Carbon-doped Sb2S3 thin films: Structural, optical and electrical properties

We report the modification of electrical properties of chemical-bath-deposited antimony sulphide (Sb₂S₃) thin films by thermal diffusion of carbon. Sb₂S₃ thin films were obtained from a chemical bath containing SbCl₃ and Na₂S₂O₃ salts at room temperature (27 °C) on glass substrates. A carbon thin film was deposited on Sb₂S₃ film by arc vacuum evaporation and the Sb₂S₃-C layer was subjected to heating at 300 °C in nitrogen atmosphere or in low vacuum for 30 min. The value of resistivity of Sb₂S₃ thin films was substantially reduced from 10⁸ Ω cm for undoped condition to 10² Ω cm for doped thin films. The doped films, Sb₂S₃:C, retained the orthogonal stibnite structure and the optical band gap energy in comparison with that of undoped Sb₂S₃ thin films. By varying the carbon content (wt%) the electrical resistivity of Sb₂S₃ can be controlled in order to make it suitable for various opto-electronic applications.     

Preparation of CuGaS2 thin films by two-stage MOCVD method

Copper gallium disulfide (CuGaS₂; CGS) films were deposited on glass or ITO glass by two-stage metal-organic chemical vapor deposition (MOCVD) method, using Cu- and Ga/S-containing precursors without toxic H₂S gas. First, pure Cu thin films were prepared on glass substrates by using a single-source precursor, bis(ethylbutyrylacetato)copper(II) or bis(ethylisobutyrylacetato)copper(II). Second, the resulting Cu films were processed using tris(N,N-ethylbutyldithiocarbamato)gallium(III) at 410-470 °C to produce CuGaS₂ films. The optical band gap of the CGS film grown at 440 °C was about 2.53 eV. In addition, it was found that the elemental ratio of Cu and Ga elements of the CGS films can be elaborately adjusted by controlling deposition conditions on demand.     

Studies on Cu2ZnSnS4 (CZTS) absorber layer using different stacking orders in precursor thin films

Cu₂ZnSnS₄ (CZTS) thin films were deposited by sputtering on glass substrates using stacked precursors. The stacked precursor thin films were prepared from Cu, SnS₂ and ZnS targets at room temperature with different stacking orders of Cu/SnS₂/ZnS/glass (A), ZnS/Cu/SnS₂/glass (B) and SnS₂/ZnS/Cu/glass (C). The stacked precursor thin films were sulfurized using a tubular rapid thermal annealing system in a mixed N₂ (95%)+H₂S (5%) atmosphere at 550 °C for 10 min. The effects of the stacking order in the precursor thin films on the structural, morphological, chemical, electrical and optical properties of the CZTS thin films were investigated. X-ray diffraction, Raman spectroscopy and X-ray photoelectron spectroscopy studies showed that the annealed CZTS thin film using a stacking order A had a single kesterite crystal structure without secondary phases, whereas stacking orders B and C have a kesterite phase with secondary phases, such as Cu_2−xS, SnS₂ and SnS. The annealed CZTS thin film using stacking order A showed a very dense morphology without voids. On the other hand, the annealed CZTS thin films using stacking orders B and C contained the volcano shape voids (B) and Sn-based secondary phases (C) on the surface of the annealed thin films. The direct band gap energies of the CZTS thin films were approximately 1.45 eV (A), 1.35 eV (B) and 1.1 eV (C).     

Structure, composition and optical properties of Cu2ZnSnS4 thin films deposited by Pulsed Laser Deposition method

Polycrystalline Cu₂ZnSnS₄ (CZTS) thin films have been directly deposited on heating Mo-coated glass substrates by Pulsed Laser Deposition (PLD) method. The results of energy dispersive X-ray spectroscopy (EDX) indicate that these CZTS thin films are Cu-rich and S-poor. The combination of X-ray diffraction (XRD) results and Raman spectroscopy reveals that these thin films exhibit strong preferential orientation of grains along [1 1 2] direction and small Cu_2−xS phase easily exists in CZTS thin films. The lattice parameters and grain sizes have been examined based on XRD patterns and Atom Force Microscopy (AFM). The band gap (E_g) of CZTS thin films, which are determined by reflection spectroscopy varies from 1.53 to 1.98 eV, depending on substrate temperature (T_sub). The optical absorption coefficient of CZTS thin film (T_sub=450 °C) measured by spectroscopic ellipsometry (SE) is above 10⁴ cm⁻¹.     

