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1.
单粒子微束辐照装置的束流光学计算   总被引:1,自引:0,他引:1  
利用束流光学计算程序TRANSPORT和TURTLE对基于2×3MV串列静电加速器的单粒子微束细胞精确照射装置的束流传输光学进行了一阶近似计算,得到了包括束流包络、束流相图、束斑大小及束流发散程度的相关数据.计算结果表明,对于能量1.5 MeV,经2 mm×2 mm狭缝入射且初始发散角x'~y'≤3mrad的典型质子束...  相似文献   

2.
针对单粒子效应测试对质子束能量的要求,中国原子能科学研究院设计了一台300 MeV/A H_2~+超导回旋加速器,该加速器使用超导线圈实现主磁铁小型化,剥离引出H_2~+离子获得可变能量的质子束。通过调节剥离点位置和分析剥离后质子的轨迹与束流包络,对该加速器引出过程的束流动力学进行了研究,完成了引出过程的物理设计。结果表明,此台加速器可在205~240 MeV、265~300 MeV内连续变能量引出质子,在更低能量范围内有单能量点引出质子的能力。  相似文献   

3.
针对中国原子能科学研究院100 MeV质子回旋加速器上的单粒子效应辐照装置进行了二期管道设计,采用八极磁铁校正法对束流进行了扩束及均匀化,最终在靶上得到了一个30 cm×30 cm、均匀性好于92%的均匀分布的束斑,满足了单粒子效应实验的需求。为降低靶站处的束流能散及中子本底,采用两级降能的方案,在偏转磁铁前放置1个降能片,将能量分为100 MeV和40 MeV两档,并分别针对这两个能量点进行方案设计,束流利用率均在42%以上。公差分析结果表明,四极磁铁对靶上束斑均匀性的影响大于八极磁铁,安装过程中应优先保证四极磁铁的安装公差。  相似文献   

4.
中性束注入器偏转磁铁是剥离束流中剩余离子的关键设备,它与剩余离子吞食器等内部部件构成了中性束注入器的束偏转系统。束偏转系统的性能对中性束注入器束流的品质及其束传输效率发挥着重要作用。本文根据EAST(Experimental Advanced Superconducting Tokamak,EAST)中性束注入器对束偏转系统的要求,对其偏转磁铁各性能参数进行了估算。为中性束注入器设计了一台用以剩余离子180°偏转的偏转磁铁。该偏转磁铁采用H型二极电磁铁结构;其磁极端面设计为138cm×47cm的圆角矩形结构;其线圈设计为每侧2饼,每饼2层,每层8根的串联结构,导线选用外方内圆空心铜导体,以满足偏转磁铁稳态运行的需要。该设计的偏转磁铁在370 A励磁电流条件下,可提供80keV氘离子束偏转所需的磁场。实验测试结果显示:500 A励磁电流稳态运行条件下,偏转磁铁线圈冷却水温升约21.5℃,该设计结构的偏转磁铁满足EAST中性束注入器满参数稳态运行和未来运行参数逐步提高的需要。  相似文献   

5.
对影响单粒子微束装置束品质的因素进行了全面分析,并提出了一种优化单粒子微束装置束品质的方法——用束流发射度精确测量与粒子束聚焦自动调节装置改进单粒子微束装置瞄准器出口束斑。  相似文献   

6.
对宇航微电子器件进行抗质子辐射性能评估时,常利用加速器产生的质子束流来测量其质子单粒子效应截面曲线(σ-E曲线)。基于北京HI-13串列加速器重离子辐照装置,研制了适用于质子能量测量的多叶法拉第筒(MLFC),为今后开展质子单粒子效应辐照实验奠定基础。测试结果表明,研制的MLFC既可测量质子能量和束流强度,也能测量质子束流的能量纯度,这对判定束流是否符合实验要求及调束非常实用。  相似文献   

7.
针对中国原子能科学研究院100 MeV质子回旋加速器上的单粒子效应辐照装置进行了二期管道设计,采用八极磁铁校正法对束流进行了扩束及均匀化,最终在靶上得到了一个30 cm×30 cm、均匀性好于92%的均匀分布的束斑,满足了单粒子效应实验的需求。为降低靶站处的束流能散及中子本底,采用两级降能的方案,在偏转磁铁前放置1个降能片,将能量分为100 MeV和40 MeV两档,并分别针对这两个能量点进行方案设计,束流利用率均在42%以上。公差分析结果表明,四极磁铁对靶上束斑均匀性的影响大于八极磁铁,安装过程中应优先保证四极磁铁的安装公差。  相似文献   

