. After the aging, there are ions (protons) remaining in the films, namely residual charges. From the results of IR absorption of the as-sputtered and aged films, the residual charges contribute to create OH and HOH bonds. Hydrogen introduced in the films during sputtering is transformed only into OH bonds combining with unstable oxygen in the films. The introduced hydrogen is considered to suppress the growth of grain in WO₃ films from AFM observation.     

Improvement of the optical properties of electrodeposited CuInSe2 thin films by thermal and chemical treatments

Cu, In and Se have been codeposited in thin films by potentiostatic one-step electrodeposition. The as-deposited material has shown direct optical transitions attributable to the CuInSe₂ semiconductor, but also additional absorption corresponding to another semimetallic phase. The secondary phases are selenium and copper selenide compounds which have been determined by composition measurements. In order to eliminate the semimetallic phases and to improve the semiconductor behaviour of the electrodeposited material, thermal and chemical treatments have been performed. After heat-treatment of the samples at 400°C in flowing argon, elemental selenium loss has been detected together with an enhancement of the allowed direct optical transition. The subsequent chemical etching of the layers in a KCN solution has showed to be successful in eliminating the copper selenide phases which were responsible of the remaining sub-bandgap absorption.     

Studies on Cu2ZnSnS4 (CZTS) absorber layer using different stacking orders in precursor thin films

Cu₂ZnSnS₄ (CZTS) thin films were deposited by sputtering on glass substrates using stacked precursors. The stacked precursor thin films were prepared from Cu, SnS₂ and ZnS targets at room temperature with different stacking orders of Cu/SnS₂/ZnS/glass (A), ZnS/Cu/SnS₂/glass (B) and SnS₂/ZnS/Cu/glass (C). The stacked precursor thin films were sulfurized using a tubular rapid thermal annealing system in a mixed N₂ (95%)+H₂S (5%) atmosphere at 550 °C for 10 min. The effects of the stacking order in the precursor thin films on the structural, morphological, chemical, electrical and optical properties of the CZTS thin films were investigated. X-ray diffraction, Raman spectroscopy and X-ray photoelectron spectroscopy studies showed that the annealed CZTS thin film using a stacking order A had a single kesterite crystal structure without secondary phases, whereas stacking orders B and C have a kesterite phase with secondary phases, such as Cu_2−xS, SnS₂ and SnS. The annealed CZTS thin film using stacking order A showed a very dense morphology without voids. On the other hand, the annealed CZTS thin films using stacking orders B and C contained the volcano shape voids (B) and Sn-based secondary phases (C) on the surface of the annealed thin films. The direct band gap energies of the CZTS thin films were approximately 1.45 eV (A), 1.35 eV (B) and 1.1 eV (C).