Effect of externally applied pressure on zinc oxide varistors

A study of the effect of uniaxial pressure on the I-V response of zinc oxide varistors has shown a pressure sensitivity in both prebreakdown and breakdown regions. The general observation is that the conductivity increases with pressure, the effect being more pronounced in the prebreakdown region. Data are in general agreement with the phenomenological model given by Schwertz and Mazenko. Data are also treated on the basis of Schottky barrier and tunneling theories. According to this analysis, the barrier height is found to decrease with pressure. At the time this work was performed, M. P. Mathur was a Consultant for the Westinghouse Electric Corporation, Pittsburgh, Pennsylvania.     

叠层片式ZnO压敏电阻器研究进展

叠层片式ZnO压敏电阻器(MLCV)具有体积小、通流容量大、响应速度快、表面安装性好和易实现低压化等优点,其广泛应用于电子和电力系统中。介绍了叠层片式ZnO压敏电阻器的生片材料和内电极材料的研究现状,分析了当前工艺中存在的电极扩散问题,并提出了其解决的办法,同时指出了叠层片式ZnO压敏电阻器向低压化、小型化、集成化及低成本化方向发展的趋势。     

层状结构低压ZnO压敏陶瓷的制备及性能研究

Double-layered, low-voltage ZnO varistors have been fabricated by feeding two kinds of ZnO powders into a die using dry extrusion molding. Compared with ZnO varistors fabricated by the conventional route, the layered ZnO varistors have larger non-linear coefficients, lower breakdown electric fields, and lower leakage current densities. The improvement in electrical performance of the layered low-voltage ZnO varistors is attributed to the asymmetric band structure at grain boundary between the two layers.     

Preparation and characterization of layered low-voltage ZnO varistors

Double-layered, low-voltage ZnO varistors have been fabricated by feeding two kinds of ZnO powders into a die using dry extrusion molding. Compared with ZnO varistors fabricated by the conventional route, the layered ZnO varistors have larger non-linear coefficients, lower breakdown electric fields, and lower leakage current densities. The improvement in electrical performance of the layered low-voltage ZnO varistors is attributed to the asymmetric band structure at grain boundary between the two layers.     

ZnO压敏电阻冲击电流寿命分布的试验研究

对氧化锌压敏电阻(MOV)样品进行了最大放电电流下的冲击电流寿命试验,得出了每只样品在失效前所能承受的冲击次数;通过对大量样品冲击电流寿命的统计分析,证明了MOV在冲击电流作用下的失效率服从威布尔(weibull)分布,从而为确定MOV的失效前平均寿命和保证寿命提供了依据。     

水基流延法制备多层ZnO压敏电阻器的研究进展

介绍了水基流延法制备多层ZnO压敏电阻器的现状和重要性.分析了粘合剂、分散剂及浆料流变特性等对水基流延的影响,并指出了改进办法.通过比较几种水基流延用粘合剂对多层ZnO压敏电阻器电性能的影响,发现水溶性丙烯酸聚合物是最好的.随着水系粘合剂性能的提高,水基流延制备的多层压敏电阻(MLV)的电性能也得到提高,再加上它具有绿...     

高能球磨法制备高电位梯度的ZnO压敏电阻

为了制备高电位梯度的ZnO压敏电阻,采用了新的粉体制备方法,即高能球磨Bi2O3和Sb2O3两种添加剂12 h,再与其它氧化物共同高能球磨5h。扫描电镜及各个烧结温度下电性能、致密度的实验结果证明:此法制备的粉体压片后,1000℃烧结时,其电位梯度高达1516V/mm,漏电流为3.0μA,非线性系数为22。     

sol-gel法制备ZnO薄膜压敏电阻

利用sol-gel法在镀有Au底电极的单晶硅片上,制备掺有Bi2O3、Co2O3、Cr2O3和MnO2的ZnO薄膜压敏电阻。薄膜由旋涂法制备,并在300℃下预处理、600℃退火。制得的ZnO薄膜结晶良好。膜厚约为1μm,ZnO薄膜压敏电阻的非线性系数为15.1,压敏电压为3.037 V,漏电流为43.25μA。     

微波烧结ZnO压敏电阻的可行性研究

采用微波烧结工艺制备了ZnO压敏电阻,研究了其致密化过程,运用XRD、SEM、电性能测试等手段,分析了烧结温度对其微观结构和电性能的影响。结果表明:微波烧结工艺不仅可显著提高ZnO压敏电阻的致密化,而且能够改善材料的微观结构和电性能。微波工艺的烧结周期仅是传统工艺的1/10~1/8。微波烧结样品的小电流特性有所提升;其通流量为11.6kA,比商用ZnO压敏电阻(7.75kA)高。     

利用光电子能谱研究氧化锌压敏电阻界面电输运特性

采用X射线光电子能谱(XPS)对比分析纯氧化锌陶瓷和氧化锌压敏电阻的界面特性。结果表明,纯氧化锌陶瓷晶粒平均尺寸小于10 祄,掺杂材料有利于ZnO晶粒均匀生长。界面上O/Zn原子数量比值等于2.58,但界面势垒不到10 mV,其体电阻率在2.36~47.97佟m。价电子谱发现:室温下仅纯ZnO费米能级附近有载流子分布,这表明:压敏电阻界面有陷阱态,氧化锌压敏电阻界面电输运特性需用载流子陷阱对双肖特基势垒进行补充。     

