Asymmetrically cut crystal pair as x-ray magnifier for imaging at high intensity laser facilities

The potential of an x-ray magnifier prepared from a pair of asymmetrically cut crystals is studied to explore high energy x-ray imaging capabilities at high intensity laser facilities. OMEGA-EP and NIF when irradiating mid and high Z targets can be a source of high-energy x-rays whose production mechanisms and use as backlighters are a subject of active research. This paper studies the properties and potential of existing asymmetric cut crystal pairs from the National Institute of Standards and Technology (NIST) built in a new enclosure for imaging x-ray sources. The technique of the x-ray magnifier has been described previously. This new approach is aimed to find a design that could be used at laser facilities by magnifying the x-ray source into a screen far away from the target chamber center, with fixed magnification defined by the crystals' lattice spacing and the asymmetry angles. The magnified image is monochromatic and the imaging wavelength is set by crystal asymmetry and incidence angles. First laboratory results are presented and discussed.     

Scaling studies with the dual crystal spectrometer at the OMEGA-EP laser facility

The dual crystal spectrometer (DCS) is an approved diagnostic at the OMEGA and the OMEGA-EP laser facilities for the measurement of high energy x-rays in the 11-90 keV energy range, e.g., for verification of the x-ray spectrum of backlighter targets of point projection radiography experiments. DCS has two cylindrically bent transmission crystal channels with image plate detectors at distances behind the crystals close to the size of the respective Rowland circle diameters taking advantage of the focusing effect of the cylindrically bent geometry. DCS, with a source to crystal distance of 1.2 m, provides the required energy dispersion for simultaneous detection of x-rays in a low energy channel (11-45 keV) and a high-energy channel (19-90 keV). A scaling study is described for varied pulse length with unchanged laser conditions (energy, focusing). The study shows that the Kα line intensity is not strongly dependent on the length of the laser pulse.     

Sub-MeV tunably polarized X-ray production with laser Thomson backscattering

Reported in this article is the generation of unique polarized x-rays in the sub-MeV region by means of the Thomson backscattering of the Nd:YAG laser photon with a wavelength of 1064 nm on the 150 MeV electron from the microtron accelerator. The maximum energy of the x-ray photons is estimated to be about 400 keV. The total energy of the backscattered x-ray pulse is measured with an imaging plate and a LYSO scintillator. The angular divergence of the x-rays is also measured by using the imaging plate. We confirm that the x-ray beam is polarized according to the laser polarization direction with the Compton scattering method. In addition, we demonstrate the imaging of the object shielded by lead with the generated x-rays.     

Differential phase contrast x-ray microimaging with scanning-imaging x-ray microscope optics

A novel x-ray microimaging system that consists of a scanning microscope optics with a one-dimensional focusing (line-focusing) device and an imaging microscope optics with a one-dimensional objective is developed. These two optical systems are set normal to each other regarding the optical axis. A two-dimensional image is obtained with one-dimensional translation scan of the line probe. During scans, positional data in the normal to the scanning direction are obtained simultaneously with the imaging microscope optics. Differential phase contrast (DPC) image and absorption contrast (AC) image can be arbitrarily obtained by image processing after data acquisition. Preliminary experiment has been carried out by using a couple of one-dimensional Fresnel zone plate as the linear-focusing device and the one-dimensional objective. Two-dimensional DPC and AC images of test sample have been successfully obtained with 8 keV x-rays.     

Monochromatic x-ray radiography for areal-density measurement of inertial fusion energy fuel in fast ignition experiment

Ultrafast, two-dimensional x-ray imaging is an important diagnostics for the inertial fusion energy research, especially in investigating implosion dynamics at the final stage of the fuel compression. Although x-ray radiography was applied to observing the implosion dynamics, intense x-rays emitted from the high temperature and dense fuel core itself are often superimposed on the radiograph. This problem can be solved by coupling the x-ray radiography with monochromatic x-ray imaging technique. In the experiment, 2.8 or 5.2 keV backlight x-rays emitted from laser-irradiated polyvinyl chloride or vanadium foils were selectively imaged by spherically bent quartz crystals with discriminating the out-of-band emission from the fuel core. This x-ray radiography system achieved 24?μm and 100 ps of spatial and temporal resolutions, respectively.     

Development of a short duration backlit pinhole for radiography on the National Ignition Facility

Experiments on the National Ignition Facility (NIF) will require bright, short duration, near-monochromatic x-ray backlighters for radiographic diagnosis of many high-energy density systems. This paper details a vanadium pinhole backlighter producing (1.8±0.5)×10(15) x-ray photons into 4π sr near the vanadium He-like characteristic x-ray energy of 5.18 keV. The x-ray yield was quantified from a set of Ross filters imaged to a calibrated image plate, with the Dante diagnostic used to confirm the quasimonochromatic nature of the spectrum produced. Additionally, an x-ray film image shows a source-limited image resolution of 26?μm from a 20?μm diameter pinhole.     

