Embedded Checker Architectures for Cyclic and Low-Cost Arithmetic Codes

Code checkers that monitor the outputs of a system can detect both permanent and transient faults. We present two novel architectures of embedded self-testing checkers for low-cost and cyclic arithmetic codes, one based on code word generators and adders, the other based on code word accumulators. In these schemes, the code checker receives all possible code words but one, irrespective of the number of different code words that are produced by the circuit under check (CUC). So any code checker can be employed that is self-testing for all or a particular subset of code words, and the structure of the code checker need not be tailored to the set of code words produced by the CUC. The proposed code word generators and accumulators are built from simple standard hardware structures, counters and end-around-carry adders. They can also be utilized in an off-line BIST environment as pattern generators and test response compactors.     

Statistical Tolerance Analysis for Assured Analog Test Coverage

Increasing numbers of analog components in today's systems necessitate system level test composition methods that utilize on-chip capabilities rather than solely relying on costly DFT approaches. We outline a tolerance analysis methodology for test signal propagation to be utilized in hierarchical test generation for analog circuits. A detailed justification of this proposed novel tolerance analysis methodology is undertaken by comparing our results with detailed SPICE Monte-Carlo simulation data on several combinations of analog modules. The results of our experiments confirm the high accuracy and efficiency of the proposed tolerance analysis methodology.     

A Statistical Sampler for a New On-Line Analog Test Method

This work shows a new strategy to the on-line test of analog circuits. The technique presents a very low analog overhead and it is completely digital. In the System-on-Chip (SoC) environment the on-line test can be developed by using processing power already available in the system. As all the signal processing is done in the digital domain, it allows use of a purely digital tester or a digital BIST technique. The main principle of operation is based on the observation of statistical properties of the circuit under test. Since it has low analog power and performance overhead, the proposed technique can be used to analyze the output of several stages of complex analog systems without the use of switches or analog multiplexors for reconfiguration, and no additional AD converter is needed. This paper presents the fundamentals of the proposed test method and some experimental results illustrating the operation of the Statistical Sampler concerning linear analog systems.     

