Film thickness dependence of microstructures and magnetic properties in single-layered FePt films by in-situ annealing

The FePt films with various thicknesses (t) of 5 to 50 nm are deposited on Si(100) substrate without any underlayer by in-situ annealing at substrate temperature (Ts) of 620 °C. A strong (001) texture of L1₀ FePt film is obtained and presents high perpendicular magnetic anisotropy as the film thickness increases to 30 nm. By further increasing the thickness to exceed 30 nm, the (111) orientation of L1₀ FePt is enhanced greatly, indicating that the quality of perpendicular magnetic anisotropy degrades when the thickness of the FePt film is greater than 30 nm. The single-layered FePt film with thickness of 30 nm by in-situ depositing at 620 °C shows good perpendicular magnetic properties (perpendicular coercivity of 1033 kA/m (13 kOe), saturation magnetization of 1.08 webers/m² and perpendicular squareness of 0.91, respectively), which reveal its significant potential for perpendicular magnetic recording media.     

The effect of thickness on the texture and magnetic properties of single-layered FePt films by rapid thermal annealing

The single-layered FePt films with thickness in the range of 5 to 50 nm are deposited directly on Si(100) substrate without underlayer, then post annealed at 700 degrees C by rapid thermal annealing (RTA) technique. As the film thickness of FePt is over 20 nm, the L1(0) FePt(111) preferred orientation is presented and tended to in-plane magnetic anisotropy. However, the L1(0) FePt(001) texture is obtained and exhibited perpendicular magnetic anisotropy as the film thickness is decreased to 10 nm. Its perpendicular coercivity (Hc(perpendicular)), saturation magnetization (Ms) and perpendicular squareness (S(perpendicular)) are 14.8 kOe, 795 emu/cm3 and 0.79, respectively. On the other hand, both the grain size and domain size of FePt film decrease with decreasing the film thickness of FePt. The grain size for 10-nm FePt film is as small as 9.7 nm with domain size of 123 nm, which reveal its significant potential as perpendicular magnetic recording media for ultra high-density recording.     

Magnetic properties and microstructures of single-layered Fe100 − xPtx films deposited onto heated substrates

The single-layered Fe_100 − xPt_x films of 30 nm thick with Pt contents (x) of 35-57 at.% are deposited on heated Si (100) substrate at a temperature (Ts) of 620 °C by magnetron co-sputtering. When the Pt content in the Fe-Pt alloy film is 35 at.%, the value of in-plane coercivity (Hc_//) is close to perpendicular coercivity (Hc_⊥) and both values are about 800 kA/m. The FePt films exhibit perpendicular magnetic anisotropy when the Pt content increases to the values of between 45 and 51 at.%. The perpendicular coercivity, saturation magnetization (Ms) and perpendicular squareness (S_⊥) for Fe₅₄Pt₄₆ film are as high as 1113 kA/m, 0.594 Wb/m² and 0.96, respectively. These magnetic properties reveal its significant potential as perpendicular magnetic recording media. Upon further increasing the Pt content to 57 at.%, the coercivity of the Fe-Pt film decreases drastically to below 230 kA/m and tends to be closer to in-plane magnetic anisotropy.     

Microstructure and magnetic properties of (0 0 1)-oriented L10 FePt films: Role of Ag underlayer and Fe/Pt ratio

FePt multilayer films were deposited on Si(1 0 0) substrate with thermally grown SiO₂ film and sputtered Ag underlayer at room temperature by dc magnetron sputtering and subsequently annealing in vacuum. Experimental results suggest that proper thickness of Ag underlayer and slightly rich of Fe content can effectively induce the (0 0 1) texture of FePt films. A Fe_57.4Pt_42.6 thin film on the 8 nm Ag underlayer exhibits a large perpendicular coercivity of 7.6 kOe with magnetic remanence close to 1.     

Effects of Cu underlayer on the growth and magnetic properties of FePt thin films on MgO (001) substrate

During ordering process of face centered tegragonal (fct) L1(0) phase of the FePt alloy, there exist three growth variants of axes (001) from original disordered fcc structured phase. When FePt film was directly deposited on the MgO (001) substrate, the variant perpendicular to the film plane grew, resulting in a low out-of-plane coercivity of 1.3 kOe. By using Cu underlayer, two variants lying in the film plane got same chance to grow, which caused an in-plane perpendicular alignment of the tetragonal axes of FePt L1(0) phases. The crystallographic relationship between Cu and FePt layers is Cu (100)<100>//fct FePt (100)<100>. A high in-plane coercivity of 4.6 kOe was obtained due to the high density of micro-defects (mcro-twins, anti-phase boundaries, etc.) in the film plane. This work demonstrated a way of selecting the growth variants of ordering process to adjust the magnetic properties of the ordered FePt thin films.     

