A time-of-flight backscattering spectrometer at the Spallation Neutron Source, BASIS

We describe the design and current performance of the backscattering silicon spectrometer (BASIS), a time-of-flight backscattering spectrometer built at the spallation neutron source (SNS) of the Oak Ridge National Laboratory (ORNL). BASIS is the first silicon-based backscattering spectrometer installed at a spallation neutron source. In addition to high intensity, it offers a high-energy resolution of about 3.5 μeV and a large and variable energy transfer range. These ensure an excellent overlap with the dynamic ranges accessible at other inelastic spectrometers at the SNS.     

Angular correlations in detection of α-γ coincidences in the nanosecond tagged neutron technology

The characteristics of the setup for analyzing the elemental composition of organic substances using spectroscopy of γ rays induced by tagged neutrons with an energy of ～14 MeV in an inelastic neutron scattering reaction are discussed. An ING-27 D-T neutron generator with a built-in position-sensitive α detector, fast neutron and γ detectors, and a multichannel detecting system providing a subnanosecond time resolution are parts of the experimental setup. The correlation between the exit angle of a neutron and the number of the α pixel, as well as the anisotropy in emission of γ rays in the inelastic neutron scattering reaction, are measured, and the errors of these measurements are estimated.     

Development of neutron spectrometer toward deuterium plasma diagnostics in LHD

Neutron spectrometer based on coincident counting of associated particles has been developed for deuterium plasma diagnostics on Large Helical Device (LHD) at the National Institute for Fusion Science. Efficient detection of 2.5 MeV neutron with high energy resolution would be achievable by coincident detection of a scattered neutron and a recoiled proton associated with an elastic scattering of incident neutron in a plastic scintillator as a radiator. The calculated neutron spectra from deuterium plasma heated by neutral beam injection indicate that the energy resolution of better than 7% is required for the spectrometer to evaluate energetic deuterium confinement. By using a prototype of the proposed spectrometer, the energy resolution of 6.3% and the detection efficiency of 3.3×10(-7)?count/neutron were experimentally demonstrated for 2.5 MeV monoenergetic neutron, respectively.     

Diffraction effects in inner-shell ionization edges

The influences of elastic on inelastic scattering under systematic-row conditions are described in a simple way. A kinematic approach, superposing inelastic intensity-distribution profiles centred at different Bragg spots is shown to be qualitatively correct but quantitatively unsatisfying. A model considering Bragg reflection of the fast electron before and after the inelastic scattering process and thus introducing interference effects is in good agreement with experimental results. Experimentally, we recorded inelastic intensities in the diffraction pattern of an epitaxial copper foil using a PEELS spectrometer and observed energy filtered extinction contours of a copper crystal.     

Elastic incoherent neutron scattering operating by varying instrumental energy resolution: principle, simulations, and experiments of the resolution elastic neutron scattering (RENS)

The main aim of this paper is to present the scientific case of the resolution elastic neutron scattering (RENS) method that is based on the collection of elastic neutron scattering intensity as a function of the instrumental energy resolution and that is able to extract information on the system dynamical properties from an elastic signal. In this framework, it is shown that in the measured elastic scattering law, as a function of the instrumental energy resolution, an inflection point occurs when the instrumental energy resolution intersects the system relaxation time, and in an equivalent way, a transition in the temperature behavior of the measured elastic scattering law occurs when the characteristic system relaxation time crosses the instrumental energy resolution time. With regard to the latter, an operative protocol to determine the system characteristic time by different elastic incoherent neutron scattering (EINS) thermal scans at different instrumental energy resolutions is also proposed. The proposed method, hence, is not primarily addressed to collect the measured elastic scattering intensity with a great accuracy, but rather relies on determining an inflection point in the measured elastic scattering law versus instrumental energy resolution. The RENS method is tested both numerically and experimentally. As far as numerical simulations are concerned, a simple model system for which the temperature behavior of the relaxation time follows an Arrhenius law, while its scattering law follows a Gaussian behavior, is considered. It is shown that the system relaxation time used as an input for the simulations coincides with the one obtained by the RENS approach. Regarding the experimental findings, due to the fact that a neutron scattering spectrometer working following the RENS method has not been constructed yet, different EINS experiments with different instrumental energy resolutions were carried out on a complex model system, i.e., dry and D(2)O hydrated lysozyme, in an extended temperature range. The resulting temperature behavior of the system relaxation time, obtained with RENS method, agrees very well with the one obtained in literature, for the same system, following the quasi-elastic neutron scattering (QENS) approach. The proposed scientific case puts into evidence the challenges of an RENS spectrometer working by varying the instrumental energy resolution; in particular, in comparison with QENS, the proposed RENS method requires a smaller amount of sample, which is an important point in dealing with biological and exotic systems; it is not affected by the use of model functions for fitting spectra as in QENS, but furnishes a direct access to relevant information.     