An On-Chip Spectrum Analyzer for Analog Built-In Testing

This paper presents an analog built-in testing (BIT) architecture and its implementation. It enables the frequency response and harmonic distortion characterizations of an integrated device-under-test (DUT) through a digital off-chip interface. External analog instrumentation is avoided, reducing test time and cost. The proposed on-chip testing scheme uses a digital frequency synthesizer and a simple signal generator synchronized with a switched capacitor bandpass filter. A general methodology for the use of this structure in the functional verification of a DUT is also provided. The circuit-level design and experimental results of an integrated prototype in standard CMOS 0.5 m technology are presented to demonstrate the feasibility of the proposed BIT technique.Marcia G. Mendez-Rivera was born in Irapuato, Mexico in 1972. She received the Communications and Electronics Engineering Degree from the Universidad de Guanajuato, Guanajuato, Mexico. in 1996, the M.Sc. degree from the Instituto Nacional de Astrofisica, Optica y Electronica (INAOE), Puebla, Mexico in 1998 and the M.Sc. from Texas A&M University, College Station in 2002. Her research interest is in the design and fabrication of analog and mixed-signal circuits.Alberto Valdes-Garcia born in 1978, grew up in San Mateo Atenco, Mexico. He received the B.S. in Electronic Systems Engineering degree from the Monterrey Institute of Technology (ITESM), Campus Toluca, Mexico in 1999 (with honors as the best score from all majors). Since the fall of 2000 he has been working towards the Ph.D. degree at Analog and Mixed-Signal Center (AMSC), Texas A&M University. During the spring and summer of 2000 he was a Design Engineer with Motorola Broadband Communications Sector. In the summer of 2002 he was with the Read Channel Design Group at Agere Systems where he investigated wide tuning range GHz LC VCOs for mass storage applications. During the summer of 2004 he was with the Mixed-Signal Communications IC Design Group at the IBM T. J. Watson Research Center, where worked on design and analysis of SiGe power amplifiers for millimeter wave radios. Since the fall of 2001 he has been a Semiconductor Research Corporation (SRC) research assistant at the AMSC working on the development of analog built-in testing techniques. Since the fall of 2000, Alberto has been the recipient of a scholarship from the Mexican National Council for Science and Technology (CONACYT). He represented Mexico in the 1994 Odyssey of the Mind World Creativity Contest and in the 1997 International Exposition for Young Scientists. His present research interests include built-in testing implementations for analog and RF circuits, system level design for wireless receivers and RF circuit design for UltraWideBand (UWB) communications.Jose Silva-Martinez was born in Tecamachalco, Puebla, México. He received the B.S. degree in electronics from the Universidad Autónoma de Puebla, México, in 1979, the M.Sc. degree from the Instituto Nacional de Astrofísica Optica y Electrónica (INAOE), Puebla, México, in 1981, and the Ph.D. degree from the Katholieke Univesiteit Leuven, Leuven Belgium in 1992. From 1981 to 1983, he was with the Electrical Engineering Department, INAOE, where he was involved with switched-capacitor circuit design. In 1983, he joined the Department of Electrical Engineering, Universidad Autonoma de Puebla, where he remained until 1993; He was a co-founder of the graduate program on Opto-Electronics in 1992. From 1985 to 1986, he was a Visiting Scholar in the Electrical Engineering Department, Texas A&M University. In 1993, he re-joined the Electronics Department, INAOE, and from May 1995 to December 1998, was the Head of the Electronics Department; He was a co-founder of the Ph.D. program on Electronics in 1993. He is currently with the Department of Electrical Engineering (Analog and Mixed Signal Center) Texas A&M University, at College Station, where He holds the position of Associate Professor. His current field of research is in the design and fabrication of integrated circuits for communication and biomedical application. Dr. Silva-Martinez has served as IEEE CASS Vice President Region-9 (1997–1998), and as Associate Editor for IEEE Transactions on Circuits and Systems part-II from 1997–1998 and May 2002–December 2003. Since January 2004 is serving as Associate Editor of IEEE TCAS Part-I. He was the main organizer of the 1998 and 1999 International IEEE-CAS Tour in region 9, and Chairman of the International Workshop on Mixed-Mode IC Design and Applications (1997–1999). He is the inaugural holder of the TI Professorship-I in Analog Engineering, Texas A&M University. He was a co-recipient of the 1990 European Solid-State Circuits Conference Best Paper Award.Edgar Sánchez-Sinencio was born in Mexico City, Mexico. He received the degree in communications and electronic engineering (Professional degree) from the National Polytechnic Institute of Mexico, Mexico City, the M.S.E.E. degree from Stanford University, CA, and the Ph.D. degree from the University of Illinois at Urbana-Champaign, in 1966, 1970, and 1973, respectively. In 1974 he held an industrial Post-Doctoral position with the Central Research Laboratories, Nippon Electric Company, Ltd., Kawasaki, Japan. From 1976 to 1983 he was the Head of the Department of Electronics at the Instituto Nacional de Astrofísica, Optica y Electrónica (INAOE), Puebla, Mexico. He was a Visiting Professor in the Department of Electrical Engineering at Texas A&M University, College Station, during the academic years of 1979–1980 and 1983-1984. He is currently the TI J Kilby Chair Professor and Director of the Analog and Mixed-Signal Center at Texas A&M University. He was the General Chairman of the 1983 26th Midwest Symposium on Circuits and Systems. He was an Associate Editor for IEEE Trans. on Circuits and Systems, (1985–1987), and an Associate Editor for the IEEE Trans. on Neural Networks. He is the former Editor-in-Chief of the Transactions on Circuits and Systems II. He is co-author of the book Switched Capacitor Circuits (Van Nostrand-Reinhold 1984), and co-editor of the book Low Voltage/Low-Power Integrated Circuits and Systems (IEEE Press 1999). In November 1995 he was awarded an Honoris Causa Doctorate by the National Institute for Astrophysics, Optics and Electronics, Mexico. The first honorary degree awarded for Microelectronic Circuit Design contributions. He is co-recipient of the 1995 Guillemin-Cauer for his work on Cellular Networks. He is a former IEEE CAS Vice President-Publications. He was also the co-recipient of the 1997 Darlington Award for his work on high-frequency filters He received the Circuits and Systems Society Golden Jubilee Medal in 1999. He was the IEEE Circuits and Systems Society, Representative to the Solid-State Circuits Society (2000–2002). He is presently a member of the IEEE Solid-State Circuits Fellow Award Committee. His present interests are in the area of RF-Communication circuits and analog and mixed-mode circuit design. He is an IEEE Fellow Member since 1992.     