无铋氧化锌压敏电阻的研究

讨论了无铋氧化锌压敏电阻压敏特性的根本原因。由于离子置换使得Ｚｎ２＋成为填隙离子,从而在氧化锌晶粒间引起肖特基势垒。对于氧化锌压敏电阻而言,双肖特基势垒是形成非线性电特性的根本因素。     

Process and device modeling for VISI

The appearance of Very Large Scale Integration caused a pronounced interest in concentrating on process and device modeling. The fundamental properties which represent the basis for all device modeling activities are summarized. The sensible use of physical and technological parameters is discussed and the most important physical phenomena which are required to be taken into account are scrutinized. The assumptions necessary for finding a reasonable trade-off between efficiency and effort for a model synthesis are recollected. Methods to bypass limitations induced by these assumptions are pin-pointed. Formulae that are applicable in a simple and easy way for the physical parameters of major importance are presented. The necessity of a careful parameter-selection, based on physical information, is shown. Some glimpses on the numerical solution of the semiconductor equations are given. The discretisation of the partial differential equations with finite differences is outlined. Linearisation methods and algorithms for the solution of large sparse linear systems are sketched. Results of our two dimensional MOSFET model — MINIMOS — are discussed. Much emphasis is laid on the didactic potential of such a complex high order model.     

直流微电机用环形低压压敏电阻器的性能比较

测量了目前直流微电机消噪用 Zn O和 Sr Ti O3两类环形压敏电阻器的特性参数 ,分析了它们的介电 -频率和介电 -温度特性 ,并与所研制的用籽晶法制备的 Zn O压敏电阻的性能相比较。比较测量结果说明 ,采用籽晶法制备的 Zn O压敏电阻器 ,具有易于低压化且压敏特性良好的优点。尽管 Zn O的电容量不及 Sr Ti O3,但由于Zn O压敏电阻的制备属常规工艺且成本低廉 ,在要求价格低的直流微电机应用领域 ,只要提高 Zn O环形压敏电阻器的压敏特性 ,它仍具有较高的实用价值     

纳/微米ZnO同质结器件的制备及电子学特性研究

用低压化学气相沉积法制备了T形和V形纳/微米ZnO同质结,用扫描电子显微镜(SEM)和高倍光学成像显微镜观察了同质结的结构与生长形貌,分析了其结构及生长机理。利用ZnO同质结组装成了纳/微米ZnO同质结器件,分析研究了这些器件的I-V特性,并对I-V特性变化规律进行了分析讨论。     

三类金属氧化物热电材料的研究进展

综述了NaxCo2O4系、ZnO系和CuAlO2系氧化物热电材料的晶体结构、制备方法和研究现状,发现这三类热电材料均具有较好的热电性能,具有进一步研究的价值。阐述了金属氧化物热电材料未来的研究方向。     

ZnO薄膜的丙酮气敏特性研究

用直流磁控反应溅射法,分别在Si(111)基片及Al2O3陶瓷基片上制备了ZnO薄膜,并进行TiO2、SnO2、Al2O3或CuO的掺杂和退火处理。用XRD分析了退火前后晶型的变化,利用气敏测试系统对各样品进行了气敏特性测试。结果表明:经过700℃退火后的样品,在最佳工作温度为220℃时,对丙酮有很好的选择性和很高的灵敏度(34.794)。掺杂TiO2或SnO2,可提高ZnO薄膜传感器对丙酮的灵敏度(57.963)。     

侧面高阻釉对ZnO压敏防雷芯片电性能的影响

为了抑制压敏防雷芯片边缘低熔点元素在烧结过程中的挥发,在芯片侧面涂覆不同配方高阻釉,研究其对压敏防雷芯片电性能的影响.结果表明:涂覆了高阻釉的芯片组分均匀性得以提高、缺陷减少,样品的8/20μs大电流耐受能力提高;在1 000 mA工频电流作用下,芯片的熔穿点位于芯片中部铜电极区,利于热脱离机构动作,从而提高芯片的暂态过电压耐受能力.     

Structural evolution of low-dimensional metal oxide semiconductors under external stress

Metal oxide semiconductors (MOSs) are attractive candidates as functional parts and connections in nanodevices. Upon spatial dimensionality reduction, the ubiquitous strain encountered in physical reality may result in structural instability and thus degrade the performance of MOS. Hence, the basic insight into the structural evolutions of low-dimensional MOS is a prerequisite for extensive applications, which unfortunately remains largely unexplored. Herein, we review the recent progress regarding the mechanical deformation mechanisms in MOSs, such as CuO and ZnO nanowires (NWs). We report the phase transformation of CuO NWs resulting from oxygen vacancy migration under compressive stress and the tensile strain-induced phase transition in ZnO NWs. Moreover, the influence of electron beam irradiation on interpreting the mechanical behaviors is discussed.     

Characteristics of a GaN-based Gunn diode for THz signal generation

A generalized large-signal computer simulation program for a Gunn oscillator has been developed.The properties of a Gunn diode oscillator based on the widely explored GaN,are investigated using the dev...     

复合玻璃粉在ZnO压敏电阻用银浆料中的作用

ZnO压敏电阻器对所用银浆附着力要求较高,通过对ZnO压敏电阻器用银浆料中玻璃粉的研究,提出了用复合玻璃粉制备ZnO压敏电阻器用银浆料。浆料经不同温度烧成后,测得了烧成膜与基体附着力的数据,复合玻璃粉S2:S5的最佳质量比为1:2.5,复合玻璃粉添加量(质量分数)为3.5%时,可显著提高浆料对基体的附着力。结果表明:可采用适合于480~580℃烧成温度的复合玻璃粉来提高烧成膜的致密性及对基体的附着力。并对其机理进行了探讨。