Large volume high-pressure cell for inelastic neutron scattering

Inelastic neutron scattering measurements typically require two orders of magnitude longer data collection times and larger sample sizes than neutron diffraction studies. Inelastic neutron scattering measurements on pressurised samples are particularly challenging since standard high-pressure apparatus restricts sample volume, attenuates the incident and scattered beams, and contributes background scattering. Here, we present the design of a large volume two-layered piston-cylinder pressure cell with optimised transmission for inelastic neutron scattering experiments. The design and the materials selected for the construction of the cell enable its safe use to a pressure of 1.8 GPa with a sample volume in excess of 400 mm(3). The design of the piston seal eliminates the need for a sample container, thus providing a larger sample volume and reduced absorption. The integrated electrical plug with a manganin pressure gauge offers an accurate measurement of pressure over the whole range of operational temperatures. The performance of the cell is demonstrated by an inelastic neutron scattering study of UGe(2).     

SANS准直器的蒙特卡罗模拟

本文采用基于蒙特卡罗方法的谱仪设计软件VITESS,对中子小角散射谱仪上三种不同形状的准直器进行了模拟。比较了这三种不同准直器在输入条件相同的情况下,它们出口处的中子注量率、水平面和竖直面的中子角分布。通过分析,采用具有超镜因子m=1．5的bender类型的准直器可以获得较高的中子注量率,但是其水平面角分布相对其它两种稍微偏大。这为中子小角散射谱仪设计中准直器的选择提供了一个参考。     

An electron energy loss spectrometer designed for studies of electronic energy losses and spin waves in the large momentum regime

Based on 143° electrostatic deflectors we have realized a new spectrometer for electron energy loss spectroscopy which is particularly suitable for studies on surface spin waves and other low energy electronic energy losses. Contrary to previous designs high resolution is maintained even for diffuse inelastic scattering due to a specific management of the angular aberrations in combination with an angle aperture. The performance of the instrument is demonstrated with high resolution energy loss spectra of surface spin waves on a cobalt film deposited on the Cu(100) surface.     

Elastic peak electron spectroscopy

Elastic peak electron spectroscopy (EPES) determines the elastic peak intensity N (E_p) in absolute units (percentage). The experimental curve N (E_p) is affected by the type of electron spectrometer used (CMA, RFA, etc.) and represents the probability P_e (E, Z) of elastic electron reflection detected by the angular window of the spectrometer. P_e (E, Z) = N_Aσ_eff (E, Z) Δ is the product of the inelastic mean free path Δ, the density N_A of atoms and the effective elastic scattering cross-section σ_eff (E, Z). Elementary processes of elastic scattering are treated with a simplified model based on a single scattering process. A more refined analysis will be to use the Monte-Carlo approach. σ_eff is given by the differential elastic scattering cross-section determined by the atomic number Z, the energy E_p, and the input and scattering angles. Results of σ_eff (E, Z) are presented based on tabulated differential cross-section data published in the literature. Angular effects are discussed. A number of EPES applications are described for AES, plasmon-, ionization-, and low energy loss spectroscopies and SEM. EPES has been successful in the experimental determination of the inelastic mean free path Δ for a number of elements and compounds.     

Neutron scattering studies of BiFeO3 multiferroics: a review for microscopists

Application of the neutron scattering technique in the study of crystal and magnetic properties of multiferroic BiFeO₃ is presented. The crucial role of the neutron scattering technique, complementary to X-ray diffraction method and transmission electron microscopy, is shown. Especially the ultra high-resolution time-of-flight (TOF) neutron diffraction technique used by Sosnowska et al. to detect the magnetic cycloid ordering and its role in studies of physical properties of BiFeO₃ and its alloys are reviewed. The first inelastic neutron scattering patterns of magnetic excitations in BiFeO₃ are also presented. Applications of different microscopy techniques such as transmission electron microscopy (TEM), scanning electron microscopy ( SEM), field emission TEM and SEM (FESEM and FETEM), magnetic force microscope (MFM) and polarization force microscopy (PFM) bring insight on the fundamental problem of ferroelectricity and confirm the potential of BiFeO₃ multiferroic material for nanoscale devices.     