Synthesis and characterization of co-electroplated Cu2ZnSnS4 thin films as potential photovoltaic material

Cu₂ZnSnS₄ thin films have been successfully prepared by a novel synthesis process that involves a single step deposition of Cu₂ZnSnS₄ followed by a post-annealing treatment at 550 °C for 60 min in the atmosphere of N₂+H₂S (5%). The microstructure, morphology, composition and optical property of the film have been investigated in detail. It is found that the Na₂S₂O₃5H₂O concentration in the solution has a significant effect on the Cu₂ZnSnS₄ thin films. X-ray diffraction data indicates that the annealed Cu₂ZnSnS₄ thin films have a kesterite structure with preferred orientation along the (1 1 2) plane. Uniform and compact topographies are observed in some annealed films. From the energy dispersive X-ray spectroscopy analysis, it can be seen that Cu-poor and Zn-rich Cu₂ZnSnS₄ thin films have been obtained. The direct band gap energy of the film is about 1.5 eV.     

Rapid formation of transparent CuAlO2 thin film by thermal annealing of Cu on Al2O3

An 850-nm-thick CuAlO₂ film was formed by solid state reaction of evaporated thin film Cu on c-cut Al₂O₃ (sapphire) at 1200 °C for reaction times as short as 10 min. X-ray diffractogram confirms the formation of (0 0 l) CuAlO₂, indicating oriented growth of CuAlO₂ on c-cut Al₂O₃. Fourier transformation infra-red (FTIR) spectra showed peaks corresponding to Cu-O, Al-O and O-Cu-O bonds, confirming further the CuAlO₂ phase formation. UV-visible spectrum measurement showed high transparency of the film in the visible region with a direct band gap of 3.25 eV. The mechanism of the formation of the film is discussed.     

Sub-micrometer thick CuInSe2 films for solar cells using sequential elemental evaporation

CuInSe₂ thin films were prepared using sequential vacuum evaporation of In, Se and Cu at moderately low substrate temperatures, avoiding any treatment using toxic H₂Se gas. The samples were annealed at 400 °C at a pressure of 10⁻⁵ mbar to form CuInSe₂. Structural, optical, electrical, compositional and morphological characterizations were carried out on these films. We could obtain highly stoichiometric film, using this simple method, without opting for co-evaporation or high substrate temperature for deposition.     

Fabrication of Cu2ZnSnS4 films by sulfurization of Cu/ZnSn/Cu precursor layers in sulfur atmosphere for solar cells

Cu₂ZnSnS₄ (CZTS) absorbers were grown by sulfurization of Cu/ZnSn/Cu precursors in sulfur atmosphere. The reaction mechanism of CZTS formation from the precursor was analyzed using XRD and Raman spectroscopy. The films with a single phase CZTS were formed at 560 and 580 °C by sulfurization for 30 min. The film grown at 560 °C showed bi-layer morphology with grooved large grains on the top and dense small grains near the bottom of the film. On the other hand, the film grown at 580 °C showed large grains with grooves that are extended from surface top to bottom of the film. The solar cell fabricated with the CZTS film grown at 560 °C showed the best conversion efficiency of 4.59% for 0.44 cm² with V_oc=0.545 V, J_sc=15.44 mA/cm², and FF=54.6. We found that further improvement of the microstructure of CZTS films can increase the efficiency of CZTS solar cells.     

