共查询到20条相似文献,搜索用时 78 毫秒
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作为一种新型低温无铅焊料,Sn-Bi基低温无铅焊料具有较低的熔化温度以及优良的焊接性能,在电子封装领域有着广泛的应用。随着电子元器件向微型化方向的发展,对低温无铅焊料的性能提出了更高的要求。添加微量的合金元素及纳米颗粒可以改善焊料的组织性能,满足电子元器件发展的需求。系统介绍了Sn-Bi基低温无铅焊料的组成、结构以及焊接性能,综述了合金元素和纳米颗粒对Sn-Bi基低温无铅焊料组织性能的影响及作用机理,分析了在研制Sn-Bi基低温无铅焊料过程中存在的不足之处,并提出了相应的改进方法。最后对Sn-Bi基低温无铅焊料在发展中需要关注的问题进行了总结与展望。 相似文献
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Sn—Ag—Cu无铅焊料性能研究 总被引:2,自引:0,他引:2
环保和微电子器件高度集成化的发展驱动了高性能无铅焊料的研究和开发,Sn—Ag-Cu系无铅焊料由于具有良好的焊接性能和使用性能,已逐渐成为一种通用电子无铅焊料。文章通过实验的方法,研究了8种不同配比的Sn—Ag—Cu焊料中银、铜含量对合金性能(包括熔点、润湿性和剪切强度)的影响,并对焊料的显微组织进行对比与分析,得出低银焊料的可靠性比高银焊料好,同时Sn-2.9Ag—1.2Cu的合金具有较低的熔点且铺展性好,为确定综合性能最佳的该系焊料合金提供了依据。 相似文献
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Sn-Zn无铅焊料由于熔点接近Sn-Pb,价格低廉、无毒性、力学性能优良等特点,倍受人们的关注。然而由于Zn的表面活性高,在钎焊过程中焊料容易氧化,导致了润湿性能下降。本文综述合金元素对Sn-Zn无铅焊料氧化性能、润湿性的影响。并对Sn-Zn焊料今后的研究方向进行了简要分析。 相似文献
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从理论上来讲,焊料、元件、PCB全部无铅化的效果最好。但目前由于种种原因,尤其是元件方面还不能实现全部无铅化。通过前两期的介绍使我们了解到:有铅和无铅混用时,无论是有铅焊料与无铅元件还是无铅焊料与有铅元件混用,都可能发生焊料合金与焊端或引脚镀层、焊料合金与PCB镀层、元器件与工艺、PCB材料及涂镀层与工艺不相容的问题。因此过渡阶段有铅、无铅混用必须注意材料的相容性。 相似文献
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无铅焊料在清华大学的研究与发展 总被引:2,自引:0,他引:2
清华大学材料科学与工程系电子材料与封装技术研究室研制了6个系列的无铅焊料:Sn-3.5Ag添加Cu或Bi; Sn-3.5Ag-1.0Cu添加In或Bi; Sn-Ag-Cu-In添加Bi; Sn-Ag-Cu添加Ga; Sn-Zn添加Ga; Sn-Zn添加多种元素。重点介绍了Sn-Zn添加多种元素。对6个系列无铅焊料的研究取得了较好的实验结果,得到比较理想的低温焊料体系,有的合金熔点已非常接近铅锡共晶焊料熔点183℃。 相似文献
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Sn-Ag-In系焊料的实用化与今后的课题 总被引:3,自引:0,他引:3
焊料合金低融点化是实现无铅化的关键技术。经研究表明,Sn-Ag-In系焊料在焊接可靠性方面能够满足要求,有广阔的应用前景。 相似文献
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Nanoparticles of the Lead-free Solder Alloy Sn-3.0Ag-0.5Cu with Large Melting Temperature Depression
Chang Dong Zou Yu Lai Gao Bin Yang Xin Zhi Xia Qi Jie Zhai Cristina Andersson Johan Liu 《Journal of Electronic Materials》2009,38(2):351-355
Due to the toxicity of lead (Pb), Pb-containing solder alloys are being phased out from the electronics industry. This has
lead to the development and implementation of lead-free solders. Being an environmentally compatible material, the lead-free
Sn-3.0Ag-0.5Cu (wt.%) solder alloy is considered to be one of the most promising alternatives to replace the traditionally
used Sn-Pb solders. This alloy composition possesses, however, some weaknesses, mainly as a result of its higher melting temperature
compared with the Sn-Pb solders. A possible way to decrease the melting temperature of a solder alloy is to decrease the alloy
particle size down to the nanometer range. The melting temperature of Sn-3.0Ag-0.5Cu lead-free solder alloy, both as bulk
and nanoparticles, was investigated. The nanoparticles were manufactured using the self-developed consumable-electrode direct
current arc (CDCA) technique. The melting temperature of the nanoparticles, with an average size of 30 nm, was found to be
