扫描探针显微镜在纳米科技中的应用

本文在介绍了扫描探针显微镜的发展和有关纳米科技知识的基础上,论述了扫描显微镜在纳米科技中的应用。     

开放式多功能扫描探针显微镜系统

开放式多功能扫描探针显微镜、集成扫描隧道显微镜、原子力显微镜、横向力显微镜和静电力显微镜．具有接触、半接触和非接触工作模式，可进行作用力、电流、电位、光能量等参数的高度局域综合测量,具有极高的开放性和可扩展性，支持用户进行二次开发。     

扫描探针显微镜在纳米材料表征中的应用

报道了扫描探针显微镜在纳米电子薄膜材料的形貌、晶界、晶粒形状与尺度、表面粗糙度和剖面分析中的具体应用实例,以及纳米磁性薄膜中的微磁畴、铁电材料的微电畴和半导体PN区像等电磁特殊性的可视分析应用。     

扫描探针显微镜在粗糙度、纳米尺寸、表面形貌观测方面的应用

扫描探针显微镜是近十几年来在表面特征表面形貌观测方面最重大的进展之一，是纳米测量学的基本工具，本文叙述了扫描探针显微镜的工作原理、检测模式及在观察检测纳米级的粗糙度、微小尺寸、表面形貌方面的特点和方法，比较了原子力显微镜、常规的表面轮廓仪、干涉显微镜、扫描电子显微镜在表面特性、表面形貌观测方面的性能，着重介绍了扫描探针显微镜在这方面的应用和存在的问题。     

双成象单元扫描探针显微镜在纳米计量中的应用

研制了用于纳米计量的双成象单元扫描隧道显微镜一原子力显微镜，由扫描隧道显微镜参考单元和原子力显微镜被测单元组合而成。两者共用同一XY扫描器，同时对参考样品石墨和被测样品扫描成象。得到的石墨原子晶格参考图象与被测样品图象横向尺度相同，计数前者的原子晶格个数，即可精确测定被测样品图象的尺寸。利用本方法可对任何样品表面的超微观结构进行严格的纳米计量。     

模块化扫描探针显微镜的研究

介绍一种多功能、模块化扫描探针显微镜,它综合了ＳＴＭ、ＡＦＭ、ＭＦＭ、ＦＦＭ等的功能,不仅能检测物质表面微观形貌,还能检测微小静电力、磁力、原子力和摩擦力,具有较好的灵活性和较宽的应用范围。     

压电微音叉扫描探针显微镜测头研究

压电微音叉具有良好的谐振特性，并易于实现其振动的检测。利用这些特性，与钨探针结合，构成了一种新型的表面轮廓扫描测头。该新型测头与X-Y压电工作台结合，采用与TM-AFM相同的工作原理，构成了扫描探针显微镜。介绍了压电微音叉扫描测头的构成、工作原理及主要特性，给出了所构成的扫描探针显微镜测量系统。通过实验及其结果，证明了新型测头具有高垂直分辨率、低破坏力等优点。除此之外，由于采用了有效长度大的钨探针，使大台阶微观表面的测量成为可能。     

双脉冲电导检测技术在离子色谱中的应用

双脉冲电导检测技术克服了电导池双电层极化电容的影响,能较准确地测置出溶液的电导值.本文介绍其工作原理以及在离子色谱中的应用,并讨论实现双脉冲电导检测枝术时,在电导池电路设计、软件编制、器件选用和电路调试方面应注意的问题、     

石英音叉扫描探针显微镜

石英音叉是一种谐振频率稳定、品质因数高的时基器件,其音叉臂的谐振参数(谐振振幅和谐振频率)对微力极其敏感。利用石英音叉对外力的敏感性,与钨探针结合,构成一种新型的表面形貌扫描测头。该测头与xyz压电工作台结合,利用测头音叉臂谐振频率对扫描微力的敏感性,研制基于相位反馈控制的扫描探针显微镜。首先介绍石英音叉测头的构成、工作原理和特性测试,以及由该测头构建的扫描探针显微镜的结构和测试、分析。通过对测头和系统的测试结果分析,系统达到1.2 nm的垂直分辨率,并通过对一维栅的测量,给出扫描获得的试样表面微观形貌图以及相位图,证明系统的有效性。另外,由于采用大长径比的钨探针,该系统具有测量大深宽比微器件表面轮廓的能力。     

Scanning probe microscopy of biological samples and other surfaces

Scanning probe microscopes derived from the scanning tunnelling microscope (STM) offer new ways to examine surfaces of biological samples and technologically important materials. The surfaces of conductive and semiconductive samples can readily be imaged with the STM. Unfortunately, most surfaces are not conductive. Three alternative approaches were used in our laboratory to image such surfaces. 1. Crystals of an amino acid were imaged with the atomic force microscope (AFM) to molecular resolution with a force of order 10^?8 N. However, it appears that for most biological systems to be imaged, the atomic force microscope should be able to operate at forces at least one and perhaps several orders of magnitude smaller. The substitution of optical detection of the cantilever bending for the measurement by electron tunnelling improved the reliability of the instrument considerably. 2. Conductive replicas of non-conductive surfaces enabled the imaging of biological surfaces with an STM with a lateral resolution comparable to that of the transmission electron microscope. Unlike the transmission electron microscope, the STM also measures the heights of the features. 3. The scanning ion conductance microscope scans a micropipette with an opening diameter of 0·04-0·1 μm at constant ionic conductance over a surface covered with a conducting solution (e.g., the surface of plant leaves in saline solution).     

