Dual-wavelength optical head with a wavelength-selective filter for 0.6- and 1.2-mm-thick-substrate optical disks

A dual-wavelength optical head, believed to be new in design, for 0.6- and 1.2-mm-thick-substrate optical disks was developed by use of 650- and 780-nm-wavelength light and a wavelength-selective filter, which reduces the spherical aberration that is due to the difference in substrate thicknesses and restricts the numerical aperture for 780-nm-wavelength light. According to this configuration, both high light power efficiency and wide image field characteristics are obtained, which are suitable not only for read-only but also for recordable or rewritable optical disk systems. A reading operation for a digital video disc and for a compact disc and a recording operation for a phase change optical disk were successfully demonstrated.     

Blue/DVD/CD compatible optical head

Compatibility with Digital Versatile Disc and Compact Disc has been demonstrated for two options of high-density optical disk systems using a blue laser diode. Option 1 (HD DVD) employs a 0.65 numerical aperture objective lens and a 0.6 mm thick protective layer disk, while Option 2 (Blu-ray Disc) employs a 0.85 numerical aperture objective lens and a 0.1 mm thick protective layer disk. An optical head has three laser diodes whose wavelengths are 405 nm, 660 nm, and 785 nm. A spherical aberration caused by the difference in the protective layer thickness of the disk is corrected by an objective lens magnification change, while the numerical aperture of the objective lens is controlled by a wavelength-selective aperture. Experimental results have shown that Option 1 is more preferable, but Option 2 is also acceptable from the viewpoint of the compatibility.     

Simple birefringence measurement method for coated optical disks with a fixed incident angle ellipsometer

In a coated and laminated optical disk, only a reflectance method is available for oblique incidence retardation measurements to evaluate the birefringence in a polycarbonate substrate. I propose a simple measurement method that simultaneously measures both the lateral and vertical birefringence in a coated substrate. In this reflectance method, only two oblique incidence retardation values with a fixed incident angle are measured from the radial and the circumferential directions of the disk. Using the sum and the difference of these two retardation values, we can calculate both birefringences without any cumbersome curve-fitting procedure. This method can easily be introduced into the routine inspection for optical disk manufacturing.     

Subtle effects of the substrate in optical disk data storage systems

Much attention has been focused on the effects of the disk substrate in optical data storage. In particular, substrate birefringence has been studied extensively because it causes significant problems in magneto-optic systems. We investigate certain subtle effects of the substrate, such as feedback into the laser diode, in compact disk and phase-change systems. Our analysis of the compact disk system led us to discover a new technique for the rapid measurement of the substrate birefringence. We also address the question of how focusing the laser beam through the substrate will affect the depth of focus.     

Colors of graphene and graphene-oxide multilayers on various substrates

We investigated the colors of graphene and graphene-oxide multilayers that were deposited on various dielectric layers. In particular, the effects of the material thickness, the types of dielectric layers, and the existence of a back silicon substrate were analyzed. The colors of graphene-oxide layers on a SiO2/Si substrate were found to periodically change as the material thickness increased. However, the colors of graphene layers on the same substrate became saturated without a similar periodic change. The calculated colors corresponding to the material thicknesses were verified by optical microscopy and profilometry. We believe that these results demonstrate the possibility of utilizing color as a simple tool for detecting and estimating the thicknesses of graphene and graphene-oxide multilayers.     

Determining the optical constants of read-write sliders during flying-height testing

Flying-height testers for rigid disk drives employ a transparent glass substrate in place of the magnetic disk and use optical interferometry to measure the flight properties of the read-write slider. Because of the material phase change on reflection, the effective optical constants n and k of the slider play an important role in the measurement. We describe an instrument that determines the optical constants simultaneously with flying height, using polarization interferometry. This in situ analysis of n and k obviates the need for independent ellipsometry, while avoiding the problematic retract calibration characteristic of traditional flying-height test equipment. The rms uncertainty for n and k are 0.04, resulting in height uncertainties that range from 3 nm for 250-nm flying heights down to 0.5 nm at contact. We verify these results by use of a variety of experimental techniques on both laboratory samples and actual read-write sliders.     