Low temperature ordering of FePt films by in-situ heating deposition plus post deposition annealing

FePt thin films with 40 nm thickness were prepared on thermally oxidized Si (001) substrates by dc magnetron sputtering at the nominal growth temperature 375 °C. The effects of annealing on microstructure and magnetic properties of FePt thin films were investigated. The as-deposited FePt thin films show soft magnetic properties. After the as-deposited FePt thin films were annealed at various temperatures and furnace cooled, it is found that the ordering temperature of L1₀ FePt phase could be reduced to 350 °C. For FePt thin films annealed at 350 °C, the in-plane and out-of-plane coercivities of the films increased to 510 and 543 kA/m, respectively, and the films had hard magnetic properties. A highly (001) orientation was obtained, when FePt thin films were annealed at 600 °C. And the hysteresis loops of FePt thin films annealed at 600 °C show out-of-plane magnetic anisotropy.     

Interaction Effects in SmCo/FeCo Bilayer Film Media

The magnetic property of Sm22Co78/Fe65Co35 bilayer film media prepared by magnetron sputtering was measured. All the samples have in-plane anisotropy and the hysteresis loops are simple single loops, indicating that the two phases are strongly exchange-coupled. The reduced remanence (Mr/Ms) was found to increase from 0.58 to 0.8 with increasing Fe65Co35 layer thickness (d) for a fixed Sm22Co78 layer thickness. The coercivity was found to increase with increasing a few Fe65Co35 layer, and then to decrease with continuously increasing Fe65Cos5 layer. The intergranular exchange and magnetostatic interaction effects were measured from their remanence magnetization curves.     

Effects of annealing time on the structural and magnetic properties of L10 FePt thin films

Thermal annealing of [Fe 1.65 nm/Pt 1.84 nm]₅₀ multilayers at 673 K for various annealing times between 60 and 12000 s leads to the direct formation of the fully ordered L1₀ FePt phase with (111) texture. The average grain sizes, determined from X-ray diffraction size-strain analysis, are smaller than the critical size for multi-domain FePt particles, suggesting the presence of single-domain (SD) grains. The coercivity increases with annealing time and increasing grain size and reaches values of about 955 kA/m. The remanence values are typical for randomly oriented weakly-interacting particles. A decrease of the remanence with annealing time suggests a decrease of the intergrain exchange interactions with annealing time. Analysis of minor loops and the initial magnetization curves shows the presence of a broad distribution of critical fields, which the individual SD particles have to overcome for the magnetization reversal.     

Remanence and coercivity in exchange-coupled amorphous Nd50Fe50/Fe multilayers

The hysteresis behavior of sputteredNd₅₀Fe₅₀/Fe multilayers consisting of alternate layers of magnetically hard Nd₅₀Fe₅₀ and sof α-Fe phases with a bilayer thickness in the range of 20–40 nm has been investigated. Samples prepared at 5 nTorr Ar gas pressure showed a uniform single-phase hysteresis loop, with increased reduced remanence (0.6) for Fe layer thickness under 7.5 nm, which is attributed to a strong exchange coupling between the hard Nd₅₀Fe₅₀ and soft α-Fe. Samples sputtered at higher gas pressures showed smooth loops for larger critical Fe thickness, with a higher coercivity and a lower reduced remanence.     

Effect of capped layer on microstructure and magnetic properties of FePt films

Sputter-deposited FePt films exhibit an in-plane magnetic anisotropy when MgO is used as the capped layer. The perpendicular magnetic anisotropy of FePt films can be enhanced by introducing a Ag capped layer instead of a MgO capped layer. Although the in-plane coercivity (Hc_//) of FePt films decreases slightly after introducing a Ag capped layer instead of a MgO capped layer, the perpendicular coercivity (Hc_⊥) is increased significantly from 3169 Oe to 6726 Oe. Auger electron spectroscopy analysis confirms that Ag atoms diffuse from the capped layer into the FePt magnetic layer and are mainly distributed at the grain boundary of FePt. This phenomenon results in enhancement of the grain boundary energy and inhibition of grain growth, thus increasing the perpendicular coercivity and reducing the grain size of the FePt film.     