213.9°C, which is approximately 10°C lower than that of the bulk alloy. The developed CDCA technique is therefore a promising
method to manufacture nanometer-sized solder alloy particles with lower melting temperature compared with the bulk alloy. 相似文献
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表面封装用无铅软钎料的接头强度及熔点范围的研究 总被引:6,自引:1,他引:5
研究了Bi的添加量,对电子表面封装(SMT)用Sn-Ag近共晶无铅软钎料钎焊接头抗拉强度和熔点及熔点范围的影响。随着Bi含量的增加,钎焊接头抗拉强度也随着增加,同时钎料的液固相线温度均降低。当Bi的含量达到5%时,抗拉强度增加快;Bi的添加量大于5%时,抗拉强度上升缓慢。在Bi的含量增加时,熔点温度范围也逐渐变宽,使得凝固时间变长,这对于表面组装中的电子元件与器件的焊接是非常不利的。故在Sn-Ag近共晶无铅软钎料中Bi的添加量,应加以适当的控制。 相似文献
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研制开发熔点在260 ℃以上的高温无铅钎料来代替传统的高铅钎料运用于电子封装一直是钎焊领域的一大难题。熔点约为272 ℃的Bi-2.6 Ag-5 Sb钎料合金因润湿性和焊接可靠性不良在运用上受到限制。文中通过在Bi-2.6 Ag-5 Sb钎料合金中添加微量元素Cu来改善B-i2.6 Ag-5 Sb合金的润湿性及焊接可靠性。研究结果表明,Cu含量对BiAgSbCu系钎料合金熔点影响较小,当Cu含量为2 %时,润湿性及焊接可靠性最佳。 相似文献
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Yueli Liu Guoyun Tian Gale S. Johnson R.W. Crane L. 《Electronics Packaging Manufacturing, IEEE Transactions on》2006,29(1):1-9
Three underfill options compatible with lead-free assembly have been evaluated: capillary underfill, fluxing underfill, and corner bond underfill. Chip scale packages (CSPs) with eutectic Sn/Pb solder were used for control samples. Without underfill, lead-free and Sn/Pb eutectic drop test results were comparable. Capillary flow underfills, dispensed and cured after reflow, are commonly used in CSP assembly with eutectic Sn/Pb solder. With capillary flow underfill, the drop test results were significantly better with lead-free solder assembly than with Sn/Pb eutectic. Fluxing underfill is dispensed at the CSP site prior to CSP placement. No solder paste is printed at the site. The CSP is placed and reflowed in a standard reflow cycle. A new fluxing underfill developed for compatibility with the higher lead-free solder reflow profiles was investigated. The fluxing underfill with lead-free solder yielded the best drop test results. Corner bond underfill is dispensed as four dots corresponding to the four corners of the CSP after solder paste print, but before CSP placement. The corner bond material cures during the reflow cycle. It is a simpler process compared to capillary or fluxing underfill. The drop test results with corner bond were intermediate between no underfill and capillary underfill and similar for both lead-free and Sn/Pb eutectic solder assembly. The effect of aging on the drop test results with lead-free solder and either no underfill or corner bond underfill was studied. Tin/lead solder with no underfill was used for control. This test was to simulate drop performance after the product has been placed in service for some period of time. There was degradation in the drop test results in all cases after 100 and 250 h of storage at 125/spl deg/C prior to the drop test. The worst degradation occurred with the lead-free solder with no underfill. 相似文献