Software defined photon counting system for time resolved x-ray experiments

The time structure of synchrotron radiation allows time resolved experiments with sub-100 ps temporal resolution using a pump-probe approach. However, the relaxation time of the samples may require a lower repetition rate of the pump pulse compared to the full repetition rate of the x-ray pulses from the synchrotron. The use of only the x-ray pulse immediately following the pump pulse is not efficient and often requires special operation modes where only a few buckets of the storage ring are filled. We designed a novel software defined photon counting system that allows to implement a variety of pump-probe schemes at the full repetition rate. The high number of photon counters allows to detect the response of the sample at multiple time delays simultaneously, thus improving the efficiency of the experiment. The system has been successfully applied to time resolved scanning transmission x-ray microscopy. However, this technique is applicable more generally.     

Linear position-sensitive x-ray detector incorporating a self-scanning photodiode array

A linear position-sensitive x-ray detector for x-ray spectroscopy and diffraction applications has been tested which can provide excellent spatial resolution, wide dynamic range and good sensitivity. The heart of the system is a self-scanning, photosensitive silicon diode array. It is interfaced via fiber optics to a thin layer of ZnS which fluoresces visible light upon absorption of x-radiation. The conversion to visible light and optical coupling provide several-fold gain in the efficiency of detection as compared to the direct detection of x-ray by the diode array. Equally important is that the array is protected from irreversible damage by high energy radiation, a limitation which previously hindered this application of silicon diode technology.     

Hard x-ray monochromator with milli-electron volt bandwidth for high-resolution diffraction studies of diamond crystals

We report on design and performance of a high-resolution x-ray monochromator with a spectral bandwidth of ΔE(X) ? 1.5 meV, which operates at x-ray energies in the vicinity of the backscattering (Bragg) energy E(H) = 13.903 keV of the (008) reflection in diamond. The monochromator is utilized for high-energy-resolution diffraction characterization of diamond crystals as elements of advanced x-ray crystal optics for synchrotrons and x-ray free-electron lasers. The monochromator and the related controls are made portable such that they can be installed and operated at any appropriate synchrotron beamline equipped with a pre-monochromator.     

A photodiode amplifier system for pulse-by-pulse intensity measurement of an x-ray free electron laser

We have developed a single-shot intensity-measurement system using a silicon positive-intrinsic-negative (PIN) photodiode for x-ray pulses from an x-ray free electron laser. A wide dynamic range (10(3)-10(11) photons/pulse) and long distance signal transmission (>100 m) were required for this measurement system. For this purpose, we developed charge-sensitive and shaping amplifiers, which can process charge pulses with a wide dynamic range and variable durations (ns-μs) and charge levels (pC-μC). Output signals from the amplifiers were transmitted to a data acquisition system through a long cable in the form of a differential signal. The x-ray pulse intensities were calculated from the peak values of the signals by a waveform fitting procedure. This system can measure 10(3)-10(9) photons/pulse of ~10 keV x-rays by direct irradiation of a silicon PIN photodiode, and from 10(7)-10(11) photons/pulse by detecting the x-rays scattered by a diamond film using the silicon PIN photodiode. This system gives a relative accuracy of ~10(-3) with a proper gain setting of the amplifiers for each measurement. Using this system, we succeeded in detecting weak light at the developmental phase of the light source, as well as intense light during lasing of the x-ray free electron laser.     

Tunable laboratory extended x-ray absorption fine structure system

A new sensitive x-ray monochromator and detector system for performing extended x-ray absorption fine structure (EXAFS) measurements in the laboratory is described. The monochromator combines x-ray focusing optics with rapid elemental tunability. The detection system effectively removes glitches from the data stream, regardless of whether they are due to impurity lines from the x-ray source or if they are due to random instabilities in the incident beam. Used together with a high intensity rotating anode x-ray source, this system can provide synchrotronlike photon intensities, flexibility and resolution, with the easy access and control possible only in the laboratory.     

Development of x-ray laminography under an x-ray microscopic condition

An x-ray laminography system under an x-ray microscopic condition was developed to obtain a three-dimensional structure of laterally-extended planar objects which were difficult to observe by x-ray tomography. An x-ray laminography technique was introduced to an x-ray transmission microscope with zone plate optics. Three prototype sample holders were evaluated for x-ray imaging laminography. Layered copper grid sheets were imaged as a laminated sample. Diatomite powder on a silicon nitride membrane was measured to confirm the applicability of this method to non-planar micro-specimens placed on the membrane. The three-dimensional information of diatom shells on the membrane was obtained at a spatial resolution of sub-micron. Images of biological cells on the membrane were also obtained by using a Zernike phase contrast technique.     

