共查询到20条相似文献,搜索用时 15 毫秒
1.
Claus Gunkel 《真空研究与实践》1995,7(2):121-134
In this review an attempt is made to look shortly into the fundamentals of optical thin films at first and to describe them more detailed by examples and applications in the second part of the paper. 相似文献
2.
3.
Circular polarization selection of light is an important property of helical micro-nanostructure.The helical thin films fabricated by glancing angle deposition can provide both circular polarization selection and wavelength tuning in this work.Their selective transmissions were depicted in calculations and experiments.The wavelength tuning mechanism was revealed as the relationship between peak wavelength and deposition parameters.Therefore,tunable circular polarization components can be designed according to the mechanism mentioned above and fabricated by glancing angle deposition techniques.Potential applications include tunable optical filters,optical pulse-shapers,biosensors etc. 相似文献
4.
5.
Keiichi Kaneto Toshiharu Abe Morio Mizue Wataru Takashima 《Fullerenes, Nanotubes and Carbon Nanostructures》1995,3(4):447-458
Absorption spectra of C60 thin film reduced in an electrochemical cell are studied. The results are compared with data of chemically reduced C60 anions. Absorption with relatively broad line-width below the energy of 1 eV is observed in the film besides the peaks at 1.14 ∼ 1.4 eV observed in C60 anion solution. The electronic states of reduced COT are discussed in terms of the solid state effect. 相似文献
6.
7.
Qinghui LI Donghong GU Fuxi GANResearch Laboratory for High Density Optical Storage Shanghai Institute of Optics Fine Mechanics Chinese Academy of Sciences Shanghai China 《材料科学技术学报》2004,20(6):678-680
TeOx thin films were prepared by vacuum evaporation of TeO2 powder. Structural characteristic and surface mor-phology of the as-deposited films was analyzed by using X-ray photoelectron spectroscopy, transmission electron microscopy, X-ray diffractometer and atomic force microscopy. It was found that the films represented a two component system comprising Te particies dispersed in an amorphous TeO2 matrix. The dispersed Te particies were in a crystalline state. The TeOx films showed a finely granular structure and a rough surface. Results of the statie recording test showed that the TeOx films had good writing sensitivity for short-wavelength laser beam (514.5 nm). Primary results of the dynamic test at 514.5 nm were also reported. The TeOx films were suitable for using as a blue-green wavelength high density optical storage medium. 相似文献
8.
M. Ohyama 《材料科学技术学报》1997,13(4):299-301
The structure, electrical transport, and optical properties of GaSe films fabricated by means of radio-frequency (RF) magnetron sputtering in Ar were investigated. The as-sputtered GaSe films were amorphous, and their optical energy gap Eg are 1.9~2.6 eV. The effect of the synthesis conditions on the optical and electrical properties of the GaSe films has also been studied 相似文献
9.
《Fullerenes, Nanotubes and Carbon Nanostructures》2013,21(1-2):327-333
Abstract The results of investigation of the real and imaginary parts of third‐order nonlinear susceptibility (χ(3)) of C60 thin films (~100 nm) at the wavelength of Nd: YAG laser radiation (532 nm, τ = 55 ps) are presented using Z‐scan technique. Our studies show that the sign of Reχ(3) changes from negative, at pulse repetition rate of 2 Hz to positive, at 0.5 Hz. Sign variations of the real part of the third‐order susceptibility were attributed to the influence of the thermal lens. 相似文献
10.
11.
Y. Z. Peng T. Liew W. D. Song C. W. An K. L. Teo T. C. Chong 《Journal of Superconductivity》2005,18(1):97-103
Co-doped zinc oxide thin films (Zn1–xCoxO) have been deposited on c-plane sapphire substrates by dual-beam pulsed laser deposition. The films have lattice parameters similar to that of ZnO, and the lattice parameters are closely distributed. The films grew along a preferred direction, following the epitaxial relationship Zn1–xCoxO (0001)substrate (0001). Excitonic emission was suppressed at higher Co-dopant concentration in ZnO because of increase in the distortion of host lattice and defects. When more Zn is replaced by Co, more impurity levels are developed within the bandgap, and more defect are generated. Under our experimental conditions, the bandgap of the films tends to increase with increasing dopant concentration. 相似文献
12.