Efficient Kalpha x-ray source from submillijoule femtosecond laser pulses operated at kilohertz repetition rate

We report an efficient Cu K(alpha) x-ray source produced by focusing submillijoule, 120 fs Ti:sapphire laser pulses on a solid copper target to a spot diameter of few microns. The experimental results show strong emission of K(alpha) x-rays from solid targets from microplasmas created by p-polarized 0.2-0.3 mJ laser pulses at 1 kHz repetition rate. We have demonstrated K(alpha) x-ray point source emission rates of 6.7 x 10(9) photonss into 2 pi sr at 1 kHz repetition rate. The source has an x-ray conversion efficiency into Cu K(alpha) line emission of 3.2 x 10(-5). The source has a measured size of approximately 8 microm. Such a high repetition rate K(alpha) x-ray source can be very useful for time resolved x-ray diffraction and radiographic applications.     

COBRA-STAR, a five frame point-projection x-ray imaging system for 1 MA scale wire-array Z pinches

A new imaging system for 1 MA scale wire-array Z-pinch experiments that produces up to five high-resolution x-ray images per experimental pulse has been developed. Calibrated areal density measurements of the Z-pinch plasma can be obtained from each pulse. The system substitutes five molybdenum (Mo) X pinches for the normal copper return-current conductors to provide point sources of x-rays for point-projection radiography. Each backlighting X pinch consists of four Mo wires, the x-ray burst timing of which was controlled by varying the wire diameter (mass) from 10.2 to 30 microm in the five X pinches. Typical images have a 16x8 mm2 field of view at the wire array and a magnification of about 6.5:1 on the x-ray-sensitive film. Titanium (Ti) filters in front of the films transmit continuum radiation in the spectral range of 3-5 keV. Inclusion on the Ti of a step wedge having known thickness increments of the same material as the wires enables the calibrated areal density measurements to be made of the exploding wire plasmas. Here, we used tungsten (W) step wedges with step thicknesses ranging from 0.015 to 1.1 microm to obtain accurate (+/-10%) areal density measurements of W plasmas from the spatial profile of film exposure. When imaging arrays that produce intense radiation pulses, a plastic monofilament "quencher" is placed on axis to avoid film saturation. Images have subnanosecond temporal resolution and about 7 microm spatial resolution.     

High-energy x-ray backlighter spectrum measurements using calibrated image plates

The x-ray spectrum between 18 and 88 keV generated by a petawatt laser driven x-ray backlighter target was measured using a 12-channel differential filter pair spectrometer. The spectrometer consists of a series of filter pairs on a Ta mask coupled with an x-ray sensitive image plate. A calibration of Fuji? MS and SR image plates was conducted using a tungsten anode x-ray source and the resulting calibration applied to the design of the Ross pair spectrometer. Additionally, the fade rate and resolution of the image plate system were measured for quantitative radiographic applications. The conversion efficiency of laser energy into silver Kα x rays from a petawatt laser target was measured using the differential filter pair spectrometer and compared to measurements using a single photon counting charge coupled device.     

Application of a transmission crystal x-ray spectrometer to moderate-intensity laser driven sources

In the pursuit of novel, laser-produced x-ray sources for medical imaging applications, appropriate instrumental diagnostics need to be developed concurrently. A type of transmission crystal spectroscopy has previously been demonstrated as a survey tool for sources produced by high-power and high-energy lasers. The present work demonstrates the extension of this method into the study of medium-intensity laser driven hard x-ray sources with a design that preserves resolving power while maintaining high sensitivity. Specifically, spectroscopic measurements of characteristic Kα and Kβ emissions were studied from Mo targets irradiated by a 100 fs, 200 mJ, Ti: sapphire laser with intensity of 10(17) W/cm(2) to 10(18) W∕cm(2) per shot. Using a transmission curved crystal spectrometer and off-Rowland circle imaging, resolving powers (E/ΔE) of around 300 for Mo Kα(2) at 17.37 keV were obtained with an end-to-end spectrometer efficiency of (1.13 ± 0.10) × 10(-5). This sensitivity is sufficient for registering x-ray lines with high signal to background from targets following irradiation by a single laser pulse, demonstrating the utility of this method in the study of the development of medium-intensity laser driven x-ray sources.     