AC and dielectric properties of thermally evaporated p-type (Sb2Te3)70 (Bi2Te3)30 thin films

Thin films of (Sb₂Te₃)₇₀ (Bi₂Te₃)₃₀ were prepared by thermal evaporation. The composition of the film was confirmed by energy dispersive analysis (EDAX). X-ray diffraction studies showed that the film was polycrystalline with grain size of 4.39 Å and with a preferred orientation in the (0 1 5) directions. Al/((Sb₂Te₃)₇₀ (Bi₂Te₃)₃₀)/Al (MSM) thin film capacitors are formed and its AC and dielectric studies were carried out using a digital LCR metre at various frequencies (12 Hz–100 kHz) and temperatures (303–483 K). The dielectric constant for a film of thickness 3000 Å was found to be 86 for 1 kHz at room temperature. The temperature coefficient of capacitance (TCC) and temperature coefficient of permittivity (TCP) were estimated as 684 and 1409 ppm/K for 10 kHz at 303 K, respectively. The activation energy was estimated as 1.190 eV for frequency of 100 kHz at 303 K. The AC conductivity of the films was found to be a hopping mechanism.     

A novel one-step electrodeposition to prepare single-phase CuInS2 thin films for solar cells

Copper indium disulfide (CuInS₂) thin films have been successfully prepared on Ni substrates using a novel one-step potentiostatic electrodeposition combined with a potassium hydrogen phthalate (C₈H₅KO₄) complexing agent, accompanied by annealing at 350 °C. Electrodeposition in the solution of Cu and In salts and sodium thiosulfate (Na₂S₂O₃) containing an adequate concentration of C₈H₅KO₄ (e.g., [C₈H₅KO₄]=23 mM) provides thin films comprised of a CuInS₂ single phase as the bulk composition, without forming Cu_xS secondary phases. In addition to the effect on bulk-phase compositions, the adjustment of [C₈H₅KO₄] causes variation in morphology and atomic composition of the film surface. The surface states of the films change from the Cu-rich rough surface at low [C₈H₅KO₄] (15 mM) to the In-rich smooth surface at high [C₈H₅KO₄] (23 mM). The higher [C₈H₅KO₄] induces the grains constructing the film to interconnect and form a densely packed CuInS₂ film without voids and pinholes. The single-phase and void-free CuInS₂ film shows a band gap of 1.54 eV, satisfying the requirement of the absorber layers in solar cells. The electrical properties tests denote its n-type conductivity with a resistivity of 9.6×10⁻⁵ Ω cm, a carrier concentration of 2.9×10²¹ cm⁻³ and a carrier mobility of 22.2 cm² V⁻¹ s⁻¹.     

Electrical and optical properties of Cu2ZnSnS4 thin films prepared by rf magnetron sputtering process

Cu₂ZnSnS₄ thin films were deposited on corning 7059 glass substrates without substrates heating by rf magnetron sputtering. The Cu/(Zn+Sn) ratio of the thin film sputtered at 75 W was close to the stoichiometry of Cu₂ZnSnS₄. However, the S/(Cu+Zn+Sn) ratio was less than the stoichiometry. The as-deposited films were amorphous and annealed in the atmosphere of Ar+S₂ (g). The annealed (1 1 2), (2 0 0), (2 2 0), (3 1 2) planes were conformed to all the reflection of a kesterite structure. A preferred (1 1 2) orientation was observed with the increase of the annealing temperature. The optical absorption coefficient of the thin film was about 1.0×10⁴ cm⁻¹. The optical band energy was derived to be 1.51 eV. The optical absorption coefficient of the sputtered Cu₂ZnSnS₄ thin films was less than that of CuInS₂ thin film, however, the band gap energy was more appropriate for photovoltaic materials.     

Influence of H2S concentration on the properties of Cu2ZnSnS4 thin films and solar cells prepared by sol-gel sulfurization

Cu₂ZnSnS₄ (CZTS) thin films prepared by a non-vacuum process based on the sulfurization of precursor coatings, consisting of a sol-gel solution of Cu, Zn, and Sn, under H₂S+N₂ atmosphere were investigated. The structure, microstructure, and electronic properties of the CZTS thin films as well as solar cell parameters were studied in dependence on the H₂S concentration. The sulfurization process was carried out at 500 °C for 1 h in an H₂S+N₂ mixed-gas atmosphere with H₂S concentrations of 3%, 5%, 10%, and 20%. As the H₂S concentration decreased from 20% to 5%, the S content of the CZTS thin films decreased. However, when the H₂S concentration was decreased below 3%, the S content of the films began to increase. A CZTS thin film prepared with an H₂S concentration of 3% had grains in the order of 1 μm in size, which were larger than those of films prepared at other H₂S concentrations. Furthermore, the most efficient solar cell, with a conversion efficiency of 2.23%, was obtained from a sample sulfurized at an H₂S concentration of 3%.     