模拟信号的数字化无线调制解调

以MCS-51系列单片机为核心，采用D／A转换器TLC5618，A／D转换器MAX197、无线数传模块PTR2000设计了一个模拟信号的数字化无线调翻解调系统。     

模拟电路的振荡测试技术

集成电路设计和制造技术的发展给电路测试带来了巨大的挑战,其中模拟电路的测试是电路测试的难点.目前在这一领域有许多致力于降低测试难度,节约测试成本的研究.介绍了一种称为"振荡测试"的模拟电路测试技术,从振荡电路的构造、测试响应的测量和分析等方面综述了振荡测试技术的研究现状,同时总结了振荡测试技术的优点,分析了当前存在的局限性,并对将来的发展进行了展望.     

An Analog Circuit Fault Characterization Methodology

A methodology for diagnosing and characterizing multiple faults in analog circuits, and results from applying this methodology to a real circuit is presented. Our method is a novel combination of a Simulation Before Test (SBT) and Interpolation After Test (IAT) methodology. Our method uses the classical SBT concept of a fault dictionary database constructed before test. It also uses a method of IAT that consists in using the measurements to guide an interpolation algorithm to effectively increase the local resolution of the fault dictionary database and thereby yield the most likely test parameter value. Our methods underlying principle is to characterize the fault-free and faulty circuit cases by their impulse responses obtained by simulation and subsequently stored in a fault dictionary database. The method uses the technique of Lagrange interpolation to resolve the faults between the fault dictionary database entries and the actual measurements. Our experimental results reveal that the method is effective for characterizing faults when the simulations match the measurements sufficiently. Consequently, the methods effectiveness depends highly on the quality of the models used to build the dictionary as well as on the accuracy of the measurements.Yvan Maidon was born in Bordeaux, France. He received the M.Sc degree in (electronics) applied physics from the University of Bordeaux, in 1980. He is currently Head of the Department for Applied Sciences in Electrical and Electronic Engineering at the University of Bordeaux 1. His special research interests include failure analysis and relaibility of analog circuits. He has also developed original BICS for mixed circuits and SoC testing.Thomas Zimmer is currently Professor at the University of Bordeaux 1. He received the M.Sc. degree in physics from the University of Würzburg, Germany, in 1989 and the Ph.D. degree in electronics from the University of Bordeaux 1, France, in 1992. His research interests include characterization and modeling of high frequency bipolar devices. He has authored and co-authored about 70 scientific and technical publications including several book chapters. He is also co-founder of the start-up company XMOD.André Ivanov is Professor in the Department of Electrical and Computer Engineering, at the University of British Columbia. Prior to joining UBC in 1989, he received his B.Eng. (Hon.), M. Eng., and Ph.D. degrees in Electrical Engineering from McGill University. In 1995–96, he spent a sabbatical leave at PMC-Sierra, Vancouver, BC. He has held invited Professor positions at the University of Montpellier II, the University of Bordeaux I, and Edith Cowan University, in Perth, Australia. His primary research interests lie in the area of integrated circuit testing, design for testability and built-in self-test, for digital, analog and mixed-signal circuits, and systems on a chip (SoCs). He has published widely in these areas and holds several patents in IC design and test. Besides testing, Ivanov has interests in the design and design methodologies of large and complex integrated circuits and SoCs. Ivanov has served and continues to serve on numerous national and international steering, program, and/or organization committees in various capacities. Recently, he was the Program Chair of the 2002 VLSI Test Symposium (VTS 02) and the General Chair for VTS 03 and VTS 04. In 2001, Ivanov co-founded Vector 12, a semiconductor IP company. He has published over 100 papers in conference and journals and holds 4 US patents. Ivanov serves on the Editorial Board of the IEEE Design and Test Magazine, and Kluwers Journal of Electronic Testing: Theory and Applications. Ivanov is currently the Chair of the IEEE Computer Societys Test Technology Technical Council (TTTC). He is a Golden Core Member of the IEEE Computer Society, a Senior Member of the IEEE, a Fellow of the British Columbia Advanced Systems Institute and a Professional Engineer of British Columbia.     