Multi-objective optimal design of high frequency probe for scanning ion conductance microscopy

Scanning ion conductance microscopy(SICM) is an emerging non-destructive surface topography characterization apparatus with nanoscale resolution. However, the low regulating frequency of probe in most existing modulated current based SICM systems increases the system noise, and has difficulty in imaging sample surface with steep height changes. In order to enable SICM to have the capability of imaging surfaces with steep height changes, a novel probe that can be used in the modulated current based hopping mode is designed. The design relies on two piezoelectric ceramics with different travels to separate position adjustment and probe frequency regulation in the Z direction. To further improve the resonant frequency of the probe, the material and the key dimensions for each component of the probe are optimized based on the multi-objective optimization method and the finite element analysis. The optimal design has a resonant frequency of above 10 kHz. To validate the rationality of the designed probe, microstructured grating samples are imaged using the homebuilt modulated current based SICM system. The experimental results indicate that the designed high frequency probe can effectively reduce the spike noise by 26% in the average number of spike noise. The proposed design provides a feasible solution for improving the imaging quality of the existing SICM systems which normally use ordinary probes with relatively low regulating frequency.     

Scanning ion microprobe analysis of composite materials

Applications of scanning ion imaging with high lateral resolution in the microchemical investigation of metal – and ceramic-matrix composites are described. The technique, which combines a scanning ion microprobe with secondary ion mass spectrometry (SIMS), is ideally suited to the study of complex, multicomponent composite structures. Most elements can be detected with good sensitivity, enabling the determination of spatial distributions for major and minor elements. Analytical images obtained with this technique reveal unprecedented chemical information about interfacial segregation and interdiffusion phenomena. As examples, the characterization of both ceramic–matrix (Al borate–SiC) and metal–matrix (Ni alloy–Al₂O₃) composite materials is described.     

Monitoring cell movements and volume changes with pulse-mode scanning ion conductance microscopy

Here we describe the use of pulse‐mode scanning ion conductance microscopy (SICM) to observe volume changes and cell membrane movements during the locomotion of cultured cells in the range of minutes to several hours. The microscope is based on the pulse‐mode SICM previously developed for stable imaging of single cells in culture. Our instrument uses current pulses to control the distance between cell surface and electrode tip as well as a back‐step mode to prevent contact of tip and membrane during lateral movements of the probe. We performed repeated scans of cell surfaces using feedback‐controlled piezoactors to position the electrode. Using patch‐clamp‐type electrode tips the height of cells could reproducibly be measured with a standard deviation of 50 nm. To quantify and separate changes in cell position and volume occurring between consecutive scans, a program was written to subtract images and calculate volume changes. Examples of repeated scans show that membrane movements in the range of 30 min to a few hours can be quantitatively monitored with a lateral resolution of 500 nm using difference images and that faster movements in the range of minutes can be recorded at defined cell sections using the line scan mode. Difference images indicate that volume changes can affect cell surfaces inhomogeneously, emphazising the role of the cytoskeleton in the stabilization of cell shape.     

Integration of a scanning ion conductance microscope into phase contrast optics and its application to the quantification of morphological parameters of selected cells

We have previously described a pulse‐mode scanning ion conductance microscope to investigate membrane surfaces and volume changes of individual cells in culture. We have now developed a miniaturized scanning headstage that enables us to select individual cells for recording under phase contrast optics, considerably improving the selection of individual cells for scanning as well as the positioning of the scanning frames with respect to the position of the cell somata. We show an application in which surfaces and volumes of somata and processes of cultured cells from the central nervous system were quantified separately.     

Scanning electron microscopy of vascular casts

Corrosion casts provide three dimensional replicas that can be examined readily by scanning electron microscopy (SEM). They are prepared by filling vascular networks with polymerizing plastic and then digesting away the tissue. As based on our studies of ocular vessels, this report describes the vascular anatomy, as well as the artifacts, that are encountered during SEM studies of such preparations.     

Scanning tunnelling microscopy of oxidized graphite

Scanning tunnelling microscopy (STM) and transmission electron microscopy (TEM) have been used to investigate the surface of a pyrolitic graphite oxidized in liquid phase by NaClO. Two main features of the oxidized HOPG are revealed by STM. First, a large number of steps of different heights have developed on the graphite surface. These steps can be observed by TEM on another kind of graphite, HSAG 12, but this technique cannot give any information on their heights. Another kind of defect on the previously flat surface of HOPG consists in patches where the surface is rough and perturbed. These domains are very difficult to observe by TEM due to a poor contrast. Thus for the study of surface heterogeneities intentionally created on graphite, STM, providing information along three directions, appears to be complementary of TEM which gives only images of project area.