CuInSe2 thin film preparation through a new selenisation process using chemical bath deposited selenium

Copper indium selenide thin films were prepared through a novel and an eco-friendly selenisation process. In this method, selenium film required for selenisation was prepared using chemical bath deposition technique, at room temperature. Thus, totally avoided usage of highly toxic H₂Se or selenium vapour. Here, the process involved annealing the Stacked layer, Se/In/Cu in which Cu and In were deposited using vacuum evaporation technique. Investigations on the solid-state reaction between the layers were done by analysing structural and optical properties of films formed at different annealing temperatures. Optimum annealing condition for the formation of copper indium selenide thin film was found to be 673 K for 1 h in high vacuum. Compositional dependence of the growth process was also studied using various Cu/In ratios. Optical band gap was decreased with increase in Cu/In ratio. Carrier concentration and hence conductivity were found to be increased with increase in Cu/In ratio. The films obtained were p-type and highly Cu-rich films were degenerate.     

Optical and photoelectrical properties of β-In2S3 thin films prepared by two-stage process

β-In₂S₃ films were grown on glass as well as on quartz substrates by rapid heating of metallic indium films in H₂S atmosphere. The effect of sulfurization temperature and time on the growth, structural, electrical and photoelectrical properties of β-In₂S₃ films has been investigated. Highly oriented single-phase β-In₂S₃ films were grown by the sulfurization technique. The morphology and composition of films have been characterized. The optical band gap of β-In₂S₃ is found to vary from 1.9 to 2.5 eV when the sulfurization temperature is varied from 300 to 600 °C or by increasing the sulfurization time. The electrical properties of the thin films have also been studied; they have n-type electrical conductivity. The photoelectrical properties of the β-In₂S₃ films are also found to depend on the sulfurizing temperature. A high photoresponse is obtained for films prepared at a sulfurizing temperature of 600 °C. β-In₂S₃ can be used as an alternative to toxic CdS as a window layer in photovoltaic technology.     

Role of substrate temperature in controlling properties of sprayed CuInS2 absorbers

Optimization of substrate temperature of spray pyrolysed CuInS₂ absorber is discussed along with its effect on the photoactivity of junction fabricated. For CuInS₂ thin films, properties like crystallinity, thickness and composition showed progressive behavior with substrate temperature. X-ray photoelectron spectroscopic depth profile of all the samples showed that the concentration of copper on the surface of the films is significantly lesser than that in the bulk thus avoiding need for toxic cyanide etching. Interestingly, samples prepared at 623 K had higher conductivity compared to those prepared above and below this temperature. Also, the low energy transition, in addition to the direct band gap which was observed in other samples were absent in films prepared at 623 K. From thermally stimulated conductivity studies it was seen that shallow levels present in this sample contribute to its improved conductivity. Also, CuInS₂/In₂S₃ bilayer prepared at this substrate temperature showed higher photoactivity than those prepared at other temperatures.     

Electrochemical deposition of porous Co3O4 nanostructured thin film for lithium-ion battery

Porous Co₃O₄ nanostructured thin films are electrodeposited by controlling the concentration of Co(NO₃)₂ aqueous solution on nickel sheets, and then sintered at 300 °C for 3 h. The as-prepared thin films are characterized by thermogravimetric analysis (TGA), X-ray diffraction (XRD), and scanning electron microscopy (SEM). The electrochemical measurements show that the highly porous Co₃O₄ thin film with the highest electrochemically active specific surface area (68.64 m² g⁻¹) yields the best electrochemical performance compared with another, less-porous film and with a non-porous film. The highest specific capacity (513 mAh g⁻¹ after 50 cycles) is obtained from the thinnest film with Co₃O₄ loaded at rate of 0.05 mg cm⁻². The present research demonstrates that electrode morphology is one of the crucial factors that affect the electrochemical properties of electrodes.     

