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Tae Sik Cho Min-Su Yi Ji Wook Jeung Do Young Noh Jin Woo Kim Jung Ho Je 《Journal of Electroceramics》2006,17(2-4):231-234
The sapphire orientation dependence of the microstructure of ZnO thin films has been studied in real-time synchrotron X-ray scattering experiments. The ZnO films with a 2400-Å-thick were grown on sapphire (001) and sapphire (110) substrates at room temperature by radio frequency magnetron sputtering. The as-deposited ZnO film on sapphire (001) has the only (002) crystal grains, while that on sapphire (110) has not only (002) crystal grains but (100) and (101) additional grains. The ZnO films were changed into fully epitaxial ZnO (002) grains both on sapphire (001) and sapphire (110) substrates with increasing the annealing temperature to 600°C. The epitaxial relationships of the ZnO grains were summarized as ZnO (00l)[100]//sapphire (00l)[110] and ZnO (00l)[110]//sapphire (110)[001]. 相似文献
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Effect of vanadium doping on ferroelectric and electrical properties of Bi3.25La0.75Ti3O12 thin film
Bi3.25La0.75Ti3O12 (BLT) and V-doped BLT (BLTV) thin films were prepared on Pt/Ti/SiO2/Si substrates by a pulsed laser deposition method. The effects of V doping on ferroelectric and electrical properties were
investigated by polarization-electric field hysteresis loops and leakage current-voltage measurements. BLTV single phases
were confirmed by X-ray diffraction. Remnant polarization was increased and the leakage current density was decreased by V
doping. The leakage current density of BLT thin films suddenly increased at 100 kV/cm while that of BLTV thin films increased
at the higher electric field of 160 kV/cm. The power law relationship J α En of current density vs. applied electric field is estimated to be J αE2.0 for BLT and J αE1.0 for BLTV thin films. The leakage current of the BLT/Pt junction can be explained by space-charge-limited current. However,
that of the BLTV/Pt junction was characterized by the Schottky emission behavior. 相似文献
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PZT thin films are used extensively in micro electromechanical systems (MEMS) due to its high piezoelectric coefficients.
The electromechanical responses can be optimized by using textured films where the transverse coefficient e31,f is of particular importance for MEMS structures such as cantilevers, bridges and membranes. It has been shown that {100}-textured
PZT of morphotropic composition fabricated by chemical solution deposition (CSD) provides the highest transverse coefficient
[1]. This specific texture can be obtained using a seeding layer of sputter deposited PbTiO3 [2]. However, in a CSD process it is advantageous to also be able to produce the seed layer by chemical methods. The piezoelectric
and dielectric properties of 2 μm PZT film seeded by CSD PbTiO3 measured by a new 4-point bending setup are presented. 相似文献
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Magnetoelectric BiFeO3 (BFO) materials exhibit ferroelectric and ferromagnetic properties simultaneously, therefore they have a potential to be
applied in magnetic as well as ferroelectric devices. BFO thin films were formed by depositing sol-gel solutions on Pt-coated
r-plane sapphire dielectric substrates. We did not observe any secondary phase such as Bi2Fe4O9 on the r-plane sapphire substrates, which is generally observed on Si substrates. We observed small ferroelectric grains
of about 0.1 μm on Pt/sapphire structures. The leakage current density in BFO films was found to be decreased dramatically
after optimizing process conditions of stoichiometric BFO chemical solution. The leakage current densities were in the range
of 10− 7 A/cm2 at room temperature and 10− 9 A/cm2 at 80 K under 0.4 MV/cm applied electric field. The main reason for low leakage current is considered to be reduction of
oxygen vacancies due to the presence of exclusive Fe3 + valance state in the films. An applied electric field higher than 0.5 MV/cm was required to pole the BFO films, which made
it difficult to obtain the saturated polarization at room temperature. We could measure the saturated remanent polarization
in the BFO films at 80 K and the obtained remanent polarization was 100 μC/cm2. 相似文献
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An effective method of fabricating micro and sub micro patterned zinc oxide nanorods without a transient metal catalytic assistants
via hydrothermal synthesis using micro molding technique was presented. Micro molding of sol-gel-derived precursor layer was
clearly accomplised by conformal contact of elastomeric molds with various kinds of patterns. The selective growth of the
nanorods over a large area of the pre-patterned seed layer was observed with a pattern feasibility of 250 nm. The orientation
of the nanorods was normal to the seed layer while characteristic sizes of the rod didn’t show any dependence on the diameter
of the seed particles. Presented synthetic process can provide simpler way of fabricating an array of semiconductor one-dimensional
nanostructures. 相似文献
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采用化学气相沉积和直流溅射沉积方法成功制备了与基体附着力高的不同Pt厚度的Pt/碳纳米管(CNT)膜层。通过扫描电子显微镜(SEM)和能谱分析(EDS)分别对薄膜厚度和表面形貌以及膜层中Pt的含量进行了研究;通过电化学阻抗谱和循环伏安曲线分别对Pt和Pt/CNT对电极的光电催化性进行了研究。结果表明:CNT与基体具有良好的接触性,并且随Pt沉积时间的增加,Pt在CNT薄膜中的含量增加,染料敏化太阳电池(DSSC)的光电转化效率随Pt厚度的增加而增加;与单纯的Pt对电极相比,Pt/CNT对电极具有更高的活性比表面,更低的电子迁移电阻以及更高的还原电流密度;以Pt(80 nm)/CNT为对电极的DSSC具有最高的光电转化效率8.54%;另外,与Pt(80 nm)对电极相比,以Pt(40 nm)/CNT为对电极制备的DSSC具有更高的光电转化效率,因此,该新型对电极结构可大大节省贵金属Pt的用量,在DSSC的应用中具有很大的潜力。 相似文献