X-ray imaging with grazing-incidence microscopes developed for the LIL program

This article describes x-ray imaging with grazing-incidence microscopes, developed for the experimental program carried out on the Ligne d'Integration Laser (LIL) facility [J. P. Le Breton et al., Inertial Fusion Sciences and Applications 2001 (Elsevier, Paris, 2002), pp. 856-862] (24 kJ, UV-0.35 nm). The design includes a large target-to-microscope (400-700 mm) distance required by the x-ray ablation issues anticipated on the Laser MégaJoule facility [P. A. Holstein et al., Laser Part. Beams 17, 403 (1999)] (1.8 MJ) which is under construction. Two eight-image Kirkpatrick-Baez microscopes [P. Kirkpatrick and A. V. Baez J. Opt. Soc. Am. 38, 766 (1948)] with different spectral wavelength ranges and with a 400 mm source-to-mirror distance image the target on a custom-built framing camera (time resolution of approximately 80 ps). The soft x-ray version microscope is sensitive below 1 keV and its spatial resolution is better than 30 microm over a 2-mm-diam region. The hard x-ray version microscope has a 10 microm resolution over an 800-microm-diam region and is sensitive in the 1-5 keV energy range. Two other x-ray microscopes based on an association of toroidal/spherical surfaces (T/S microscopes) produce an image on a streak camera with a spatial resolution better than 30 microm over a 3 mm field of view in the direction of the camera slit. Both microscopes have been designed to have, respectively, a maximum sensitivity in the 0.1-1 and 1-5 keV energy range. We present the original design of these four microscopes and their test on a dc x-ray tube in the laboratory. The diagnostics were successfully used on LIL first experiments early in 2005. Results of soft x-ray imaging of a radiative jet during conical shaped laser interaction are shown.     

A photodiode amplifier system for pulse-by-pulse intensity measurement of an x-ray free electron laser

We have developed a single-shot intensity-measurement system using a silicon positive-intrinsic-negative (PIN) photodiode for x-ray pulses from an x-ray free electron laser. A wide dynamic range (10(3)-10(11) photons/pulse) and long distance signal transmission (>100 m) were required for this measurement system. For this purpose, we developed charge-sensitive and shaping amplifiers, which can process charge pulses with a wide dynamic range and variable durations (ns-μs) and charge levels (pC-μC). Output signals from the amplifiers were transmitted to a data acquisition system through a long cable in the form of a differential signal. The x-ray pulse intensities were calculated from the peak values of the signals by a waveform fitting procedure. This system can measure 10(3)-10(9) photons/pulse of ~10 keV x-rays by direct irradiation of a silicon PIN photodiode, and from 10(7)-10(11) photons/pulse by detecting the x-rays scattered by a diamond film using the silicon PIN photodiode. This system gives a relative accuracy of ~10(-3) with a proper gain setting of the amplifiers for each measurement. Using this system, we succeeded in detecting weak light at the developmental phase of the light source, as well as intense light during lasing of the x-ray free electron laser.     

Characterization of pyrocarbon coated materials using laboratory based x-ray phase contrast imaging technique

In-line x-ray phase contrast is an emerging x-ray imaging technique that promises to improve the contrast in x-ray imaging process. This technique is most suited for x-ray imaging of soft materials, low atomic number elements such as carbon composite fibers, very thin coatings, etc. We have used this new emerging technique for visualization and characterization of the pyrocarbon coated materials using a combination of microfocus x-ray source and x-ray charge coupled device detector. These studies are important for characterization of coating and optimization of various process parameters during deposition. These experiments will help us to exploit the potential of this technique for studies in other areas of material science such as characterization of carbon fibered structures and detection of cracks and flaws in materials. The characterization of the imaging system and optimization of some process parameters for carbon deposition are also described in detail.     

Talbot-Lau x-ray interferometry for high energy density plasma diagnostic

High resolution density diagnostics are difficult in high energy density laboratory plasmas (HEDLP) experiments due to the scarcity of probes that can penetrate above solid density plasmas. Hard x-rays are one possible probe for such dense plasmas. We study the possibility of applying an x-ray method recently developed for medical imaging, differential phase-contrast with Talbot-Lau interferometers, for the diagnostic of electron density and small-scale hydrodynamic instabilities in HEDLP experiments. The Talbot method uses micro-periodic gratings to measure the refraction and ultra-small angle scatter of x-rays through an object and is attractive for HEDLP diagnostic due to its capability to work with incoherent and polychromatic x-ray sources such as the laser driven backlighters used for HEDLP radiography. Our paper studies the potential of the Talbot method for HEDLP diagnostic, its adaptation to the HEDLP environment, and its extension of high x-ray energy using micro-periodic mirrors. The analysis is illustrated with experimental results obtained using a laboratory Talbot interferometer.     

