异质结双极型晶体管SPICE模型及其参数提取

将异质结双极型晶体管(HBT)模型分为本征模型和外模型,并综合考虑了异质结双极型晶体管的寄生效应、空间电荷区的复合效应、隧道效应、热效应和重搀杂效应等因数,应用VC 语言编制提取HBT模型参数软件包,根据HBT的物理参数模拟了HBT的Ⅰ-Ⅴ特性、差分电路的稳态特性和瞬态特性,并与实验结果相对比,验证了HBT模型的正确性.     

fT为75GHz的SiGe基区异质结双极晶体管

报道了具有最高单位电流增益截止频率（fT)的Si异质结双极晶体管（HBT）的制作，器件的fT值达75GHz，集电极－基极偏压1V，本征基区层电阻（Rbi)17kΩ/□，发射极宽0．9um，该器件用SiGe作基底材料，采用多发射极双极工艺制作，其75GHZ的性能指标几乎比Si双极晶体管的速度提高一倍，45nm基区中的Ge是缓变的，这样就产生了约为20kV/cm的漂移电场，因而本征渡越时间仅为1．9ps。     

异质结双极晶体管的最新进展

八十年代以来，微波半导体技术的迅速发展，应用领域不断扩大，为适应微波、毫米波半导体技术的发展，近年来已出现不少新结构、新器件，如异质结双极晶体管（HBT）、高电子迁移李晶体管（HEMT）、双极反型沟道场效应晶体管（BiCFET）调制掺杂场效应晶体管（MOFET）、谐振隧道晶体管（RTT）、负阻效应晶体管（NBERFET）、毫米波混合隧道雪崩渡越时间（MITATT）二极管、超导器件及量子器件等。本文主要叙述异质结双板晶体管的最新进展及其应用。     

硅异质结和赝异质结双极器件研究进展

本文作者结合自己的工作，综述了硅异质结和赝异质结双极器件的研究进展，指出ＧｅＳｉ ＨＢＴ将成为双极结构的主流技术，硅赝异质结器件也将在低温应用等方面显示出优势。     

国外异质结双极晶体管的发展

随着微波半导体技术的发展，近年来出现不少新结构、新器件。本文介绍国外异质结双极晶体管的发展，包括ＡｌＧａＡｓ／ＧａＡｓ，ＩｎＰ／ＩｎＧａＡｓ，ＧｅＳｉ等开发现状和性能参数达到的水平。     

SiGe／Si异质结双极晶体管

介绍了ＳｉＧｅ／Ｓｉ异质结双极晶体管的特点，自对准ＨＢＴ、非自对准ＨＢＴ的结构以及通过低温热循环、ＳＰＯＴＥＬ、重硼掺杂等工艺使ｆＴ从２０ＧＨｚ增至１１０ＧＨｚ的方法。     

一种改进的InP HBT小信号模型的直接提取法

提出了一种改进的直接提取方法来提取InP HBT小信号等效电路中的模型参数,并将其成功地应用InP异质结双极晶体管（HBT）小信号等效电路。在所采用的模型中考虑了分布式基极-集电极电容效应。与其他直接参数提取方法相比,该方法从外围寄生元件到内部本征元件依次进行参数提取,提取过程较为清晰。除寄生参数外,其余所有的参数计算均未经过任何简化近似。该方法依赖于S参数的测量,所有等效电路参数直接从S参数数据中提取,而无需任何基于初始值的近似。在0.1 ~ 40 GHz的频率范围内,直接提取法在InP HBT上得到了成功的验证,并在整个频率范围内得到了较好的测量结果与计算结果的一致性。     

An approach for SiGe HBT small-signal modelling up to 40 GHz

In this article, a simple method for the small-signal equivalent-circuit modelling of SiGe heterojunction bipolar transistors (HBTs) fabricated with a 0.13-μm BiCMOS technology is proposed. The presented transistor model is compatible with BiCMOS processes and takes into account the parasitic effects such as substrate effect and the extrinsic capacitances. The parameter-extraction approach is based on the analytically derived equations in conjunction with the optimisation technology. The intrinsic parameters are described as the function of extrinsic resistances. The extrinsic resistances are iteratively extracted by the variance of the intrinsic elements as an optimisation criterion. The proposed modelling approach is validated by SiGe HBTs with 0.2 × 5.9 μm² emitter occupying area from 50 MHz to 40 GHz. The agreements between the measured and modelled data are excellent in the desired frequency range over a wide range of bias points with different bias conditions.     

An approach to determine small-signal model parameters for InP-based heterojunction bipolar transistors

A new method for the extraction of the small-signal model parameters of InP-based heterojunction bipolar transistors (HBT) is proposed. The approach is based on the combination of the analytical and optimization technology. The initial values of the parasitic pad capacitances are extracted by using a set of closed-form expressions derived from cutoff mode S-parameters without any test structure, and the intrinsic elements determined by using the analytical method are described as functions of the parasitic elements. An advanced design system is then used to optimize only the parasitic parameters with very small dispersion of initial values. Good agreement is obtained between simulated and measured results for an InP HBT with 5/spl times/5 /spl mu/m/sup 2/ emitter area over a wide range of bias points up to 40 GHz.     

