一种消除FPD灰度图像显示低频闪烁的设计

针对现有的FPD(平板显示器)灰度图像显示的低频闪烁提出了新的图像驱动设计.分析了FPD灰度图像显示过程中低频闪烁的产生原因,提出了分权插序扫描方法,有效地降低了低频闪烁的产生,提高了灰度图像的显示质量.     

电视机大面积闪烁感分析及消除方案

综合分析了电视机大面积闪烁感的产生原因和和种影响因素，提供了一种适合我国情况的场重复法倍场频消闪烁方案，并且对其经济和性能分析。     

GPS电离层闪烁实时监测系统的设计与实现

给出了一种用于电离层闪烁测量和显示的GPS电离层闪烁实时监测系统,它既能实时监测分析GPS信号的幅度闪烁和相位闪烁指数,也能自动存储闪烁发生时间段内的原始幅度和相位数据,用于对闪烁事件的详细分析.此外,对电离层闪烁的测量原理和闪烁指数的计算也作了详细讨论,这对利用我国北斗卫星信号测量电离层闪烁也具有指导意义.     

环境光对固态体积式真三维显示闪烁的影响研究

为了优化固态体积式真三维显示中的闪烁现象,研究了环境光对于显示闪烁的影响。通过傅里叶变换在频域获得环境光与成像光信号叠加后的频域能量分布,分析了环境光影响显示闪烁的原因。同时,设计完成了两组视觉感知实验并进行统计分析。结果显示,环境光的频率、最大光强及占空比对于真三维显示的闪烁程度有显著性影响,显著性差异小于0.001。其中,环境光的频率是影响显示闪烁的首要因素,环境光频率与显示刷新率相匹配是消除环境光对闪烁影响的主要途径;降低最大光强或提高占空比有助于消除闪烁。闪烁程度评价模型的评估结果与实验结果的相关系数大于0.99,研究结果对于基于层叠屏的三维显示闪烁程度优化具有积极的启发和指导作用。     

立体电视闪烁的客观评价

本文主要针对快门式立体电视图像闪烁问题,结合平板电视闪烁测试的研究成果,提出了一种立体电视图像闪烁的检测和数据分析方法。选择LCD与PDP两种显示面板的立体电视,分别抽取不同尺寸的样品进行检测。实验表明两种显示屏的立体电视图像都会存在闪烁,但有差异,并且大尺寸PDP面板的闪烁现象较明显。     

一种极化测量雷达的角闪烁抑制方法

角闪烁是雷达目标的固有特性.以半波振子对为目标模型,利用相位畸变理论,研究了目标在极化测量条件下的角闪烁特性.建立了半波振子对目标在单极化和全极化接收条件下的角闪烁模型,在此基础上提出了一种极化测量雷达的角闪烁抑制方法.理论分析表明,该方法可明显降低目标的角闪烁线偏差.     

LCD液晶显示器画面闪烁解决方法探讨

画面闪烁是LCD液晶显示器的一种常见故障,机制差异和纠正方法都会对其成功率造成影响。本文首先概述了什么是LCD显示技术,并对LCD闪烁的原因进行了分析,最后提出了LCD液晶显示器画面闪烁的解决方法。     

3V至5V LED显示驱动器简化软件并加速设计进度 集成了多工引擎、数字亮度控制、闪烁控制和字库，直接与主μP接口

MAX6950-MAX6959 LED显示驱动器可驱动5x7点阵和7、14和16段显示器。这些器件集成了多工引擎、字库、键盘扫描、闪烁控制和亮度控制。利用主处理器（μP）通过串行接口非常容易对其进行控制，采用这些器件后可以省去一个单独的面板微控制器（μC）。     

昆明站电离层闪烁形态与海口站的对比分析

对昆明站和海口站2004年1～12月的GPS电离层闪烁形态进行了对比分析.结果表明,昆明站的闪烁频率和强度均弱于海口站,其闪烁发生的时间比海口站晚大约一小时,昆明站将近90%的闪烁事件发生在观测站以南,仅个别事件发生在北向,而海口站闪烁事件发生在南向的不到70%.这充分体现了昆明站的地域特性及赤道异常区电离层不规则结构发展特性.     

中国电离层闪烁监测和预报

我国低纬度地区是全球电离层闪烁衰落影响最严重的地区之一,介绍了在青岛开展电离层闪烁效应研究的先期工作:电离层闪烁监测和预报,建立了覆盖我国中低纬地区的电离层闪烁监测网,给出了闪烁监测预报系统的组成和进行电离层闪烁预报的技术路线.     

基于抛物方程法的主动雷达探测威力评估方法

基于适用于大区域复杂环境中的电波传播求解的抛物方程算法,结合了雷达方程模型和Swerling目标闪烁模型,提出了一种主动雷达对海探测威力评估算法。采用美海军的AREPS对其进行正确性验证,结果表明误差<3 dB。该算法能够用于主动雷达的探测威力评估。     

Electrical simulation of the flicker in poly-Si TFT-LCD pixels for the large-area and high-quality TFT-LCD development and manufacturing

In this paper, we present a new flicker evaluation model through the electrical simulation of the optical flicker phenomena in different kinds of poly-Si TFT-LCD arrays for the development and manufacturing of large-area and high-quality TFT-LCDs. We applied our flicker evaluation model to three different types of TFTs; excimer laser annealed (ELA) poly-Si TFT, silicide mediated crystallization (SMC) poly-Si TFT, and counter-doped lateral body terminal (LBT) poly-Si TFT. We compared the flicker quantitatively for these three different TFT-LCDs on 40 in. UXGA scale. We identified three major factors causing the flicker such as charging time, kickback voltage and leakage current, analyzed their relative contributions to the flicker, and evaluated the values of the flicker in decibel (dB) for the three different TFT-LCD arrays. In addition, we show that the flicker is very sensitive to the low-level (minimum) gate voltage due to the large leakage current of the poly-Si TFT, and the low-level gate voltage should be chosen carefully to minimize the flicker.     