Perpendicular exchange bias in IrMn/Pt/[Co/Pt]3 multilayers with cone magnetization

The perpendicular exchange bias and magnetic anisotropy were investigated in IrMn/Pt/[Co/Pt]₃ multilayers through the analysis of in-plane and out-of-plane magnetization hysteresis loops. A phenomenological model was used to simulate the in-plane curves and the effective perpendicular anisotropies were obtained employing the area method. The canted state anisotropy was introduced by taking into account the first and second uniaxial anisotropy terms of the ferromagnet with the corresponding uniaxial anisotropy direction allowed to make a nonzero angle with the film's normal. This angle, obtained from the fittings, was of approximately 15° for IrMn/[Co/Pt]₃ film and decreases with the introduction of Pt in the IrMn/Pt/ [Co/Pt]₃ system, indicating that the Pt interlayer leads to a predominant perpendicular anisotropy. A maximum of the out-of-plane anisotropy was found between 0.5 and 0.6 nm of Pt, whereas a maximum of the perpendicular exchange bias was found at 0.3 nm. These results are very similar to those obtained for IrMn/Cu/[Co/Pt]₃ system; however, the decrease of the exchange bias with the spacer thickness is more abrupt and the enhacement of the perpendicular anisotropy is higher for the case of Cu spacer as compared with that of Pt spacer. The existence of a maximum in the perpendicular exchange bias as a function of the Pt layer thickness was attributed to the predominance of the enhancement of exchange bias due to more perpendicular Co moment orientation over the exponential decrease of the ferromagnetic/antiferromagnetic exchange coupling and, consequently, of the exchange-bias field.     

Microstructural enhancement of high coercivity L1(0)-FePt films for next-generation magnetic recording media

The effects of substrate Ar-ion milling and Ta adhesion layer on the microstructural and magnetic properties of L1(0)-FePt films prepared on Si, SiO2, and glass substrates were investigated. It was discovered that the relatively large in-plane surface roughness of CrRu/MgO/FePt films deposited on Si substrates was due to the deformation of the CrRu layer when the composition was heated to 550 degrees C. More than an order of magnitude improvement for the in-plane surface roughness was achieved when substrate Ar-ion milling or Ta adhesion layer was incorporated into the process. While the Ta adhesion layer proved to be detrimental to the (200) growth of the CrRu layer, optimal FePt film properties with coercivity values larger than 2 Tesla and out-of-plane roughness less than 1 nm were achieved when only substrate Ar-ion milling was implemented.     

Effect of Pt content on structure and magnetic properties of Fe100−xPtx films deposited on thermally oxidized Si substrates by rapid thermal annealing

Fe_100-xPt_x films with Pt contents (x) = 29–65 at.% were deposited directly onto thermally oxidized Si(100) substrate by dc magnetron sputtering. The films were then post-annealed at 700 °C for 3 min by rapid thermal annealing (RTA) at a high heating ramp rate of 100 °C/s. Experimental results show that Fe₃Pt film displayed (111) preferred orientation and tended towards in-plane magnetic anisotropy when the Pt content was 29 at.%. When the Pt content was increased to 49 at.%, the FePt film inclined towards (001)-texture and perpendicular magnetic anisotropy. Its out-of-plane coercivity (Hc_⊥), saturation magnetization (M_s) and out-of-plane squareness (S_⊥) reached 1010 kA/m, 0.47 T and 0.8, respectively. These results reveal its significant potential as perpendicular magnetic recording media for high-density recording. Upon further increasing the Pt content to 65 at.%, the coercivity of the films decreased drastically to below 65 kA/m and tended towards in-plane magnetic anisotropy.     

Positive and negative exchange bias in IrMn/NiFe bilayers

We present the observation of double shifted hysteresis loops in IrMn/NiFe bilayer structures. The bilayer structures were fabricated using high vacuum DC magnetron sputtering system. The hysteresis loops of the as deposited samples show the double shifted loops at NiFe layer thicknesses 5 nm and 6 nm, whereas the IrMn layer thickness was kept constant at 15 nm. The results were interpreted as the contribution of both positive and negative exchange bias fields. We suppose that this phenomenon is occurring due to the ferromagnetic (FM) layer exchange coupled with the antiferromagnetic (AFM) layer in two different magnetization directions. The ferromagnetic coupling of the interface spins in some regions of the film generates the hysteresis loop shift toward negative fields and antiferromagnetic coupling toward positive fields in the other regions. The double shifted hysteresis loops disappeared after magnetic field annealing of the samples above Neel temperature of the AFM layer. The X-ray diffraction patterns of the sample show the IrMn (111) crystalline growth necessary for the development of exchange bias field in this system. The correlation between the Magnetic Force Microscopy (MFM) domain structures of the as deposited sample and the magnetization reversal process of the double shifted hysteresis loops were discussed. The results suggest that the larger multidomain formation in the AFM layer with different magnetization directions was responsible for the positive and negative exchange bias fields in IrMn/NiFe bilayer samples.     