中子斩盘斩束效果的模拟计算

转盘式中子斩波器广泛地应用于飞行时间模式中子散射谱仪上,斩盘斩出的脉冲柬流特性直接影响着谱仪性能。为更好地进行转盘式中子斩波器的设计,采用Mcstas程序软件,分别对单盘和双盘的中子斩波特性进行了模拟计算。获得了相关物理参数对脉冲注量率和发散度的影响关系曲线。通过理论计算可以了解相关物理参数对斩波特性的影响,计算结果可为斩波器的理论设计以及相关物理参数的优化选择提供理论参考。     

Contrast and resolution of scanning transmission electron microscope imaging modes

Image blurring due to delocalization of inelastic events was studied for scanning transmission electron microscopy (STEM) of unstained thin sections. The delocalization probability was obtained from the angular distribution of inelastic scattering, which was calculated from experimental electron loss spectra of organic samples. This probability was implemented in a Monte Carlo program to simulate the effects of multiple scattering and delocalization for STEM images collected by either the annular detector or the spectrometer, and images generated by a combination of these two signals. Depending on the illumination, the detector geometry and the energy-loss range selected for imaging the annular detector image is blurred by a non-negligible fraction of inelastically scattered electrons. Simultaneous acquisition of an inelastic image using a spectrometer allows the blurring to be reduced by calculation of either the ratio or the difference of the two darkfield signals. While inherent nonlinearities reduce the interpretability of ratio-contrast images, difference-contrast improves the visibility of details submerged in a diffuse background without introducing artifacts.     

Characterization of one-dimensional position sensitive detectors with improved efficiency and position resolution for neutron spectrometers

Development and characterization of one-dimentional (1D) position sensitive detectors (PSDs) with improved efficiency and position resolution for neutron scattering applications are reported. The PSDs are characterized for energy resolution, count rate capability, sensitivity, efficiency, position resolution, and uniformity of response over the sensitive length. The studies are carried out to verify the dependence of position resolution on detector geometry, electronic noise, and stopping power of the fill gas. One of the PSDs is mounted on the small angle neutron scattering spectrometer and spectra from CTAB micelle sample are recorded using 5.4 A neutrons. A gain of factors 1.1 and 1.2 is obtained compared to earlier in house made 1D PSD and LND-made 1D PSD, respectively. The diffraction patterns from standard vanadium, nickel, and silicon samples are recorded on a powder diffractometer using newly designed PSDs. Gain in efficiency obtained at shorter wavelength of 0.783 A is by a factor of 1.6. All high pressure PSDs show improvement in the position resolution by 2-3 mm. It is observed that 1D PSD filled with isobutane as stopping gas improves the gamma tolerance and position resolution at lower partial pressures as compared to Kr. It is advantageous to use two or more 36C-type PSDs stacked together. It is economic and gives better efficiency due to scanning more beam height.     

Design and operation of the wide angular-range chopper spectrometer ARCS at the Spallation Neutron Source

The wide angular-range chopper spectrometer ARCS at the Spallation Neutron Source (SNS) is optimized to provide a high neutron flux at the sample position with a large solid angle of detector coverage. The instrument incorporates modern neutron instrumentation, such as an elliptically focused neutron guide, high speed magnetic bearing choppers, and a massive array of (3)He linear position sensitive detectors. Novel features of the spectrometer include the use of a large gate valve between the sample and detector vacuum chambers and the placement of the detectors within the vacuum, both of which provide a window-free final flight path to minimize background scattering while allowing rapid changing of the sample and sample environment equipment. ARCS views the SNS decoupled ambient temperature water moderator, using neutrons with incident energy typically in the range from 15 to 1500 meV. This range, coupled with the large detector coverage, allows a wide variety of studies of excitations in condensed matter, such as lattice dynamics and magnetism, in both powder and single-crystal samples. Comparisons of early results to both analytical and Monte Carlo simulation of the instrument performance demonstrate that the instrument is operating as expected and its neutronic performance is understood. ARCS is currently in the SNS user program and continues to improve its scientific productivity by incorporating new instrumentation to increase the range of science covered and improve its effectiveness in data collection.     

