A Formal Representation of Abbe's Theory of Microscopic Image Formation

Abstract

Continuing previous work, the well known theory of coherent image processing is reformulated using the mathematical tools of Fourier optics. A general wave optical image equation is established from which imperfect imaging, as well as techniques to affect the process of image formation can be derived. This is demonstrated for two methods, known in the field of microscopic mineral diagnostics as Becke's line and the Schroeder-Van Der Kolk Criterion. The observed phenomena are correctly interpreted within the wave optical theory.     

A Formal Representation of Abbe's Theory of Microscopic Image Formation

The theory of image generation for systems with coherent wave propagation is formally represented using the mathematical methods of Fourier optics. Abbe's theory of constructing the secondary image (the image conjugate to the object) by coherent superposition of the waves originating from the primary image (at the back focal plane of the system for plane wave illumination) is shown to be included within the general Fourier optical treatment of optical transfer systems.     

Image Formation in the Scanning Microscope

Fourier imaging in the scanning microscope is considered. It is shown that there are two geometries of the microscope, which have been designated Type 1 and Type 2. Those of Type 1 exhibit identical imaging to the conventional microscope, whereas those of Type 2 (confocal microscopes) display various differences. Imaging of a single point object, two-point resolution and response to a straight edge are also considered. The effect of various arrangements using lenses with annular pupil functions is also discussed. It is found that Type 2 microscopes have improved imaging properties over conventional microscopes and that these may be further improved by use of one or two lenses with annular pupils.     

Fluorescent Image Formation in the Fibre-optical Confocal Scanning Microscope

Abstract

Reported in this paper are theoretical studies on two-dimensional and three-dimensional image formation with fluorescent objects in a fibre-optical confocal scanning microscope. An effective point spread function is introduced to derive the two- and three-dimensional optical transfer functions. It is found that, unlike confocal fluorescence microscopes with a finite circular detector, there is no missing cone of spatial frequencies, and no negative tail in the transfer function. The effect of the system parameters on the optical sectioning property is also investigated.     

Microscope Image Comparator

The need for objective means of assessing the severity of imperfections such as digs and scratches on optically polished surfaces is discussed. Previously used inspection techniques are reviewed and it is concluded that measurement of the visibility of an image of a particular defect relative to that of a standard, by the use of a microscope image comparator, offers many advantages.     

图象自动处理显微镜系统

该图象自动处理显微镜系统采用了电荷藕合器件对显微镜系统的涂片(或其它试片)进行了自动测光、自动调焦、自动曝光,以及对涂片(如细胞)进行自动筛选的功能。整个系统由微机控制,设有自动输涂片机械手装置、显微镜工作台自动二维扫描机构、自动测光、自动拍照等装置。微机对CCD器件所得到的图象信息按预定模式进行处理,并由预定程序对其组成机构的每步动作自动控制,达到显微镜系统对图象进行自动分析和处理的目的。     

扫描电子声显微镜的成像机理及其应用

扫描电子声显微镜是近几年国际上发展起来的一种新型的显微微观察与成像工具，由于它的成像机理与以往的扫描电镜完全不同，特别是它能进行非破坏性的揭示样品亚表面特性的能力。因此，正越来越多的受到人们的重视与研究。本文主要介绍了扫描电子声显微镜的发展历史，简述了电子声成像技术的基本工作原理。     

基于显微观测及图像处理的颗粒检测综述

本文对粉体颗粒的检测方法进行总结回顾，分析了各种方法的技术特点和局限性。针对颗粒特性，对基于显微观测与图像处理的粉体颗粒分析检测技术做了研究介绍，分析了此技术的现状与发展及应用前景。     

On the Theory of Formation of a Sandwich Structure of a Spherical Hailstone

The paper analyzes the motion of the crystallization front under laminar and turbulent conditions of film motion on a hailstone surface. It is shown that the transition from one structure of ice to another is determined by both the equilibrium critical thickness of the film and the generalized Maclean parameter. A relation between them has been established. An expression for Kachurin's critical water content q _K defining the dry–wet transition of the hailstone growth has been obtained. It is shown that the Schumann–Ludlam critical water content q _Sch–L gives only that value of the critical content at which droplets settled on the hailstone freeze. If q _Sch–L < q < q _K, then a film is formed on the hailstone surface, but it is in an unstable state and, in the course of time, disappears, and the wet regime of the hailstone changes into the dry one. The hailstone will grow in the wet regime only at q > q _K.     