Multi-VDD Testing for Analog Circuits

We present industrial results of a quiescent current testing technique suitable for RF testing. The operational method consists of ramping the power supply and of observing the corresponding quiescent current signatures. When the power supply is swept, all transistors are forced into various regions of operation. This has as advantage that the detection of faults is done for multiple supply voltages and corresponding quiescent currents, enhancing in this form the detectability of faults. We found that this method of structural testing yields fault coverage results comparable to functional RF tests making it a potential and attractive technique for production wafer testing due to its low cost, low testing times and low frequency requirements.José Pineda de Gyvez received the Ph.D. degree from the Eindhoven University of Technology. He is currently a principal scientist at Philips Research Laboratories, The Netherlands. Dr. Pineda was Associate Editor in IEEE Transactions on Circuits and Systems Part I and also Associate Editor for Technology in IEEE Transactions on Semiconductor Manufacturing. His research interests are in the general areas of design for manufacturability and analog signal processing.Guido Gronthoud received the electrical engineering degree from the Delft University in 1975. From 1976 to 1980 he worked at the Delft University on the design of Microwave systems. From 1980 he works with Philips. He has been working in the fields of circuit simulation and modelling for IC designs, CAD development for PCB design and electronic circuits and systems reliability. Since 1998 he is working on test innovation of digital and mixed-signal circuits. His interests are Defect Oriented Test, fault modeling and Process Related Test. He has authored and co-authored technical papers.     