Characterizing high energy spectra of NIF ignition Hohlraums using a differentially filtered high energy multipinhole x-ray imager

Understanding hot electron distributions generated inside Hohlraums is important to the national ignition campaign for controlling implosion symmetry and sources of preheat. While direct imaging of hot electrons is difficult, their spatial distribution and spectrum can be deduced by detecting high energy x-rays generated as they interact with target materials. We used an array of 18 pinholes with four independent filter combinations to image entire Hohlraums with a magnification of 0.87× during the Hohlraum energetics campaign on NIF. Comparing our results with Hohlraum simulations indicates that the characteristic 10-40 keV hot electrons are mainly generated from backscattered laser-plasma interactions rather than from Hohlraum hydrodynamics.     

X-ray grating interferometer for materials-science imaging at a low-coherent wiggler source

X-ray phase-contrast radiography and tomography enable to increase contrast for weakly absorbing materials. Recently, x-ray grating interferometers were developed that extend the possibility of phase-contrast imaging from highly brilliant radiation sources like third-generation synchrotron sources to non-coherent conventional x-ray tube sources. Here, we present the first installation of a three grating x-ray interferometer at a low-coherence wiggler source at the beamline W2 (HARWI II) operated by the Helmholtz-Zentrum Geesthacht at the second-generation synchrotron storage ring DORIS (DESY, Hamburg, Germany). Using this type of the wiggler insertion device with a millimeter-sized source allows monochromatic phase-contrast imaging of centimeter sized objects with high photon flux. Thus, biological and materials-science imaging applications can highly profit from this imaging modality. The specially designed grating interferometer currently works in the photon energy range from 22 to 30 keV, and the range will be increased by using adapted x-ray optical gratings. Our results of an energy-dependent visibility measurement in comparison to corresponding simulations demonstrate the performance of the new setup.     

Images of the laser entrance hole from the static x-ray imager at NIF

The static x-ray imager at the National Ignition Facility is a pinhole camera using a CCD detector to obtain images of Hohlraum wall x-ray drive illumination patterns seen through the laser entrance hole (LEH). Carefully chosen filters, combined with the CCD response, allow recording images in the x-ray range of 3-5 keV with 60?μm spatial resolution. The routines used to obtain the apparent size of the backlit LEH and the location and intensity of beam spots are discussed and compared to predictions. A new soft x-ray channel centered at 870 eV (near the x-ray peak of a 300 eV temperature ignition Hohlraum) is discussed.     

Inspection of refractive X-ray lenses using high-resolution differential phase contrast imaging with a microfocus X-ray source

A refractive x-ray lens was characterized using a magnifying cone beam setup for differential phase contrast imaging in combination with a microfocus x-ray tube. Thereby, the differential and the total phase shift of x rays transmitted through the lens were determined. Lens aberrations have been characterized based on these refractive properties.     

Absolute x-ray energy calibration over a wide energy range using a diffraction-based iterative method

In this paper, we report a method of precise and fast absolute x-ray energy calibration over a wide energy range using an iterative x-ray diffraction based method. Although accurate x-ray energy calibration is indispensable for x-ray energy-sensitive scattering and diffraction experiments, there is still a lack of effective methods to precisely calibrate energy over a wide range, especially when normal transmission monitoring is not an option and complicated micro-focusing optics are fixed in place. It is found that by using an iterative algorithm the x-ray energy is only tied to the relative offset of sample-to-detector distance, which can be readily varied with high precision of the order of 10(-5) -10(-6) spatial resolution using gauge blocks. Even starting with arbitrary initial values of 0.1 A?, 0.3 A?, and 0.4 A?, the iteration process converges to a value within 3.5 eV for 31.122 keV x-rays after three iterations. Different common diffraction standards CeO(2), Au, and Si show an energy deviation of 14 eV. As an application, the proposed method has been applied to determine the energy-sensitive first sharp diffraction peak of network forming GeO(2) glass at high pressure, exhibiting a distinct behavior in the pressure range of 2-4 GPa. Another application presented is pair distribution function measurement using calibrated high-energy x-rays at 82.273 keV. Unlike the traditional x-ray absorption-based calibration method, the proposed approach does not rely on any edges of specific elements, and is applicable to the hard x-ray region where no appropriate absorption edge is available.     

Determination of the saturation thickness and albedo factors for mercury(II) oxide and lead(II) oxide

It is important to know the saturation thickness and reflecting power of a target for accurate x-ray analysis. In the present work, the saturation thickness was determined by using photons scattered from mercury(II) oxide and lead(II) oxide targets. Also, albedo factors (albedo number, albedo energy and albedo dose) were determined experimentally. Mercury(II) oxide and lead(II) oxide were excited by 59.54 keV gamma rays emitted from a ²⁴¹Am annular radioactive source with 5 Ci activity by energy dispersive x-ray fluorescence. The scattered and emitted x-rays were counted by a high-purity germanium detector with a resolution of 182 eV at 5.9 keV at a scattering angle of 168^o. The saturation thickness decreased with the increasing mean atomic number. The albedo factors decreased with increasing target thickness.