An instrument for 3D x-ray nano-imaging

We present an instrument dedicated to 3D scanning x-ray microscopy, allowing a sample to be precisely scanned through a beam while the angle of x-ray incidence can be changed. The position of the sample is controlled with respect to the beam-defining optics by laser interferometry. The instrument achieves a position stability better than 10 nm standard deviation. The instrument performance is assessed using scanning x-ray diffraction microscopy and we demonstrate a resolution of 18 nm in 2D imaging of a lithographic test pattern while the beam was defined by a pinhole of 3 μm in diameter. In 3D on a test object of copper interconnects of a microprocessor, a resolution of 53 nm is achieved.     

High repetition rate laser produced soft x-ray source for ultrafast x-ray absorption near edge structure measurements

Recent progress in high intensity ultrafast laser systems provides the opportunity to produce laser plasma x-ray sources exhibiting broad spectrum and high average x-ray flux that are well adapted to x-ray absorption measurements. In this paper, the development of a laser based x-ray absorption near edge structure (XANES) beamline exhibiting high repetition rate by using the Advanced Laser Light Source (ALLS) facility 100 Hz laser system (100 mJ, 35 fs at 800 nm) is presented. This system is based on a broadband tantalum solid target soft x-ray source and a grazing incidence grating spectrometer in the 1-5 nm wavelength range. To demonstrate the high potential of this laser based XANES technique in condensed matter physics, material science, or biology, measurements realized with several samples are presented: VO2 vanadium L edge, Si3N4 nitrogen K edge, and BPDA/PPD polyimide carbon K edge. The characteristics of this laser based beamline are discussed in terms of brightness, signal to noise ratio, and compared to conventional synchrotron broadband x-ray sources which allow achieving similar measurements. Apart from the very compact size and the relative low cost, the main advantages of such a laser based soft x-ray source are the picosecond pulse duration and the perfect synchronization between this x-ray probe and a laser pulse excitation which open the way to the realization of time resolved x-ray absorption measurements with picosecond range time resolution to study the dynamics of ultrafast processes and phase transition.     

Development of optics for x-ray phase-contrast imaging of high energy density plasmas

Phase-contrast or refraction-enhanced x-ray radiography can be useful for the diagnostic of low-Z high energy density plasmas, such as imploding inertial confinement fusion (ICF) pellets, due to its sensitivity to density gradients. To separate and quantify the absorption and refraction contributions to x-ray images, methods based on microperiodic optics, such as shearing interferometry, can be used. To enable applying such methods with the energetic x rays needed for ICF radiography, we investigate a new type of optics consisting of grazing incidence microperiodic mirrors. Using such mirrors, efficient phase-contrast imaging systems could be built for energies up to ～100?keV. In addition, a simple lithographic method is proposed for the production of the microperiodic x-ray mirrors based on the difference in the total reflection between a low-Z substrate and a high-Z film. Prototype mirrors fabricated with this method show promising characteristics in laboratory tests.     

Continuous measurement of the arrival times of x-ray photon sequence

In order to record x-ray pulse profile for x-ray pulsar-based navigation and timing, this paper presents a continuous, high-precision method for measuring arrival times of photon sequence with a common starting point. In this method, a high stability atomic clock is counted to measure the coarse time of arrival photon. A high resolution time-to-digital converter is used to measure the fine time of arrival photon. The coarse times and the fine times are recorded continuously and then transferred to computer memory by way of memory switch. The pulse profile is obtained by a special data processing method. A special circuit was developed and a low-level x-ray pulse profile measurement experiment system was setup. The arrival times of x-ray photon sequence can be consecutively recorded with a time resolution of 500 ps and the profile of x-ray pulse was constructed. The data also can be used for analysis by many other methods, such as statistical distribution of photon events per time interval, statistical distribution of time interval between two photon events, photon counting histogram, autocorrelation and higher order autocorrelation.     

