Localized Auger Recombination in Quantum-Dot Lasers

We have calculated radiative and Auger recombination rates due to localized recombination in individual dots, for an ensemble of 10⁶ dots with carriers occupying the inhomogeneous distribution of energy states according to global Fermi-Dirac statistics. The recombination rates cannot be represented by simple power laws, though the Auger rate has a stronger dependence on the ensemble electron population than radiative recombination. Using single-dot recombination probabilities which are independent of temperature, the ensemble recombination rates and modal gain decrease with increasing temperature at fixed population. The net effect is that the threshold current density increases with increasing temperature due to the increase in threshold carrier density. The most significant consequence of these effects is that the temperature dependence of the Auger recombination rate at threshold is much weaker than in quantum wells, being characterized by a T₀ value of about 325 K. Observations of a strong temperature dependence of threshold in quantum dot lasers may have explanations other than Auger recombination, such as recombination from higher lying states, or carrier leakage.     

Theory of the temperature dependence of the threshold current of an InGaAsP laser

The threshold current of an InGaAsP laser is calculated, where the radiative emission, reflection and absorption losses, and Auger recombination are considered. Moreover, the enhancement of the threshold carrier density at high temperatures is an important point. A mechanism for this enhancement is discussed. Then we obtain an excellent agreement with the measured temperature dependence of the threshold current, in particular the To-values for T≷TBand the break point TB. The reason for this break point is that the radiative recombination dominates for T < TB, whereas the strongly temperature dependent valence band Auger process becomes more and more important for T > TB. It is this process which causes the strong increase of the threshold current in the room temperature range.     

The effect of temperature dependent processes on the performance of1.5-μm compressively strained InGaAs(P) MQW semiconductor diodelasers

We describe measurements of the threshold current I_th and spontaneous emission characteristics of InGaAs (P)-based 1.5-μm compressively strained multiple-quantum-well semiconductor lasers from 90 K to above room temperature. We show that below a break-point temperature, T_B≈130 K, I_th and its temperature dependence are governed by the radiative current. Above this temperature, a thermally activated Auger recombination process becomes the dominant recombination mechanism responsible for both I_th and its temperature sensitivity. At room temperature nonradiative Auger recombination is found to account for approximately 80% of the threshold current in these devices     

The temperature dependence of internal parameters of disc laser diodes InAs/InAsSbP

For disc lasers based on the InAs/InAsSbP heterostructure with a generation wavelength of 3.03–3.06 μm, the internal quantum yield of luminescence and rates of radiative and nonradiative recombination in a temperature range of 85–120 K are determined. It is established that as the temperature increases, the relative contribution of the rate of nonradiative recombination to the density of the threshold current increases from 89.9 to 92.8%. It is shown that the most probable mechanisms of nonradiative transitions in the InAs/InAsSbP disc heterolasers can be the CHCC and CHSH Auger processes with involvement of phonons. Coefficients of total losses for two experimentally observed generation bands are determined, and the maximum level of the internal optical losses is estimated. The figure of merit of the resonator of the InAs/InAsSbP disc heterolaser is ～10⁴.     

Temperature dependence of the threshold current density of aquantum dot laser

Detailed theoretical analysis of the temperature dependence of threshold current density of a semiconductor quantum dot (QD) laser is given. Temperature dependences of the threshold current density components associated with the radiative recombination in QDs and in the optical confinement layer (OCL) are calculated. Violation of the charge neutrality in QDs is shown to give rise to the slight temperature dependence of the current density component associated with the recombination in QD's. The temperature is calculated (as a function of the parameters of the structure) at which the components of threshold current density become equal to each other. Temperature dependences of the optimum surface density of QD's and the optimum thickness of the OCL, minimizing the threshold current density, are obtained. The characteristic temperature of QD laser T_o is calculated for the first time considering carrier recombination in the OCL (barrier regions) and violation of the charge neutrality in QDs. The inclusion of violation of the charge neutrality is shown to be critical for the correct calculation of T_o. The characteristic temperature is shown to fall off profoundly with increasing temperature. A drastic decrease in T_o is shown to occur in passing from temperature conditions wherein the threshold current density is controlled by radiative recombination in QD's to temperature conditions wherein the threshold current density is controlled by radiative recombination in the OCL. The dependences of T_o on the root mean square of relative QD size fluctuations, total losses, and surface density of QDs are obtained     