Nickel xanthate thin films (NXTF) were successfully deposited by chemical bath deposition, on to amorphous glass substrates, as well as on p- and n-silicon, indium tin oxide and poly(methyl methacrylate). The structure of the films was analysed by X-ray diffraction (XRD), far-infrared spectrum (FIR), mid-infrared (MIR) spectrum, nuclear magnetic resonance (NMR) and scanning electron microscopy (SEM). These films were investigated from their structural, optical and electrical properties point of view. Uniform distribution of grains was clearly observed from the photographs taken by scanning electron microscope (SEM). The higher transmittance was about 50–60% after optimizing the parameters of deposition time and temperature (4 h, 50 °C). The optical bandgap of the NXTF was graphically estimated as 3·90–3·96 eV. The resistivity of the films was calculated as 62·6–90·7 Ω·cm on commercial glass depending on the film thickness and 62·2–74·5 Ω·cm on the other substrates. The MIR and FIR spectra of the films conformed to the literature and their solid powder forms. The expected peaks of nickel xanthate were observed in NMR analysis on glass. The films were dipped into chloroform as organic solvent and were analysed by NMR. 相似文献
13.
14.
15.
16.
L. Bočánek B. Handlířová J. Humlíček T. Nguyen Manh H. Sitter 《Fullerenes, Nanotubes and Carbon Nanostructures》2013,21(4-5):267-278
Abstract We examine the temperature-induced changes of the optical spectra of thin C60 films deposited on silicon and gold. We have used thermoreflectance to study the spectral response of the lowest electronic states. We have found strong effects related to the phase transition and freezing of the rotations of C60 molecules upon cooling. 相似文献
17.
L. Bo
nek B. Handlí ov J. Humlí
ek T. Nguyen Manh H. Sitter 《Fullerenes, Nanotubes and Carbon Nanostructures》2000,8(4):267-278
We examine the temperature-induced changes of the optical spectra of thin C60 films deposited on silicon and gold. We have used thermoreflectance to study the spectral response of the lowest electronic states. We have found strong effects related to the phase transition and freezing of the rotations of C60 molecules upon cooling. 相似文献
18.
A series of hot (600 °C) and room temperature C+/Al+ co-implanted 6H-SiC epitaxial films, under different implantation dose levels and high temperature (1550 °C) post-annealing, were studied by a variety of structural and optical characterization techniques, including secondary ion mass spectroscopy, high resolution X-ray diffraction, Fourier transform infrared reflectance, micro-Raman and photoluminescence (PL) spectroscopy. The damage and amorphization of SiC layer by co-implantation, and the elimination/suppression of the implantation induced amorphous layer via high temperature annealing are observed. The recovery of the crystallinity and the activation of the implant acceptors are confirmed. The results from hot or RT co-implantation are compared. 相似文献
19.
原子层沉积技术及其在光学薄膜中的应用 总被引:5,自引:0,他引:5
回顾了原子层沉积(ALD)技术的发展背景,通过分析ALD的基本工艺,并与传统薄膜制备工艺进行了对比研究.介绍了它在膜层的均匀性、保形性以及膜厚控制能力等方面的优势.着重列举ALD在减反膜、紫外截止膜、折射率可调的薄膜、抗激光损伤薄膜及复杂结构光子晶体等方面的应用.同时指出了目前ALD工艺在光学薄膜应用中存在的主要问题,并对ALD未来的发展进行了展望. 相似文献
20.
Weil R Joucla M Loison JL Mazilu M Ohlmann D Robino M Schwalbach G 《Applied optics》1998,37(13):2681-2686
A procedure to make optical quality thin films of Zn(x)Cd(1-x)Te by use ofvacuum evaporation of the ternary compound has been developed. Thestarting point was the preparation of the compound that was then usedas the source in a simple vacuum evaporation system. Thecharacteristics of a film containing 85% ZnTe (x =0.85) are presented. Electron microscope, atomic forcemicroscope, x-ray and optical spectral measurements were made. Theindex of refraction was determined at room temperature fromtransmittance measurements in the range of from 580 to 800 nm and wasfound to agree within 1% with values found by others for singlecrystals. We did this by assuming a Sellmeier equation and a knownindex of refraction at infinite wavelength. The calculation alsoyielded the roughness of the film. 相似文献