Numerical analysis of crater formation and ablation depth in thin silicon films heated by ultrashort pulse train lasers

This study numerically investigates the optical and heat transfer characteristics of thin silicon films irradiated by ultrashort (shorter than 10 ps) pulse train lasers. The one-dimensional two-temperature model (1DTTM) is extended to the two-dimensional (2DTTM) model for estimation of crater formation. In addition, the wave interference effects on the optical and energy transfer characteristics are considered to predict accurately the energy absorption rates in thin silicon films irradiated by picosecond-to-femtosecond pulse train lasers. Unlike bulk silicon, a significant change in energy absorption is found to occur in thin silicon films with the variation of film thickness due to the wave interference. The spatial distributions of energy carrier and lattice temperature show quite a different tendency at different pulse durations as well as the number of pulses because of significant changes in the optical and thermal properties. The predicted crater shapes and the ablation depths by 2DTTM are also presented.     

Standard design for National Ignition Facility x-ray streak and framing cameras

The x-ray streak camera and x-ray framing camera for the National Ignition Facility were redesigned to improve electromagnetic pulse hardening, protect high voltage circuits from pressure transients, and maximize the use of common parts and operational software. Both instruments use the same PC104 based controller, interface, power supply, charge coupled device camera, protective hermetically sealed housing, and mechanical interfaces. Communication is over fiber optics with identical facility hardware for both instruments. Each has three triggers that can be either fiber optic or coax. High voltage protection consists of a vacuum sensor to enable the high voltage and pulsed microchannel plate phosphor voltage. In the streak camera, the high voltage is removed after the sweep. Both rely on the hardened aluminum box and a custom power supply to reduce electromagnetic pulse/electromagnetic interference (EMP/EMI) getting into the electronics. In addition, the streak camera has an EMP/EMI shield enclosing the front of the streak tube.     

小型的高精度软X射线-极紫外反射率计

针对探月二期工程中的有效载荷之一极紫外相机中的多层膜光学元件高精度反射率测量的需要,建立了一台使用液体靶激光等离子体光源的小型软X射线-极紫外波段反射率计。该反射率计主要由激光等离子体光源、Mcpherson 247动狭缝掠入射单色仪及相关的数据采集系统组成。单色仪波段范围1-125nm,光谱分辨率小于0.08nm。无碎屑的液体靶激光等离子体光源的使用避免了光学元件的损坏,而动狭缝掠入射单色仪的使用则提高了光谱分辨率和波段范围。使用该反射率计实测了工作波长为13.5nm和30.4nm的Mo/Si多层膜的反射率,测量结果表明测量重复性优于±0.5%。     

Thin optic constraint

The success of using thin substrates in various fields has urged researchers to further study the possibilities of improving the technology for future applications. For example, the high surface-area-to-weight ratio and strength of sheet glass allow flat-panel display technology to result in high-definition televisions that can be hung on walls like paintings. Sheet glass is also the prime candidate for grazing-incidence foil-optic X-ray telescopes, such as the segmented mirror approach considered for the NASA C onstellation X mission, where cost limitations necessitate lightweight substrates.The effects of different parameters present during the metrology of thin optics, such as gravity, frictional and thermal forces, are identified and analyzed. These forces alter the optic’s surface topography by tens of microns depending on how the optics are manipulated and constrained. This renders metrology and thus surface shaping process results inconclusive.A metrology truss utilizing monolithic flexures to kinematically constrain thin optics during metrology is designed. This device mitigates the effects of the forces mentioned above that are induced on the thin sheet while being mechanically constrained, thus significantly improving the repeatability of the optic surface map measurements.     

Linac Coherent Light Source soft x-ray materials science instrument optical design and monochromator commissioning

We present the x-ray optical design of the soft x-ray materials science instrument at the Linac Coherent Light Source, consisting of a varied line-spaced grating monochromator and Kirkpatrick-Baez refocusing optics. Results from the commissioning of the monochromator are shown. A resolving power of 3000 was achieved, which is within a factor of two of the design goal.     

Calculation and Analysis of the Pulse Response of Spatially Non-Invariant Projection Systems

Characteristics of spatially non-invariant telecentric projection systems, which are widely used in practice, are considered within the framework of wave optics. In the class of the Fresnel functions, the pulse response of the system is precisely calculated for various values of the projection objective and filter apertures. It is found that the response consists of two components, which determine the invariant and non-invariant properties of the system, respectively. Based on the approximation of the Fresnel function by elementary functions proposed previously by the author, an analytical expression for the pulse response is derived for the first time, and the response behavior is studied for various relationships of the objective and filter apertures. The correctness of choosing the parameters of the known quasi-invariant optical systems is analyzed. Recommendations on choosing the filter aperture are given to improve their spatially invariant characteristics. In contrast to available optical and geometrical methods, the proposed approach allows one to obtain reliable information about the character of wave field transformations in the considered systems.     