8.
如图1所示,由HI-13引出的束流聚焦在第一狭缝S_1处,通过90°偏转磁铁M_1又重新聚焦于S_2处。S_1与S_2分别为M_1的两侧焦点,距磁铁出入口为2R距离,R为M_1的中心偏转半径。通过S_2后经4.27m的漂移空间进入第一对双四极透镜Q_1与Q_2,再经0.3m的短漂移空间进入单聚焦开关磁铁M_2,这即是分管道前加速器束流传输安排。表1列出偏转磁铁M_1与开关磁铁M_2的指标。  相似文献   

9.
强流质子直线加速器中束晕现象研究   总被引:1,自引:0,他引:1  
从束流包络方程与单粒子运动方程联立模型出发,考虑了纵向能量方程的耦合,研究了强流质子直线加速器中的束晕现象。采用相交间的Poincare截面方法和实空间Poincare截面方法,研究了周期聚焦系统失配的情况下束晕的形成以及加速对束晕形成的影响。  相似文献   

10.
为满足物理实验需要,我们将质子静电加速器分析磁铁真空盒加以保护,成功地加速了H_2~ 和H_5~ 离子。束流经分析磁铁偏转聚焦后进入实验管道,通过如图1所示的装置轰击到靶上。加速H_2~ 、H_3~ 离子束时,分析磁铁出口60cm处石英屏上束流强度分别可达10μA、3.2μA,靶上流强一般被限制在几nA左右,束流能散度0.07%。  相似文献   

11.
西安质子应用装置(XiPAF)中能传输段设有6个束流位置探测器(BPM)用于测量束流位置及相位,要求位置和相位测量分辨率分别好于0.1 mm和1°,绝对位置测量准确度好于±0.5 mm。本文从理论上分析了纽扣型BPM位置测量分辨率与电极长度及电极张角的关系,并结合CST模拟得到最优值,设计分辨率达24.5 μm。离线测试结果表明,BPM样机的电极电容、灵敏度及电极间耦合度均与设计值相符。利用旋转法测量得到BPM样机水平和竖直方向电中心与机械中心的偏差分别为(0.04±0.05) mm和(-1.53±0.05) mm。样机安装在清华大学微型脉冲强子源(CPHS)高能传输段进行测试,测试结果表明,XiPAF BPM位置测量分辨率好于60 μm,相位测量分辨率好于0.74°,绝对位置测量准确度为±0.35 mm。该设计满足西安质子应用装置的要求。  相似文献   

12.
Single ion hit system has been installed in heavy ion microbeam system in JAERI Takasaki for analysis of single event phenomenon in semiconductor devices. The detection and control of a single ion injection to a target have been achieved by combining a beam pulsing system with a gated detection system. The microscopic observation of a track detector hit by a single ion periodically, shows the controls of the hit positions and numbers of incident ions are successful.  相似文献   

13.
14.
Transport of heavy ions through an ion microbeam focusing system can be affected by insufficient vacuum within the beam transport tube. Due to interactions of heavy ions with atoms of residual gas in the vacuum tube of a microbeam facility, the angular, lateral and energy spreading of an ion beam increases prior to focusing, creating a beam halo. This beam halo can produce undesirable effects in some applications of ion microbeam techniques. In order to model this effect, the ion beam angular spread in residual gas has been approximated by Sigmund’s theoretical predictions for small-angle ion multiple scattering (MS), while ion energy loss straggling distributions have been applied for studying the energy spread. The extent of the beam halo has been estimated by combining the results of these calculations with ion optics calculations. Recommendations concerning microbeam focusing due to the vacuum conditions are given for different heavy ions in the MeV energy range.  相似文献   