Low Cost On-Line Testing Strategy for RF Circuits

This work proposes the use of a simple 1-bit digitizer as an analog block observer, in order to enable the implementation of on-line test strategies for RF analog circuits in the System-on-Chip environment. The main advantages of using a simple digitizer for RF circuits are related to the increased observability of the RF signal path and minimum RF signal degradation, as neither reconfiguration of the signal path nor variable load for the analog RF circuit are introduced. As an additional advantage, the same digitizer can be used to implement BIST strategies, if required. The feasibility of using a 1-bit digitizer for the test of analog signals has already been presented in the literature for low frequency linear analog systems. This paper discusses the implementation of an on-line test strategy for analog RF circuits in the SoC environment, and presents new results for on-line RF testing. Moreover, we also provide detailed analysis regarding the overhead of the test strategy implementation. Experimental results illustrate the feasibility of the proposed technique.Marcelo Negreiros was born in Porto Alegre, Brazil, in 1969. He received the electrical engineering degree in 1992 and the M.S. degree in 1994, both from Universidade Federal do Rio Grande do Sul (UFRGS), Brazil. Since then he was been working as an associate researcher in the Signal Processing Lab. (LaPSI) of the Electrical Engineering Department at UFRGS. Since 2000 he also works toward a Ph.D. in Computer Science from UFRGS. His main research interests include mixed-signal and analog testing and digital signal processing.Luigi Carro was born in Porto Alegre, Brazil, in 1962. He received the Electrical Engineering and the MSc. degrees from Universidade Federal do Rio Grande do Sul (UFRGS), Brazil, in 1985 and 1989, respectively. From 1989 to 1991 he worked at ST-Microelectronics, Agrate, Italy, in the R&D group. In 1996 he received the Ph.D. degree in the area of Computer Science from Universidade Federal do Rio Grande do Sul (UFRGS), Brazil. He is presently a lecturer at the Electrical Engineering Department of UFRGS, in charge of Digital Systems Design and Digital Signal processing disciplines at the graduate and undergraduate level. He is also a member of the Graduation Program in Computer Science of UFRGS, where he is responsible for courses in Embedded Systems, Digital Signal Processing, and VLSI Design. His primary research interests include mixed-signal design, digital signal processing, mixed-signal and analog testing, and fast system prototyping. He has published more than 90 technical papers in those topics and is the author of the book Digital Systems Design and Prototyping (in portuguese).Altamiro A. Susin was born in Vacaria-RS, Brazil, in 1945. He received the Electrical Engineering and the MSc. degrees from Universidade Federal do Rio Grande do Sul (UFRGS), Brazil, in 1972 and 1977, respectively. Since 1968 he worked in the start up of Computer Centers of two local Universities. In 1981 he got his Dr Eng degree from Institut National Polytechnique de Grenoble-France. He is presently a lecturer at the Electrical Engineering Department of UFRGS, in charge of Digital Systems Design disciplines at the graduate and undergraduate level. He is also a member of the Graduation Program in Computer Science of UFRGS, where he is responsible for courses in VLSI Architecture and is also thesis director. His main research interests are integrated circuit architecture, embedded systems, signal processing with more than 50 technical papers published in those domains. He is/was responsible for several R&D projects either funded with public and/or industry resources.     

Structural Fault Based Specification Reduction for Testing Analog Circuits

Specification reduction can reduce test time, consequently, test cost. In this paper, a methodology to reduce specifications during specification testing for analog circuit is proposed and demonstrated. It starts with first deriving relationships between specifications and parameter variations of the circuit-under-test (CUT) and then reduces specifications by considering bounds of parameter variations. A statistical approach by taking into account of circuit fabrication process fluctuation is also employed and the result shows that the specification reduction depends on the testing confidence. A continuous-time state-variable benchmark filter circuit is applied with this methodology to demonstrate the effectiveness of the approach.     

基于遗传算法的容差模拟电路故障诊断

给出了用于模拟电路元件参数识别的多频传递函数法的过程,并对故障诊断方程的可解度进行了分析,在此基础上,将诊断方程的求解转化为非线性函数的优化问题,并运用改进的遗传算法来解决这个问题,算法实例表明该方法简化了故障诊断方程的求解过程,加速了容差电路故障元件的定位,有一定的应用价值。     

Using Spectral Subtraction for Suppression of Noise in Speech Signals with Analog Integrated Circuits

A new modification of the spectral subtraction algorithm is presented which enables operating entirely in the time domain and is thus suitable for realization in analog integrated circuits. The noise spectrum is obtained during speechless intervals and stored for spectral subtraction when speech is present in the signal. The frequency range of interest of the speech signal is divided into narrow frequency bands by means of a bank of band-pass filters. For each frequency band the noise model is realized as an auxiliary signal multiplied by a particular weight. A subsystem is presented that produces an output signal whose power is equal to the difference between the input signal power and the noise model power for each frequency channel, thereby realizing the spectral subtraction. Circuits to achieve the described operation are outlined. Finally, simulation results of the noise removal algorithm are shown in the form of a spectrogram and the results showing improvement in automatic speech recognition are given.     

