Low dose exposure diagnosis with a transXend detector aiming for iodine-marked cancer detection

The energy resolved computed tomography (CT), which had advantage over conventional CT (twofold higher CT value for iodine contrast agent and being free from beam hardening effect), was shown practical by employing the transXend detector: it measured X-rays as electric current and gave energy distribution of incident X-rays after analysis. This article shows a new application of the transXend detector for estimating the thicknesses of acrylic, iodine, and aluminum in a phantom. For this purpose, the responses of the segment detectors in the transXend detector are changed intentionally with inserting filters. With previously obtained two-dimensional maps for acrylic–iodine and acrylic–aluminum thicknesses, which are shown by the ratios of electric currents measured by the segment detectors, the thickness of materials on the path of the X-rays are obtained by a transmission measurement.     

A Current-Mode Detector for Unfolding X-ray Energy Distribution

To turn the advantage of energy measurement in x-ray transmission diagnosis into practice, we propose a novel detector for the estimation of x-ray energy distribution. This detector consists of several segment detectors arrayed in the direction of x-ray incidence. Each segment detector measures x-rays as current. With unfolding measured currents, the x-ray energy distribution is obtained. The practical application of this detector was verified by estimating the iodine thickness in an acryl phantom.     

Computed tomography reconstruction from two transmission measurements for iodine-marked cancer detection

The authors invented the transXend detector, which measures X-rays as electric currents, and then gives the energy distribution of the X-rays after an unfolding process. In a previous paper, it was shown that the material thickness distributions can be estimated with the transXend detector by using reference points plotted from the electric current ratios, such as the I ₂/I ₁ ? I ₃/I ₁ graph, where I_i denotes the electric current measured by the i-th segment of the transXend detector. In this paper, the tomographic images of iodine, aluminum, and the acrylic those surround the other two materials are reconstructed from their material thickness distributions, which are estimated from two X-ray incidence directions. The X-ray event ratios are also used to estimate the material thickness distributions.