Probing heterogeneous electron transfer at an unbiased conductor by scanning electrochemical microscopy in the feedback mode

The theory of the feedback mode of scanning electrochemical microscopy is extended for probing heterogeneous electron transfer at an unbiased conductor. A steady-state SECM diffusion problem with a pair of disk ultramicroelectrodes as a tip and a substrate is solved numerically. The potential of the unbiased substrate is such that the net current flow across the substrate/solution interface is zero. For a reversible substrate reaction, the potential and the corresponding tip current depend on SECM geometries with respective to the tip radius including not only the tip-substrate distance and the substrate radius but also the thickness of the insulating sheath surrounding the tip. A larger feedback current is obtained using a probe with a thinner insulating sheath, enabling identification of a smaller unbiased substrate with a radius that is approximately as small as the tip radius. An intrinsically slow reaction at an unbiased substrate as driven by a SECM probe can be quasi-reversible. The standard rate constant of the substrate reaction can be determined from the feedback tip current when the SECM geometries are known. The numerical simulations are extended to an SECM line scan above an unbiased substrate to demonstrate a "dip" in the steady-state tip current above the substrate center. The theoretical predictions are confirmed experimentally for reversible and quasi-reversible reactions at an unbiased disk substrate using disk probes with different tip radii and outer radii.     

Tilt correction in an optical disk system

A servo system for the correction of disk tilt in optical disk data storage is proposed, and its basic concepts are demonstrated by the use of a static system in which the disk does not spin. Because disk tilt produces primarily coma in the beam focused onto the disk, the system uses a variable coma generator to produce an equal and opposite amount of coma as that caused by the tilted disk. The magnitude and direction of disk tilt are detected by the use of the light reflected from the front facet of the disk substrate.     

Three-dimensional holographic disks

We describe optical disks that store data holographically in three dimensions by using either angle multiplexing or wavelength multiplexing. Data are stored and retrieved in parallel blocks or pages, and each page consists of approximately 10(6) bits. The storage capacity of such disks is derived as a function of disk thickness, pixel size, page size, and scanning parameters. The optimum storage density is approximately 120 bits/μm(2).     

Crystal structure of GeTe and Ge2Sb2Te5 meta-stable phase

Direct X-ray diffraction measurement of the erased state of the Ge–Sb–Te recording layer in a four-layered phase change optical disk, which was produced by an optical disk drive, was performed. It was identified as an fcc crystal structure. In order to carry out the detailed crystal structure analysis by the powder X-ray diffraction method with Rietveld refinements, somewhat larger amount of the fcc crystal powder was prepared from deposited 10 μm thick films. It revealed that Ge₂Sb₂Te₅ belongs to the NaCl type structure (Fm m) with the 4a site including 20% vacancies. The conclusion was supported by the results of the density measurements with Grazing Incidence of X-ray Reflectivity.     

磁光盘记录光场畸变分析

运用光波衍射理论，针对磁光盘建立了记录光场的数学模型。该数学模型可全面描述基片杂质大小、位置、透射率对记录光场的影响。利用该数学模型可进一步研究基片杂质与磁畴特性，以及盘片误码的关系。     

Principe du contrôle de couches minces d'épaisseurs optiques inégales par maximètre monochromatique: Influence de l'épaisseur du support

A survey of different methods of monitoring the optical and geometrical thickness of thin multilayer dielectrics using a monochromatic maximeter is presented. The numerical results, obtained by computer, are in agreement with an analytical approach. Finally the effect of the optical thickness of the substrate is studied and the best operating conditions are given.     

基底温度对直流溅射Nb掺杂TiO2薄膜性能的影响

采用陶瓷靶直流磁控溅射,以玻璃为基底制备2.5wt%Nb掺杂TiO2薄膜,控制薄膜厚度在300~350 nm,研究了不同基底温度下所制得薄膜的结构、形貌和光学特性.XRD分析表明,基底温度为150℃、250℃和350℃时,薄膜分别为非晶态、锐钛矿(101)和金红石相(110)结构.基底温度250℃时,锐钛矿相薄膜的晶粒尺寸最大,约为32 nm.薄膜表面形貌的SEM分析显示,薄膜粗糙度和致密度随基底温度升高得到改善.薄膜的平均可见光透过率在基底温度为250℃以内约为70%,随基底温度升高至350℃,平均透过率下降为59%,金红石相的存在不利于可见光透过.Nb掺杂TiO2薄膜的光学带宽在3.68~3.78 eV之间变化.基底温度为250℃时,锐钛矿相薄膜的禁带宽度最大,为3.78 eV.     