非线性容差模拟电阻电路故障诊断神经网络方法

将线性电路故障定位 l1 范数最优化算法推广到非线性电路的故障定位 ,由于测后计算是基于神经网络计算机环境 ,所需时间较少 ,能满足现代工业实时性需要。实例和计算机模拟结果表明所提方法是可行的     

基于优化技术的单元级模拟集成电路综合器

本文介绍了一种基于优化技术的单元级模拟集成电路综合方法，该方法采用模拟退火法同时进行拓扑选择和器件尺寸优化，克服了“两步模式”所固有的弊端，本文还构造了一种迭代策略以减少模拟退火法的计算量。按该方法开发的综合器能很好地完成单管放大器，电流镜，运算放大器，模拟乘法器，开关电源控制器等模拟集成电路单元的自动综合。     

Fault Simulation for Analog Circuits Under Parameter Variations

Analog integrated circuit testing and diagnosis is a very challenging problem. The inaccuracy of measurements, the infinite domain of possible values and the parameter deviations are among the major difficulties. During the process of optimizing production tests, Monte Carlo simulation is often needed due to parameter variations, but because of its expensive computational cost, it becomes the bottleneck of such a process. This paper describes a new technique to reduce the number of simulations required during analog fault simulation. This leads to the optimization of production tests subjected to parameter variations. In Section 1 a review of the state of the art is presented, Section 2 introduces the algorithm and describes the methodology of our approach. The results on CMOS 2-stage opamp and Fifth-order Low-pass switched-capacitor Filter are given in Sections 3 and conclusions in Section 4.     

Effect of Noise on Analog Circuit Testing

The effect of test environment noise (tester noise) on test waveforms is considered. We show that tests generated ignoring the tester noise characteristics are prone to failure when actually applied to the circuit-under-test (CUT). The failure may result in the good circuit being declared faulty or the faulty circuit being declared good. This failure is independent of the fault model and nature of the test, i.e., AC or DC, time domain or frequency domain. We characterize the total noise at the primary outputs (PO's) of the circuit using second order statistics. We use the noise power spectrum and root mean square (RMS) values to make decisions about the test waveforms and recommend more noise-robust tests. For non-linear circuits we use the Central Limit Theorem of statistics to approximate narrow band noise at a primary input (PI) by a sum of sinusoidal distributions, and we use Monte-Carlo simulations to determine the noise at the PO's in the time domain. Results of experiments on an instrumentation amplifier, a biquadratic filter, and a Gilbert multiplier are presented, which prove that valid tests in a noise-free environment are invalid when tester noise is considered.     

PLC接收模拟量输入信号的通用计算表达式

本文针对PLC接收模拟量输入信号量值转换的计算问题,推导出PLC模拟量输入模块的模拟值与传感器测量物理量之间关系的通用计算表达式,并就具体实例情况进行了演绎。笔者得出的通用计算表达式,对于使用PLC处理模拟量的量值转换计算,对教学具有指导意义。     

新型程控模拟量发生器

对 SIMI2 0 0 0数模 IC测试系统的模拟量发生器进行了改进 ,采用多级分布式流水线步进传输结构 ,解决了从控制器到终端之间的数据传输问题以及灵活扩展的问题     

An Analog Correlator for a WCDMA Receiver

A prototype analog correlator structure suitable for a WCDMA receiver was implemented. The advantages of this correlator are low power consumption compared to a digital correlator and small chip area. The target is to use such correlator as parallel correlators (fingers) of a RAKE receiver. The analog baseband correlator utilizes passive MOS-multipliers, a first-order low-pass continuous-time oversampling sigma–delta analog-to-digital converter and a second-order sinc type of decimation filter (for both I and Q input paths). The modulator sampling rate is twice the chip rate with oversampling ratios of 8–512 depending of the PN code length. The circuit was implemented in 0.8 m CMOS-technology with a supply voltage of 2.8 V. The layout size is 345 m×686 m and the current drain is approximately 370 A.     

Analog State Transmission with Digital Hardware

A novel strategy for analog state transmission providing a large number of analog channels is presented. The total bandwidth of a digital asynchronous bus is dynamically divided by a large number of separate channels using relatively simple modulation and arbitration circuitry. The concept introduces several interesting aspects like random quantization noise, good scaling capabilities and low area consumption. The feasibility of the method has been proven by measurements on a working chip implementation.