基于能量算子和最大旁瓣衰减自卷积窗函数频谱校正的电压闪变参数识别技术及其在风电场的应用研究

风力发电并网和电力电子技术的广泛发展与应用,造成的电压波动与闪变已成为当前智能电网不容忽视的问题。针对人眼更为敏感的矩形波调制下的电压闪变模型,该文提出改进能量算子和加截断窗谱线插值快速傅里叶变换(FFT) 的闪变包络参数识别法。通过优化能量算子采样间隔实现电压波动分量准确提取,以改进的最大旁瓣衰减速率(MSLD)6项组合余弦窗为母窗构建频域性能优良的MSLD自卷积窗(MSLD-SCW)函数,推导基于新型2阶 MSLD-SCW函数谱线插值校正公式,据此实现矩形方波调制的闪变参数识别与分析。仿真结果表明,优化改进算法在单频矩形方波调制、多频方波调幅波调制、含有谐波与次/超同步间谐波干扰、基频变动及含有噪声等干扰源背景下,相较于传统检测算法均保持较高准确性。最后,将优化算法应用于新疆某地区电网电压闪变识别,验证其有效性。     

A transcoding-resistant video watermarking algorithm based on corners and singular value decomposition

The singular value decomposition (SVD) mathematical technique provides an elegant method for extracting algebraic features form an image. When a small change is added to singular values, great variance of image doesn’t occur, and singular values in an image are less affected if general image processing is performed. Because singular value matrix of an image has good stability, the watermark can be embedded to this matrix without causing large variation in the stego-image. The reason of causing block effects and flicker in the traditional watermarked video using SVD is firstly analyzed in this paper. Based on the feature of SVD and that human eyes are not sensitive to the changes in corner area of each frame of video, we embed watermark into blocks with corner inside using quantization index modulation. We analyze the validity of the proposed algorithm about synchronizing error, block effects, and flicker. The experiment shows that the proposed approach has an excellent robustness against transcoding and some normal attacks, such as adding noise, re-encoding and so on without causing any block effects and flicker. The result also shows that the correct rate of extracting watermark can achieve 98 % per second.     

闪变仪器的软件设计

本文分析了IEC闪变仪灯-眼-脑环节各部分的输入输出信号.根据国际电工委员会(IEC)制定的闪变仪的设计规则,利用虚拟仪器仿真软件--LabVIEW,建立了数字式闪变仪灯-眼-脑环节的模型,使之能对电压数字信号进行分析处理得到电压瞬时闪变视感度.仿真结果验证了用灯-眼-脑传递函数形式来逼近视感度系数,能够得到正确的结果.     

Analysis of sensitivity degradation caused by the flicker noise ofGaAs-MESFETs in fiber-optic receivers

The total input noise current and sensitivity of the fiber-optic receiver was calculated. The flicker noise source was included by adopting a pertinent flicker noise model. Power penalties caused by the flicker noise were calculated for various fiber-optic receivers using the calculated noise current. It has been found that the flicker noise affects the sensitivity over the whole range of the bit rates, and that the total input capacitance is an important parameter affecting the power penalty which is serious in the case of a high-impedance-type p-i-n FET receiver. The optimum feedback resistance for practical p-i-n FET receiver design is also suggested     

Oxide thickness dependent compact model of channel noise for E-mode AlGaN/GaN MOS-HEMT

In this paper, a compact channel noise model for gate recessed enhancement mode GaN based MOS-HEMT which is valid for all regions of operation is proposed. The compact noise model consists of high frequency thermal noise and low frequency flicker noise. The drain current, which is one of the most important parameters for compact noise model is developed by incorporating interface and oxide traps, mobility degradation due to vertical electric field, velocity saturation effect and self-heating effect. The flicker noise model is derived by considering mobility and carrier fluctuation due to traps present in both oxide and interface layer. The thermal noise and flicker noise models are validated by comparing the results with TCAD simulation and experimental results from literature respectively. Effect of thermal and flicker noise power spectral density (PSD) variation with different oxide thickness has also been analyzed.     

Noise in RF-CMOS mixers: a simple physical model

Flicker noise in the mixer of a zero- or low-intermediate frequency (IF) wireless receiver can compromise overall receiver sensitivity. A qualitative physical model has been developed to explain the mechanisms responsible for flicker noise in mixers. The model simply explains how frequency translations take place within a mixer. Although developed to explain flicker noise, the model predicts white noise as well. Simple equations are derived to estimate the flicker and white noise at the output of a switching active mixer. Measurements and simulations validate the accuracy of the predictions, and the dependence of mixer noise on local oscillator (LO) amplitude and other circuit parameters     

Flicker and thermal noise in an n-channel underlap DG FinFET in a weak inversion region

We propose an analytical model for drain current and inversion charge in the subthreshold region for an underlap DG FinFET by using the minimum channel potential method,i.e.,the virtual source.The flicker and thermal noise spectral density models are also developed using these charge and current models expression.The model is validated with already published experimental results of flicker noise for DG FinFETs.For an ultrathin body,the degradation of effective mobility and variation of the scattering parameter are considered.The effect of device parameters like gate length L_g and underlap length L_un on both flicker and thermal noise spectral densities are also analyzed.Increasing L_g and L_un,increases the effective gate length,which reduces drain current,resulting in decreased flicker and thermal noise density.A decrease of flicker noise is observed for an increase of frequency, which indicates that the device can be used for wide range of frequency applications.