15.
At the PTB's ion accelerators, a new microbeam facility is now in operation that is capable of delivering single ions, for example, to the nuclei of individual living cells. The wide range of proton and 4He2+ ion energies affords LET-values between 3 and 200 keV/μm. A beam diameter of less than 2 μm outside the vacuum system has been measured and a targeting accuracy of better than 2 μm has been determined. In contrast to other microbeam facilities operated for radiobiological research using mechanical collimators in front of the target to define the beam, the PTB facility utilises beam focusing by quadrupole magnets. The microbeam has a unique ion optical design that incorporates a 90° bending magnet in the beam transport system. This design has the advantage of providing a microbeam basically without scattered particles. Every ion reaching the target is detected by a thin scintillating foil and a photomultiplier tube with efficiency close to 100%. Presently up to 1500 single cells per hour can be automatically irradiated with a chosen number of particles. Procedures and results of first cell irradiations are described as an example.  相似文献   

16.
中国原子能科学研究院建成了100 MeV紧凑型强流质子回旋加速器,其引出能量为75~100 MeV,流强为200μA。安装在回旋加速器狭小磁极气隙的中心区与螺旋静电偏转板是关键部件,其结构设计涉及磁场、高频电场、高压静电场、真空、传热等方面。本文介绍了中心区与螺旋静电偏转板的结构设计及使用情况。在设计过程中,采取加大绝缘距离、优化高频连接结构、增加杂散束流阻拦装置等措施,解决了中心区与螺旋静电偏转板在强流注入时可靠工作的问题。本文对螺旋偏转板进行了传热分析,得出了该螺旋偏转板在强流束注入时的温度分布。设计的中心区和螺旋偏转板已安装在加速器上,20μA/100 MeV的引出束流通过了12h稳定性测试,在加速器测试过程中,中心区工作稳定可靠。  相似文献   

17.
We have implemented a fast switching electrostatic system on the actinides beamline on the ANTARES accelerator at ANSTO, to improve the precision of analyses by accelerator mass spectrometry. This high-energy bouncing system is based on a pair of deflector plates, deflecting in the orbit plane, set at the entrance and exit of the analysing magnet. The design of deflector plates is unique, and it was modelled by SIMION in order to minimize field inhomogenity and fringe field effects. The pair of deflector plates are supplied by a high-voltage amplifier driven by an EPICS-enabled control unit, with two 4 W power supplies providing up to ±10 kV modulation. The high-energy bouncing system is synchronized with the existing low-energy bouncing system. To measure the isotopic ratio with the new system, the magnetic fields of the injector and analysing magnets are set to transmit selected isotopes along the beam line with zero voltage applied. The other isotopes of interest are transmitted by keeping the magnetic fields constant and modulating the voltages on the injector magnet chamber and on the high-energy deflector plates.  相似文献   

18.
An ion microbeam radiation test system has been built for studying radiation-induced charge collection and single event upsets in advanced semiconductor circuits. With this system, it is possible to direct an ion beam of a diameter as small as 1 μm onto a circuit or test structure with a placement accuracy of 1 μm. The components of the system and its operation are described. Applications are described which demonstrate the capabilities of the system  相似文献   

19.
A high resolution focused beam line has been recently installed on the AIFIRA (“Applications Interdisciplinaires des Faisceaux d’Ions en Région Aquitaine”) facility at CENBG. This nanobeam line, based on a doublet-triplet configuration of Oxford Microbeam Ltd. OM-50™ quadrupoles, offers the opportunity to focus protons, deuterons and alpha particles in the MeV energy range to a sub-micrometer beam spot. The beam optics design has been studied in detail and optimized using detailed ray-tracing simulations and the full mechanical design of the beam line was reported in the Debrecen ICNMTA conference in 2008. During the last two years, the lenses have been carefully aligned and the target chamber has been fully equipped with particle and X-ray detectors, microscopes and precise positioning stages. The beam line is now operational and has been used for its first applications to ion beam analysis. Interestingly, this set-up turned out to be a very versatile tool for a wide range of applications. Indeed, even if it was not intended during the design phase, the ion optics configuration offers the opportunity to work either with a high current microbeam (using the triplet only) or with a lower current beam presenting a sub-micrometer resolution (using the doublet-triplet configuration).The performances of the CENBG nanobeam line are presented for both configurations. Quantitative data concerning the beam lateral resolutions at different beam currents are provided. Finally, the first results obtained for different types of application are shown, including nuclear reaction analysis at the micrometer scale and the first results on biological samples.  相似文献   

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