俄歇复合对应变量子阱激光器阈值电流的影响

通过考虑不同因素对压应变和张应变量子阱激光器阈值电流和特征温度的影响,得到了俄歇复合和非俄歇复合对阈值电流起主要作用的转变温度Tc,小于Tc时,主要是非俄歇复合;大于Tc时,主要是俄歇复合,而且张应变量子阱激光器转变温度要比压应变量子阱激光器的转变温度要高;张应变量子阱激光器与压应变量子阱激光器相比,阈值电流更低,特征温度更高。     

Temperature dependence of the threshold current density in semiconductor lasers (λ = 1050–1070 nm)

The temperature dependences of the threshold current density and threshold concentration in semiconductor lasers based on MOVPE-grown asymmetric separate-confinement heterostructures with an extended waveguide have been studied (wavelengths ?? = 1050?C1070). It is shown that the temperature dependence of the threshold current density in semiconductor lasers becomes markedly stronger at above-room temperatures, which is due to temperature-induced carrier delocalization into the waveguide layers of a laser heterostructure. It was found that the sharp decrease in the thermal stability of the threshold current density with increasing temperature correlates with the coincidence of the Fermi level with the conduction-band bottom of the waveguide layer in the laser heterostructure. It is experimentally demonstrated that an increase in the energy depth and number of quantum wells in the active region of a semiconductor laser improves the thermal stability of the threshold current density. It is demonstrated that the characteristic parameter T ₀ attains a value of 220 K in the temperature range from ?20 to +70°C.     

Mechanism of radiative recombination in the region of interband transitions in Si-Ge solid solutions

The electroluminescence of Si-Ge diodes (with a Ge content of 5.2% in the corresponding solid solutions) in the region of interband transitions has been studied at the temperatures T = 82 K and 300 K. The emission spectra, the linear dependence of the electroluminescence intensity on current, and the exponential decay of the intensity suggest an exciton mechanism of radiative recombination with and without the involvement of phonons during radiative transitions.     

Auger recombination effect on threshold current of InGaAsP quantum well lasers

The Auger recombination effect on the threshold current of the InGaAsP quantum well (QW) laser is studied theoretically. All possible transitions between the quantized subbands of two-dimensional carriers are taken into account in evaluating the radiative process with thek-selection rule and the Auger process. The calculated threshold current agrees well with the reported experimental results for 1.07 μm InGaAsP QW lasers. The Auger component of the threshold current and its temperature dependence strongly depend on the QW structure, resulting in the necessity for an elaborate QW structure design, although both cannot be optimized at the same time. A design procedure is elucidated for a structure which gives the lowest threshold current density for the 1.07, 1.3, and 1.55 μm InGaAsP QW lasers.     

Temperature dependence of the threshold current in quantum-well WGM lasers (2.0–2.5 μm)

The temperature dependence of the threshold current and emission spectra of disk-shaped quantum-well whispering-gallery mode (WGM) lasers is studied in the temperature range of 80–463 K in which the laser emission wavelength increases from 2 to 2.5 μm. It is shown that lasing is observed up to 190°C. Radiative recombination is dominant up to a temperature of 300 K, and nonradiative Auger recombination, in which a recombining electron gives energy to another electron, is so at higher temperatures. The spin-orbit split-off valence subband is not involved in recombination processes, which is attributed to mechanical compression of the quantum-well material.     

Threshold characteristics of λ=1.55 µm InGaAsP/InP heterolasers

Temperature dependences of the threshold characteristics of InGaAsP/InP quantum well (QW) lasers have been studied. The main contribution to the threshold current is made by the thresholdless Auger recombination. The observed power-law temperature dependence of the threshold current is explained by the predominance of the thresholdless Auger recombination in QWs over the threshold Auger process.     

Evidence of the importance of Auger recombination for InGaAsP lasers

The temperature dependence of Auger recombination in InGaAsP can be described by two regions, one with a slow increase of the Auger coefficient and one with a strong increase. This behaviour is similar to that of the threshold current of an InGaAsP laser. In particular, the slope of the temperature curve of the Auger coefficient changes at T = 255 K, which is exactly the break point temperature of the threshold current. Auger recombination therefore seems to be the most important cause for the temperature dependence of the threshold current in InGaAsP lasers.     