Streak camera measurement of subnanosecond plastic scintillator properties

A streak camera technique with temporal resolution of 20 ps has been used to measure the fluorescence properties of several subnanosecond plastic scintillators. The method employs a vacuum light pipe coupled to an optical streak camera. The scintillators are excited by a 200-ps x-ray pulse generated by a 1.06-microm Nd:YAG laser focused onto an iron target. The time history of the low-energy x-ray pulse is measured with an x-ray streak camera. Results are given for NElll plastic scintillators doped with benzophenone or acetophenone, for PVT doped with butyl-PBD, and for a ZnO phosphor doped with Ga.     

方酸衍生物的三阶非线性光学特性

采用波长为800 nm、脉宽为50 fs的激光系统,运用双光束前向简并四波混频技术(DFWM)研究了两种方酸衍生物的三阶非线性光学特性,并探讨了它们的非线性形成机制。实验测得所研究的两种方酸衍生物的分子超极化率γ值均为~10^-31 esu,其非线性光学响应时间小于激光脉宽(50 fs)。因而,所研究的方酸衍生物有较大的三阶非线性光学性质和较快的光学响应,在光学器件中具有潜在的应用价值。     

X-ray imaging with grazing-incidence microscopes developed for the LIL program

This article describes x-ray imaging with grazing-incidence microscopes, developed for the experimental program carried out on the Ligne d'Integration Laser (LIL) facility [J. P. Le Breton et al., Inertial Fusion Sciences and Applications 2001 (Elsevier, Paris, 2002), pp. 856-862] (24 kJ, UV-0.35 nm). The design includes a large target-to-microscope (400-700 mm) distance required by the x-ray ablation issues anticipated on the Laser MégaJoule facility [P. A. Holstein et al., Laser Part. Beams 17, 403 (1999)] (1.8 MJ) which is under construction. Two eight-image Kirkpatrick-Baez microscopes [P. Kirkpatrick and A. V. Baez J. Opt. Soc. Am. 38, 766 (1948)] with different spectral wavelength ranges and with a 400 mm source-to-mirror distance image the target on a custom-built framing camera (time resolution of approximately 80 ps). The soft x-ray version microscope is sensitive below 1 keV and its spatial resolution is better than 30 microm over a 2-mm-diam region. The hard x-ray version microscope has a 10 microm resolution over an 800-microm-diam region and is sensitive in the 1-5 keV energy range. Two other x-ray microscopes based on an association of toroidal/spherical surfaces (T/S microscopes) produce an image on a streak camera with a spatial resolution better than 30 microm over a 3 mm field of view in the direction of the camera slit. Both microscopes have been designed to have, respectively, a maximum sensitivity in the 0.1-1 and 1-5 keV energy range. We present the original design of these four microscopes and their test on a dc x-ray tube in the laboratory. The diagnostics were successfully used on LIL first experiments early in 2005. Results of soft x-ray imaging of a radiative jet during conical shaped laser interaction are shown.     

Microscopy of biological sample through advanced diffractive optics from visible to X-ray wavelength regime

The aim of this report is to demonstrate a unified version of microscopy through the use of advanced diffractive optics. The unified scheme derives from the technical possibility of realizing front wave engineering in a wide range of electromagnetic spectrum. The unified treatment is realized through the design and nanofabrication of phase diffractive elements (PDE) through which wave front beam shaping is obtained. In particular, we will show applications, by using biological samples, ranging from micromanipulation using optical tweezers to X-ray differential interference contrast (DIC) microscopy combined with X-ray fluorescence. We report some details on the design and physical implementation of diffractive elements that besides focusing also perform other optical functions: beam splitting, beam intensity, and phase redistribution or mode conversion. Laser beam splitting is used for multiple trapping and independent manipulation of micro-beads surrounding a cell as an array of tweezers and for arraying and sorting microscopic size biological samples. Another application is the Gauss to Laguerre-Gauss mode conversion, which allows for trapping and transfering orbital angular momentum of light to micro-particles immersed in a fluid. These experiments are performed in an inverted optical microscope coupled with an infrared laser beam and a spatial light modulator for diffractive optics implementation. High-resolution optics, fabricated by means of e-beam lithography, are demonstrated to control the intensity and the phase of the sheared beams in x-ray DIC microscopy. DIC experiments with phase objects reveal a dramatic increase in image contrast compared to bright-field x-ray microscopy. Besides the topographic information, fluorescence allows detection of certain chemical elements (Cl, P, Sc, K) in the same setup, by changing the photon energy of the x-ray beam.