一种高精度阈值可调过温保护电路的设计

设计了一种高精度阈值可调过温保护电路。该电路利用与温度无关的电压和一个具有负温度系数的电压相比较,实现温度的检测。通过基准分压得到高、低阈值电压可调的迟滞比较器,具有较高的精度。基于0.18μm BCD工艺模型,利用Hspice软件对电路进行仿真。仿真结果表明,在典型应用下,当温度高于150.5℃时,过温保护电路输出高电平,关断电路;当温度低于130.5℃时,电路重新开启,具有20℃迟滞量。在3~5.5 V电源电压范围内,过温电压阈值和迟滞温度最大偏移量小于0.02℃。     

一种改进的高精度低功耗过温保护电路

为了防止芯片过热,提高芯片可靠性和稳定性,文中提出一种改进的高精度、低功耗,具有迟滞功能,结构简单的过温保护电路.基于JAZZ BCD 0.5μm工艺库模型,采用Cadence的Spectre仿真器进行模拟验证,结果表明:当温度超过140℃时,电路输出信号发生翻转,控制芯片停止工作;当温度降至118℃时,恢复芯片工作.在电源电压VDD工作范围2.9～6V内,过温保护阚值变化量为0.275℃,迟滞阚值变化量为0.225℃.典型工作状态下,电路的静态电流为46μA.因此该电路适用于各种电源管理芯片.     

0.13μm CMOS高精度过温保护电路的设计

采用0.13 μm CMOS工艺,设计了一款过温保护电路.芯片内部温度超过109℃时,产生过温保护信号,电路停止工作,从而起到保护作用.为了防止产生热振荡,采用滞回方式.设计实现了在109℃时关断,78℃时再次开启,有31℃滞迟.仿真结果显示,在电源电压波动或工艺参数变化时,过温保护电路的热关断及迟滞阈值点漂移最大误差仅为2℃,稳定性好.     

一种用于马达驱动芯片的新型过温保护电路

为简化电路结构,提高精度和降低功耗,提出了一种新型过温保护电路。该电路无需基准电压和比较器,利用PTAT电流源的正温度系数特性,对温度进行检测,同时设计迟滞回路,避免了热震荡的发生。基于HHNEC的0.35μm BCD工艺实现,在电源电压为3V~5.5V下进行测试结果表明,该电路热关断温度为165℃,温度迟滞量为15℃,误差为1℃,与仿真结果一致,可以广泛应用于功率集成芯片中。     

一种基于电流比较的新型过温保护电路

为了防止芯片过热,提高芯片可靠性和稳定性,提出了一种改进的高精度、低功耗、具有迟滞功能且结构简单的过温保护电路。在不引入热振荡的前提下,实现稳定电路温度和输出关断信号的双重功能。阐述了过温保护电路的工作原理,基于先锋国际半导体公司的BiCMOS0.5μm工艺库模型进行电路设计,采用Hspice软件并用先锋国际半导体公司的BiCMOS 0.5μm工艺库模型对该电路进行模拟仿真。仿真结果表明:当外界温度达到137℃时,过温保护电路输出发生翻转,从而关断芯片内的其他电路,降低功耗,使温度降低。当温度降到120℃时,芯片回到正常工作状态,温度迟滞量为17℃,性能稳定可靠。     

一种用于升压型DC-DC变换器的过温保护电路

设计了一种用于升压型DC-DC变换器的过温保护电路。采用具有正负温度系数的电流相减,得到随温度变化更加明显的电流,经过电阻分压控制三极管的通断,并采用推挽反相器整形滤波后得到输出信号,实现了芯片过温关断和迟滞开启的功能。采用HHNEC BCD 0.35μm工艺,使用Cadence软件进行仿真验证。仿真结果显示,在各个工艺角及电源电压波动情况下,电路均能在芯片温度上升到170℃时关断、在芯片温度下降到140℃时开启,迟滞值为30℃(±2℃)。     