A multi-crystal wavelength dispersive x-ray spectrometer

A multi-crystal wavelength dispersive hard x-ray spectrometer with high-energy resolution and large solid angle collection is described. The instrument is specifically designed for time-resolved applications of x-ray emission spectroscopy (XES) and x-ray Raman scattering (XRS) at X-ray Free Electron Lasers (XFEL) and synchrotron radiation facilities. It also simplifies resonant inelastic x-ray scattering (RIXS) studies of the whole 2d RIXS plane. The spectrometer is based on the Von Hamos geometry. This dispersive setup enables an XES or XRS spectrum to be measured in a single-shot mode, overcoming the scanning needs of the Rowland circle spectrometers. In conjunction with the XFEL temporal profile and high-flux, it is a powerful tool for studying the dynamics of time-dependent systems. Photo-induced processes and fast catalytic reaction kinetics, ranging from femtoseconds to milliseconds, will be resolvable in a wide array of systems circumventing radiation damage.     

Angle-resolving time-of-flight electron spectrometer for near-threshold precision measurements of differential cross sections of electron-impact excitation of atoms and molecules

This article presents a new type of low-energy crossed-beam electron spectrometer for measuring angular differential cross sections of electron-impact excitation of atomic and molecular targets. Designed for investigations at energies close to excitation thresholds, the spectrometer combines a pulsed electron beam with the time-of-flight technique to distinguish between scattering channels. A large-area, position-sensitive detector is used to offset the low average scattering rate resulting from the pulsing duty cycle, without sacrificing angular resolution. A total energy resolution better than 150 meV (full width at half maximum) at scattered energies of 0.5-3 eV is achieved by monochromating the electron beam prior to pulsing it. The results of a precision measurement of the differential cross section for electron-impact excitation of helium, at an energy of 22 eV, are used to assess the sensitivity and resolution of the spectrometer.     

A study of structure inhomogeneities using a neutron double-crystal spectrometer according to the Warren technique: A review

A technique for examining inhomogeneities of materials on a neutron beam using a double-crystal spectrometer is described. The parameters of inhomogeneities are determined from the measured integrated attenuation due to small-angle scattering (the Warren technique for X rays). The theoretical basis for adaptation of this technique to neutron flux measurements is presented, and the scope of its applicability is outlined. Results from examining different materials using this technique are described. Proposals for developing a stationary express method for serial small-angle measurements are formulated.     

Spectroscopy of the cross section of inelastic scattering of electrons in SiO2/Si(100) layered systems

Spectra of the cross section of inelastic scattering of electrons (product of the mean free path of inelastic scattering and its differential cross section) are obtained for SiO₂/Si(100) layered structures from experimental spectra of energy losses of reflected electrons with different energies of primary electrons. Computer simulations of the spectra of the cross section of inelastic scattering of reflected electrons for these layered structures are performed with the use of the dielectric function of the film and substrate materials. It is found that the SiO₂ layer thickness determined through comparisons of experimental and model spectra agrees with results of ellipsometric measurements.     

Primary considerations for image enhancement in high-pressure scanning electron microscopy

The mechanisms of electron beam scattering are examined to evaluate its effect on contrast and resolution in high-pressure scanning electron microscopy (SEM) techniques reported in the literature, such as moist-environment ambient-temperature SEM (MEATSEM) or environmental SEM (ESEM). The elastic and inelastic scattering cross-sections for nitrogen are calculated in the energy range 5–25 keV. The results for nitrogen are verified by measuring the ionization efficiency, and measurements are also made for water vapour. The effect of the scattered beam on the image contrast was assessed and checked experimentally for a step contrast function at 20 kV beam voltage. A considerable degree of beam scattering can be tolerated in high-pressure SEM operation without a significant degradation in resolution. The image formation and detection techniques in high-pressure SEM are considered in detail in the accompanying paper.     

Elemental imaging and resolution in energy-filtered conventional electron microscopy

Energy-filtered transmission electron microscopy (EFEM) was used to image the distributions of uranium and carbon in uranyl acetate stained catalase crystals. The spatial resolution obtained from inelastic C K-edge and U O4,5-edge images, determined from the highest-order reflection in the computed diffraction pattern, was 3.4 nm for both carbon and uranium. The resolution limit imposed by the delocalization of inelastic scattering was estimated from cross-section measurements to be 0.6 nm for U and 0.2 nm for C. Considering both delocalization and the effects of microscope aberrations, for an objective lens chromatic aberration coefficient of 2.8 mm and 10 eV energy window, the calculated resolutions are 2.0 nm for C and 1.2 nm for U. The effects of plural inelastic and elastic-inelastic scattering were sufficiently large to show crystalline structure in unprocessed pre-edge inelastic images. Previously suggested methods for eliminating these artifacts were applied to obtain the compositional information in the catalase EFEM images.