TiO2 thin films - Influence of annealing temperature on structural, optical and photocatalytic properties

Nanostructured TiO₂ thin films were deposited on glass substrates by sol-gel dip coating technique. The structural, morphological and optical characterizations of the as deposited and annealed films were carried out using X-ray diffraction (XRD), Raman spectroscopy, atomic force microscopy (AFM), and UV-vis transmittance spectroscopy. As-deposited films were amorphous, and the XRD studies showed that the formation of anatase phase was initiated at annealing temperature close to 400 °C. The grain size of the film annealed at 600 °C was about 20 nm. The lattice parameters for the films annealed at 600 °C were a = 3.7862 ? and c = 9.5172 ?, which is close to the reported values of anatase phase. Band gap of the as deposited film was estimated as 3.42 eV and was found to decrease with the annealing temperature. At 550 nm the refractive index of the films annealed at 600 °C was 2.11, which is low compared to a pore free anatase TiO₂. The room temperature electrical resistivity in the dark was of the order of 4.45 × 10⁶ ohm-cm. Photocatalytic activity of the TiO₂ films were studied by monitoring the degradation of aqueous methylene blue under UV light irradiation and was observed that films annealed above 400 °C had good photocatalytic activity which is explained as due to the structural and morphological properties of the films.     

Structural and optical properties of CuInTe2 films prepared by thermal vacuum evaporation from a single source

The CuInTe₂ thin films were prepared by thermal vacuum evaporation from a single source. The effects of heat treatment on both structural an optical properties of CuInTe₂ films were studied. X-ray diffraction studies reveal that the films prepared by the present method showed formation of single phase CuInTe₂ at heating treatment temperature higher than 300°C. The calculated lattice constants for CuInTe₂ films annealed at 300°C were found to be and . The value of the grain size obtained in these films was of the order of 50 nm. The value of optical energy gap (0.97 eV) and the dispersive refractive index n(λ) for CuInTe₂ film annealed at 300°C were evaluated by optical absorption measurement.     

Preparation and characterization of spray-deposited Cu2ZnSnS4 thin films

Thin films of Cu₂ZnSnS₄ (CZTS), a potential candidate for absorber layer in thin film heterojunction solar cell, have been successfully deposited by spray pyrolysis technique on soda-lime glass substrates. The effect of substrate temperature on the growth of CZTS films is investigated. X-ray diffraction studies reveal that polycrystalline CZTS films with better crystallinity could be obtained for substrate temperatures in the range 643-683 K. The lattice parameters are found to be a=0.542 and c=1.085 nm. The optical band gap of films deposited at various substrate temperatures is found to lie between 1.40 and 1.45 eV. The average optical absorption coefficient is found to be >10⁴ cm⁻¹.     

Preparation of Cu(In,Ga)(S,Se)2 thin films by sequential evaporation and annealing in sulfur atmosphere

Cu(In,Ga)(S,Se)₂ thin films with high Ga/III ratio (around 0.8) were prepared by sequential evaporation from CuGaSe₂, CuInSe₂, In₂Se₃ and Ga₂Se₃ compounds and then annealing in H₂S gas atmosphere. The annealing temperature was varied from 400 to 500 °C. These samples were characterized by means of XRF, EPMA, XRD and SEM. The S/(S+Se) mole ratio in the thin films increased with increase in the annealing temperature, keeping the Cu, In and Ga contents nearly constant. The open circuit voltage increased and the short circuit current density decreased with increase in the annealing temperature. The best solar cell using Cu(In,Ga)(S,Se)₂ thin film with Ga/(In+Ga)=0.79 and S/(S+Se)=0.11 annealed at 400 °C demonstrated V_oc=535 mV, I_sc=13.3 mA/cm², FF=0.61 and efficiency=4.34% without AR-coating.