Diffusion induced columnar structure, high perpendicular anisotropy and low transformation temperature in thick FePt films

Thick FePt films (800 nm) were deposited by electroplating using Ag electrode. 2 at.% Ag doping into the electrolyte can lead to a columnar structure after annealing. The annealed film shows a high coercivity and perpendicular anisotropy. The additive of Ag can also significantly reduce fct-phase ordering temperature to 400 °C, comparing with an ordering temperature of 700 °C without Ag doping. The diffusion from Ag electrode and dopant is attributed to the formation of columnar structure, perpendicular anisotropy and reduced ordering temperature.     

Nanogranular L1(0) FePt-C-Ta2O5 composite media for perpendicular recording applications

In this report, the effect of simultaneously adding two dopants (C and Ta2O5) in FePt was investigated. (Fe55Pt45)79C21-(x vol%) Ta2O5 films (where x = 0% to 20%) were prepared using both low and high power magnetron sputtering on MgO (2 nm)/CrRu (30 nm) underlayers with in-situ heating at 350 degrees C. Films deposited at low power showed a decrease in exchange coupling with increasing Ta2O5 content. Out-of-plane coercivity of 7.2 kOe was observed even with up to 20 vol% Ta2O5. X-Ray diffraction spectra showed presence of FePt(001) texture for all compositions of Ta2O5 ranging from 0 to 20 vol% suggesting that the perpendicular anisotropy was maintained even with up to 20 vol% of dopant content. Films deposited at high power showed a different behavior with an initial increase in out-of-plane coercivity to 8.2 kOe and a reduction in exchange coupling with loop slope parameter (alpha) approaching a fully decoupled value of 1. Further increase in doping content led to deterioration in the out-of-plane coercivity, as well as an increase in the exchange coupling.     

Effect of carbon additive on microstructure evolution and magnetic properties of epitaxial FePt (001) thin films

FePt:C thin films were deposited on CrRu underlayers by DC magnetron co-sputtering. The effects of C content, FePt:C film thickness and substrate temperature on the microstructural and magnetic properties of the epitaxial FePt (001) films were studied. Experimental results showed that even with 30 vol.% C doping, the FePt films could keep a (001) preferred orientation at 350 °C. When a FePt:C film was very thin (< 5 nm), the film had a continuous microstructure instead of a granual structure with C diffused onto the film surface. With further increased film thickness, the film started to nucleate and formed a column microstructure over continuous FePt films. A strong exchange coupling in the FePt:C films was believed to be due to the presence of a thin continuous FePt layer attributed to the carbon diffusion during the initial stage of the FePt:C film growth. Despite the presence of a strong exchange coupling in the FePt:C (20 vol.% C) film, the SNR ratio of the FePt:C media was about 10 dB better than that of the pure FePt media. The epitaxial growth of the FePt:C films on the Pt layers was observed from high resolution TEM cross sectional images even for the films grown at about 200 °C. The TEM images did not show an obvious change in the morphology of the FePt:C films deposited at different temperatures (from 200 °C to 350 °C), though the ordering degree and coercivity of the films increased with increased substrate temperature.     

Structure and magnetic properties of high coercive [PrFeBx/Cu]n films with out-of-plane orientation

Pr-Fe-B single layer and [PrFeB_x/Cu]_n films were prepared by magnetron sputtering on Si substrate heated at 650 °C. The influence of the composition and thickness of Cu spacer layer on the structure and magnetic properties of films with out-of-plane orientation are investigated. The [PrFeB_x/Cu]_n films present an enhanced coercivity and a lower remanence, in comparison with the results of Pr-Fe-B single layer. The coercivity H_c⊥ of about 19.7 kOe and the remanence ratio M_r/M_s of about 0.90 are achieved in the Mo(50 nm) / [PrFeB(300 nm) / Cu(2 nm)]₂ / Mo(50 nm) film.     

Optimization of L10-FePt/MgO/CrRu thin films for next-generation magnetic recording media

L1₀-FePt thin films were deposited on silicon substrates with the structure of Si/CrRu/MgO/FePt. The magnetic and microstructural properties were optimized by varying the FePt sputter pressure and temperature, as well as the thicknesses of all three layers. High coercivity films greater than 1.8 T were grown when the FePt sputter pressure was at 1.33 Pa with a thickness of only 4 nm, on CrRu and MgO underlayers as thin as 10 nm and 2 nm, respectively.     

基于元胞自动机的薄膜磁滞回线的计算机模拟

利用Stoner-Wohlfarth模型,概率型元胞自动机的模型和算法,在考虑了退磁场和交换作用的情况下对薄膜的磁滞回线进行了模拟,比较了温度以及和易轴取向变化时磁化曲线以及剩磁矩形比和矫顽力的不同及变化趋势.退磁场和交换作用的引入对磁化翻转过程有显著的影响,剩磁矩形比和矫顽力都有不同程度的提高.