Recombination mechanisms in 1.3-/spl mu/m InAs quantum-dot lasers

We measure, in real units, the radiative and total current density in high performance 1.3-/spl mu/m InAs quantum-dot-laser structures. Despite very low threshold current densities, significant nonradiative recombination (/spl sim/80% of the total recombination) occurs at 300 K with an increasing fraction at higher current density and higher temperature. Two nonradiative processes are identified; the first increases approximately linearly with the radiative recombination while the second increases at a faster rate and is associated with the loss of carriers to either excited dot states or the wetting layer.     

Gain measurements in 1.3 µm InGaAsP-InP double heterostructure lasers

The net gain per unit length (G) versus current (I) is measured at various temperatures for 1.3 μm InGaAsP-InP double heterostructure lasers.Gis found to vary linearly with the currentIat a given temperature. The gain bandwidth is found to decrease with decreasing temperature. The lasing photon energy decreases at 0.325 meV/K with increasing temperature. Also, the slopedG/dIat the lasing photon energies decreases with increasing temperature. This decrease is more rapid forT > sim210K. This faster decrease is consistent with the observed higher temperature dependence of threshold (low T0at high temperatures) of 1.3 μm InGaAsP lasers. A carrier loss mechanism, due to Auger recombination, also predicts thatdG/dIshould decrease much faster with increasing temperature at high temperatures. We also find that the slopedG/dIdecreases slowly with increasing temperature for a GaAs laser, which is consistent with the observed temperature dependence of threshold of these lasers.     

Electroluminescence of InAs/InAs(Sb)/InAsSbP LED heterostructures in the temperature range 4.2–300 K

The electroluminescence of InAs/InAsSbP and InAsSb/InAsSbP LED heterostructures grown on InAs substrates is studied in the temperature range T = 4.2–300 K. At low temperatures (T = 4.2–100 K), stimulated emission is observed for the InAs/InAsSbP and InAsSb/InAsSbP heterostructures with an optical cavity formed normal to the growth plane at wavelengths of, respectively, 3.03 and 3.55 μm. The emission becomes spontaneous at T > 70 K due to the resonant “switch-on” of the CHHS Auger recombination process in which the energy of a recombining electron–hole pair is transferred to a hole, with hole transition to the spin–orbit-split band. It remains spontaneous up to room temperature because of the influence exerted by other Auger processes. The results obtained show that InAs/InAs(Sb)/InAsSbP structures are promising for the fabrication of vertically emitting mid-IR lasers.     

Temperature dependence of the effective coefficient of Auger recombination in 1.3 μm InAs/GaAs QD lasers

Semiconductor laser heterostructures containing five and ten sheets of InAs/GaAs QDs on GaAs substrates, with an emission wavelength of ～1.3 μm, have been studied. Dependences of the nonradiative lifetime and effective Auger coefficient in QDs are obtained from an analysis of temperature and current dependences of the efficiency of spontaneous radiative recombination. The zero-threshold Auger recombination channel in QDs is shown to dominate at low (below 200 K) temperature, whereas at higher temperatures the quasithreshold channel becomes dominant. The effective 3D Auger coefficient is estimated in the approximation of a spherical QD, and a good agreement with the experimental data is obtained.     

High-temperature luminescence in an n-GaSb/n-InGaAsSb/p-AlGaAsSb light-emitting heterostructure with a high potential barrier

The electroluminescent properties of an n-GaSb/n-InGaAsSb/p-AlGaAsSb heterostructure with a high potential barrier in the conduction band (large conduction-band offset) at the n-GaSb/n-InGaAsSb type-II heterointerface (ΔE _c = 0.79 eV) are studied. Two bands with peaks at 0.28 and 0.64 eV at 300 K, associated with radiative recombination in n-InGaAsSb and n-GaSb, respectively, are observed in the electroluminescence (EL) spectrum. In the entire temperature range under study, T = 290–480 K, additional electron-hole pairs are formed in the n-InGaAsSb active region by impact ionization with hot electrons heated as a result of the conduction-band offset. These pairs contribute to radiative recombination, which leads to a nonlinear increase in the EL intensity and output optical power with increasing pump current. A superlinear increase in the emission power of the long-wavelength band is observed upon heating in the temperature range T = 290–345 K, and a linear increase is observed at T > 345 K. This work for the first time reports an increase in the emission power of a light-emitting diode structure with increasing temperature. It is shown that this rise is caused by a decrease in the threshold energy of the impact ionization due to narrowing of the band gap of the active region.     