Vector diffraction analysis of optical disk readout

The optical disk readout signals from ROM disks are presented by use of a rigorous three-dimensional vector diffraction method. The optical disk is modeled as a crossed metal grating without restriction on the form of the information marks, and the permittivity of the metal is taken into account. The diffracted field from the disk is obtained by means of decomposing the focused incident beam into a spectrum of plane waves and then calculating the diffracted plane waves for each respective incident component. The readout signal is obtained by integration of the energy-flux density of the diffracted field according to the detection scheme of the optical disk system. A typical digital versatile disk (DVD) system is applied with this theory, and the result is far from that of scalar diffraction theory.     

Effects of thickness on surface potential and surface conductivity in non-insulating Langmuir-Blodgett multilayers of porphyrins

The surface potentials of Langmuir-Blodgett multilayers of several porphyrins on aluminium were measured as a function of thickness using the Kelvin technique. The in-plane d.c. conductivity on insulating substrates and its variation with thickness were also measured wherever possible. Insulating long-chain and metal-free porphyrins showed almost no change in surface potential over a wide thickness range, whereas non-insulating silver mesoporphyrins showed a change of 600–800 mV relative to the potential of the aluminium substrate. The change in potential with thickness was paralleled by a change in conductivity for each material, and both changes occurred over a smaller thickness range as the bulk conductivity increased. It is suggested that a Schottky-type depletion region is responsible for the main effects observed and that the conduction is characterized by a high carrier (or defect) density but a low mobility.     

Measuring distribution of the ellipsoid of birefringence through the thickness of optical disk substrates

We have measured the birefringence of polycarbonate optical disk substrates, using ellipsometry. For a more comprehensive characterization, the probe beam was incident upon substrates in a wide range of polar angles and from different azimuths relative to track direction (?). Our measurements show that the ellipsoid of birefringence is tilted in the plane of radial (r) and normal (z) directions. The tilt angle varies through thickness, with a maximum value of approximately 10°. For beams passing through the substrate in the ?-z plane and at large incident angles, this tilt causes significant conversion (up to 100%) between p- and s-polarized components. Distributions of other parameters, such as the values of in-plane and vertical birefringence, are obtained simultaneously in the measurements.     

Optical readout for optical storage with phase jump

A novel, to our knowledge, optical readout for optical storage with phase jump is presented. In the readout scheme two coherent laser beams are focused on an optical disk with one beam scanning along pits and the other along land. When the probe beam scans across a pit, two phase jumps will take place in the interference resultant of the two beams if the phase difference between two beams is prefixed at pi, resulting in a phase pulse of 180 deg. The slopes of rising and falling edges of the phase pulse are infinite, and they are not affected by the intensity variation of the light source, stray light, and the vibration of the disk. Therefore this phase pulse can be used to read out the information on an optical disk. The use of phase jump will improve the signal-to-noise ratio of the readout signal and enhance the density of optical storage. An optical readout with phase jump was constructed. Both the theoretical design and the experimental verification are conducted. Experimental results show that the proposed optical readout is feasible.     

微波多层板基材的性能要求

介绍了微波多层板所用基材的性能参数,重点阐述了材料的介电常数、介质损耗、热胀系数、特性阻抗对多层板性能的影响。通过对微带线特性阻抗公式的理论计算,得出了带线的线宽W、导体层的厚度t、介质的厚度h以及介电常数ε1的精度对特性阻抗Z。的影响程度。这4个因素中,介质的厚度h和带线的线宽W对特性阻抗Z。的精度影响最大。总结了国内外微波介质材料的研究情况,优选了适合于制造微波多层板的材料。     

A statistical theory for the dielectric properties of thin island films

A statistical theory is given for the surface dielectric susceptibilities of a thin island film. The effects due to the mirror images in the substrate are taken into account. The resulting expressions, which contain local field effects, have a Clausius-Mossotti-like form. In these expressions two parameters occur (with the dimensionality of an inverse length) for which explicit formulae are found in terms of the autocorrelation function of the polarizability density in the film. It is shown that, for spherical islands and neglecting the effects of the substrate, our results reduce to those found by Maxwell Garnett except for the fact that an explicit expression is obtained for the optical thickness in terms of the autocorrelation function for the island distribution.