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AbstractZnO and ZnO/Graphene thin films were deposited on Cu substrate using a low pressure chemical vapor deposition (LPCVD) and the magnetron sputtering method. The impacts of graphene layer growth and annealing temperature on the optical properties ZnO and ZnO/Graphene thin films were investigated by X-ray diffraction (XRD), Raman spectroscopy, scanning electron microscope (SEM), X-ray photoelectron spectroscopic (XPS), and photoluminescence (PL) measurements respectively. XRD and SEM results reveal that all the thin films preferred the crystalline [001] orientation along the c-axis direction, which were vertical grown on substrate surface. By comparing the results and analysis of their structure, morphology, chemical bonding and optical property, it is proved that using Graphene as a buffer layer can improve the crystal quality of ZnO thin films. For the annealed ZnO/graphene nanostructures, the area ratio of UV and visible emission region of ZnO/graphene thin films increase with increasing the annealing temperature, reaches a maximum at 500?°C and then starts decreasing with further increase in annealing temperature, which indicating that the controllable ZnO/Graphene thin films have the higher crystallization quality at the annealing temperature of 500?°C. Our results demonstrate that for high quality ZnO/graphene thin films deposition, decreasing the defect concentration should be preferable to simply applying the proper annealing temperature, which might have promising applications for various UV photodetectors devices. 相似文献
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Abstract MgTiO3 thin films have been grown on various substrates by pulsed laser deposition (PLD) to investigate the application for microwave dielectrics and optical devices. Highly oriented MgTiO3 thin films were obtained on sapphire (c-plane Al2O3). MgTiO3 thin films deposited on SiO2/Si and platinized silicon (Pt/Ti/SiO2/Si) substrates were polycrystalline nature. MgTiO3thin films grown on sapphire were transparent in the visible and had a sharp absorption edge at 280 nm. These MgTiO3 thin films had extremely fine feature of surface morphology, i.e., rms roughness of 0.87 nm. Dielectric constant and loss of MgTiO3 thin films deposited by PLD were about 24 and 1.5% at 1MHz, respectively. These MgTiO3 thin films also exhibited little dielectric dispersion. 相似文献
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F. K. Shan G. X. Liu W. J. Lee B. C. Shin S. C. Kim 《Journal of Electroceramics》2006,17(2-4):287-292
Gallium-doped ZnO (1.2 at. %) thin films with various thicknesses were deposited on sapphire (001) substrates at 500∘C using a pulsed laser deposition (PLD) technique. The thin films with different thicknesses (20, 40, 100, 200, 400, and 600
nm, respectively) were obtained by changing the deposition time. An x-ray diffractometer (XRD) was used to investigate the
structural properties of the thin films. All of the thin films had a preferred (002) orientation. However, the thin films
with 20 and 40 nm thicknesses were of low crystallinity. With increasing thickness the (002) peak increased greatly, and the
full width at half maximum (FWHM) values were calculated by using omega scans. Scanning electron microscope (SEM) and atomic
force microscope (AFM) were used to investigate the nanoscale phenomena and the surface morphologies of the thin films. The
surface roughness increased as the thickness increased. The thin film with 20 nm thickness was very smooth, and no nucleation
center could be observed. However, the thin film with thickness over 100 nm showed nucleation. The nucleation center varied
with increasing thickness. A spectrometer was used to investigate the luminescent properties of the thin films. It was found
that all of the thin films showed near band edge emissions and no deep-level emissions were observed. A blueshift was also
observed due to the Burstein-Moss effect. 相似文献
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Bharti Sharma Atul Kumar Satya Dev Rakesh Dhar Ram P. Tandon 《Integrated ferroelectrics》2017,184(1):69-74
ABSTRACTThin films of magnesium ferrite (MgFe2O4) are synthesized on the glass substrate by using thermal evaporation technique and studied their anti-bacterial biofilm activity against the gram-negative and gram-positive bacterium. The MgFe2O4 thin films (100 nm) were prepared at a deposition rate of 10 ± 2 Å/S, followed by annealing at 600°C. The morphological and structural study using scanning electron microscope, X-ray diffraction, and transmission electron microscope reveals crystalline structure of the magnesium ferrite. The model organisms for anti-bacterial biofilm activity were tested with E. coli (gram negative) and S. aureus (gram positive). The E. coli and S. aureus biofilms grown on the glass slides and MgFe2O4 coated glass slide were imaged using fluorescent microscope. It is observed that the MgFe2O4 coated glass slides exhibit minimum bacterial growth (both negative and positive bacteria) compared to the uncoated glass slide. 相似文献
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采用射频磁控溅射法在玻璃基片上成功地制备了SmTbCo/Cr非晶垂直磁化膜,对薄膜的磁特性与温度特性进行了研究.薄膜组分为(Sm0.286Tb0.714)31Co69/Cr时,其饱和磁化强度为330kA/m,矫顽力为398kA/m,薄膜的磁各向异性能值高达415kJ/m3;该种薄膜的居里温度在220℃左右,补偿温度在室... 相似文献