The Non-isoplanatic Image Equation and the Effect of Not Satisfying the Sine Condition in the Scanning Microscope

Abstract

By considering lack of agreement with the sine condition and using the concept of image formation by interference of plane waves, we derive a new equation for non-isoplanatic image formation. Moreover, applying this equation and considering alignment errors between optical elements, a new equation for the image formation of the object-scan type scanning microscope is derived. This type of microscope also includes laser-disc optical systems. Effects of the sine condition not being satisfied both for the illumination lens and for the collector lens are discussed.     

光子扫描隧道显微镜测量折射率图象的初步研究

光子扫描隧道显微镜（ＰＳＴＭ：Ｐｈｏｔｏｎ Ｓｃａｎｎｉｎｇ ＴｕｎｎｅｌｉｎｇＭｉｃｒｏｓｃｏｐｅ）测得的图象不仅与形貌有关,而且与贯穿整个样品的光学参数有关,即有可能用它获取样品折射率图象。本文在理想情况下运用多层薄膜理论,分析了ＰＳＴＭ中各种参量（样品层折射率ｎ１,厚度ｄ１,入射角θ０）对折射率测量的影响。结果表明在适当的样品厚度ｄ１（ｄ１≤λ／８）,能达到较大灵敏度,且无明显假象,结论可供     

Calculation and Measurement of Image Formation,Spatial Resolution,and Effective Depth of Focus for a Scanning Microscope with Confined Electromagnetic Waves

The resolution of scanning microscopes with confined waves is mainly determined by the diameter of the confinement region instead of by the wavelength. The ‘effective depth of focus’, i.e. the tolerable distance between the plane of minimum confinement of waves and the object plane is about one-quarter of the diameter of the confinement cross-section.     

基于类高斯模型的显微图像固点噪声定位算法

针对显微图像固点噪声的特点和技术要求,本文提出类高斯模型和相应的固点噪声检测方法.首先,利用显微图像序列的时间相关性,计算类高斯模型中图像序列相同位置像素彩色分量的均值和方差;然后,根据彩色分量均值图像用最大类间方差法计算彩色分量的自适应阈值,用均分法计算彩色分量方差的自适应阈值;再者,根据阈值对图像序列中的每个像素进...     

Image Formation by Magneto-optic Effects

The observation of magnetic domain structures by means of the Faraday and Kerr effect is described in terms of geometrical and physical optics; experimental techniques and theoretical explanations depend on the magnetic and optical properties of the investigated materials. Two methods are presented considering magnetization objects by means of Kirchhoff's diffraction theory. Starting from the calculation of intensities and polarization states of the diffraction by a magnetization grating, experiments are discussed concerning Fraunhofer diffraction and dark-field observation, artefacts in the image of domains, multiple diffraction by thick specimens, object functions available by magnetic structures and the applications for the investigation of magnetization reversal processes and data processing.     

应用AFM相位图像分析SiO2颗粒在橡胶中的分布

对原子力显微镜探针与填充SiO2颗粒橡胶之间的相互作用进行了分析,利用"tapping"模式原子力显微镜相位图像研究了橡胶中填充SiO2颗粒的微分布,并对SiO2颗粒的微分布进行了统计分析.     

扫描电镜结合图像处理对人牙微观结构的分析

采用扫描电镜结合图像处理技术对人牙微观结构进行了研究。经过直方图均衡化处理后的图像质量明显改善,表现为图像对比度增加,牙齿的特征微结构更加明显。图像增强技术可明显改善人牙的电镜照片质量,为研究人牙的显微结构提供高质量的图像。     

On the Limitations of the Confocal Scanning Optical Microscope as a Profilometer

Abstract

We present a numerical study of the performance of a one-dimensional Confocal Scanning Optical Microscope (CSOM) when used as a profiler of highly reflecting surfaces. The study is conducted by means of a computer simulation that describes the interaction between the incident beam and the sample in a fairly rigorous manner. The degradation of the depth discrimination as a function of the local surface slope is illustrated with examples, and a criterion for the maximum allowable slope is proposed. We also show that the instrument has difficulties in profiling surfaces that have steps or sharp edges and it is argued that, in general, problems are encountered when the surface profile cannot be considered locally flat in the scale of the Point Spread Function (PSF) of the optical system. This implies that the lateral resolution of the instrument is far worse as a profilometer than when used as an imaging system, and that the unresolved features introduce spurious details on the estimated profile.