A complete small-signal HBT model including AC current crowding effect

An improved small-signal equivalent circuit of HBT concerning the AC current crowding effect is proposed in this paper.AC current crowding effect is modeled as a parallel RC circuit composed of Cbi and Rbi,with distributed base-collector junction capacitance also taken into account.The intrinsic portion is taken as a whole and extracted directly from the measured S-parameters in the whole frequency range of operation without any special test structures.An HBT device with a 2 × 20 μm2 emitter-area under three different biases were used to demonstrate the extraction and verify the accuracy of the equivalent circuit.     

SiGe HBT高频噪声等效模型研究

对硅锗异质结双极型晶体管（SiGe HBT）等效高频噪声模型进行了研究,在建模过程中,SiGe HBT的等效电路为小信号准静态等效电路,使用二端口网络噪声相关矩阵技术从实测噪声参数提取基极和发射极的散粒噪声,提取结果与几种散粒噪声模型进行对比分析,重点研究半经验模型建立过程,对半经验模型与常用的噪声模型使用CAD仿真验证,结果表明了半经验模型的有效性、更具准确性,该半经验模型能够用到不同工艺SiGe HBT的高频噪声模拟。     

InAlAs/InGaAs PHEMTs的设计及其110GHz全频段小信号建模

90-nm T-shaped gate InP-based In_0.52Al_0.48As/In_0.6Ga_0.4As pseudomorphic high electron mobility transistors were designed and fabricated with a gate-width of 2×30 μm,a source-drain space of 2.5 μm,and a source-gate space of 0.75 μm.DC,RF and small-signal model characterizations were demonstrated.The maximum saturation current density was measured to be 755 mA/mm biased at V_gs=0.6 V and V_ds=1.5 V.The maximum extrinsic transconductance was measured to be 1006 mS/mm biased at V_ds=—0.1V and V_ds=1.5 V.The extrapolated current gain cutoff frequency and maximum oscillation frequency based on S-parameters measured from 0.5 to 110 GHz were 180 and 264 GHz,respectively.The inflection point（the stability factor k=1）where the slope from-10 dB/decade（MSG） to-20 dB/decade（MAG） was measured to be 83 GHz.The smallsignal model of this device was also established,and the S-parameters of the model are consistent with those measured from 0.5-110 GHz.     

5 GHz无线局域网的锗硅异质结晶体管功率放大器

采用IBM 0.35 μm SiGe BiCMOS工艺设计了一种应用于5 GHz无线局域网的射频功率放大器.功率放大器工作在A类状态,由两级共发射极放大电路组成,并利用自适应偏置技术改善了功放的线性度.输入输出和级间匹配网络都采用片内元件实现.在3.3 V的电源电压下,模拟得到的功率增益为32.7dB;1dB压缩点输出功率为25.7 dBm;最大功率附加效率(PAE)为15%.     

GaAs HBT功率放大器在5 GHz无线局域网的应用

采用2μm GaAs HBT技术实现了单片集成线性功率放大器(PA)在5 GHz无线局域网中的应用.在单端三级功率放大器中应用片上电感和键合线电感对输入,级间网络进行匹配设计,输出匹配网络在PCB上实现.在单独供电3.3 V的情况下,功率放大器的仿真结果是线性输出功率24 dB(1 dB压缩点),小信号增益35 dB,1 dB压缩点处功率附加效率(PAE)39%;GaAsHBT MMIC功率放大器测试呈现线性输出功率20.5 dB(1 dB压缩点),4、信号增益27 dB,1 dB压缩点处功率附加效率(PAE)36%;芯片尺寸仅480 μm×450 μm.     

InP HBT 在0.2GHz 至220 GHz频段稳定性研究

The frequency stabilities of InP DHBTs in a broadband over 1 to 220 GHz are investigated. A hybrid-topology small-signal model is used to accurately capture the parasitics of devices. The model parameters are extracted from measurements analytically. The investigation results show that the excellent agreement between the measured and simulated data is obtained in the frequency range 200 MHz to 220 GHz. The dominant parameters of the-topology model, bias conditions and emitter area have significant effects on the stability factor K. The HBT model can be unconditionally stable by reasonable selection of the proper bias condition and the physical layout of the device.     

InP基PIN HBT光电集成器件的设计与研制

对用于光电集成电路(OEIC)的InP基异质结双极性晶体管(HBT)及PIN探测器进行了设计与研制,讨论了堆叠层结构和共享层结构2种常见的集成方式,通过实验比较,确定了共享层结构器件性能更好,并对此结构进行了改进。所研制的HBT截止频率达到30 GHz,直流增益达到100;PIN的3 dB带宽达到了15 GHz。详细介绍了器件结构及工艺流程。