投影机高精度过温保护电路的设计

基于UMC 0.25μm BiCMOS工艺,设计了一款投影机过温保护电路。利用三极管BE结电压的负温度特性实现温度的检测,与传统的过温保护电路不同,该保护电路巧妙地利用比较器的内部正反馈实现热滞回,提高了迟滞的精确度。HSPICE仿真结果表明,该电路能很好地抑制电源电压变化造成的热关断和迟滞阈值点的漂移,性能稳定、可靠。电路能在温度过高时准确地将系统关断,达到保护光源和液晶板的目的,最大限度地保证了投影机的使用寿命。     

VDMOS过温保护功能的实现

提出一种内部集成过温保护功能的VDMOS器件。对传统过温保护原理进行了分析,在此基础上,提出了一种适用于功率器件过温保护的改进电路结构。仿真结果表明,该器件在温度超过174℃时实现自关断,在温度降回142℃时实现自重启。该温度迟滞功能可有效防止热振荡。     

基于迟滞比较器的过热保护电路设计

为了防止芯片过热,提高芯片可靠性和稳定性,采用0.5μm CMOS工艺,设计了一种具有迟滞比较器的过热保护电路。由于采用了折叠式运放,使得比较器输入范围更大,灵敏度和迟滞性能更好。利用Cadence Spectre仿真工具对电路进行了仿真,结果表明电源电压为4.5～7 V时,过温保护阈值变化量极小,表现出输出信号对电源的良好抑制。当温度超过130℃时,输出信号翻转,芯片停止工作;温度降低至90℃时,芯片恢复工作。此电路可以通过调整特定管子的尺寸而控制两个阈值电压的大小,从而避免热振荡的发生。     

一种高精度过温保护电路的设计

设计了一种高精度的过温保护电路。利用晶体管基极和发射极的负温特性实现温度检测,通过将检测点电压和设定的电压相比较,检测是否过温。由于使用了一个高、低阈值可调的高精度滞回比较器,并且阈值电压点电压由与温度无关的带隙基准提供,因此实现较高的精度和可靠性。通过Cadence Spectre工具基于某公司0.35μm CMOS工艺进行了仿真验证。该设计具有20℃温度迟滞,热关断点为125℃,热开启点为105℃,在3~5.5 V的电压范围内,热关断点和热开启点温度最大漂移不超过0.4℃。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Teleportation of an arbitrary unknown N-qubit entangled state under the controlling of M controllers

A new quantum protocol to teleport an arbitrary unknown N-qubit entangled state from a sender to a fixed receiver under M controllers(M < N) is proposed. The quantum resources required are M non-maximally entangled Greenberger-Home-Zeilinger (GHZ) state and N-M non-maximally entangled Einstein-Podolsky-Rosen (EPR) pairs. The sender performs N generalized Bell-state measurements on the 2N particles. Controllers take M single-particle measurement along x-axis, and the receiver needs to introduce one auxiliary two-level particle to extract quantum information probabilistically with the fidelity unit if controllers cooperate with it.     

Diode-end-pumped Nd:YVO4/LBO lasers with 4.2W continuous-wave output at 457 nm

A continuous-wave (CW) 457 nm blue laser operating at the power of 4.2 W is demonstrated by using a fiber coupled laser diode module pumped Nd: YVO4 and using LBO as the intra-cavity SHG crystal With the optimization of laser cavity and crystal parameters, the laser operates at a very high efficiency. When the pumping power is about 31 W, the output at 457nm reaches 4.2 W, and the optical to optical conversion efficiency is about 13.5% accordingly. The stability of the out putpower is better than 1.2% for 8 h continuously working.     

A rigorous proof of MIMO channel capacity’s increase with antenna number

It is well known that adding more antennas at the transmitter or at the receiver may offer larger channel capacity in the multiple-input multiple-output（MIMO） communication systems. In this letter, a simple proof is presented for the fact that the channel capacity increases with an increase in the number of receiving antennas. The proof is based on the famous capacity formula of Foschini and Gans with matrix theory.     

Call for Papers

正Wireless Body-area Networks The last decade has witnessed the convergence of three giant worlds:electronics,computer science and telecommunications.The next decade should follow this convergence in most of our activities with the generalization of sensor networks.In particular with the progress in medicine,people live longer and the aging of population will push the development of wireless personal networks