Threshold characteristics of an IR laser based on deep InAsSb/AlSb quantum well

The basic threshold characteristics of a semiconductor IR laser based on a heterostructure with deep InAs_0.84Sb_0.16/AlSb quantum wells (QWs) have been studied. The threshold carrier densities and threshold current densities of radiative and Auger recombination (AR) were found. It is shown that at certain QW parameters the AR rate is strongly (by several orders of magnitude) suppressed. In this case, the emission wavelength falls within the interval 2–3.5 μm, which corresponds to the mid-IR spectral range. The internal quantum efficiency of emission at the lasing threshold was calculated and its dependence on the QW width within the AR suppression range was demonstrated. The laser structure was optimized with respect to the number of QWs.     

Characterization of the temperature sensitivity of gain and recombination mechanisms in 1.3-/spl mu/m AlGaInAs MQW lasers

The potential of 1.3-/spl mu/m AlGaInAs multiple quantum-well (MQW) laser diodes for uncooled operation in high-speed optical communication systems is experimentally evaluated by characterizing the temperature dependence of key parameters such as the threshold current, transparency current density, optical gain and carrier lifetime. Detailed measurements performed in the 20/spl deg/C-100/spl deg/C temperature range indicate a localized T/sub 0/ value of 68 K at 98/spl deg/C for a device with a 2.8 /spl mu/m ridge width and 700-/spl mu/m cavity length. The transparency current density is measured for temperatures from 20/spl deg/C to 60/spl deg/C and found to increase at a rate of 7.7 A/spl middot/cm/sup -2//spl middot/ /spl deg/C/sup -1/. Optical gain characterizations show that the peak modal gain at threshold is independent of temperature, whereas the differential gain decreases linearly with temperature at a rate of 3/spl times/10/sup -4/ A/sup -1//spl middot//spl deg/C/sup -1/. The differential carrier lifetime is determined from electrical impedance measurements and found to decrease with temperature. From the measured carrier lifetime we derive the monomolecular ( A), radiative (B), and nonradiative Auger (C) recombination coefficients and determine their temperature dependence in the 20/spl deg/C-80/spl deg/C range. Our study shows that A is temperature independent, B decreases with temperature, and C exhibits a less pronounced increase with temperature. The experimental observations are discussed and compared with theoretical predictions and measurements performed on other material systems.     

Dark Currents in a Fully-Depleted LWIR HgCdTe <Emphasis Type="Italic">P</Emphasis>-on-<Emphasis Type="Italic">n</Emphasis> Heterojunction: Analytical and Numerical Simulations

In this paper, we use the theory of Evans and Landsberg, which is a generalization of the Shockley–Read–Hall recombination statistics in the space charge region (SCR), to include effects of Auger and radiative recombination processes that are also of origin in the SCR. Using analytical expressions for the current density, we calculate the total dark current density for a variety of conditions. Contributions include radiative and Auger transitions of origin in both the quasi-neutral region and the SCR. Numerical simulations are used to assess the nature of the limitations associated with the analytical calculation in the n-extrinsic region (\(N_{\rm d} \gg n_{\rm i}\), where \(N_{\rm d}\) is the doping concentration and \(n_{\rm i}\) is the intrinsic carrier concentration), and to extend the calculations to operating temperatures in the intrinsic region (\(n_{\rm i} \gg N_{\rm d}\)). Major findings include the observation that in a fully depleted \(P^+n\) double-layer planar hetero-structure, at a reverse bias voltage sufficiently high to suppress the Auger process, SRH centers are not limiting, and the dark current is due to radiative transitions of origin in the n-side SCR. From the numerical simulations, while the Auger recombination rate changes drastically with varying the carrier concentration (such as applying reverse bias), the radiative recombination rate remains nearly invariant to varying the carrier concentration, and, as such, does not appreciably change with increasing reverse bias. Using the theory of van Roosbroeck and Shockley, the radiative recombination rate is obtained by integrating the measured optical absorption coefficient over all photon energies. Hence, the theory links the measured absorption coefficient to the measured dark current density for conditions in which the dominant current component is due to radiative recombination. Finally, the numerical simulations reveal, in both the n-extrinsic and intrinsic operating regions, that, under sufficient conditions, the detector is radiatively limited.